This patent application relates generally to interconnection systems, such as those including cables and electrical connectors.
Cables are used in many electronic systems. Electronic systems are assembled from multiple components that are interconnected. Often, components are mounted to printed circuit boards (PCBs), which provide both mechanical support for the components and conductive structures that deliver power to the components and provide signal paths between components attached to the PCB.
Sometimes PCBs are joined together with electrical connectors. The connectors provide a separable interface such that the PCBs in a system can be manufactured at different times or in different locations, yet simply assembled into a system. A known arrangement for joining several printed circuit boards is to have one printed circuit board serve as a backplane. Other printed circuit boards, called “daughterboards” or “daughtercards,” may be connected through the backplane.
A backplane is a printed circuit board onto which many connectors may be mounted. Conducting traces in the backplane may be electrically connected to signal conductors in the connectors so that signals may be routed between the connectors. Daughtercards may also have connectors mounted thereon. The connectors mounted on a daughtercard may be plugged into the connectors mounted on the backplane. In this way, signals may be routed among the daughtercards through the backplane.
Connectors may also be used in other configurations for interconnecting printed circuit boards. Sometimes, one or more smaller printed circuit boards may be connected to another larger printed circuit board. In such a configuration, the larger printed circuit board may be called a “motherboard” and the printed circuit boards connected to it may be called daughterboards. Also, boards of the same size or similar sizes may sometimes be aligned in parallel. Connectors used in these applications are often called “stacking connectors” or “mezzanine connectors.”
In some scenarios, components may be separated by a longer distance than can be connected via traces in a PCB. Cables may be used to route signals between components because cables can be routed through curving paths where it would be difficult to install a rigid PCB or can be manufactured with less signal loss per inch than a PCB.
Cables provide signal paths with high signal integrity, particularly for high frequency signals, such as those above 40 Gbps using an NRZ protocol. Each cable has one or more signal conductors, which is surrounded by a dielectric material, which in turn is surrounded by a conductive layer. A protective jacket, often made of plastic, may surround these components. Additionally the jacket or other portions of the cable may include fibers or other structures for mechanical support.
One type of cable, referred to as a “twinax cable,” is constructed to support transmission of a differential signal and has a balanced pair of signal wires, is embedded in a dielectric, and encircled by a conductive layer. The conductive layer is usually formed using foil, such as aluminized Mylar. The twinax cable can also have a drain wire. Unlike a signal wire, which is generally surrounded by a dielectric, the drain wire may be uncoated so that it contacts the conductive layer at multiple points over the length of the cable.
Cables may be terminated with connectors, forming a cable assembly. The connectors may plug into mating connectors that are in turn connected to the components to be connected. At an end of the cable, where the cable is to be terminated to a connector or other terminating structure, the protective jacket, dielectric and the foil may be removed, leaving portions of the signal wires and the drain wire exposed at the end of the cable. These wires may be attached to a connector or other terminating structure. The signal wires may be attached to conductive elements serving as mating contacts in the connector. The drain wire may be attached to a ground conductor in the terminating structure. In this way, any ground return path may be continued from the cable to the terminating structure.
To receive the connector of a cable assembly, a connector, called an “I/O connector” may be mounted to a PCB, usually at an edge of the PCB. That connector may be configured to receive a plug at one end of a cable assembly, such that the cable is connected to the PCB through the I/O connector. The other end of the cable assembly may be connected to another electronic device.
Cables have also been used to make connections within the same electronic device. For example, cables have been used to route signals from an I/O connector to a processor assembly that is located at the interior of the PCB, away from the edge at which the I/O connector is mounted. In other configurations, both ends of a cable may be connected to the same PCB. The cables can be used to carry signals between components mounted to the PCB near where each end of the cable connects to the PCB.
Aspects described herein relate to low loss interconnection systems.
In one aspect, some embodiments may relate to a connector assembly comprising a first signal conductor having a first contact tail and a first wire extending from a cable. The first contact tail includes an edge having a first planar surface, and a portion of the first wire is at least partially flattened to form a second planar surface. The first wire is attached to the edge of the first contact tail with the second planar surface of the first wire in contact with the first planar surface of the first contact tail.
In another aspect, some embodiments may relate to a connector assembly comprising a signal conductor having a contact tail, the contact tail comprising an edge, and wire extending from a cable and attached to the edge of the contact tail via a bond extending along an attachment interface. At least a portion of the bond is a metallurgical bond.
In a further aspect, some embodiments may relate to a method of forming an electrical connector. The method comprises bonding a wire of a cable to an edge of contact tail of a signal conductor along an attachment interface, at least in part, by melting a first material, flowing the first material into the attachment interface, and interdiffusing at least a portion of the first material and a second material across the attachment interface to form a metallurgical bond.
In yet another aspect, some embodiments may relate to a method of forming an electrical connector comprising deforming a portion of a first wire of a cable to form a first planar surface. The method further comprises attaching the first wire to an edge of a first contact tail of a first signal conductor, at least in part, by contacting the first planar surface of the first wire to a second planar surface of the edge of the first contact tail.
The foregoing is provided by way of illustration and is not intended to be limiting.
The accompanying drawings are not intended to be drawn to scale. In the drawings, each identical or nearly identical component that is illustrated in various figures is represented by a like numeral. For purposes of clarity, not every component may be labeled in every drawing. In the drawings:
The inventors have recognized and appreciated techniques for improving the performance of an electronic system through the use of low loss interconnects, particularly for high frequency signals that are enabled by the manner in which cables are attached to conductive elements in connectors or other terminating structures. In some embodiments, a pair of signal conductors of a cable (e.g., wires in the cable) may be reliably attached at opposed edges of conductive elements of a connector configured to carry a differential pair signal. With such an arrangement, changes of geometry at the cable attachment interface, which might otherwise cause changes of impedance that could impact signal integrity, may be reduced. Alternatively or additionally, such an attachment interface may reduce the amount of metal at the attachment interface, reducing the change of inductance relative to a convention design in which a cable is soldered on a broadside of a signal conductor, which also reduces changes of impedance.
The inventors have recognized and appreciated techniques that enable robust attachment of wires at an edge of conductive element. One such technique may include adjusting a shape of at least a portion of a signal conductor of a cable prior to attaching the signal conductor to a conductive element of a connector, such as a contact tail. In particular, the inventors have recognized that the typical round shape of a wire in a cable may result in a limited contact area between the wire and the conductive element of the connector, which may lead to poor quality attachment of the wire to the connector and/or undesirable impedance changes at the attachment interface as a result of the mass of material required to form a suitable attachment.
According to some aspects described herein, a wire may be deformed prior to joining with an associated conductive element of a connector such that at least a portion of the wire is at least partially flattened. The flattened portion of the wire may form a planar surface that may be placed into contact with a corresponding planar surface of the conductive element of the connector, and the wire and conductive element may subsequently be joined to attach the wire to the connector. In some embodiments, an area of the flattened portion of the wire (i.e., the planar surface of the wire) may substantially match a corresponding contact area on the conductive element of the connector (i.e., the planar surface of the conductive element), which may aid in avoiding changes in impedance through the attachment interface. For example, the wire may initially have a diameter that is larger than a thickness of the conductive element of the connector, and after flattening, the thickness of the flattened portion of the wire may substantially match the thickness of the conductive element. In some embodiments, the wire may be pressed against the contact area on the conductive element during attachment to achieve the above-described deformation of the wire. However, it should be understood that the wire may be deformed or flattened in any suitable manner, such as by flattening the wire with appropriate tooling, as the current disclosure is not limited in this regard.
Another such technique may involve forming an attachment interface and physically bonding and/or joining a wire of a cable to a conductive portion of a connector (e.g., a contact tail) with a small volume of conductive material. As noted above, changes of geometry at the cable attachment interface may lead to undesirable changes of impedance that may impact signal integrity. Accordingly, techniques described herein may reduce or eliminate such changes in geometry, for example, by forming a bond at the attachment interface without requiring solder or other material to be added to the attachment interface that may cause such geometry changes. In some embodiments, the wires of a cable and contact tails of a connector may comprise materials selected to provide desired material properties (e.g., thermodynamic and/or kinetic properties), which may facilitate joining of the wire to the conductive portion without the need for solder or other joining material. For example, the materials may be selected to form a metallurgical bond along at least a portion of the attachment interface upon heating of the attachment interface. As described in more detail below, in some instances, the heating required to form the metallurgical bond may be less than may be required for other conventional joining techniques, such as welding. Moreover, the inventors have recognized and appreciated that such lower heating requirements to form a bond may, in some instances, avoid undesirable loss of material at the attachment interface that may occur due to ablation or other effects associated with higher power joining operations, such as high power laser welding.
