The present invention relates generally to a fixture or carrier for securing and testing an electrical or optical device. In a specific example, the present invention relates to a fixture for securing and testing a hard drive.
A fixture or carrier is typically used in testing computer hard drives. The hard drives are generally subjected to a “burn-in” testing procedure and to thermal testing or environmental conditioning testing during the design and prototyping phases of the manufacturing process. The fixture or carrier is typically used to hold the drive while it undergoes the burn-in or final verification testing procedures. In addition, the fixture or carrier holding the drive may be placed in an environmentally-controlled test chamber for the testing procedures. These chambers are designed to expose the device under test to controlled temperature and humidity levels so that the drive manufacturer can obtain accurate performance test results over expected environmental ranges in which the devices are designed to operate. The tests can provide a valuable tool to verify product quality and reliability and to assure that the hard drives meet industry standards.
The present invention, in one embodiment, is a test fixture. The test fixture has a top component, a first rail and a second rail coupled to the top component, a connection component coupled to the first and second rails, and an insert component configured to be removably insertable into the test fixture.
The present invention, in another embodiment, is a test fixture. The test fixture has a first rail and a second rail, a connection component, and a first and second retention component. The first rail has a first receiving component and the second rail has a second receiving component. The connection component is removably coupleable with first and second receiving components. Further, the first and a second retention components are removably coupleable with the first and second receiving components, respectively, whereby the connection component is retainable in coupled connection with the first and second rails.
In a further embodiment, the present invention is a test pan. The test pan has a computer component coupled to the pan, a connector operably coupled to the computer component, and an interface controller component removeably coupled to the pan, wherein the interface controller component is operably and removably coupled to the connector.
The present invention, in yet another embodiment, is a method of testing a device. The method includes inserting an insert component into a fixture, inserting the device into the fixture; performing at least one test on the device; and removing the device from the test fixture. The fixture has a top component, a first rail and a second rail coupled to the top component, and a connection component coupled to the first and second rails.
While multiple embodiments are disclosed, still other embodiments of the present invention will become apparent to those skilled in the art from the following detailed description, which shows and describes illustrative embodiments of the invention. As will be realized, the invention is capable of modifications in various obvious aspects, all without departing from the spirit and scope of the present invention. Accordingly, the drawings and detailed description are to be regarded as illustrative in nature and not restrictive.
The present invention relates to a test fixture configured to be adjustable to receive any one of several different kinds of 2.5 inch hard drives. Further, the present invention according to another embodiment is a stackable test fixture, such that two or more test fixtures can be stacked on top of each other, wherein two such stacked test fixtures occupy the same volume as one 3.5 inch hard drive test fixture. In addition, the present invention relates to a test fixture that is configured to receive 2.5 inch hard drives and is further configured to be used in test chambers designed to receive 3.5 inch hard drive test fixtures. The present invention can also be configured to receive 1.0 inch or 1.8 inch hard drives.
According to one embodiment, the test fixture 10 is configured to receive an insert component 12. According to one embodiment, the insert component 12 allows for the variable compatibility of the test fixture 10 with several types of 2.5 inch hard drives. That is, the type of 2.5 inch hard drive that can be received by the test fixture 10 is determined, according to one embodiment, by the disposition of the insert component 12 within the fixture 10.
According to one embodiment, the insert component 12 can be inserted into the test fixture 10 as shown by the arrow in its depicted disposition. Alternatively, the insert component 12 can be inverted and inserted into the test fixture 10. Further, the test fixture 10 in one aspect of the present invention is configured to receive the insert component 12 such that the insert component 12 can be disposed within the test fixture 10 in at least two different locations.
In use, a device to be tested can be inserted through the opening of the fixture 10 above the ejection handle 32 and into the testing area. According to one embodiment where the device is a hard disk drive, the fixture 10 is configured to allow for the drive to be positioned during insertion such that it can interface with the connection component 30 for testing purposes. According to a further embodiment, the fixture 10 is configured to also allow for the drive to be positioned in relation to the insert 12, which is appropriately positioned in the fixture 10 as described further herein to accommodate the drive. Alternatively, there is no insert 12 in the fixture 10. In a further alternative, the fixture 10 of the present invention is used to test other devices. In accordance with one aspect of the invention, the fixture 10 of the present invention containing a device to be tested is functional in either a horizontal or a vertical position.
