Number | Name | Date | Kind |
---|---|---|---|
1016369 | Siedentopf | Feb 1912 | |
1613583 | Berek | Jan 1927 | |
2097494 | Lihotzky | Nov 1937 | |
2198014 | Ott | Apr 1940 | |
3055259 | Dietrich | Sep 1962 | |
3602596 | Astheimer | Aug 1971 | |
3718396 | Hennings | Feb 1973 | |
3719421 | Poilleux | Mar 1973 | |
3827059 | Rambauske | Jul 1974 | |
3843227 | Kato et al. | Oct 1974 | |
4358202 | Puffer et al. | Nov 1982 | |
4477185 | Berger et al. | Oct 1984 | |
4479700 | Abe | Oct 1984 | |
4558949 | Uehara et al. | Dec 1985 | |
4594509 | Simon et al. | Jun 1986 | |
4653880 | Sting et al. | Mar 1987 | |
4655592 | Allemand | Apr 1987 | |
4657360 | Izukawa et al. | Apr 1987 |
Number | Date | Country |
---|---|---|
0144869 | EPX | |
2333181 | Jan 1974 | DEX |
2173436 | Oct 1973 | FRX |
983455 | Dec 1982 | SUX |
Entry |
---|
Syassen et al, "Microoptic Double Beam System for Reflectance and Absorption Measurements at High Pressure", Rev. of Sci. Instruments, 5-1982, pp. 644-650. |
Gupta, D. C., "Non-Destructive Determination of Carrier Concentration in Epitaxial Silicon Using a Total Internal Reflection Technique", Solid State Electronics, vol. 13, #5, 1970, pp. 543-552. |
Burch, C. R., "Reflecting Microscopes", Proc. Physical Soc. (London), vol. 59, 1947, pp. 541-549. |
Hartmann, H. S., "High-Temperature Microscopy", Glass Industry, 3-1970, pp. 116-117. |
BIO-RAD, Digilab Division, The New Digilab Micro/IR40 Spectrometer. |
Digilab Micro/FT-IR Users Newsletter, vol. 2, No. 1, Jan. 1986. |