In some embodiments, at least a portion of the wires of a cable and/or the contact tails of a connector may comprise a coating selected to provide the above-described material properties, which may facilitate joining of the wires to the contact tails. For example, such coatings may be selected such that the coating material is soluble in a base alloy of the wire and/or contact tail, to promote interdiffusion of the materials of the wire and/or the contact tail, and/or to facilitate melting and flow of material into the attachment interface between the wire and the contact tail at lower temperatures. As used herein, a first material being soluble within a second material refers a two (or more) component material system in which the two (or more) materials form a single phase mixture at equilibrium conditions when the two (or more) materials are combined. For example, materials that are fully soluble in one another (e.g., copper and nickel; see
Additionally, in some embodiments, a coating material and a base alloy may be selected such that the coating material and base alloy form a eutectic material system in which a mixture of the coating material and the base alloy melts at a lower temperature than the melting temperatures of the coating material and the base alloy. In some such eutectic systems, the coating material and base alloy may form three distinct phases: a liquid (at high temperatures) in which the coating material and base alloy are miscible in one another, a first solid phase in which the coating material may exhibit limited solubility in the base alloy, and a second solid phase in which the base alloy may exhibit some solubility in the coating material. Each of the solid phases may be a solid solution exhibiting the crystal structure of the primary component. One exemplary material system that exhibits such eutectic behavior is the silver-copper material system (see
In some applications, the coating materials on the wires of the cable and the contact tails may be different and may provide different thermodynamic effects. For example, in one embodiment, the wires and contact tails may comprise similar or identical base alloys, but may have different coating materials. For instance, a first coating on the wires of the cable may be selected to form a eutectic alloy system (as described above) such that the addition of the first coating material to the base alloy effectively lowers the melting point of the base alloy of the wire; a second coating on the contact tails of the connector may be selected such that the coating material is partially or fully soluble with the base alloy of the connector such that the second coating material and the base alloy form a single phase solid or liquid over suitable composition ranges. As described in more detail below, such a configuration may allow for flow of material into an attachment interface and subsequent interdiffusion of the coating and base alloy materials to form a metallurgical bond along at least a portion of the attachment interface. While a particular configuration of first and second coatings is described above, it should be understood that other configurations may be suitable. For instance, in other embodiments, a first coating on the wires may be selected to be partially or fully soluble with the base alloy of the wire, and the second coating on the contact tails may be selected to form a eutectic system. In further embodiments, the first and second coatings may be selected to provide the same or similar type of thermodynamic response, such as forming a soluble mixture or a eutectic system.
Cable termination techniques as described herein may be used to terminate cables of any suitable type to conductive structures of any suitable type. Termination of a twinax cable to signal conductors of a connector is described as an example of a cable termination herein. Each signal conductor may include a contact tail, a mating contact portion, and an intermediate portion that extends between the contact tail and the mating contact portion. In some embodiments, the connector assembly may further include a plurality of cables. Each cable may include one or more wires. Each wire may be attached to a contact tail of a signal conductor of a connector using the above-described attachment and/or joining techniques.
In some embodiments, each of the pair of signal conductors of a connector may include broadsides and edges joining the broadsides. The pair of signal conductors may be formed by stamping a metal piece, with one or more tie bars connecting two opposing edges of the pair such that the separation between the pair is controlled by the size of the tie bar. The size of the tie bar may be selected based on the size of a wire in a cable to be attached, e.g., AWG 28, AWG 30, etc. The tie bar may set a spacing between opposing edges of the contact tails of the signal conductors such that, when the wire is attached to each edge, the separation between the wires yields a desired impedance, such as an impedance matching that of the cable or other parts of the interconnect.
Either before or after the wires are attached to the signal conductors, a housing may be molded around the pair of signal conductors such that the contact tails of the pair of signal conductors may be held in the housing in an edge-to-edge configuration. The tie bar then may be severed in order to isolate the pair of signal conductors. Compared with the conventional method of terminating cable wires on surfaces thus forming large bumps, attaching the cable wires to the edges allows for more precise control over the spacing between cable wires and reduces impedance mismatch. Impedance control may also be provided by an attachment that has a small impact on inductance at the conductor to wire interface, such as via the above-described attachment and/or joining techniques.
The foregoing principles are illustrated with an example, such as the interconnection system shown in
In the illustrated example, connector 2900 includes both signal conductors configured to attach to a cable and to attach to a printed circuit board. Connector 2900 may be assembled from connector units that are configured for each type of attachment, such that there is a first type of connector units that have signal conductors configured to attach to a printed circuit board and a second type of connector units that have signal conductors configured to attach to a cable. However, the present invention is not limited in this regard. In some embodiments, cables may be terminated to other types of connectors or to conductors that are part of other types of electronic components.
Connector 2804 may be mounted to PCB 2803 at one end and mate with connector 2900 on the other end such that PCB 2803 is orthogonal to PCB 2801.
Cables 2806 may have first ends 2808 attached to the second type connector units 2904 and second ends 2810 attached to connector 2805. Connector 2805 is here mated to connector 2802, through which signals carried by the cables are coupled to PCB 2801. The second ends of the cables may be coupled to PCB 2801 at a location spaced from the first ends of the cables with a distance D. Any suitable value may be selected for the distance D. In some embodiments, D may be at least 6 inches, in the range of 1 to 20 inches, or any value within the range, such as between 6 and 20 inches. However, the upper limit of the range may depend on the size of PCB 2801, and the distance from connector 2900 that components (not shown) are mounted to PCB 2801, as connector 2802 may be mounted near components that receive or generate signals that pass through cables 2806. As a specific example, connector 2802 may be mounted within 6 inches of those components, and in some embodiments, will be mounted within 4 inches of those components or within 2 inches of those components.
Connector 2900 may be mated to any suitable type of connector. In some embodiments, mating connector 2804 may be an orthogonal connector. In the illustrated embodiments, both connectors 2900 and 2804 may have a modular construction, and similar modules may be used for corresponding components. Connector 2900 may be configured as a direct attach orthogonal connector. That configuration may be achieved by attaching an extender to a connector with a mating interface that is the same as the mating interface described in connection with connector 2804.
As can be seen in
Each of the connectors also has a mating interface where that connector can mate—or be separated from—the other connector. Connector 2804 includes a mating interface. Though not fully visible in the view shown in
Each of these conductive elements includes an intermediate portion that connects a contact tail to a mating contact portion. The intermediate portions may be held within a connector housing, at least a portion of which may be dielectric so as to provide electrical isolation between conductive elements. Additionally, the connector housings may include conductive or lossy portions, which in some embodiments may provide conductive or partially conductive paths between some of the conductive elements. In some embodiments, the conductive portions may provide shielding. The lossy portions may also provide shielding in some instances and/or may provide desirable electrical properties within the connectors.
In various embodiments, dielectric members may be molded or over-molded from a dielectric material such as plastic or nylon. Examples of suitable materials include, but are not limited to, liquid crystal polymer (LCP), polyphenyline sulfide (PPS), high temperature nylon or polyphenylenoxide (PPO) or polypropylene (PP). Other suitable materials may be employed, as aspects of the present disclosure are not limited in this regard.
All of the above-described materials are suitable for use as binder material in manufacturing connectors. In accordance some embodiments, one or more fillers may be included in some or all of the binder material. As a non-limiting example, thermoplastic PPS filled to 30% by volume with glass fiber may be used to form the entire connector housing or dielectric portions of the housings.
Alternatively or additionally, portions of the housings may be formed of conductive materials, such as machined metal or pressed metal powder. In some embodiments, portions of the housing may be formed of metal or other conductive material with dielectric members spacing signal conductors from the conductive portions. For example, a housing of a connector may have regions formed of a conductive material with insulative members separating the intermediate portions of signal conductors from the conductive portions of the housing.
The housing of connector 2804 may also be formed in any suitable way. In the embodiment illustrated, daughtercard connector 2804 may be formed from multiple units, which may be subassemblies, which may include one or more “wafers” and, in some embodiments, one or more extender modules, and one or more support members to hold the components together. Each of the wafers may include a housing portion, which may similarly include dielectric, lossy and/or conductive portions. One or more members may hold the wafers in a desired position. For example, support members may hold top and rear portions, respectively, of multiple wafers in a side-by-side configuration. Support members may be formed of any suitable material, such as a sheet of metal stamped with tabs, openings or other features that engage corresponding features on the individual wafers.
Other members that may form a portion of the connector housing may provide mechanical integrity for daughtercard connector 2804 and/or hold the wafers in a desired position. For example, a front housing portion may receive portions of the wafers forming the mating interface. Any or all of these portions of the connector housing may be dielectric, lossy and/or conductive, to achieve desired electrical properties for the interconnection system.
In some embodiments, each wafer may hold a column of conductive elements forming signal conductors. These signal conductors may be shaped and spaced to form single ended signal conductors. However, in the embodiment illustrated in
Conductive elements may be made of metal or any other material that is conductive and provides suitable mechanical properties for conductive elements in an electrical connector. Phosphor-bronze, beryllium copper and other copper alloys are non-limiting examples of materials that may be used. The conductive elements may be formed from such materials in any suitable way, including by stamping and/or forming.
