Claims
- 1. In an electronic measurement instrument, a method for estimating a trace of second measurements related to the derivative of a trace of first measurements of an electrical property of a network, the method comprising:
- obtaining a plurality of uniformly spaced samples of a first measurement to form the first trace; and
- performing a least mean squares fit to samples in the first trace within each of a plurality of apertures to determine a plurality of estimates of a second measurement for forming the second trace.
- 2. The method of claim 1 further comprising multiplying the second trace by a constant multiplier to form a trace of estimates of the second measurement.
- 3. The method of claim 2 wherein the first measurements are the phase response of a network sampled at uniformly spaced frequencies and the second measurements are the group delay of the network at various frequencies.
- 4. The method of claim 1 wherein the first measurements are the phase of a signal sampled at uniformly spaced sample times and the second measurements are the instantaneous frequency of the signal at various times.
- 5. The method of claim 1 comprising:
- determining a first estimate in the second trace by performing a least mean square error fit to samples of the first trace within a first aperture;
- determining each subsequent estimate in the second trace by determining a value which, when added to a previous estimate adjacent the subsequent estimate, provides a least mean square error fit to samples of the first trace within a subsequent aperture of the plurality of apertures, and adding the value to the previous estimate to form the subsequent estimate.
- 6. An electronic measurement instrument comprising:
- a reference receiver connectable to an input of a network to receive a stimulus signal;
- a response receiver connectable to an output of the network to receive a network output signal produced by the network in response to the stimulus signal;
- means for measuring the phase response of the network at uniform intervals of frequency; and
- means for performing a least mean squared error analysis on a number of phase response measurements made at frequencies within each of a plurality of apertures to estimate a group delay trace of the network at a plurality of selected frequencies.
- 7. The instrument of claim 6 wherein the means for measuring the phase response of the network is a phase response processor for determining an array of phase response data measured at uniform frequency intervals from samples of the stimulus signal and the network output signal.
- 8. The instrument of claim 7 wherein the means for performing the least mean square error analysis is a group delay processor for performing the least mean squared error analysis on subsets of the array to yield estimates of the group delay of the network at a plurality of selected frequencies.
- 9. The instrument of claim 6 wherein the means for measuring the phase response and the means for performing the least mean square error analysis are embodied in a single processor.
- 10. The instrument of claim 6 wherein the phase response measurements are measurements of the cumulative phase response of the network.
- 11. The instrument of claim 6 wherein the phase response measurements are measurements of the difference in phase response of the network between two adjacent frequencies.
- 12. The method of claim 3 comprising:
- determining a first estimate in the second trace by performing a least mean square error fit to samples of the first trace within a first aperture;
- determining each subsequent estimate in the second trace by determining a value which, when added to a previous estimate adjacent the subsequent estimate, provides a least mean square error fit to samples of the first trace within a subsequent aperture of the plurality of apertures, and adding the value to the previous estimate to form the subsequent estimate.
- 13. The method of claim 3 further comprising multiplying the second trace by a constant multiplier to form a trace of estimates of the second measurement.
- 14. The method of claim 4 comprising:
- determining a first estimate in the second trace by performing a least mean square error fit to samples of the first trace within a first aperture;
- determining each subsequent estimate in the second trace by determining a value which, when added to a previous estimate adjacent the subsequent estimate, provides a least mean square error fit to samples of the first trace within a subsequent aperture of the plurality of apertures, and adding the value to the previous estimate to form the subsequent estimate.
- 15. The method of claim 4 further comprising multiplying the second trace by a constant multiplier to form a trace of estimates of the second measurement.
- 16. In an electronic measurement instrument, a method for estimating a trace of second measurements related to the derivative of a trace of first measurements of an electrical property of a network, the method comprising:
- obtaining a plurality of uniformly spaced samples of a first measurement to form the first trace; and
- performing a least mean squares fit of a linear function to samples in the first trace within each of a plurality of apertures, wherein at least two of the apertures have more than one of the samples in common; and
- determining a plurality of estimates of a second measurement centered in the apertures to form the second trace.
- 17. The method of claim 16 further comprising multiplying the second trace by a constant multiplier to form a trace of estimates of the second measurement.
- 18. The method of claim 16 wherein the first measurements are the phase response of a network sampled at uniformly spaced frequencies and the second measurements are the group delay of the network at various frequencies.
- 19. The method of claim 16 wherein the first measurements are the phase of a signal sampled at uniformly spaced times and the second measurements are the instantaneous frequency of the signal at various times.
- 20. The method of claim 16 comprising:
- determining a first estimate in the second trace by performing a least mean square error fit to samples of the first trace within a first aperture;
- determining each subsequent estimate in the second trace by determining a value which, when added to a previous estimate adjacent the subsequent estimate, provides a least mean square error fit to samples of the first trace within a subsequent aperture of the plurality of apertures, and adding the value to the previous estimate to form the subsequent estimate.
Parent Case Info
this is a divisional of application Ser. No. 08/013,882 filed on Feb. 5, 1993, now U.S. Pat. No. 5,399,976.
US Referenced Citations (4)
Divisions (1)
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Number |
Date |
Country |
Parent |
013882 |
Feb 1993 |
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