Patent Grant
8049860
This application is a U.S. National Phase Application under 35 USC 371 of International Application PCT/JP2007/063522 filed Jun. 29, 2007.
The present invention relates to a glass substrate for a reflective mirror, a reflective mirror including the glass substrate, a glass substrate for a liquid crystal panel, and a liquid crystal panel including the glass substrate, and more particularly, to a glass substrate for a reflective mirror of a rear projection television (RPTV), a reflective mirror including the glass substrate, a glass substrate for a liquid crystal panel, and a liquid crystal panel including the glass substrate.
As a substrate for a reflective mirror of a general rear projection television (RPTV), a float glass plate of a board thickness of 3 to 5 mm is used. The float glass plate has waves in the direction perpendicular to the flow direction of the float, and the wave continues in the direction of the flow of the float. More specifically, on the float glass plate, a streaked pattern (microscopic wavy irregularities) is formed in the direction parallel to the flow direction of the float. The microscopic wavy irregularity has an influence on the optical uniformity of the surface reflection. Therefore, when a number of irregularities are formed on a float glass plate, streaked unevenness (light and dark pattern) due to high and low intensities of light may be formed on the reflected image. An MTF method for determining whether or not a streaked light and dark pattern is formed on the reflected image of a float glass plate by quantitatively extracting the distortion of the reflected image and evaluating it, and the total visual inspection for determining whether or not all float glass plates reach the good item reference level by visually determining the reflected images which are actually projected are carried out. As the result of these evaluations, it has been found out that matching the flow direction of the float with the wide angle diffusion direction of the projection system brings about a good result in the visual inspection.
Thus, the display performance of rear projection televisions (RPTV) is maintained by carrying out total visual inspection of the reflected images actually projected after carrying out the draw line control which makes the wide angle diffusion direction of the projection system, namely, the long side direction of the float glass plate, and the flow direction of the float parallel to each other, for the float glass plates for use in the reflective mirrors of the rear projection televisions (RPTV).
Further, it is already disclosed that in the reflective mirror for use in a rear projection type display or the like, at least one surface of a glass substrate is polished so as to have a predetermined surface roughness (0.05 μm or less under the measurement condition of the cutoff value of 0.8 mm to 8 mm) (for example, see Japanese Laid-Open Patent Publication (Kokai) No. 2001-235798).
Meanwhile, as a glass substrate for use in a liquid crystal panel, a float glass plate of a plate thickness of 0.2 to 1.1 mm (±0.1 mm) is usually used. When a liquid crystal panel is manufactured by using the float glass plate as the glass substrate, color unevenness may occur to the liquid crystal panel due to the abovementioned wave. Therefore, in order that the liquid crystal panels reach the good item reference level, inspection of the quality of the glass substrates for use in the liquid crystal panels is carried out.
However, the abovementioned total visual inspection is generally carried out by making white display by placing a reflective mirror in the projection system of a rear projection television (RPTV) and by an inspector observing the light and dark patterns on the screen at a predetermined distance to make judgment of presence or absence of a streaked pattern, and therefore, the inspection depends on the visual acuity and memory of the inspector. Therefore, the good item reference level is likely to vary depending on daily change in the conditions, and the quality of the float glass plate cannot be quantified. Thus, it is necessary to set the good item reference level to be higher, and excessively high quality is brought about.
Further, in order to perform the total visual inspection, the number of the projection systems of rear projection televisions (RPTV) has to be increased in accordance with increase in the number of objects to be inspected. Therefore, the capital investment and human cost increase, and cost reduction by mass production cannot be carried out to result in cost increase.
Further, the draw line control needs to match the flow direction of the float glass plate with the long side direction of the float glass plate, and therefore, the degree of freedom of glass cutting decreases. As a result, yield reduces and cost increases as compared with the case in which the draw line control is not carried out.
Meanwhile, in the liquid crystal panels, color unevenness sometimes occurs even in the liquid crystal panels using the glass substrates determined to be within the standard in the index (for example, amplitude) of the quality inspection of the glass substrate used at present, or color unevenness does not sometimes occur even in the liquid crystal panels using the glass substrates which are determined as non-standard, and the index of the quality inspection and the good item reference level of the liquid crystal panel do not correspond to each other.