The spacing between adjacent columns of conductors may be within a range that provides a desirable density and desirable signal integrity. As a non-limiting example, the conductors may be stamped from 0.4 mm thick copper alloy, and the conductors within each column may be spaced apart by 2.25 mm and the columns of conductors may be spaced apart by 2.4 mm. However, a higher density may be achieved by placing the conductors closer together. In other embodiments, for example, smaller dimensions may be used to provide higher density, such as a thickness between 0.2 and 0.4 mm or spacing of 0.7 to 1.85 mm between columns or between conductors within a column. Moreover, each column may include four pairs of signal conductors, such that a density of 60 or more pairs per linear inch is achieved for the interconnection system illustrated in
The wafers may be formed in any suitable way. In some embodiments, the wafers may be formed by stamping columns of conductive elements from a sheet of metal and over molding dielectric portions on the intermediate portions of the conductive elements. In other embodiments, wafers may be assembled from modules each of which includes a single, single-ended signal conductor, a single pair of differential signal conductors or any suitable number of single ended or differential pairs.
The inventors have recognized and appreciated that assembling wafers from modules may aid in reducing “skew” in signal pairs at higher frequencies, such as between about 25 GHz and 40 GHz, or higher. Skew, in this context, refers to the difference in electrical propagation time between signals of a pair that operates as a differential signal. Modular construction that reduces skew is designed described, for example in U.S. Pat. Nos. 9,509,101 and 9,450,344, which are incorporated herein by reference.
In accordance with techniques described in those patents incorporated by reference, in some embodiments, connectors may be formed of modules, each carrying a signal pair. The modules may be individually shielded, such as by attaching shield members to the modules and/or inserting the modules into an organizer or other structure that may provide electrical shielding between pairs and/or ground structures around the conductive elements carrying signals.
In some embodiments, signal conductor pairs within each module may be broadside coupled over substantial portions of their lengths. Broadside coupling enables the signal conductors in a pair to have the same physical length. To facilitate routing of signal traces within the connector footprint of a printed circuit board to which a connector is attached and/or constructing of mating interfaces of the connectors, the signal conductors may be aligned with edge to edge coupling in one or both of these regions. As a result, the signal conductors may include transition regions in which coupling changes from edge-to-edge to broadside or vice versa. As described below, these transition regions may be designed to prevent mode conversion or suppress undesired propagation modes that can interfere with signal integrity of the interconnection system.
The modules may be assembled into wafers or other connector structures. In some embodiments, a different module may be formed for each row position at which a pair is to be assembled into a right angle connector. These modules may be made to be used together to build up a connector with as many rows as desired. For example, a module of one shape may be formed for a pair to be positioned at the shortest rows of the connector, sometimes called the a-b rows. A separate module may be formed for conductive elements in the next longest rows, sometimes called the c-d rows. The inner portion of the module with the c-d rows may be designed to conform to the outer portion of the module with the a-b rows.
This pattern may be repeated for any number of pairs. Each module may be shaped to be used with modules that carry pairs for shorter and/or longer rows. To make a connector of any suitable size, a connector manufacturer may assemble into a wafer a number of modules to provide a desired number of pairs in the wafer. In this way, a connector manufacturer may introduce a connector family for a widely used connector size—such as 2 pairs. As customer requirements change, the connector manufacturer may procure tools for each additional pair, or, for modules that contain multiple pairs, group of pairs to produce connectors of larger sizes. The tooling used to produce modules for smaller connectors can be used to produce modules for the shorter rows even of the larger connectors.
In this example, the first type connector units 2902 include wafers 3008. Rear portions of the wafers may be held by a support member 3014. In the illustrated embodiment, connector 2900 includes 10 wafers 3008. A wafer 3008 includes 6 wafer modules held by a housing made by two halves 3018A and 3018B. Each module includes a pair of differential signal conductors 2916A, 2916B.
As illustrated, the pairs of signal conductors within each of wafers 3008 may be aligned in column direction 3002. To achieve the orientation of pins at the mating interface illustrated in
A plurality of wafers and a plurality of extender modules may be held by one or more support members 3004. In the embodiment illustrated, support members 3004 are implemented as at least two separate components 2902A and 2902B. However, any suitable number and shape of components may be used to form a support member. Additional components, for example, may hold the wafers at an opposing surface and/or at the sides of the structure shown. Alternatively or additionally, support member 3004 may be a housing, having an opening receiving and securing the wafers.
In the embodiment of
However, it should be appreciated that each first type connector unit may be a subassembly of any suitable number of components to implement any suitable number of columns of conductive elements or may be implemented as a single component or in any other suitable way. Using wafers and extender modules as illustrated, each first type connector unit may be formed from a multiple of two wafers, such as two, four, six or eight wafers and a multiple of that number of extender modules, the multiple being equal to the number of signal conductors in one wafer, but the application is not limited in this regard.
If multiple units are used, the connector units may be held together by a support member. In the embodiment illustrated, extender shell 2906 acts as a support member. The support member 3004 may include retaining features 2950 to engage with corresponding features 2960 on the extender shell 2906. It should be appreciated, however, that support members 3004 may, in some embodiments, may be omitted, if wafers are attached directly to extender shell 2906 or, if other supporting structures are used to hold the components of the connector together.
In
In the illustrated example, there is one second type unit 2904. To be complementary with the first type units, the illustrative second type unit 2904 includes 12 cables 2806 aligned in a direction of column 3002. Each second type unit 2904 may include a plurality of modules 3100 held by a unit housing 3102. The plurality of modules in a second type unit may be aligned in the direction of column 3002. Each module 3100 may include a module housing 3112 holding a pair of signal conductors 3104A, 3104B. The pair of signal conductors are separated in the direction of column 3006. The mating contact portions of the second type units may form an array 3204. The arrays 3202 and 3204 together may form the mating interface 2920 of the connector 2900.
The mating contact portions of the signal conductors are illustrated as pins. However, other configurations may be adopted, e.g., receptacles. The contact tails (not shown) of the signal conductors are attached with cables 2806. The attachment interface between the contact tails and the cables are protected by at least the unit housing. Each cable may include a pair of wires, each of which is attached to a respective contact tail of a pair of signal conductors of a module. In some embodiments, the cables may be twin-ax cables. A shield surrounding the conductors of the twin-ax cable may be attached to a shield surrounding the conductive elements in a respective module 3100. The unit housing 3102 may extend farther in the direction of cable length than support members 3004 such that the attachment interface between the modules 3100 and the cables 2806 are covered.
The housing 3402 and the modules 3420 may form a second type connector unit. In the embodiment illustrated, each of the modules 3420 has a pair of signal conductors, and the modules 3420 are arranged such that the second type connector unit has two columns of signal conductors.
Conductors of the cables such as wires may be attached to signal conductors within modules 3408 in any suitable way. However, in accordance with some embodiments, the cable conductors may be attached to edges of the signal conductors so as to provide a conducting structure of substantially uniform thickness and/or substantially uniform spacing between the conductive elements. For example, the thickness, including both the thickness of the conductor of the cable, the signal conductor and any weld, solder or other material to fuse the two may be no more than 10% greater than the thickness of the stock used to form the signal conductor. In some embodiments, the variation in thickness between the cable attachment and the stock thickness may be less than 25% or less than 50%. More generally, the variation in thickness may be less than the variation that might result from a conventional approach of attaching the cable conductor at the broadside to connector signal conductor, which might increase the thickness of the conducting path by 100% or more. Likewise, the separation at the attachment location may be relatively small, such as differing from the separation at the mating interface by no more than 10%.
Such a connection is illustrated in
Portions of the pair of conductive elements may be exposed out of the dielectric portion. The exposed portion of the conductive element 3510A may be attached to the edge 3504A of the signal conductor 3410A. The exposed portion of the conductive element 3510B may be attached to the edge 3504B of the signal conductor 3410B. The attachment may be made in any suitable way, such as by welding, soldering, or brazing. For example, laser welding may be used. For example, a laser welding operation may be performed in which a laser is aimed in a path along the edge of the conductive element, fusing the wire in the cable to the edge of the conductive element as the laser's point of focus changes.
In some embodiments, the laser may be controlled to form a running fillet joint between each conductive element of the cable and the edge of the signal conductor in the connector. The inventors have found that such a joint may be more reliable and more repeatable than a weld through a wire. A suitable weld may be formed with a commercially available green laser, but any suitable welding equipment may be used.
Operations such as welding, soldering, or brazing without any filler metal or other fusible material result in directly fusing the conductive elements of the cable to the conductive elements of the connector, thereby avoiding the bulk of conductive material that might be present if other attachment techniques, such as soldering using a filler metal, were used. Reducing the bulk of conductive material used for attachment may reduce changes in impedance, which can contribute to desirable electrical properties. However, in some embodiments, solder or other fusible material may be added to facilitate attachment.
Cable conductors may be attached to edges of conductive elements of any suitable shape in a connector.
The cable 3606 may include a pair of conductive elements 3620A, 3620B, each of which is attached to one of opposing edges of the signal conductors 3610A, 3610B. The pair of signal conductors 3610A and 3610B is spaced from each other by a distance d1 to accommodate the cable 3606. The distance d1 may be controlled by a width W of the tie bar 3602 and/or the degree of slopes in the transition regions 3614. This distance may be accurately controlled by the stamping.
With tie bar 3602 severed, mating contacts 3604A and 3604B on conductive elements 3610A and 3610B may be formed to provide any suitable shape. Any suitable metal forming technique may be used. For example, the edges may be coined to provide mating contacts that are blades. Alternatively or additionally, the mating contacts may be rolled to provide mating contacts that are pins. As yet a further variation, the mating contacts may be shaped as single beam contacts, dual-beam contacts or multi-beam contacts. As a further alternative, separate components may be attached to conductive elements 3610A and 3610B, such as to form a multi-beam structure or to provide a receptacle.
