Number | Date | Country | Kind |
---|---|---|---|
83639 A/90 | Oct 1990 | ITX |
Filing Document | Filing Date | Country | Kind | 102e Date | 371c Date |
---|---|---|---|---|---|
PCT/EP91/01965 | 10/16/1991 | 6/12/1992 | 6/12/1992 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO92/08119 | 5/14/1992 |
Number | Name | Date | Kind |
---|---|---|---|
1781002 | Esnault-Pelterie | Nov 1930 | |
2122203 | Gogon | Jun 1938 | |
3416367 | Ernst | Dec 1968 | |
4445367 | Goldsmid | May 1984 | |
4667509 | Tobolski et al. | May 1987 | |
4984453 | Enomoto | Jan 1991 |
Number | Date | Country |
---|---|---|
1060211 | Mar 1954 | FRX |
8606833 | Nov 1986 | WOX |
8803644 | May 1988 | WOX |
Entry |
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Howes, V. R. et al, Hardness Measurement At Constant Depth Using An Indenter Partially Coated With A Conducting Film, Journal of Physics E/Scientific Instruments 20 (1987) Dec., No. 12 Bristol, Gr. Britain, pp. 1507-1510. |
Notification of Transmittal and International Search Report PCT/EP91/01965, May 2, 1992. |