Therefore, in order to manufacture the liquid crystal panels at the good item reference level reliably, excessive polishing needs to be performed for the float glass plates, as a result of which, tact time becomes long, and cost increases.
The invention is made in view of the problems as above. An object of the invention is to provide a glass substrate for a reflective mirror, the reflective mirror including the glass substrate, a glass substrate for a liquid crystal panel and a liquid crystal panel including the glass substrate, which secure display quality by quantitative control and can reduce control cost and manufacturing cost.
In order to attain the above described object, according to the first aspect of the present invention, there is provided a glass substrate for a reflective mirror, wherein in a measurement condition of a cut-off value of 0.8 to 8 mm, a maximum amplitude of a filtered waviness curve is 0.1 μm or less, a maximum value of a viewability index value γ expressed by the following formula (1) in a range of spatial frequencies of 2 to 500/mm by spectral analysis of the filtered waviness curve is 0.02 (/m2) or less,
γ=A/D3 (1)
(where A represents each amplitude (m) in a range of spatial frequencies of 2 to 500/mm, and D represents each period (m) in a range of spatial frequencies of 2 to 500/mm), and an integral value of the viewability index value γ is 2.0 (/m3) or less.
In the first aspect of the present invention, in the above described glass substrate for a reflective mirror, a maximum value of the viewability index value γ is preferably 0.01 (/m2) or less, and an integral value of the viewability index value γ is preferably 1.0 (/m3) or less.
In the first aspect of the present invention, in the above described glass substrate for a reflective mirror, the maximum value of the viewability index value γ is preferably 0.006 (/m2) or less, and the integral value of the aforesaid viewability index value γ is preferably 0.6 (/m3) or less.
In the first aspect of the present invention, the above described glass substrate for a reflective mirror is preferably such that in a measurement condition of a cut-off value of 0.8 to 25 mm, a maximum amplitude of a filtered waviness curve is 0.5 μm or less, a maximum value of a viewability index value γ expressed by the following formula (1) in a range of spatial frequencies of 2 to 500/mm by spectral analysis of the filtered waviness curve is 0.2 (/m2) or less,
γ=A/D3 (1)
(where A represents each amplitude (m) in a range of spatial frequencies of 2 to 500/mm, and D represents each period (m) in a range of spatial frequencies of 2 to 500/mm), and an integral value of the viewability index value γ is 20.0 (/m3) or less.
In the first aspect of the present invention, the above described glass substrate for a reflective mirror is preferably such that a maximum value of the viewability index value γ is 0.1 (/m2) or less, and an integral value of the viewability index value γ is 10.0 (/m3) or less.
In the first aspect of the present invention, it is preferable in the above described glass substrate for a reflective mirror, the maximum value of the viewability index value γ is 0.06 (/m2) or less, and an integral value of the viewability index value γ is 6.0 (/m3) or less.
In order to attain the above described object, according to a second aspect of the present invention, there is provided a reflective mirror including the above described glass substrate for a reflective mirror.
In order to attain the above described object, according to a third aspect of the present invention, there is provided a glass substrate for a liquid crystal panel, wherein a plate thickness is 0.2 to 1.1 mm (±0.1 mm), and in a measurement condition of a cut-off value of 0.8 to 8 mm, a viewability index value γ expressed by the following formula (1) in a range of spatial frequencies of 2 to 500/mm by spectral analysis of a filtered waviness curve is 0.0004 (/m2) or less, or the viewability index value γ is 5.0×10−9/D3 (/m2) or less.
γ=A/D3 (1)
(where A represents an amplitude (m) of the filtered waviness curve of the glass substrate, and D represents a period (m) of the filtered waviness curve of the glass substrate).
In the third aspect of the present invention, the above described glass substrate for a liquid crystal panel is preferably manufactured by a float process.
