The present application relates to design and operation of electronic circuits for delivering electrical current to an element in a display device, such as for example to an organic light-emitting diode (OLED) in the pixel of an active matrix OLED (AMOLED) display device.
Organic light-emitting diodes (OLED) generate light by re-combination of electrons and holes, and emit light when a bias is applied between the anode and cathode such that an electrical current passes between them. The brightness of the light is related to the amount of the current. If there is no current, there will be no light emission, so OLED technology is a type of technology capable of absolute blacks and achieving almost “infinite” contrast ratio between pixels when used in display applications. Similar display technologies may employ other types of light-emitting devices, including for example micro LEDs and quantum dot LEDs.
Several approaches are taught in the prior art for pixel thin film transistor (TFT) circuits to deliver current to an element of a display device, such as for example an organic light-emitting diode (OLED), through a p-type drive transistor. In one example, an input signal, such as a low “SCAN” signal, is employed to switch transistors in the circuit to permit a data voltage, VDAT, to be stored at a storage capacitor during a programming phase. When the SCAN signal is high and the switch transistors isolate the circuit from the data voltage, the VDAT voltage is retained by the capacitor, and this voltage is applied to a gate of a drive transistor. With the drive transistor having a threshold voltage VTH, the amount of current to the OLED is related to the voltage on the gate of the drive transistor by:
where VDD is a power supply connected to the source of the drive transistor.
TFT device characteristics, especially the TFT threshold voltage VTH, may vary with time or among comparable devices, for example due to manufacturing processes or stress and aging of the TFT device over the course of operation. With the same VDAT voltage, therefore, the amount of current delivered by the drive TFT could vary by a significant amount due to such threshold voltage variations. Therefore, pixels in a display may not exhibit uniform brightness for a given VDAT value.
Conventionally, therefore, OLED pixel circuits have high tolerance ranges to variations in threshold voltage and/or carrier mobility of the drive transistor by employing circuits that compensate for mismatch in the properties of the drive transistors. For example, an approach is described in U.S. Pat. No. 7,414,599 (Chung et al., issued Aug. 19, 2008), which describes a circuit in which the drive TFT is configured to be a diode-connected device during a programming period, and a data voltage is applied to the source of the drive transistor. The threshold compensation time is decided by the drive transistor's characteristics, which may require a long compensation time for high compensation accuracy. For the data programming time, the RC constant time required for charging the programming capacitor is determinative of the programming time. As is denoted in the art, the one horizontal (1H) time is the time that it takes for the data to be programmed for one row. In some configurations, such as in the circuit configuration of U.S. Pat. No. 7,414,599, the data is programmed at the same time as when the threshold voltage of the drive transistor is compensated.
In certain display configurations, such as for example high power applications and other display configurations that may use certain types of LEDs as the light-emitting device, a relatively high operating current is desired to drive the light-emitting device. The amount of current at which a conventional light-emitting pixel can be driven is a function of the saturation voltage of the drive transistor, the light-emitting device voltage for light emission, and the driving supply voltage. For very high operating currents, the saturation voltage of the drive transistor increases to a point where the power arising from the current through the drive transistor is being mainly consumed in the drive transistor itself. As such, the current supplied to the light-emitting device becomes limited, which is undesirable for high current applications as the driving current to the light-emitting device is insufficient for peak performance. Conventional pixel circuit configurations, therefore, have proven deficient for high current display applications because of limitations arising out of the saturation voltage of the drive transistor.
The present application relates to pixel circuits that are able to output relatively high drive currents for high-current display applications as compared to conventional pixel circuit configurations. This provides enhanced performance in display applications that require higher driving or operating currents. As referenced above, the amount of current at which a conventional light-emitting pixel can be driven is a function of the saturation voltage of the drive transistor, the light-emitting device voltage for light emission, and the driving supply voltage. For high current applications, the saturation voltage of the drive transistor increases to a point where the power arising from the current through the drive transistor is being mainly consumed in the drive transistor itself. As such, the current supplied to the light-emitting device becomes limited, which is undesirable for high-current applications as the driving current to the light-emitting device is insufficient for peak performance.
