This application claims priority to Japanese Patent Application No. 2023-138776 filed on Aug. 29, 2023, incorporated herein by reference in its entirety.
The present disclosure relates to a heat management system and a vehicle.
WO2005/071824 discloses a technology for cooling a semiconductor device by controlling a temperature of a refrigerant circulating in a flow path provided in a housing of the semiconductor device.
In recent years, a heat management system that performs not only heat dissipation management but also heat generation management has been proposed in the field of automobiles etc. For example, in a system described in WO2005/071824, heat released from the semiconductor device may be used to heat other devices. However, WO2005/071824 describes only the heat management related to the heat dissipation of the semiconductor device (heat dissipation management), and does not describe the heat management using the heat generated by the semiconductor device (heat generation management). Therefore, there are some situations where the heat generation management is not performed appropriately.
The present disclosure has been made to address the above issue. An object thereof is to appropriately perform both heat dissipation management and heat generation management.
A heat management system according to an aspect of the present disclosure includes a heat generation portion including a plurality of heat dissipation paths. The heat dissipation paths include a first heat dissipation path and a second heat dissipation path.
The first heat dissipation path is configured to transfer heat from the heat generation portion to another portion other than the heat generation portion.
A heat dissipation amount of the heat generation portion through the second heat dissipation path increases along with a temperature rise of the heat generation portion.
Another aspect of the present disclosure provides a vehicle including the system described above.
According to the present disclosure, it is possible to appropriately perform both the heat dissipation management and the heat generation management.
Features, advantages, and technical and industrial significance of exemplary embodiments of the disclosure will be described below with reference to the accompanying drawings, in which like signs denote like elements, and wherein:
An embodiment of the present disclosure will be described in detail with reference to the drawings. The same or corresponding parts in the drawings are designated by the same reference signs and repetitive description will be omitted. In the drawings used below, among the X-axis, the Y-axis, and the Z-axis orthogonal to each other, the Z-axis represents the thickness direction of the substrate. Hereinafter, “+” is indicated in the direction indicated by the arrows of the X axis, the Y axis, and the Z axis, and “−” is indicated in the opposite direction. With respect to the two main surfaces (front and back surfaces) of the plate-shaped member (or the laminate thereof), the surface in the +Z direction may be referred to as a “first surface”, and the surface in-Z direction may be referred to as a “second surface”.
The semiconductor power device 10 includes, in addition to the power semiconductor 11, a laminated substrate in which the substrates 13-15 are laminated in the Z direction, and a cooler 16. The substrate 15, the substrate 14, and the substrate 13 are stacked in this order from −Z. Each of the substrates 13 and 15 is, for example, a metal substrate. Each of the substrates 13 and 15 may be a copper plate. The substrate 14 is an insulating substrate made of ceramic. Examples of the ceramic insulating substrate include an alumina substrate, an aluminum nitride substrate, and a silicon nitride substrate. The laminated substrate is, for example, an insulating heat dissipation circuit board having a structure in which a ceramic substrate is sandwiched between two metal substrates. The ceramic substrate and the two metal substrates may be bonded and integrated by an active metal bonding method (AMB) or a direct bonding method (DCB).
The substrate 13 includes an electronic circuit, and the power semiconductor 11 is mounted on the first surface of the substrate 13 via a bonding material 12. Examples of the bonding material 12 include solder and a conductive adhesive. The semiconductor power device 10 is configured to perform power conversion and/or control using the electronic circuit including the power semiconductor 11. A power transistor such as a IGBT, MOSFET or a bipolar power transistor may be exemplified as the power semiconductors 11. Exemplary semiconducting materials include Si, SiC, GaN.
A cooler 16 is bonded to the second surface of the substrate 15. Examples of the bonding material for the cooler 16 include solder and grease. The cooler 16 is configured to transfer the heat received from the laminated substrate to the heat dissipation path 30. The cooler 16 is made of, for example, metal. The cooler 16 has a plurality of protrusions protruding toward the heat dissipation path 30.
The heat dissipation path 30 includes a tube 31 and a heat insulating material 33. The tube 31 is, for example, a cylindrical member made of metal. The heat insulating material 33 is provided on-Z outer surface of the tube 31. Thus, heat-exchange on-Z of the tube 31 is suppressed. However, the present disclosure is not limited thereto, and a heat dissipation material may be provided in place of the heat insulating material 33 to promote heat dissipation-Z the tube 31. The tube 31 houses the heat medium 30a and the cooling fin 32 in the tube. The heat medium 30a flows through the tube 31 toward +Y, for example. The outer surface of the tube 31 on the +Z side is in contact with each protrusion of the cooler 16. Heat from the cooler 16 is transferred to the heat medium 30a and the cooling fin 32 via the tube 31. Exemplary thermal media 30a include water, antifreeze, organofluorine compounds, carbon dioxide, and ammonia.