In the third aspect of the present invention, it is preferable that in the above described glass substrate for a liquid crystal panel, when the period of the filtered waviness curve is not less than 2 mm and less than 8 mm, another index value ε expressed by the following formula (2) is 3.5×10−7 or less.
ε=A/D (2)
In order to attain the above described object, according to a fourth aspect of the present invention, there is provided a liquid crystal panel including two glass substrates opposed to each other, a liquid crystal layer interposed between the two glass substrates, and spacers disposed to abut on each of opposed surfaces of the two glass substrates, wherein the glass substrate is the above described glass substrate for a liquid crystal panel.
Hereinafter, a glass substrate for a reflective mirror and a reflective mirror including the same according to an embodiment of the present invention will be described in detail with reference to the drawings.
In
The microscopic irregularity existing on the surface of the glass substrate 1 is approximated by the sin curve as shown in
Further, when the required image quality of the rear projection television (RPTV) is considered, it is desirable that the maximum amplitude of the filtered waviness curve is 0.1 μm or less under the measurement condition of the cut-off value of 0.8 to 8 mm (the maximum amplitude of the filtered waviness curve is 0.5 μm or less under the measurement condition of the cut-off value of 0.8 to 25 mm). The cut-off value is defined by the JIS B 0601, and the filtered waviness curve is defined by the JIS B 0651.
In
C=((Max+Average)−(Min+Average))/((Max+Average)+(Min+Average))=(Max−Min)/(Max+Min+2×Average) (3)
From
From
From
Next, viewability φ of the light and dark pattern in the range of the spatial frequency of 2 to 500/mm is proportional to the contrast C (illuminance unevenness), and is inversely proportional to the period (λ) of illuminance. More specifically, the viewability φ is obviously proportional to C/λ, and therefore, the viewability φ is considered to be proportional to a viewability index value γ (=A/D3).
From
From
Thus, the viewability φ (=C/λ) is proportional to the viewability index value γ (=A/D3), and therefore, by making the viewability index value γ (=A/D3) small, the viewability φ (=C/λ) can be made small, whereby the light and dark pattern can be made difficult to see.
Hereinafter, examples of the present invention will be described by using
Check of the reflectivities in the respective wavelengths (450 nm, 550 nm, 650 nm) and reflected images (observation of the reflected image (white display) of the rear projection television (RPTV) of 55 inches from the position of 1.5 m away) was performed for the glass substrate with the maximum value of the viewability index value γ (=A/D3) in measurement of the cut-off value of 0.8 to 8 mm being 0.02 or less (0.02), the integral value being 2.0 or less (1.93), and the reflection enhancing film constituted of aluminum (Al) being formed on one surface of the float glass plate by a sputtering method. Reflected image check was performed for the glasses with and without draw line control being carried out at the time of being manufactured by a float process.
In
As a result, the reflectivities in the respective wavelengths (450 nm, 550 nm, 650 nm) were 96%, 94% and 91%. As for the reflected image check, the glass substrate with the draw line control being carried out was beyond the good item reference level though a light and dark pattern was recognized, whereas the glass substrate with the draw line control being carried out did not reach the good item reference level with a light and dark pattern being recognized.
Check of the reflectivities in the respective wavelengths (450 nm, 550 nm, 650 nm) and the reflected images (observation of a reflected image (white display) of the rear projection television (RPTV) of 55 inches from the position of 1.5 m away) was performed for the glass substrate with the maximum value of the viewability index value γ (=A/D3) in measurement of the cut-off value of 0.8 to 8 mm being 0.01 or less (0.008), the integral value being 1.0 or less (0.82), and a reflection enhancing film constituted of aluminum (Al) being formed on one surface of the float glass plate by the sputtering method. Reflected image check was performed for the glass substrates with and without draw line control being carried out at the time of being manufactured by the float process.
As a result, the reflectivities in the respective wavelengths (450 nm, 550 nm, 650 nm) were 96%, 94% and 91%. As for the reflected image check, the glass substrates were completely beyond the good item reference level with no bright-dark pattern being recognized irrespective of applying or not the draw line control.
