| Syassen et al, "Microoptic Double Beam System for Reflectance and Absorption Measurements at High Pressure", Rev. of Sci. Instruments, 5-1982, pp. 644-650. |
| Gupta, D. C., "Non-Destructive Determination of Carrier Concentration in Epitaxial Silicon Using a Total Internal Reflection Technique", Solid State Electronics, vol. 13, #5, 1970, pp. 543-552. |
| Burch, C. R., "Reflecting Microscopes", Proc. Physical Soc. (London), vol. 59, 1947, pp. 541-549. |
| Hartmann, H. S., "High-Temperature Microscopy", Glass Industry, 3-1970, pp. 116-117. |
| BIO-RAD, Digilab Division, The New Digilab Micro/IR40 Spectrometer. |
| Digilab Micro/FT-IR Users Newsletter, vol. 2, No. 1, Jan. 1986. |