The top component 18, in accordance with one aspect of the present invention, provides substantial rigidity and stability to the fixture 10, which can contribute to vibration dampening. According to one embodiment, the top plate 18 is disposed on spacer components (also referred to herein as “spacers”) 20 disposed above the rails 14 and fastened to the spacers 20 and rails 14 by fastening components 22 that, according to one embodiment, are screws. According to one alternative embodiment, the top plate 18 has a baffle component 38 configured to block air flow if the fixture 10 is placed in a test chamber. In an alternative aspect of the invention, the top component 18 has a protruding component or “finger” 33 that is configured to assist with retaining the connection component 30. In a further alternative, the top plate 18 has a tab 40 that, according to one embodiment, has an indicator 42 that, in one embodiment, is an LED indicator 42. The indicator 42 is configured to provide information. According to one embodiment, the indicator 42 could provide test status information, such as whether the test is complete, failed, busy, in progress, etc. Further, the indicator 42, according to an alternative aspect of the invention, could provide any relevant information.
According to one embodiment, the top component 18 is made of a non-magnetic stainless steel. Alternatively, the top component 18 is made of any known non-magnetic material that can provide substantial rigidity and stability to the fixture 10. In a further alternative, the top component 18 is configured in any structural configuration known to provide rigidity and stability, which can thereby contribute to vibration dampening.
Each spacer component 20 also has a top receiving portion 54a and a bottom receiving portion 54b. The top and bottom receiving portions 54a, 54b are configured to receive and position the insert component 12. The rail 14 also defines four recesses 25 configured to receive either positioning or pressure rollers 24, 26. Each recess has a top roller receiving component 56a configured to receive and position the roller. The rail 14 also has connection component slots 28 configured to assist with positioning and retaining the connection component 30. The rail 14 has a hole 58 configured to receive the fastening component 36 as shown in
According to one embodiment, each rail 14 is configured identically such that each one is universally interchangeable with any other. Alternatively, each rail 14 is not identical.
Each rail 14 and rail receiving component 16, according to one embodiment, is made of a lubricative, injection-molded, electrically dissipative and vibration-damping composite material. For example, according to one embodiment, each rail 14 is made of RTP387 TFE 10, which is a carbon fiber filled polytetrafluoroethylene polycarbonate manufactured by RTP Company in Winona, Minn. Alternatively, each rail 14 and rail receiving component 16 is made of any known material having suitable electrical dissipation and vibration damping characteristics for hard drive testing.
According to one embodiment, the rollers 24, 26 as shown in
According to one embodiment, the rollers 24, 26 protrude somewhat from each rail 14 into the test area of the fixture 10. The positioning rollers 24, in accordance with one aspect of the invention, protrude from about 10 mils to about 30 mils from the rail 14. In a further embodiment, the pressure rollers 26 protrude from about 50 mils to about 100 mils from the rail 14. Alternatively, the rollers 24, 26 can be spring biased.
According to one embodiment, the top and bottom roller receiving components 56a, 56b, as shown, for example, in
According to one embodiment in which the device under test is a hard drive, the rollers 24, 26 are configured to contact the hard drive only at the mounting screw locations on the hard drive. Given that 2.5 inch hard drives typically have only two mounting screw locations on each side, only two rollers 24, 26 need be disposed within each of the rails 14 in such an embodiment. That is, only two positioning rollers 24 are needed in one rail 14, and only two pressure rollers 26 are needed in the other rail 14. Further, the location of the rollers 24, 26 in the rails 14 according to this embodiment are determined by the location of the mounting screw locations. As such, the positioning rollers 24 may be disposed within the two inner recesses 25 or the two outer recesses 25 of the rail 14, depending on the mounting screw locations. Similarly, the pressure rollers 26 may be disposed within the two inner recesses 25 or the two outer recesses 25 of the rail 14, depending on the mounting screw locations. Alternatively, the rollers 24, 26 are positioned in any fashion that allows the rollers 24, 26 to receive and position the device to be tested in the fixture 10.