Check of the reflectivities in the respective wavelengths (450 nm, 550 nm, 650 nm) and reflected images (observation of the reflected image (white display) of the rear projection television (RPTV) of 55 inches from the position of 1.5 m away) was performed for the glass substrate with the maximum value of the viewability index value γ (=A/D3) in the measurement of the cut-off value of 0.8 to 8 mm being 0.006 or less (0.006), the integral value being 0.6 or less (0.48), and a reflection enhancing film constituted of aluminum (Al) being formed on one surface of the float glass plate by the sputtering method. Reflected image check was carried out for the glass substrates with and without draw line control being carried out at the time of being manufactured by the float process.
As a result, the reflectivities in the respective wavelengths (450 nm, 550 nm, 650 nm) were 96%, 94% and 91%. As for the reflected image check, the glass substrates were completely beyond the good item reference level with no light and dark pattern being recognized irrespective of applying or not the draw line control.
Next, a liquid crystal panel according to another embodiment of the present invention will be described in detail with reference to the drawings.
In
In the liquid crystal panel 30, crests and valleys occur to the glass substrate 31 due to the manufacturing process (float process) of the glass substrate 31, and therefore, the spacers 33a which abut on the glass substrate 31 and the spacers 33b which do not abut on the glass substrate 31 exist. More specifically, when the difference in height of the crest and valley is set as the amplitude A, and the length of one period from a certain valley to the adjacent valley is set as the period D, if the valleys at both ends of the period D abut on the two spacers 33a, the spacer 33b disposed in the portion corresponding to the crest existing between the valleys at both the ends is disposed at the position away from the glass substrate 31 by the amplitude A from the glass substrate 31.
However, in reality, the liquid crystal layer 34 is injected between the glass substrates 31 and 32, and the liquid crystal layer 34 has surface tension. Therefore, the glass substrate 31 is attracted to the liquid crystal layer 34 by the surface tension, and the amplitude A is corrected. Thus, the distance between the spacer 33b and the glass substrate 31 is assumed to be ΔA in reality.
Thus, the present inventors assumed the glass substrate 31 between the adjacent spacers 33a as a beam and applied the following dynamic model for the abovementioned phenomenon.
In
I=t3×W/12 (4)
further, when the geometrical moment of inertia I is used, bending δ is expressed by the following formula (5).
δ=F×D3/(4×E×I) (5)
(where E is Young's modulus.)
By the above described formulae (4) and (5), the bending δ is as shown in the following formula (6).
Δ=F×D3/(4×E×W×t3) (6)
When the dynamic model of
Further, from the above described formula (6), the bending δ is proportional to the cube of the period D, and therefore, the relationship of the abovementioned viewability index value γ (=A/D3) and the wave correction index value A/δ is expressed by the following formula (7),
A/δ∝A/D3=γ (7)
the wave correction index value A/δ is proportional to the viewability index value γ. More specifically, it is conceivable that the wave correction index value A/δ can be expressed by using the viewability index value γ in the substitution way.
Incidentally, the wave of the glass substrate 31 is generally corrected more easily, as the attraction amount (bending δ) of the glass substrate 31 by the surface tension is larger, or the amplitude A is smaller. When this is applied to the correction index value A/δ, the wave of the glass substrate 31 is corrected more easily as the wave correction index value A/δ is smaller. Meanwhile, the wave correction index value A/δ is proportional to the viewability index value γ, and therefore, the wave of the glass substrate 31 is corrected more easily as the viewability index value γ is smaller. As a result, color unevenness due to waviness is suppressed.