The circuit configuration described in the current application reduces the undesirable power consumption in the drive transistor by operating the drive transistor in the triode region in which the drive transistor functions more like a voltage-controlled resistor, whereby the current through the drive transistor essentially is linearly proportional to the source-drain voltage across the drive transistor. By operating the drive transistor in the triode region, saturation limitations of conventional configurations are avoided, resulting in a much lower power consumption in the drive transistor at higher operating currents. In this manner, more power goes toward driving the light-emitting device for light emission, which provides enhanced performance for high-current display applications.
When operating the drive transistor in the triode region, an issue arises from the interdependence of the current through the drive transistor and the source-drain voltage across the drive transistor. Such interdependence could result in current fluctuations to the light-emitting device, which would undermine the light emission. To maintain operation of the drive transistor in the triode region in a stable manner, the source-drain voltage dependence of the output current of the drive transistor is compensated with a bias transistor, which keeps the drain voltage value of the drive transistor constant at a target drain voltage value. The bias transistor is controlled by an operational amplifier (Opamp) running a negative feedback loop to ensure a fixed target voltage occurs at the drain of the drive transistor. One Opamp can be shared among multiple pixels, or an Opamp can be provided in each pixel circuit individually.
An aspect of the invention, therefore, is a pixel circuit for a display device and related method of circuit operation that is enhanced for high-current display applications by operating the drive transistor in the triode region. In exemplary embodiments, the pixel circuit incudes a drive transistor configured to control an amount of current to a light-emitting device during an emission phase depending upon a voltage applied to a gate of the drive transistor, the drive transistor having a first terminal and a second terminal and the first terminal of the drive transistor is electrically connected to a first voltage supply line during the emission phase; a light-emitting device that is electrically connected at a first terminal to the second terminal of the drive transistor during the emission phase and is connected at a second terminal to a second voltage supply line; a bias transistor having a first terminal connected to the second terminal of the drive transistor and a second terminal that is electrically connected to the first terminal of the light-emitting device during the emission phase; and an operational amplifier (Opamp) having an output terminal that is connected to a gate of the bias transistor, and the Opamp is connected in a negative feedback loop configuration to fix a voltage at the second terminal of the drive transistor to a target voltage during the emission phase.
Performing the emission phase during which light is emitted from the light-emitting device includes operating the Opamp in a negative feedback loop to fix a voltage at the second terminal of the drive transistor to the target voltage; electrically connecting the first terminal of the drive transistor to the first voltage supply line to apply the first voltage supply to the first terminal of the drive transistor; and electrically connecting the first terminal of the light-emitting device to the second terminal of the drive transistor through the bias transistor, thereby applying the first voltage supply to the light-emitting device. The first terminal of the drive transistor may be a source of the drive transistor, and the second terminal of the drive transistor may be a drain of the drive transistor.
To the accomplishment of the foregoing and related ends, the invention, then, comprises the features hereinafter fully described and particularly pointed out in the claims. The following description and the annexed drawings set forth in detail certain illustrative embodiments of the invention. These embodiments are indicative, however, of but a few of the various ways in which the principles of the invention may be employed. Other objects, advantages and novel features of the invention will become apparent from the following detailed description of the invention when considered in conjunction with the drawings.
Embodiments of the present application will now be described with reference to the drawings, wherein like reference numerals are used to refer to like elements throughout. It will be understood that the figures are not necessarily to scale.
More specifically,
The OLED and the pixel circuit 10, including the transistors, capacitors and connecting wires, may be fabricated using TFT fabrication processes conventional in the art. It will be appreciated that comparable fabrication processes may be employed to fabricate the TFT circuits according to any of the embodiments.