The cooling fin 32 is, for example, a corrugated metal plate (corrugated fin). The cooling fin 32 is formed so as to move back and forth between the inner surface on the +Z side and the inner surface on-Z side of the tube 31. Such a configuration promotes heat exchanging between the cooling fin 32 and the heat medium 30a. The cooling fin 32 is in contact with a portion of the inner surface of the tube 31 on the +Z side facing the protrusion of the cooler 16. This promotes heat exchange between the cooling fin 32 and the cooler 16.
The heat dissipation path 30 is configured to transfer heat from the power semiconductor 11 to other components (components other than the power semiconductor 11). Hereinafter, the other components that perform heat exchange with the power semiconductor 11 through the heat dissipation path 30 are referred to as “target components”. In this embodiment, the heat medium 30a flows through the flow path formed by the tube 31. The heat medium 30a exchanges heat with each of the power semiconductors 11 and the target components (not shown in
The heat management system shown in
The thermal expansion material M1 changes its volume in the operating temperature-range of the power semiconductor 11. The thermal expansion material M1 may have a melting point within the operating temperature-region of the power semiconductor 11. The thermal expansion material M1 is, for example, solid-state at room temperature, and liquefies in accordance with the temperature rise of the power semiconductor 11. The volume of the thermal expansion material M1 increases due to liquefaction. Exemplary thermal expansion material M1 include waxes. The high heat conductivity material M2 maintains high fluidity in the operating-temperature range of the power semiconductor 11. The high heat conductivity material M2 may be in a liquid-state or a semi-solid-state in the operating temperature-region of the power semiconductor 11. The thermal conductivity of the high heat conductivity material M2 may be greater than or equal to 50 W/m·K and less than or equal to 100 W/m·K, or may be about 80 W/m·K. Exemplary high heat conductivity material M2 include liquid-sodium, heat-dissipating grease. The low heat conductivity material M3 maintains high-fluidity in the operating-temperature range of the power semiconductor 11. The low heat conductivity material M3 may be a gas in the operating temperature-range of the power semiconductor 11. The thermal conductivity of the low heat conductivity material M3 may be 0.01 W/m·K or more and 1.00 W/m·K or less, and may be about 0.02 W/m·K. Examples of the low heat conductivity material M3 include air-gas, nitrogen-gas and argon-gas. When the thermal expansion material M1, the high heat conductivity material M2, and the low heat conductivity material M3 become different from each other (solid/liquid/gas), the separation is promoted and the mixing is suppressed.
The heat dissipation path 40 includes metal members 41 and 42 and a thermally conductive variable portion 43. The metal member 41 is, for example, a metal case, and functions as a heat dissipation portion that promotes heat dissipation. Although details will be described later, an example of the metal member 41 is a case of an in-vehicle electronic device (see
The metal member 42 is, for example, a metal member formed in a rod shape or a plate shape. The metal member 42 is in contact with the substrate 15, the cooler 16, the tube 31, and the metal portion 23 of the container 20. The metal member 42 transfers heat from the power semiconductor 11 to the thermally conductive variable portion 43. The metal member 42 is connected to the metal member 41 via the thermally conductive variable portion 43. The metal member 42 and the thermally conductive variable portion 43 function as a heat conductive portion that transfers heat from the power semiconductor 11 to the metal member 41 (heat dissipation portion). The thermally conductive variable portion 43 is configured to have high thermal conductivity in accordance with the temperature rise of the power semiconductor 11.
The thermally conductive variable portion 43 includes a metal portion 23 of the container 20. In the container 20, the metal portion 21 is configured to transfer the heat generated by the power semiconductor 11 to the thermal expansion material M1. The thermal expansion material M1 contracts and expands in accordance with the temperature of the power semiconductor 11. The high heat conductivity material M2 and the low heat conductivity material M3 move within the container 20 in response to shrinkage/expansion of the thermal expansion material M1.
As described above, the power semiconductor 11 (heat generation portion) has a plurality of heat dissipation paths (heat dissipation paths 30 and 40). By transferring the heat from the power semiconductor 11 to another portion (a portion other than the power semiconductor 11) through the heat dissipation path 30, the temperature of the other portion can be increased by using the heat generated by the power semiconductor 11. Further, by simultaneously radiating the power semiconductor 11 through the plurality of heat dissipation paths, the total heat dissipation amount of the power semiconductor 11 is increased, and the power semiconductor 11 is easily cooled. However, when the power semiconductor 11 is radiated by a plurality of heat dissipation paths, the amount of heat radiation per path decreases. Therefore, in the case where the power semiconductor 11 is radiated by the heat dissipation paths 30 and 40, the amount of heat transferred to other portions through the heat dissipation path 30 is smaller than in the case where the power semiconductor 11 is radiated only by the heat dissipation path 30. This makes it difficult for the temperature of the other parts to rise.