The forming operations may leave mating contacts 3604A and 3604B spaced from each other by a distance d2, measured edge-to-edge. In the embodiment illustrated, d2 may approximate d1. For example, d2 may differ from d1 by 10% or less, or in some embodiments, 25% or 50% or less.
However, it is not a requirement that the separation between edges be uniform over the entire length of the contacts. The edges of the contacts at the attachment region may taper towards each other or may taper away from each other in a direction along the elongated axis of mating contacts 3604A and 3604B. Such a configuration may provide a gradual impedance transition from the cable the mating interface of the connector. Alternatively or additionally, the shape of the conductive elements 3610A and 3610B may vary over the length, such as to provide a wider or narrower width inside the housing relative to outside. As an example of a further variation, even if the opposing edges of conductive elements 3610A and 3610B are shaped to provide a uniform spacing d2 along the length of the conductive elements, the width of the conductive elements in the attachment may be controlled, even varying along the length of the conductive elements, by changing in the profile of the outer edges of conductive elements 3610A and 3610B. The outer edges, for example, may taper toward or away from each other.
The inventors have recognized and appreciated techniques for reliably joining a cable to an edge of a conductive element so as to provide cable terminations that yield interconnections with high signal integrity. Referring now to
Additionally, as illustrated in
In some embodiments, a thickness of a flattened portion of signal conductor 3710B of the cable 3706 may be between about 75% and about 150% of a thickness of the contact tail 3510, and in some instances, the flattened portion of the signal conductor 3710B may have a thickness that is substantially equal to the thickness of the contact tail 3510. Additionally, in some embodiments, the thickness of the flattened portion of the signal conductor 3710B may be between about 50% and 100% of the diameter of the signal conductor within the cable 3706 (i.e., the diameter of the undeformed signal conductor 3710B). For instance, the thickness of the flattened portion may be between about 50% and 75% of the diameter of the signal conductor within the cable. The current disclosure is not limited to any particular method for flattening a conductor of a cable. For example, the conductor 3710B may be pressed against the edge of the contact tail 3510 during the joining process with a contact force sufficient to at least partially deform the conductor. In this manner, the conductor may be compressed between a tool (not depicted) and the edge of the contact tail to achieve a desired degree of deformation and flattening of the conductor, and thus, a desired contact area at the attachment interface. Such a tool may be implemented, for example, with a hardened member between conductors 2710A and 3710B. That portion may have a width, equal to a desired spacing between conductors 2710A and 3710B. Such a tool may also have members constraining motions of contact tails 3510. In operation, the tool might apply force on the ends of conductors 2710A and 2710B, in a direction parallel to the edges of contact tails 3510 so as to compress the conductors at the attachment interface 3730. Such compression may result in the ends of conductors 2710A and 2710B having a thickness approximating the thickness of the contact tails 3510. As displacement of the metal of conductors 2710A and 2710B is constrained on three sides by the tool, the metal of conductors 2710A and 2710B displaced by compression will move towards the contact tails 3510, creating flattened surfaces on the conductor facing the edges of contact tails 3510.
Alternatively or additionally, a separate tool may be used to partially or fully deform and flatten at least a portion of the conductor 3710B prior to joining with the contact tail 3510.
Shaping the conductors prior to attachment facilities a more robust attachment and provides for less changes in impedance. Further improvements may be achieved based on material selection and/or regulation of energy used to form the attachment. As discussed above, some aspects of the current disclosure relate to selecting materials for a conductor of a cable (e.g., a wire) and a contact tail of a signal conductor of a connector to facilitate joining, such as by providing desired material properties for the joining process. In some embodiments such thermodynamic properties may be achieved by coating one or both of the conductor and contact tail. For example,
In one embodiment, the first coating material 3816 and first base alloy 3814 may be selected such that the first coating material is soluble within the first base alloy (e.g., soluble over a substantial range of composition of the mixture of the first base alloy and first coating material) such that the first coating material and first base alloy may interdiffuse within each other to form a single phase solid solution. The second coating material 3820 and second base alloy 3818 may be selected such that the materials form a eutectic system. Specifically, a mixture of the second coating material and second base alloy may exhibit a lower melting temperature than either the melting temperature of the second base alloy or the second coating material. In some instances, the second coating material may exhibit some solid phase solubility in the and second base alloy (e.g., over a range of compositions of up to at least 1%, up to at least 5%, up to at least 10%, up to at least 20%, up to at least 30% or more of the second coating material in the second base alloy). In this manner, the dissolution of the second coating material in to the second base alloy may, in effect, lower the melting point of the second base alloy, as discussed above.
In some embodiments, the first and second base alloys may comprise one or more common primary component elements. For example, the first and second base alloys may both be copper alloys. However, other compositions and/or combinations of compositions also may be suitable, as would be apparent to one of skill in the art.
Referring now to
In some embodiments, the metallurgical bond 3834 may extend along a substantial portion of a length of the attachment interface 3830 along a direction parallel to the length of the conductor 3812. For example, the metallurgical bond may extend along at least 50%, at least 75%, at least 90% or more of the length of the attachment interface. In some exemplary embodiments, the length of the attachment interface may be between about 0.005 inches and about 0.02 inches (e.g., between about 0.01 inches and about 0.015 inches), and the metallurgical bond may extend along a length of at least 0.0025 inches, at least 0.005 inches, at least 0.01 inches, at least 0.015 inches, at least 0.018 inches or more of the attachment interface.
Moreover, elevated temperatures at an attachment interface during the heat treatment process described above may result in faster diffusion of the various materials. Consequently, a metallurgical bond 3834 may be formed along the attachment interface 3830 via the interdiffusion of the first base alloy 3814, first coating material 3816, second base alloy 3818, and second coating material 3820. In particular, the metallurgical bond 3834 may form a region along the attachment interface in which the first and second base alloys and first and second coating materials form a substantially homogeneous microstructure without a well-defined interface between the conductor 3812 and contact tail 3810.
Although the metallurgical bond 3834 is depicted as extending substantially along the entire thickness of the attachment interface below the heat effected zone 3832, it should be understood that other configurations may be suitable. For example, in some embodiments a suitable bond may be formed with a metallurgical bond along only a portion of the thickness of the attachment interface. Alternatively or additionally, in some embodiments, the attachment interface may be heated from both sides such that heat effected zones may be formed at both sides ends of the attachment interface (along the thickness of the attachment interface) and metallurgical bonds may extend from each heat effected zone, or may span the attachment interface between the heat effected zones. In some embodiments, the heat effected zone(s) may comprise a region in which the applied heat is sufficient to melt at least a portion of the base alloys and form a liquid mixture, which may subsequently solidify into one or more distinct phases. In such embodiments, the heat effected zone(s) may be characterized as welded portions of an attachment interface. Alternatively or additionally, the heat affected zone(s) may comprise regions in which the applied heat was sufficient to create a change in microstructure relative to the microstructure of the base alloy(s) and/or coating(s). Moreover, in some embodiments, a ratio of the thickness of the metallurgical bond in a direction along the thickness of the contact tail to the total thickness of the heat affected zone(s) may be at least 2:1, at least 3:1, at least 4:1, at least 5:1, or more.
In one exemplary embodiment, the contact tail may comprise a precipitation hardened copper alloy as the first base alloy, and the first coating material may be nickel. As shown in the phase diagram illustrated in
Having thus described several embodiments, it is to be appreciated various alterations, modifications, and improvements may readily occur to those skilled in the art. Such alterations, modifications, and improvements are intended to be within the spirit and scope of the application. Accordingly, the foregoing description and drawings are by way of example only. Various changes may be made to the illustrative structures, materials and processes shown and described herein.
For example, while certain combinations of alloys and/or materials were described above in connection with one illustrative embodiment, it should be understood that other compositions may be suitable. Moreover, the current disclosure is not limited to configurations in which the first and second base alloys are different types of alloys and/or the first and second coating materials comprise different materials. For example, in one embodiment, a silver coating could be employed on both the conductor and the contact tail. Accordingly, it should be understood that the current disclosure is not limited to metallurgical bonds formed from a soluble material system (e.g., Ni—Cu) and a eutectic or eutectoid system (e.g., Ag—Cu), and that one or both of these material systems may be used in connection with either of the conductor of the cable and the contact tail of the connector. Moreover, the various alloys or metals used for the base alloys and/or coatings may be selected for any of a variety of purposes, including, but not limited to, providing a desired electrical conductivity, corrosion resistance, and/or melting point reduction. For instance, in certain embodiments, tin may be incorporated into one or more coating materials (such as a silver or nickel coating) to further reduce the melting point of the mixture. In another embodiment, a silver-plated copper wire may be joined to a bare copper contact tail.
Additionally, while embodiments have been described in connection with joining a conductor (such as a wire) of a cable to a contact tail of a connector, it should be understood that the techniques described herein may be suitable for forming other types of joints, such as between contact tails on signal conductors of different connectors.