For example, the TFT circuit 10 may be disposed on a substrate such as a glass, plastic, or metal substrate. Each TFT may comprise a gate electrode, a gate insulating layer, a semiconducting layer, a first electrode, and a second electrode. The semiconducting layer is disposed on the substrate. The gate insulating layer is disposed on the semiconducting layer, and the gate electrode may be disposed on the insulating layer. The first electrode and second electrode may be disposed on the insulating layer and connected to the semiconducting layer using vias. The first electrode and second electrode respectively may commonly be referred to as the “source electrode” and “drain electrode” of the TFT. The capacitors each may comprise a first electrode, an insulating layer and a second electrode, whereby the insulating layer forms an insulating barrier between the first and second electrodes. Wiring between components in the circuit, and wiring used to introduce signals to the circuit (e.g. SCAN, EMI, VINI, and VDAT) may comprise metal lines or a doped semiconductor material. For example, metal lines may be disposed between the substrate and the gate electrode of a TFT, and connected to electrodes using vias. The semiconductor layer may be deposited by chemical vapour deposition, and metal layers may be deposited by a thermal evaporation technique.
The OLED device may be disposed over the TFT circuit. The OLED device may comprise a first electrode (e.g. anode of the OLED), which is connected to transistors T5 and T6 in this example, one or more layers for injecting or transporting charge (e.g. holes) to an emission layer, an emission layer, one or more layers for injecting or transporting electrical charge (e.g. electrons) to the emission layer, and a second electrode (e.g. cathode of the OLED), which is connected to voltage supply ELVSS in this example. The injection layers, transport layers and emission layer may be organic materials, the first and second electrodes may be metals, and all of these layers may be deposited by a thermal evaporation technique.
Referring to the TFT pixel circuit 10 of
As seen in the circuit configuration of
The initialization phase is performed to initialize the various circuit voltages, such as voltages at the storage capacitor and the drive transistor, to remove effects of previous frames. At the beginning of the initialization phase, the EMI(n) signal level is changed from a low voltage value to a high voltage value, causing switch transistors T3 and T5 to be placed in the off state. Switch transistor T3 has a first terminal connected to an input voltage supply line that supplies the input driving voltage ELVDD, and a second terminal connected to the first terminal (source) of the drive transistor. Switch transistor T5 has a first terminal connected to the bias transistor and that is electrically connected to the second terminal (drain) of the drive transistor during the emission phase, and a second terminal connected to the first terminal of the light-emitting device. As transistors T3 and T5 are turned off, the drive transistor is electrically disconnected from the driving voltage supply ELVDD and is electrically disconnected from the light-emitting device OLED.
Also during the initialization phase, the SCAN(n−1) signal level is changed from a high voltage value to a low voltage value, which places switch transistor T1 in an on state. As to the circuit components, the storage capacitor Cst has a first plate connected to the input voltage supply line that supplies the input driving voltage ELVDD, and a second plate connected to the gate of the drive transistor. Switch transistor T1 has a first terminal connected to the gate of the drive transistor and the second plate of the storage capacitor, and a second terminal connected to an initialization voltage supply line that supplies an initialization voltage VINI. With switch transistor T1 turning on, VINI is applied to the gate of the drive transistor and to the second plate of the storage capacitor through T1. The drive transistor's gate voltage (which also is the voltage at the second plate of the storage capacitor) from the previous frame is therefore reset, and the drive transistor is initialized to a low gate voltage which is required for the subsequent combined threshold compensation and data programming phase. Toward the end the initialization phase, the signal SCAN(n−1) is changed from a low voltage value to a high voltage value, which places switch transistor T1 in the off state to isolate the gate of the drive transistor from the initialization voltage supply line.
The pixel circuit next is operable in a combined threshold compensation and data programming phase, during which a threshold voltage of the drive transistor is compensated and a data voltage value for light emission is programmed to the pixel circuit. The signal SCAN(n) is changed from a high voltage value to a low voltage value, which places switch transistors T2, T4, and T6 in an on state. Switch transistor T6 has a first terminal connected to the initialization voltage supply line that supplies the initialization voltage VINI, and a second terminal connected to the first terminal of the light-emitting device. With T6 turning on, VINI is applied to the first terminal of the light-emitting device through T6, which resets or initializes the voltage at the light-emitting device to remove any effects from the previous frame.