In accordance with one aspect of the invention, the positioning rollers 24 are hard and the pressure rollers 26 are soft. That is, each positioning roller 24 is fabricated of an acetal copolymer or an equivalent polymer with similar dissipative and hardness characteristics. For example, according to one embodiment, the rollers 24 are fabricated of Pomalux SD-A®, which is available from Westlake Plastics Co. in Lenni, Pa. Alternatively, each positioning roller 24 is made up of any known hard material. In a further alternative, each positioning roller 24 is made up of any known material used for rollers in test fixtures.
The connection component 30 (also referred to as an “interposer”) as best shown in
The insert 12 is configured to be inserted into the fixture 10 in several different positions, thereby allowing for different types or thicknesses of 2.5 inch hard drives to be inserted into the fixture 10. According to one embodiment, the insert 12 can be inserted as depicted in
In use, the insert 12 is inserted into the testing area of the fixture 10 with the appropriate projections facing in the desired direction and the tabs 86 positioned in the fixture 10 as desired. As the insert 12 is inserted into the fixture 10, the catch 92 on each side of the insert 12 is moved past the spacers 20 closest to the connection component 30. As they move past the spacers 20, the catches 92 make contact with the spacers 20 and are pushed inward by the spacers 20 such that when they move to the back of the spacers 20 (toward the connection component 30), the catches 92 spring outward to their untensioned positions. In this position, the tabs 86 contact the spacers 20 as described above. As a result, the release retention components 88 provide a retention function that maintains the position of the insert 12 in the fixture 10 but can be overcome by lightly pulling on the handle 84 of the insert 12 in a direction away from the connection component 30.
According to one embodiment, each variation in the disposition of the projections 80, 82 and in the position of the insert 12 within the fixture 10 provides for accommodating a different type of hard drive. For example, in accordance with one aspect of the invention in which the projections 80 are larger than the projections 82, if the insert 12 is inserted with the upper projections 80 facing upward and the insert 12 positioned such that the tabs 86 are positioned in contact with the top receiving portions 54a of the spacers 20, the fixture 10 can, according to one embodiment, accommodate a 15 mm thick hard drive. If the same insert 12 is inserted with the upper projections 80 facing upward and the insert 12 positioned such that the tabs 86 are positioned in contact with the bottom receiving portions 54b of the spacers 20, the fixture 10 can accommodate a 9.5 mm thick hard drive. In one embodiment using the same insert 12, if the insert 12 is inserted with the upper projections 80 facing downward and the insert 12 positioned such that the tabs 86 are positioned in contact with the top receiving portions 54a of the spacers 20, the fixture 10 can accommodate a 12.5 mm thick hard drive. In a further embodiment, if the same insert 12 is inserted with the upper projections 80 facing downward and the insert 12 positioned such that the tabs 86 are positioned in contact with the bottom receiving portions 54b of the spacers 20, the fixture can accommodate a 7 mm thick hard drive. Alternatively, if no insert 12 is placed in the fixture 10, the fixture can accommodate a 17 mm thick hard drive.
According to one alternative embodiment, the ejection component 31 as best depicted in
In operation, a device under test in the fixture 10 is removed by a user pulling on the handle 32. The movement of the handle 32 away from the fixture 10 causes the rods 34 and the ejection bumpers 35 to move in the same direction, thereby contacting the device in the fixture 10 and urging the device out of the fixture 10. According to one embodiment, the configuration of the ejection component 31 with two bumpers 35 allows for even pressure on the device being ejected by the ejection bumpers 35, thereby assuring that the device will be ejected out of the fixture 10 without contacting portions of the fixture 10 and causing damage to the device. Because the ejection component 31 has no return mechanism, the component 31 remains in an extended or “ejected” position wherein the handle 32 is at its most extended position away from the fixture 10. In this position, the handle 32 can act as a guide component for a new device to be tested. That is, the handle 32 and rods 34 extending out from the fixture 10 can be used to position or support and direct the device into the appropriate disposition as it is inserted into the fixture 10. In this embodiment, the handle 32 is then urged back toward the fixture 10 as the device to be tested is urged into the fixture 10.