As another example, a method of manufacturing a module for a cable connector was described in connection with
As another example, techniques are described for improving signal quality at the mating interface of an electrical interconnection system. These techniques may be used alone or in any suitable combination. Furthermore, the size of a connector may be increased or decreased from what is shown. Also, it is possible that materials other than those expressly mentioned may be used to construct the connector. As another example, connectors with four differential signal pairs in a column are used for illustrative purposes only. Any desired number of signal conductors may be used in a connector.
As another example, an embodiment was described in which a different front housing portion is used to hold connector modules in a connector configuration versus an orthogonal configuration. It should be appreciated that, in some embodiments, a front housing portion may be configured to support either use.
Manufacturing techniques may also be varied. For example, embodiments are described in which the connector 600 is formed by organizing a plurality of wafers onto a stiffener. It may be possible that an equivalent structure may be formed by inserting a plurality of shield pieces and signal receptacles into a molded housing.
As another example, connectors are described that are formed of modules, each of which contains one pair of signal conductors. It is not necessary that each module contain exactly one pair or that the number of signal pairs be the same in all modules in a connector. For example, a 2-pair or 3-pair module may be formed. Moreover, in some embodiments, a core module may be formed that has two, three, four, five, six, or some greater number of rows in a single-ended or differential pair configuration. Each connector, or each wafer in embodiments in which the connector is waferized, may include such a core module. To make a connector with more rows than are included in the base module, additional modules (e.g., each with a smaller number of pairs such as a single pair per module) may be coupled to the core module.
As a further variation,
Furthermore, although many inventive aspects are shown and described with reference to a orthogonal connector having a right angle configuration, it should be appreciated that aspects of the present disclosure is not limited in this regard, as any of the inventive concepts, whether alone or in combination with one or more other inventive concepts, may be used in other types of electrical connectors, such as backplane connectors, daughterboard connectors, midplane connectors, cable connectors, stacking connectors, mezzanine connectors, I/O connectors, chip sockets, etc.
In some embodiments, contact tails were illustrated as press fit “eye of the needle” compliant sections that are designed to fit within vias of printed circuit boards. However, other configurations may also be used, such as surface mount elements, spring contacts, solderable pins, etc., as aspects of the present disclosure are not limited to the use of any particular mechanism for attaching connectors to printed circuit boards.
Further, signal and ground conductors are illustrated as having specific shapes. In the embodiments above, the signal conductors were routed in pairs, with each conductive element of the pair having approximately the same shape so as to provide a balanced signal path. The signal conductors of the pair are positioned closer to each other than to other conductive structures. One of skill in the art will understand that other shapes may be used, and that a signal conductor or a ground conductor may be recognized by its shape or measurable characteristics. A signal conductor in many embodiments may be narrow relative to other conductive elements that may serve as reference conductors to provide low inductance. Alternatively or additionally, the signal conductor may have a shape and position relative to a broader conductive element that can serve as a reference to provide a characteristic impedance suitable for use in an electronic system, such as in the range of 50-120 Ohms. Alternatively or additionally, in some embodiments, the signal conductors may be recognized based on the relative positioning of conductive structures that serve as shielding. The signal conductors, for example, may be substantially surrounded by conductive structures that can serve as shield members.
Further, the configuration of connector modules and extender modules as described above provides shielding of signal paths through the interconnection system formed by connector modules and extender modules in a first connector and connector modules in a second connector. In some embodiments, minor gaps in shield members or spacing between shield members may be present without materially impacting the effectiveness of this shielding. It may be impractical, for example, in some embodiments, to extend shielding to the surface of a printed circuit board such that there is a gap on the order of 1 mm. Despite such separation or gaps, these configurations may nonetheless be regarded as fully shielded.
Moreover, examples of an extender module are pictured with an orthogonal configuration. It should be appreciated that, without a 90 degree twist, the extender modules may be used to form a RAM, if the extender module has pins or blades at its second end. Other types of connectors may alternatively be formed with modules with receptacles or mating contacts of other configurations at the second end.
Moreover, the extender modules are illustrated as forming a separable interface with connector modules. Such an interface may include gold plating or plating with some other metal or other material that may prevent oxide formation. Such a configuration, for example, may enable modules identical to those used in a connector to be used with the extender modules. However, it is not a requirement that the interface between the connector modules and the extender modules be separable. In some embodiments, for example, mating contacts of either the connector module or extender module may generate sufficient force to scrape oxide from the mating contact and form a hermetic seal when mated. In such an embodiment, gold and other platings might be omitted.
Connectors configured as described herein may provide desirable signal integrity properties across a frequency range of interest. The frequency range of interest may depend on the operating parameters of the system in which such a connector is used, but may generally have an upper limit between about 15 GHz and 50 GHz, such as 25 GHz, 30 or 40 GHz, although higher frequencies or lower frequencies may be of interest in some applications. Some connector designs may have frequency ranges of interest that span only a portion of this range, such as 1 to 10 GHz or 3 to 15 GHz or 5 to 35 GHz.
The operating frequency range for an interconnection system may be determined based on the range of frequencies that can pass through the interconnection with acceptable signal integrity. Signal integrity may be measured in terms of a number of criteria that depend on the application for which an interconnection system is designed. Some of these criteria may relate to the propagation of the signal along a single-ended signal path, a differential signal path, a hollow waveguide, or any other type of signal path. Two examples of such criteria are the attenuation of a signal along a signal path or the reflection of a signal from a signal path.
Other criteria may relate to interaction of multiple distinct signal paths. Such criteria may include, for example, near end cross talk, defined as the portion of a signal injected on one signal path at one end of the interconnection system that is measurable at any other signal path on the same end of the interconnection system. Another such criterion may be far end cross talk, defined as the portion of a signal injected on one signal path at one end of the interconnection system that is measurable at any other signal path on the other end of the interconnection system.
As specific examples, it could be required that signal path attenuation be no more than 3 dB power loss, reflected power ratio be no greater than −20 dB, and individual signal path to signal path crosstalk contributions be no greater than −50 dB. Because these characteristics are frequency dependent, the operating range of an interconnection system is defined as the range of frequencies over which the specified criteria are met.
Designs of an electrical connector are described herein that may provide desirable signal integrity for high frequency signals, such as at frequencies in the GHz range, including up to about 25 GHz or up to about 40 GHz or higher, while maintaining high density, such as with a spacing between adjacent mating contacts on the order of 3 mm or less, including center-to-center spacing between adjacent contacts in a column of between 1 mm and 2.5 mm or between 2 mm and 2.5 mm, for example. Spacing between columns of mating contact portions may be similar, although there is no requirement that the spacing between all mating contacts in a connector be the same.
Examples of arrangements that may be implemented according to some embodiments include the following:
1. A connector assembly, comprising:
2. The connector assembly of arrangement 1, further comprising:
3. The connector assembly of arrangement 2, wherein the edge of the first contact tail and the edge of the second contact tail are opposing edges in a pair of signal conductors.
4. The connector assembly of arrangement 3, wherein the pair of signal conductors are configured as a differential pair.
5. The connector assembly of any of arrangement 3-4, wherein:
6. The connector assembly of arrangement 5, wherein:
7. The connector assembly of any of arrangement 5-6, wherein:
8. The connector assembly of any of arrangement 5-7, wherein:
9. The connector assembly of any of arrangement 5-8, wherein:
10. The connector assembly of any of arrangement 2-9, wherein the first and third planar surfaces face one another.
11. The connector assembly of any of arrangement 1-10, wherein the first wire is joined to the first signal conductor via a metallurgical bond extending at least partially along an interface between the first planar surface and the second planar surface.
12. The connector assembly of arrangement 11, wherein a length of the interface along a direction parallel to a direction of extension of the wire is between about 0.005 inches and about 0.02 inches.
13. The connector assembly of arrangement 12, wherein the length of the interface is between about 0.01 inches and about 0.015 inches.
14. The connector assembly of any of arrangement 12-13, wherein the metallurgical bond extends along at least 50% of the interface.
15. The connector assembly of arrangement 14, wherein the metallurgical bond extends along at least 75% of the interface.
16. The connector assembly of arrangement 15, wherein the metallurgical bond extends along at least 90% of the interface.
17. The connector assembly of any of arrangement 1-16, wherein a thickness of the portion of the wire is between about 75% and about 150% of a thickness of the first contact tail.
18. The connector assembly of arrangement 17, wherein the thickness of the portion of the wire is substantially equal to the thickness of the first contact tail.
19. The connector assembly of any of arrangements 1-18, wherein a thickness of the portion of the wire is greater than about 50% of a diameter of the wire within the cable.
20. The connector assembly of arrangement 19, wherein the thickness of the portion of the wire is less than 75% of the diameter of the wire within the cable.
21. The connector assembly of any of arrangements 1-20, wherein:
22. A connector assembly, comprising:
23. The connector of arrangement 22, wherein the metallurgical bond extends along at least 50 percent of the attachment interface.
24. The connector of any of arrangements 22-23, wherein the bond comprises a heat effected zone at a first end of the attachment interface.
25. The connector of any of arrangements 22-24, wherein the bond extends along the entire attachment interface.
26. The connector of any of arrangements 22-25, wherein the signal conductor comprises a first base alloy and a first coating material, and wherein the wire comprises a second base alloy and a second coating material.