Here, the present inventers produced a plurality of glass substrates which have crests and valleys (have wave) and differ in the amplitude A from one another by the float process with draw line control. The present inventers produced a plurality of liquid crystal panels by using the plurality of glass substrates 31, and observed color unevenness of each of the liquid crystal panels. Through the observation, the present inventers has found out that in the liquid crystal panel using the glass substrate 31 of a plate thickness of 0.2 to 1.1 mm (±0.1 mm), the amplitude A of 9.8×10−9 m, and the period D of 2.93×10−2 m, color unevenness is not observed. This is considered to be because the wave of the glass substrate 31 has been corrected by the surface tension of the liquid crystal layer 34. When the amplitude A and the period D at this time are substituted into the above described formula (1), the viewability index value γ in a range of spatial frequencies 2 to 500 by the spectral analysis of the filtered waviness curve in the measurement condition of the cut-off value of 0.8 to 8 mm is the value shown by the following formula (8).
γ=A/D3=9.8×10−9/(2.93×10−2)≈0.0004 (8)
From the above, it is found out that when at least the viewability index value γ is 0.0004 or less, the wave of the glass substrate 31 is corrected by the surface tension of the liquid crystal layer 34 to suppress color unevenness, and the color unevenness is not observed.
Further, the viewability index value γ is inversely proportional to the cube of the period D, and therefore, the larger the period D, more easily the wave of the glass substrate 31 is corrected. Here, in the condition in which the abovementioned color unevenness is not observed, the period D is 2.93×10−2 m, and therefore, it has been inferred that when at least the period D is 3.0×10−2 m or more, color unevenness is suppressed.
Further, from the observation of color unevenness of each of the liquid crystal panels, the present inventers has obtained the knowledge that when the amplitude A is 5.0×10−9 or less in the glass substrate 31, color unevenness is not observed in the liquid crystal panel substantially irrespective of the period D.
In the discussion based on the abovementioned dynamic model, the smaller the period D, the larger the viewability index value γ, the wave of the glass substrate 31 is more difficult to correct, and color unevenness is more easily observed. Accordingly, it is difficult to explain the above described knowledge based on the dynamic model. Therefore, the present inventers paid attention to the fact that human brightness/darkness (contrast) recognition depends on the spatial frequency, and has inferred the following hypothesis by analogy.
More specifically, as shown in the graph of
Further, when it is expressed by using the above described formula (1) that the amplitude A is 5.0×10−9 m or less, it is equivalent to the range of the viewability index value γ expressed by the following formula (9).
γ=A/D3≦5.0×10−9/D3 (9)
(where unit of D is m).
From the above, it is inferred that when the amplitude A is 5.0×10−9 m or less, that is, when the viewability index value γ is 5.0×10−9/D3 (/m2) or less, due to the synergistic effect consisting of the smallness of the original amplitude making color unevenness difficult to observe and that the reduction in the relative sensitivity of the human brightness/darkness recognition in the spatial frequencies except for a certain specific spatial frequency, color unevenness is not observed in the liquid crystal panel with any period D.
From the above, it has been inferred that color unevenness is not observed in the liquid crystal panel when the viewability index value γ in a range of spatial frequencies 2 to 500/mm by the spectral analysis of the filtered waviness curve is 0.0004 or less, or the viewability index value γ is 5.0×10−9/D3 (/m2) or less in the measurement condition of at least the cut-off value of 0.8 to 8 mm in the liquid crystal panel including the glass substrate 31 of a plate thickness of 0.2 to 1.1 mm (±0.1 mm). When the relationship of them is shown in the graph, the graph in
In the graph of
Here, when the liquid crystal panels were produced by using each sample and the observation of color unevenness was performed in the liquid crystal panels, color unevenness was observed in samples 1, whereas color unevenness was not observed in samples 2. In the graph of
From the observation result of color unevenness of samples 1 and 2 and data (the period D, the viewability index value γ), through the graph of
The abovementioned samples 2 were produced by the float process, but the glass substrate for the liquid crystal panel according to the present embodiment may be the glass substrate produced by the float process with polishing being applied more or less as long as the glass substrate satisfies the abovementioned conditions (in the measurement condition of the cut-off value of 0.8 to 8 mm, the viewability index value γ in a range of spatial frequencies 2 to 500/mm by the spectral analysis of the filtered waviness curve is 0.0004 or less, or the viewability index value γ is 5.0×10−9/D3 (/m2) or less), and as the amount of the polishing, 5 μm or less is proper from the aspect of productivity (reduction in the number of manufacturing process steps, reduction in quality control process steps).