Switch transistor T2 has a first terminal connected to the gate of the drive transistor, which is also connected to the second plate of the storage capacitor, and a second terminal connected to the second terminal (drain) of the drive transistor. As transistor T2 is turned on, the gate and second terminal (drain) of the drive transistor TD are electrically connected to each other through switch transistor T2, and the drive transistor TD becomes diode-connected. Diode-connected refers to the drive transistor TD being operated with its gate and another terminal (e.g., source or drain) being electrically connected to each other, such that current flows in one direction. In addition, switch transistor T4 has a first terminal connected to a data voltage supply line that supplies the data voltage VDAT, and a second terminal connected to the first terminal (source) of the drive transistor. As transistor T4 is turned on, the data voltage supply line is electrically connected to the first terminal (source) of the drive transistor, and thus the data voltage value VDAT is applied to the first terminal of the drive transistor through T4. With such operation, the source-gate voltage of the drive transistor is:
VSG=VDAT−VVINI
Since the gate node VG of the drive transistor is floating, the drive transistor TD will inject a current into the node VG until the gate voltage of the drive transistor is high enough to turn off the drive transistor which permits threshold voltage compensation of the drive transistor. The voltage on the gate node VG of the drive transistor for compensation, which again also corresponds to the second plate of the storage capacitor Cst, becomes:
VG=VDAT−VTH
where VTH is the threshold voltage of the drive transistor TD. In this manner, the threshold voltage of the drive transistor and the data voltage value effectively are stored by the storage capacitor Cst.
Preferably, to have effective voltage threshold compensation of the drive transistor TD, the initial voltage difference between the gate and the source of the drive transistor should be:
VDAT−VVINI>|VTH|+ΔV
where ΔV is a voltage that is large enough to generate a high initial current to charge the storage capacitor within an allocated threshold compensation time. The value of ΔV will depend on the properties of the transistors. For example, ΔV would be at least three volts for exemplary IGZO and LTPS thin film transistor processes. The voltages ELVDD and VINI, are set to satisfy this voltage requirement. The voltage stored on the storage capacitor Cst is:
VCst=VELVDD−VDAT+VTH
Again, therefore, the threshold voltage of the drive transistor and the data voltage value effectively are stored by the storage capacitor Cst.
At the end of the combined threshold compensation and data programming phase, the signal SCAN(n) is changed from a low voltage value to a high voltage value, which places switch transistors T2, T4, and T6 in an off state. With such transistors turning off, the drive transistor TD is no longer diode connected and the drive transistor source is electrically isolated from the data voltage supply line VDAT, and the light-emitting device is electrically isolated from the initialization voltage supply line VINI.
The pixel circuit next is operable in an emission phase during which light is emitted by the light-emitting device. In general, to enhance usage in high-current applications, the drive transistor TD is operated in the triode region in which the drive transistor functions more like a voltage-controlled resistor, whereby the current through the drive transistor essentially is linearly proportional to the source-drain voltage across the drive transistor. By operating the drive transistor in the triode region, saturation limitations of conventional configurations are avoided, and a higher current can be supplied to the light-emitting device for light emission. As referenced above, however, when operating the drive transistor in the triode region an issue arises from the interdependence of the current through the drive transistor and the source-drain voltage across the drive transistor. Such interdependence could result in current fluctuations to the light-emitting device, which would undermine the light emission. To maintain operation of the drive transistor in the triode region in a stable manner in which the current does not fluctuate, the source-drain voltage dependence of the output current of the drive transistor is compensated with a bias transistor TB, which keeps the drain voltage of the drive transistor constant at a target drain voltage value. The bias transistor TB is controlled by an operational amplifier (Opamp) connected in a negative feedback loop configuration to ensure a fixed target voltage occurs at the drain of the drive transistor. One Opamp can be shared among multiple pixels, or an Opamp can be provided in each pixel circuit individually.