27. The connector of arrangement 26, wherein the metallurgical bond comprises, at least in part, a region in which the first base alloy, first coating material, second base alloy, and second coating material are interdiffused with one another.
28. The connector of any of arrangements 26-27, wherein the first coating material is soluble in the first base alloy, and the second coating material and second base alloy form a eutectic material system.
29. The connector of any of arrangements 26-28, wherein the first and second base alloys comprise copper.
30. The connector of arrangement 29, wherein the first coating material comprises nickel and the second coating material comprises silver.
31. The connector of arrangement 30, wherein the second coating material further comprises tin.
32. The connector of any of arrangements 22-31, wherein at least a portion of the wire extending along the attachment interface is deformed such that a thickness of the portion is less than a diameter of the wire in the cable.
33. A method of forming an electrical connector, the method comprising:
34. The method of arrangement 33, wherein bonding the wire of the cable to the edge of the contact tail further comprises at least partially melting the first material and flowing the first material into the attachment interface.
35. The method of any of arrangements 33-34, wherein the first material comprises a first base alloy of the wire and a first coating material on the wire.
36. The method of arrangement 35, wherein the first base alloy and first coating material form a eutectic material system.
37. The method of any of arrangements 33-36, further comprising deforming at least a portion of the wire before bonding the wire to the contact tail.
38. The method of arrangement 37, wherein deforming at least a portion of the wire comprises flattening the portion of the wire.
39. The method of any of arrangements 33-38, wherein melting the first material comprises increasing the temperature of the first material to a temperature between about 800° C. and about 1100° C.
40. The method of any of arrangements 33-29, wherein the metallurgical bond extends along at least 50% of a length of the attachment interface.
41. The method of arrangement 40, wherein the metallurgical bond extends along at least 75% of a length of the attachment interface.
42. The method of arrangement 41, wherein the metallurgical bond extends along at least 90% of a length of the attachment interface.
43. A method of forming an electrical connector, the method comprising:
44. The method of arrangement 43, further comprising:
45. The method of arrangement 44, wherein the edge of the first contact tail and the edge of the second contact tail are opposing edges in a pair of signal conductors.
46. The method of arrangement 45, wherein the pair of signal conductors are configured as a differential pair.
47. The method of any of arrangements 45-46, further comprising attaching the wires to respective edges of the pair of contact tails via metallurgical bonds.
48. The method of any of arrangements 43-47, wherein deforming the portion of the first wire comprises flattening the portion of the first wire.
49. The method of arrangement 48, wherein after flattening, a thickness of the portion of the first wire is greater than about 50% of a diameter of the first wire within the cable.
50. The method of arrangement 49, wherein after flattening, the thickness of the portion of the first wire is less than about 75% of the diameter of the first wire within the cable.
51. The method of any of arrangements 48-50, wherein after flattening, a thickness of the portion of the first wire is between about 75% and about 150% of a thickness of the first contact tail.
52. The method of any of arrangements 43-51, wherein attaching the first wire to the edge of the first contact tail comprises forming a bond along the attachment interface, and wherein at least a portion of the bond is a metallurgical bond.
Accordingly, the present disclosure is not limited to the details of construction or the arrangements of components set forth in the following description and/or the drawings. Various embodiments are provided solely for purposes of illustration, and the concepts described herein are capable of being practiced or carried out in other ways. Also, the phraseology and terminology used herein are for the purpose of description and should not be regarded as limiting. The use of “including,” “comprising,” “having,” “containing,” or “involving,” and variations thereof herein, is meant to encompass the items listed thereafter (or equivalents thereof) and/or as additional items.
This application claims the benefit under 35 U.S.C. § 119(e) of U.S. Provisional Patent Application Ser. No. 62/809,381, filed on Feb. 22, 2019, entitled “HIGH PERFORMANCE CABLE CONNECTOR ASSEMBLY,” which is hereby incorporated herein by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
2124207 | Carl | Jul 1938 | A |
2996710 | Pratt | Aug 1961 | A |
3002162 | Garstang | Sep 1961 | A |
3007131 | Dahlgren et al. | Oct 1961 | A |
3134950 | Cook | May 1964 | A |
3229240 | Harrison et al. | Jan 1966 | A |
3322885 | May et al. | May 1967 | A |
3594613 | Prietula | Jul 1971 | A |
3715706 | Cook et al. | Feb 1973 | A |
3786372 | Epis et al. | Jan 1974 | A |
3825874 | Peverill | Jul 1974 | A |
3863181 | Glance et al. | Jan 1975 | A |
4067039 | Stanley | Jan 1978 | A |
4083615 | Volinskie | Apr 1978 | A |
4155613 | Brandeau | May 1979 | A |
4157612 | Rainal | Jun 1979 | A |
4195272 | Boutros | Mar 1980 | A |
4276523 | Boutros et al. | Jun 1981 | A |
4307926 | Smith | Dec 1981 | A |
4371742 | Manly | Feb 1983 | A |
4397516 | Koren et al. | Aug 1983 | A |
4408255 | Adkins | Oct 1983 | A |
4447105 | Ruehl | May 1984 | A |
4471015 | Ebneth et al. | Sep 1984 | A |
4484159 | Whitley | Nov 1984 | A |
4490283 | Kleiner | Dec 1984 | A |
4518651 | Wolfe, Jr. | May 1985 | A |
4519664 | Tillotson | May 1985 | A |
4519665 | Althouse et al. | May 1985 | A |
4615578 | Stadler et al. | Oct 1986 | A |
4632476 | Schell | Dec 1986 | A |
4636752 | Saito | Jan 1987 | A |
4639054 | Kersbergen | Jan 1987 | A |
4682129 | Bakermans et al. | Jul 1987 | A |
4697862 | Hasircoglu | Oct 1987 | A |
4708660 | Claeys et al. | Nov 1987 | A |
4724409 | Lehman | Feb 1988 | A |
4728762 | Roth et al. | Mar 1988 | A |
4751479 | Parr | Jun 1988 | A |
4761147 | Gauthier | Aug 1988 | A |
4795375 | Williams | Jan 1989 | A |
4806107 | Arnold et al. | Feb 1989 | A |
4826443 | Lockard | May 1989 | A |
4846724 | Sasaki et al. | Jul 1989 | A |
4846727 | Glover et al. | Jul 1989 | A |
4871316 | Herrell et al. | Oct 1989 | A |
4878155 | Conley | Oct 1989 | A |
4889500 | Lazar et al. | Dec 1989 | A |
4913667 | Muz | Apr 1990 | A |
4924179 | Sherman | May 1990 | A |
4948922 | Varadan et al. | Aug 1990 | A |