Further, the present inventers studied another index value ε defined by A/D as another index value concerning the observation limit of color unevenness.
In the graph of
From the above, it has been found out that when the other index value ε is 3.5×10−7 or less in the range of the period D of 8 to 20 mm, color unevenness is not observed.
According to the first aspect of the present invention, in the measurement condition of the cut-off value of 0.8 to 8 mm, the maximum value of the viewability index value γ for each spectral of each spatial frequency is 0.02 (/m2) or less, and the integral value is 2.0 (/m3) or less. Therefore, the display quality for a light and dark pattern can be improved.
According to the first aspect of the present invention, in the measurement condition of the cut-off value of 0.8 to 8 mm, the maximum value of the viewability index value γ for each spectral of each spatial frequency is 0.01 (/m2) or less, and the integral value is 1.0 (/m3) or less, which exceeds the good item reference level of the unevenness of the reflective mirror. Thus, total inspection by visual observation can be made unnecessary.
According to the first aspect of the present invention, in the measurement condition of the cut-off value of 0.8 to 8 mm, the maximum value of the viewability index value γ for each spectral at each spatial frequency is 0.006 (/m2) or less, and the integral value is 0.6 (/m3) or less, which exceed the good item reference level for the unevenness of the reflective mirror. Thus, cost can be reduced by increase in the degree of freedom of cutting work.
According to the first aspect of the present invention, in the measurement condition of the cut-off value of 0.8 to 25 mm, the maximum value of the viewability index value γ for each spectral at each spatial frequency is 0.2 (/m2) or less, and the integral value is 20.0 (/m3) or less. Therefore, the display quality for a light and dark pattern can be improved.
According to the first aspect of the present invention, in the measurement condition of the cut-off value of 0.8 to 25 mm, the maximum value of the viewability index value γ at each spectral at each spatial frequency is 0.1 (/m2) or less, and the integral value is 10.0 (/m3) or less, which exceed the good item reference level of the reflective mirror. Therefore, total inspection by visual observation can be made unnecessary.
According to the first aspect of the present invention, in the measurement condition of the cut-off value of 0.8 to 25 mm, the maximum value of the viewability index value γ at each spectral at each spatial frequency is 0.06 (/m2) or less, and the integral value is 6.0 (/m3) or less, which is far beyond the good item reference level of the unevenness of the reflection mirror, and cost can be reduced by increase in the degree of freedom of cutting work.
According to the third aspect of the present invention, the glass substrate for a liquid crystal panel has the viewability index value γ of 0.0004 (/m2) or less, or the viewability index value γ of 5.0×10−9/D3 (/m2) or less in the measurement condition of the cut-off value of 0.8 to 8 mm, and therefore, display quality for color unevenness can be improved.
According to the third aspect of the present invention, the glass substrate for a liquid crystal panel is manufactured by a float process. Therefore, the number of manufacture process steps and quality control steps can be reduced, and thereby, cost can be reduced.
According to the third aspect of the present invention, when the period of the filtered waviness curve of the glass substrate for a liquid crystal panel is not less than 2 mm and less than 8 mm, the other index value ε is 3.5×10−7 or less. Therefore, display quality for color unevenness can be reliably improved.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2006-182616 | Jun 2006 | JP | national |
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/JP2007/063522 | 6/29/2007 | WO | 00 | 2/12/2009 |
| Publishing Document | Publishing Date | Country | Kind |
|---|---|---|---|
| WO2008/001954 | 1/3/2008 | WO | A |
| Number | Name | Date | Kind |
|---|---|---|---|
| 20010004283 | Akimoto et al. | Jun 2001 | A1 |
| Number | Date | Country |
|---|---|---|
| 2001-235798 | Aug 2001 | JP |
| 2006-137631 | Jun 2006 | JP |
| 2006-267883 | Oct 2006 | JP |
| Number | Date | Country | |
|---|---|---|---|
| 20090323008 A1 | Dec 2009 | US |