Therefore, in the heat management system according to this embodiment, the amount of heat dissipation of the power semiconductor 11 through the heat dissipation path 40 is increased in accordance with the temperature rise of the power semiconductor 11. That is, the amount of heat dissipation of the power semiconductor 11 through the heat dissipation path 40 is smaller when the temperature of the power semiconductor 11 is lower than when the temperature of the power semiconductor 11 is higher (see
In the heat management system according to this embodiment, the thermal expansion material M1 displaces the high heat conductivity material M2 and the low heat conductivity material M3 in accordance with the temperature of the power semiconductor 11. The thermal expansion material M1 pulls or pushes the thermally conductive materials by shrinking or expanding. When the thermally conductive variable portion 43 includes the high heat conductivity material M2, the thermal conductivity of the thermally conductive variable portion 43 becomes high (see
The container 20 illustrated in
The heat management system 100a includes a first circuit 110, a second circuit 120, a third circuit 130, a condenser 140, a refrigeration cycle 150, a chiller 160, a five-way valve 310, and a reservoir tank (R/T) 320. The five-way valve 310 and the reservoir tank 320 are shared by the second circuit 120 and the third circuit 130. The condenser 140, the refrigeration cycle 150, and the chiller 160 are disposed between the first circuit 110 and the second circuit 120, and function as a heat transfer mechanism.
The first circuit 110 includes a pump 111, an electric heater 112, a three-way valve 113, a heater core 114, and a reservoir tank (R/T) 115 and radiator 118. The pump 111 circulates the heat medium to the first circuit 110.
The five-way valve 310 comprises five-port P1-P5. P1 and P2 of the five-way valve 310 are connected to form a second circuit 120 including the flow path 120a and 120b. The flow path 120a includes a pump 121 and a chiller 160. The flow path 120b includes a battery 200 and electric heaters 220. The pump 121 circulates the heat medium to the second circuit 120. Each of the port P3, P4 of the five-way valve 310 is connected to the reservoir tank 320 via a flow path 130b, 130a. The connecting of the port P3 and P4 forms the third circuit 130 including the flow path 130a and 130b. The flow path 130a includes a Smart Power Unit (SPU) 131, a Power Control Unit (PCU) 132, 134, a pump 133, and an oil cooler (O/C) 135, 136. The pump 133 circulates the heat medium to the third circuit 130. Each of the oil coolers 135,136 cools the oil supplied to T/A of the vehicle 100 by an electric oil pump (EOP). The ported P5 of the five-way valve 310 is connected to the reservoir tank 320 via a flow path 170a. The flow path 170a includes a radiator 170.
SPU 131 functions as an in-vehicle charger/discharger (charger and discharger) of the battery 200. However, it is not essential that the vehicle 100 have an external power supply function (for example, a V2H function). SPU 131 includes, for example, power converting circuitry. PCU 132, 134 drives a Fr-MG (front motor) and a Rr-MG (rear motor) (not shown) using electric power supplied from the battery 200. MG correspond to motors that drive the vehicle 100. The torque outputted by the respective MG rotates the drive wheels of the vehicle 100 via T/A. T/A functions as a power transmission. The battery 200 functions as a traveling power storage device. PCU may include bi-directional inverters.
The refrigeration cycle 150 includes a compressor 151, an electric expansion valve 152, an evaporator 153, a Evaporative Pressure Regulator (EPR) 154, and an electric expansion valve 155. The condenser 140 is connected to both the first circuit 110 and the refrigeration cycle 150, and functions as a heat exchanger. The chiller 160 is connected to both the refrigeration cycle 150 and the flow path 120a, and functions as a heat-exchanger. The air conditioner mounted on the vehicle 100 performs air conditioning (heating and cooling) inside the vehicle 100 using the first circuit 110 and the refrigeration cycle 150. For example, the heater core 114 warms the air in the vehicle cabin, and the evaporator 153 cools the air in the vehicle cabin.
The refrigeration cycle 150, the chiller 160, SPU 132, PCU, the heaters, the pumps, and the valves in the heat management system 100a are controlled by an in-vehicle Electronic Control Unit (ECU) (not shown). Each of PCU 132, 134 comprises the semiconductor power device 10 shown in
The heat dissipation structure shown in
The embodiments disclosed herein are illustrative and not restrictive in all respects. The scope of the present disclosure is defined by the terms of the claims, rather than the description of the embodiments described above, and includes all modifications within the scope equivalent to the terms of the claims.
Number | Date | Country | Kind |
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2023-138776 | Aug 2023 | JP | national |