4949379 | Cordell | Aug 1990 | A |
4970354 | Iwasa et al. | Nov 1990 | A |
4975084 | Fedder et al. | Dec 1990 | A |
4990099 | Marin et al. | Feb 1991 | A |
4992060 | Meyer | Feb 1991 | A |
5000700 | Masubuchi et al. | Mar 1991 | A |
RE33611 | Michaels et al. | Jun 1991 | E |
5037330 | Fulponi et al. | Aug 1991 | A |
5066236 | Broeksteeg | Nov 1991 | A |
5091606 | Balsells | Feb 1992 | A |
5141454 | Garrett et al. | Aug 1992 | A |
5150086 | Ito | Sep 1992 | A |
5168252 | Naito | Dec 1992 | A |
5168432 | Murphy et al. | Dec 1992 | A |
5176538 | Hansell, III et al. | Jan 1993 | A |
5190473 | Mroczkowski et al. | Mar 1993 | A |
5197893 | Morlion et al. | Mar 1993 | A |
5266055 | Naito et al. | Nov 1993 | A |
5280191 | Chang | Jan 1994 | A |
5280257 | Cravens et al. | Jan 1994 | A |
5281150 | Bundga et al. | Jan 1994 | A |
5281762 | Long et al. | Jan 1994 | A |
5287076 | Johnescu et al. | Feb 1994 | A |
5306171 | Marshall | Apr 1994 | A |
5332397 | Ingalsbe | Jul 1994 | A |
5332979 | Roskewitsch et al. | Jul 1994 | A |
5334050 | Andrews | Aug 1994 | A |
5340334 | Nguyen | Aug 1994 | A |
5346410 | Moore, Jr. | Sep 1994 | A |
5387130 | Fedder et al. | Feb 1995 | A |
5402088 | Pierro et al. | Mar 1995 | A |
5429520 | Morlion et al. | Jul 1995 | A |
5429521 | Morlion et al. | Jul 1995 | A |
5433617 | Morlion et al. | Jul 1995 | A |
5433618 | Morlion et al. | Jul 1995 | A |
5435757 | Fedder et al. | Jul 1995 | A |
5441424 | Morlion et al. | Aug 1995 | A |
5453026 | Ikegami | Sep 1995 | A |
5456619 | Belopolsky et al. | Oct 1995 | A |
5461392 | Mott et al. | Oct 1995 | A |
5480327 | Zola | Jan 1996 | A |
5483020 | Hardie et al. | Jan 1996 | A |
5484310 | McNamara et al. | Jan 1996 | A |
5487673 | Arte | Jan 1996 | A |
5495075 | Jonckheere et al. | Feb 1996 | A |
5496183 | Soes et al. | Mar 1996 | A |
5499935 | Powell | Mar 1996 | A |
5509827 | Huppenthal et al. | Apr 1996 | A |
5551893 | Johnson | Sep 1996 | A |
5554038 | Morlion et al. | Sep 1996 | A |
5562497 | Yagi et al. | Oct 1996 | A |
5580264 | Aoyama et al. | Dec 1996 | A |
5597328 | Mouissie | Jan 1997 | A |
5598627 | Saka et al. | Feb 1997 | A |
5632634 | Soes | May 1997 | A |
5637015 | Tan et al. | Jun 1997 | A |
5651702 | Hanning et al. | Jul 1997 | A |
5669789 | Law | Sep 1997 | A |
5691506 | Miyazaki et al. | Nov 1997 | A |
5702258 | Provencher et al. | Dec 1997 | A |
5733148 | Kaplan et al. | Mar 1998 | A |
5743765 | Andrews et al. | Apr 1998 | A |
5781759 | Kashiwabara | Jul 1998 | A |
5785555 | O'Sullivan et al. | Jul 1998 | A |
5796323 | Uchikoba et al. | Aug 1998 | A |
5797770 | Davis et al. | Aug 1998 | A |
5808236 | Brezina et al. | Sep 1998 | A |
5831491 | Buer et al. | Nov 1998 | A |
5865646 | Ortega et al. | Feb 1999 | A |
5924890 | Morin et al. | Jul 1999 | A |
5924899 | Paagman | Jul 1999 | A |
5961348 | Murphy | Oct 1999 | A |
5981869 | Kroger | Nov 1999 | A |
5982253 | Perrin et al. | Nov 1999 | A |
6019616 | Yagi et al. | Feb 2000 | A |
6022239 | Wright | Feb 2000 | A |
6053770 | Blom | Apr 2000 | A |
6083046 | Wu et al. | Jul 2000 | A |
6095825 | Liao | Aug 2000 | A |
6095872 | Lang et al. | Aug 2000 | A |
6116926 | Ortega et al. | Sep 2000 | A |
6144559 | Johnson et al. | Nov 2000 | A |
6146202 | Ramey et al. | Nov 2000 | A |
6152747 | McNamara | Nov 2000 | A |
6156975 | Roose | Dec 2000 | A |
6168466 | Chiou | Jan 2001 | B1 |
6168469 | Lu | Jan 2001 | B1 |
6174203 | Asao | Jan 2001 | B1 |
6174944 | Chiba et al. | Jan 2001 | B1 |
6203376 | Magajne et al. | Mar 2001 | B1 |
6215666 | Hileman et al. | Apr 2001 | B1 |
6217372 | Reed | Apr 2001 | B1 |
6238241 | Zhu et al. | May 2001 | B1 |
6273753 | Ko | Aug 2001 | B1 |
6273758 | Lloyd et al. | Aug 2001 | B1 |
6283786 | Margulis et al. | Sep 2001 | B1 |
6285542 | Kennedy, III et al. | Sep 2001 | B1 |
6293827 | Stokoe | Sep 2001 | B1 |
6299438 | Sahagian et al. | Oct 2001 | B1 |
6299483 | Cohen et al. | Oct 2001 | B1 |
6322379 | Ortega et al. | Nov 2001 | B1 |
6328601 | Yip et al. | Dec 2001 | B1 |
6347962 | Kline | Feb 2002 | B1 |
6350134 | Fogg et al. | Feb 2002 | B1 |
6364711 | Berg et al. | Apr 2002 | B1 |
6364718 | Polgar et al. | Apr 2002 | B1 |
6366471 | Edwards et al. | Apr 2002 | B1 |
6371788 | Bowling et al. | Apr 2002 | B1 |
6375510 | Asao | Apr 2002 | B2 |
6379188 | Cohen et al. | Apr 2002 | B1 |
6380485 | Beaman et al. | Apr 2002 | B1 |
6398588 | Bickford | Jun 2002 | B1 |
6409543 | Astbury, Jr. et al. | Jun 2002 | B1 |
6452789 | Pallotti et al. | Sep 2002 | B1 |
6482017 | Van Doorn | Nov 2002 | B1 |
6489563 | Zhao et al. | Dec 2002 | B1 |
6503103 | Cohen et al. | Jan 2003 | B1 |
6506076 | Cohen et al. | Jan 2003 | B2 |
6517360 | Cohen | Feb 2003 | B1 |
6517382 | Flickinger et al. | Feb 2003 | B2 |
6530790 | McNamara et al. | Mar 2003 | B1 |
6535367 | Carpenter et al. | Mar 2003 | B1 |
6537086 | Mac Mullin | Mar 2003 | B1 |
6537087 | McNamara et al. | Mar 2003 | B2 |
6551140 | Billman et al. | Apr 2003 | B2 |
6554647 | Cohen et al. | Apr 2003 | B1 |
6565387 | Cohen | May 2003 | B2 |
6574115 | Asano et al. | Jun 2003 | B2 |
6575772 | Soubh et al. | Jun 2003 | B1 |
6579116 | Brennan et al. | Jun 2003 | B2 |
6582244 | Fogg et al. | Jun 2003 | B2 |
6592390 | Davis et al. | Jul 2003 | B1 |
6592401 | Gardnet et al. | Jul 2003 | B1 |
6595802 | Watanabe et al. | Jul 2003 | B1 |
6602095 | Astbury, Jr. et al. | Aug 2003 | B2 |
6607402 | Cohen et al. | Aug 2003 | B2 |
6616864 | Jiang et al. | Sep 2003 | B1 |
6648676 | Lee | Nov 2003 | B1 |
6652296 | Kuroda et al. | Nov 2003 | B2 |
6652318 | Winings et al. | Nov 2003 | B1 |
6655966 | Rothermel et al. | Dec 2003 | B2 |
6685501 | Wu et al. | Feb 2004 | B1 |
6692262 | Loveless | Feb 2004 | B1 |
6705893 | Ko | Mar 2004 | B1 |
6709294 | Cohen et al. | Mar 2004 | B1 |
6713672 | Stickney | Mar 2004 | B1 |
6743057 | Davis et al. | Jun 2004 | B2 |
6749448 | Bright et al. | Jun 2004 | B2 |
6776649 | Pape et al. | Aug 2004 | B2 |
6776659 | Stokoe et al. | Aug 2004 | B1 |
6786771 | Gailus | Sep 2004 | B2 |
6797891 | Blair et al. | Sep 2004 | B1 |
6814619 | Stokoe et al. | Nov 2004 | B1 |
6816376 | Bright et al. | Nov 2004 | B2 |
6824426 | Spink, Jr. | Nov 2004 | B1 |
6830489 | Aoyama | Dec 2004 | B2 |
6843657 | Driscoll et al. | Jan 2005 | B2 |
6846115 | Shang et al. | Jan 2005 | B1 |
6872085 | Cohen et al. | Mar 2005 | B1 |
6896549 | Feuerreiter et al. | May 2005 | B2 |
6896556 | Wu | May 2005 | B1 |
6902688 | Narayan et al. | Jun 2005 | B2 |
6903934 | Lo et al. | Jun 2005 | B2 |
6916183 | Alger et al. | Jul 2005 | B2 |
6932649 | Rothermel et al. | Aug 2005 | B1 |
6955565 | Lloyd et al. | Oct 2005 | B2 |
6971887 | Trobough | Dec 2005 | B1 |
6979226 | Otsu et al. | Dec 2005 | B2 |
7025634 | Swantner et al. | Apr 2006 | B1 |
7044794 | Consoli et al. | May 2006 | B2 |
7056128 | Driscoll et al. | Jun 2006 | B2 |
7057570 | Irion, II et al. | Jun 2006 | B2 |