According to one embodiment of the present invention, the test fixture 10 and base component 100 of the present invention can be mounted to area A of the pan 110. The fixture 10 and base component 100 are mounted to the pan 110 by fastening components (not shown) inserted through holes 104 in the base component 100 and into holes (not shown) in the pan 110. Alternatively, the base component 100 is connected to the pan 110 by any known fastening means.
According to one embodiment, if the fixture 10 is placed on a pan 110 configured for receiving 3.5 inch hard drive test fixtures, the baffle 38 on the top component 18 as best shown in
In an alternative embodiment, the present invention is a test pan and a fixture allowing for fast and simple replacement of various components.
The computer component 122 is a known component configured to control the testing of the device, such as a hard drive, being tested, and according to one embodiment is a single board computer (“SBC”). The computer component 122, according to one embodiment, is disposed on the pan 120 by four support components 132 and fastened to the support components 132 and pan 120 by fastening components 134.
The interface controller component 124 is a known component configured to receive instructions from the computer component 122 via the connector 126, translate the instructions and transmit the instructions via the cable connector 128 and the connection component 30 to the hard drive being tested. According to one embodiment, the interface controller component 124 is an interface controller board. In one example, the interface controller board is an industry standard hard drive interface such as SCSI, SATA-1, SATA-2, SATA-3, SAS, U320, USB, or FCAL interface, or any other known interface. According to one embodiment, the interface controller component 124 is slideably and removably disposed on the pan 120 in slots 136 that are connected to support components 138.
According to one embodiment, the connector 126 is a known high speed connector. In one example, the connector 126 is a standard PCI-Express.
The power component 130, according to one embodiment, is configured to supply electrical power to the hard drive under test via the cable connector 128. According to one embodiment, the power component 130 is a margin or voltage component 130 and may also be referred to herein as a “power card” or “margin card.” The power component 130, in one aspect of the invention, is disposed above the interface controller component 124 on top of the support components 138 and attached to the support components 138 by the fastening components 140.
The pan 120 is configured to allow for quick and easy removal and replacement of various components. According to one embodiment, the interface controller component 124 and associated cables and connectors can be quickly and easily removed from the pan 120 and replaced. For example, the interface controller component 124 can be removed and replaced in the following fashion, according to one embodiment of the present invention. First, the pan 120 is removed from the test chamber. Then the insulating brick wall (not shown) of the pan 120 (equivalent to the brick wall shown in area A of
The present invention, according to an alternative embodiment, includes a test fixture configured to allow for quick and easy connection component 30 removal and replacement. That is, the connection component 30 can be easily removed from the fixture 10 and disconnected from the cable connector 128.
Alternatively, the interface controller component 124 and the connection component 30 at the test fixture 10 are both quickly and easily removed and replaced. In this embodiment, the interface controller component 124 is unique to the connection component 30 such that if the connection component 30 is removed and replaced, the interface controller component 124 must be replaced with an interface controller component 124 compatible with the new connection component 30.
In a further alternative, the interface component 124, the connector 128, the cable 151, and the connection component 30 are removed and replaced as a unit. In yet another alternative, any of these components, including the computer component 122, the power component 130, or any other known associated components, can be individually, or in any combination, removed and replaced with ease.
According to one alternative embodiment, the test fixture 152 as shown in
In use, a connection component 158 as shown in
Subsequently, another connection component 158 can be placed over the protruding components 156 and fastened into position by sliding the retention component 162 over the groove 164 in the protruding component 156.
Although the present invention has been described with reference to preferred embodiments, persons skilled in the art will recognize that changes may be made in form and detail without departing from the spirit and scope of the invention.
This application claims benefit under 35 U.S.C. § 119(e) to U.S. Provisional Patent Application Ser. No. 60/557,873, filed Mar. 31, 2004, entitled “Hard Drive Test Fixture”, the content of which is incorporated herein in their entirety for all purposes.
Number | Date | Country | |
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60557873 | Mar 2004 | US |