High Efficiency X-Ray Detector for Electron Microscopy

Information

  • Research Project
  • 6881807
  • ApplicationId
    6881807
  • Core Project Number
    R43RR021292
  • Full Project Number
    1R43RR021292-01
  • Serial Number
    21292
  • FOA Number
  • Sub Project Id
  • Project Start Date
    2/18/2005 - 21 years ago
  • Project End Date
    5/31/2006 - 19 years ago
  • Program Officer Name
    SWAIN, AMY L
  • Budget Start Date
    2/18/2005 - 21 years ago
  • Budget End Date
    5/31/2006 - 19 years ago
  • Fiscal Year
    2005
  • Support Year
    1
  • Suffix
  • Award Notice Date
    2/15/2005 - 21 years ago
Organizations

High Efficiency X-Ray Detector for Electron Microscopy

DESCRIPTION (provided by applicant): We propose to develop the next generation of x-ray detectors for analytical electron microscopy that will offer larger solid angle (thus higher sensitivity), higher count rate capability, and higher detection efficiency, to match the next generation of analytical electron microscopes which will offer the opportunity for unprecedented analytical measurements in biological applications. Smaller areas (<1 nm spatial resolution), for structural and chemical analysis, and higher sensitivities than ever before will be possible. One of the standard analytical tools on almost all electron microscopes (EM) is an energy dispersive spectroscopy (EDS) detector used for chemical analysis. However, there are many limitations with the current generation of EDS detectors for EM and TEM. The proposed new EDS detectors will be based on the silicon multi-cathode detectors (SMCD) that Photon Imaging has been developing for a number of different x-ray fluorescence (XRF) and x-ray diffraction (XRD) applications. Unlike with traditional Si(Li) or HPGe EDS detectors, these new detectors do not require liquid nitrogen, which makes them extremely compact and very flexible in their mechanical design, which can open up new possibilities in measurements capabilities. In addition, they are capable of operating at much higher count rates than traditional EDS detectors. Recently, we have begun to develop very thick SMC detectors (up to 1.5 mm thick). This extra thickness (beyond the standard 0.35 mm) offers an extended detection efficiency for hard x-rays, up to 40 keV. In Phase I, we will evaluate the x-ray performance of the new, 10-20 mm2, high efficiency SMCD detectors for TEM applications. The spectrometer will be designed to fit tightly into the EM probe area, to maximize the solid angle for signal collection, while not interfering with the pole piece nor other analytical equipment. The detector and spectrometer will be thoroughly evaluated at Photon, using radioisotope sources and an x-ray generator, and then will be evaluated on the EM, in conjunction with Dr. Nestor Zaluzec, who will consult on this project. In Phase II, we will develop larger area 50 mm2 detectors, the full prototype commercial spectrometer, with full data acquisition software, for insertion into commercially available TEMs and other types of EMs.

IC Name
NATIONAL CENTER FOR RESEARCH RESOURCES
  • Activity
    R43
  • Administering IC
    RR
  • Application Type
    1
  • Direct Cost Amount
  • Indirect Cost Amount
  • Total Cost
    100000
  • Sub Project Total Cost
  • ARRA Funded
  • CFDA Code
    389
  • Ed Inst. Type
  • Funding ICs
    NCRR:100000\
  • Funding Mechanism
  • Study Section
    ZRG1
  • Study Section Name
    Special Emphasis Panel
  • Organization Name
    PHOTON IMAGING, INC.
  • Organization Department
  • Organization DUNS
    111439089
  • Organization City
    NORTHRIDGE
  • Organization State
    CA
  • Organization Country
    UNITED STATES
  • Organization Zip Code
    913243576
  • Organization District
    UNITED STATES