Referring to the pixel circuit configuration 10 of
The negative terminal of the Opamp is connected to the second terminal (drain) of the drive transistor TD. When current flows through the drive transistor, a negative feedback loop operates via the Opamp output through the bias transistor TB to pull the drain voltage of the drive transistor at the drain terminal VD to fix the voltage at the second terminal (drain) of the drive transistor to the target voltage value VD-target. By fixing the drain voltage of the drive transistor to the target drain voltage value VD-target, the voltage across the drive transistor is stabilized and the drive transistor is operable in the triode mode without any propensity toward current fluctuations.
During the emission phase, the signal EMI(n) is changed from a low voltage value to a high voltage value, which places transistors T3 and T5 in an on state. With transistors T3 and T5 turning on, the first terminal (source) of the drive transistor is electrically connected to the input voltage supply line that supplies the input driving voltage ELVDD through T3, and the first terminal of the light-emitting device is electrically connected to the second terminal (drain) of the drive transistor through T5 and the bias transistor TB. A driving current, therefore, is supplied via ELVDD to the light emitting device through transistors T3, TD, TB, and T5. The gate-source voltage of the drive transistor is therefore identical with the voltage stored on the storage capacitor Cst, which is:
VSG=VCst=VELVDD−VDATA+VTH
In this configuration the source-gate voltage of the drive transistor is chosen such that the drive transistor is operating in the triode region as referenced above. The following relations are satisfied for the drive transistor to be operating in the triode region.
VSG−VTH>VSD
VELVDD−VDATA>VELVDD−VD
VDATA<VD
The target drain voltage can be set for triode region operation with the bias transistor TB if the following relations are true:
VELVDD−VELVSS−VOLED>VSD
VELVDD−VELVSS−VOLED>VELVDD−VD
VELVSS+VOLED<VD
With the above relations satisfied whereby the drive transistor is operated in the triode mode, the drive transistor now supplies a current to the light emitting device from the positive to the negative supply rail. The amount of current supplied by the drive transistor to the light-emitting device is:
where
Cox is the capacitance of the drive transistor gate oxide;
W is the width of the drive transistor channel;
L is the length of the drive transistor channel (i.e. distance between source and drain); and
μn is the carrier mobility of the drive transistor.
Accordingly, the current to the OLED does not depend on the threshold voltage of the drive transistor TD, and hence the current to the OLED device IOLED is not affected by threshold voltage variations of the drive transistor. In this manner, any variation in the threshold voltage of the drive transistor has been compensated. In addition, by operating the drive transistor in the triode region, a significantly higher operating current may be provided for operation of the pixel circuit as compared to convention configurations that are limited by drive transistor saturation, which provides enhanced operation for high-current display applications.
In the example of
Although the invention has been shown and described with respect to a certain embodiment or embodiments, it is obvious that equivalent alterations and modifications will occur to others skilled in the art upon the reading and understanding of this specification and the annexed drawings. In particular regard to the various functions performed by the above described elements (components, assemblies, devices, compositions, etc.), the terms (including a reference to a “means”) used to describe such elements are intended to correspond, unless otherwise indicated, to any element which performs the specified function of the described element (i.e., that is functionally equivalent), even though not structurally equivalent to the disclosed structure which performs the function in the herein illustrated exemplary embodiment or embodiments of the invention. In addition, while a particular feature of the invention may have been described above with respect to only one or more of several illustrated embodiments, such feature may be combined with one or more other features of the other embodiments, as may be desired and advantageous for any given or particular application.
Embodiments of the present invention are applicable to many display devices to permit display devices of high resolution with effective threshold voltage compensation and true black performance. Examples of such devices include televisions, mobile phones, personal digital assistants (PDAs), tablet and laptop computers, desktop monitors, digital cameras, and like devices for which a high resolution display is desirable.
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