7070446 | Henry et al. | Jul 2006 | B2 |
7074086 | Cohen et al. | Jul 2006 | B2 |
7077658 | Ashman et al. | Jul 2006 | B1 |
7094102 | Cohen et al. | Aug 2006 | B2 |
7108556 | Cohen et al. | Sep 2006 | B2 |
7148428 | Meier et al. | Dec 2006 | B2 |
7158376 | Richardson et al. | Jan 2007 | B2 |
7163421 | Cohen et al. | Jan 2007 | B1 |
7175444 | Lang et al. | Feb 2007 | B2 |
7198519 | Regnier et al. | Apr 2007 | B2 |
7214097 | Hsu et al. | May 2007 | B1 |
7223915 | Hackman | May 2007 | B2 |
7234944 | Nordin et al. | Jun 2007 | B2 |
7244137 | Renfro et al. | Jul 2007 | B2 |
7267515 | Lappöhn | Sep 2007 | B2 |
7280372 | Grundy et al. | Oct 2007 | B2 |
7285018 | Kenny et al. | Oct 2007 | B2 |
7303438 | Dawiedczyk et al. | Dec 2007 | B2 |
7307293 | Fjelstad et al. | Dec 2007 | B2 |
7331816 | Krohn et al. | Feb 2008 | B2 |
7331830 | Minich | Feb 2008 | B2 |
7335063 | Cohen et al. | Feb 2008 | B2 |
7354274 | Minich | Apr 2008 | B2 |
7371117 | Gailus | May 2008 | B2 |
7384275 | Ngo | Jun 2008 | B2 |
7402048 | Meier et al. | Jul 2008 | B2 |
7422483 | Avery et al. | Sep 2008 | B2 |
7431608 | Sakaguchi et al. | Oct 2008 | B2 |
7445471 | Scherer et al. | Nov 2008 | B1 |
7448897 | Dawiedcyzk et al. | Nov 2008 | B2 |
7462942 | Tan et al. | Dec 2008 | B2 |
7485012 | Daugherty et al. | Feb 2009 | B2 |
7494383 | Cohen et al. | Feb 2009 | B2 |
7510439 | Gordon et al. | Mar 2009 | B2 |
7534142 | Avery et al. | May 2009 | B2 |
7540781 | Kenny et al. | Jun 2009 | B2 |
7549897 | Fedder et al. | Jun 2009 | B2 |
7575471 | Long | Aug 2009 | B2 |
7581990 | Kirk et al. | Sep 2009 | B2 |
7585188 | Regnier | Sep 2009 | B2 |
7588464 | Kim | Sep 2009 | B2 |
7613011 | Grundy et al. | Nov 2009 | B2 |
7621779 | Laurx et al. | Nov 2009 | B2 |
7652381 | Grundy et al. | Jan 2010 | B2 |
7654831 | Wu | Feb 2010 | B1 |
7658654 | Ohyama et al. | Feb 2010 | B2 |
7686659 | Peng | Mar 2010 | B2 |
7690930 | Chen et al. | Apr 2010 | B2 |
7713077 | McGowan et al. | May 2010 | B1 |
7719843 | Dunham | May 2010 | B2 |
7722401 | Kirk et al. | May 2010 | B2 |
7731537 | Amleshi et al. | Jun 2010 | B2 |
7744414 | Scherer et al. | Jun 2010 | B2 |
7753731 | Cohen et al. | Jul 2010 | B2 |
7771233 | Gailus | Aug 2010 | B2 |
7775802 | Defibaugh et al. | Aug 2010 | B2 |
7781294 | Mauder et al. | Aug 2010 | B2 |
7789676 | Morgan et al. | Sep 2010 | B2 |
7794240 | Cohen et al. | Sep 2010 | B2 |
7794278 | Cohen et al. | Sep 2010 | B2 |
7806698 | Regnier | Oct 2010 | B2 |
7811129 | Glover et al. | Oct 2010 | B2 |
7819675 | Ko et al. | Oct 2010 | B2 |
7824197 | Westman et al. | Nov 2010 | B1 |
7857630 | Hermant et al. | Dec 2010 | B2 |
7862344 | Morgan et al. | Jan 2011 | B2 |
7871294 | Long | Jan 2011 | B2 |
7871296 | Fowler et al. | Jan 2011 | B2 |
7874873 | Do et al. | Jan 2011 | B2 |
7887371 | Kenny et al. | Feb 2011 | B2 |
7906730 | Atkinson et al. | Mar 2011 | B2 |
7914304 | Cartier et al. | Mar 2011 | B2 |
7976318 | Fedder et al. | Jul 2011 | B2 |
7985097 | Gulla | Jul 2011 | B2 |
7993147 | Cole et al. | Aug 2011 | B2 |
8002581 | Whiteman, Jr. et al. | Aug 2011 | B1 |
8016616 | Glover et al. | Sep 2011 | B2 |
8018733 | Jia | Sep 2011 | B2 |
8036500 | McColloch | Oct 2011 | B2 |
8057267 | Johnescu | Nov 2011 | B2 |
8083553 | Manter et al. | Dec 2011 | B2 |
8100699 | Costello | Jan 2012 | B1 |
8157573 | Tanaka | Apr 2012 | B2 |
8162675 | Regnier et al. | Apr 2012 | B2 |
RE43427 | Dawiedczyk et al. | May 2012 | E |
8167651 | Glover et al. | May 2012 | B2 |
8182289 | Stokoe et al. | May 2012 | B2 |
8192222 | Kameyama | Jun 2012 | B2 |
8197285 | Farmer | Jun 2012 | B2 |
8210877 | Droesbeke | Jul 2012 | B2 |
8215968 | Cartier et al. | Jul 2012 | B2 |
8226441 | Regnier et al. | Jul 2012 | B2 |
8251745 | Johnescu et al. | Aug 2012 | B2 |
8253021 | Adachi et al. | Aug 2012 | B2 |
8272877 | Stokoe et al. | Sep 2012 | B2 |
8308491 | Nichols et al. | Nov 2012 | B2 |
8308512 | Ritter et al. | Nov 2012 | B2 |
8337243 | Elkhatib et al. | Dec 2012 | B2 |
8338713 | Fjelstad et al. | Dec 2012 | B2 |
8360805 | Schwarz | Jan 2013 | B2 |
8371875 | Gailus | Feb 2013 | B2 |
8371876 | Davis | Feb 2013 | B2 |
8382524 | Khilchenko et al. | Feb 2013 | B2 |
8398433 | Yang | Mar 2013 | B1 |
8419472 | Swanger et al. | Apr 2013 | B1 |
8439704 | Reed | May 2013 | B2 |
8449312 | Lang et al. | May 2013 | B2 |
8449330 | Schroll et al. | May 2013 | B1 |
8465302 | Regnier et al. | Jun 2013 | B2 |
8465320 | Long | Jun 2013 | B2 |
8469738 | Long | Jun 2013 | B2 |
8469745 | Davis et al. | Jun 2013 | B2 |
8475210 | Wang et al. | Jul 2013 | B2 |
8535065 | Costello et al. | Sep 2013 | B2 |
8540525 | Regnier et al. | Sep 2013 | B2 |
8550861 | Cohen et al. | Oct 2013 | B2 |
8553102 | Yamada | Oct 2013 | B2 |
8556657 | Nichols | Oct 2013 | B1 |
8588561 | Zbinden et al. | Nov 2013 | B2 |
8588562 | Zbinden et al. | Nov 2013 | B2 |
8597045 | Zhu et al. | Dec 2013 | B2 |
8597055 | Regnier et al. | Dec 2013 | B2 |
8657627 | McNamara et al. | Feb 2014 | B2 |
8672707 | Nichols et al. | Mar 2014 | B2 |
8678860 | Minich et al. | Mar 2014 | B2 |
8690604 | Davis | Apr 2014 | B2 |
8696378 | Behziz et al. | Apr 2014 | B2 |
8715003 | Buck et al. | May 2014 | B2 |
8740644 | Long | Jun 2014 | B2 |
8753145 | Lang et al. | Jun 2014 | B2 |
8758051 | Nonen et al. | Jun 2014 | B2 |
8771016 | Atkinson et al. | Jul 2014 | B2 |
8772636 | Yamaguchi et al. | Jul 2014 | B2 |
8787711 | Zbinden et al. | Jul 2014 | B2 |
8804342 | Behziz et al. | Aug 2014 | B2 |
8814595 | Cohen et al. | Aug 2014 | B2 |
8845364 | Wanha et al. | Sep 2014 | B2 |
8864521 | Atkinson et al. | Oct 2014 | B2 |
8870597 | Kawakami | Oct 2014 | B2 |
D718253 | Zerebilov et al. | Nov 2014 | S |
8888531 | Jeon | Nov 2014 | B2 |
8888533 | Westman et al. | Nov 2014 | B2 |
8911255 | Scherer et al. | Dec 2014 | B2 |
D720698 | Zerebilov et al. | Jan 2015 | S |
8926377 | Kirk et al. | Jan 2015 | B2 |
8944831 | Stoner et al. | Feb 2015 | B2 |
8992236 | Wittig et al. | Mar 2015 | B2 |
8992237 | Regnier et al. | Mar 2015 | B2 |
8998642 | Manter et al. | Apr 2015 | B2 |
9004942 | Paniauqa | Apr 2015 | B2 |
9011177 | Lloyd et al. | Apr 2015 | B2 |
9022806 | Girard, Jr. et al. | May 2015 | B2 |
9028201 | Kirk et al. | May 2015 | B2 |
9028281 | Kirk et al. | May 2015 | B2 |
9035183 | Kodama et al. | May 2015 | B2 |
9035200 | Kato et al. | May 2015 | B2 |
9040824 | Guetig et al. | May 2015 | B2 |
9071001 | Scherer et al. | Jun 2015 | B2 |
9118151 | Tran et al. | Aug 2015 | B2 |
9119292 | Gundel | Aug 2015 | B2 |
9124009 | Atkinson et al. | Sep 2015 | B2 |
9142921 | Wanha et al. | Sep 2015 | B2 |
9203171 | Yu et al. | Dec 2015 | B2 |
9210817 | Briant et al. | Dec 2015 | B2 |
9214768 | Pao et al. | Dec 2015 | B2 |
9219335 | Atkinson et al. | Dec 2015 | B2 |
9225085 | Girard, Jr. et al. | Dec 2015 | B2 |
9232676 | Sechrist et al. | Jan 2016 | B2 |
9246251 | Regnier et al. | Jan 2016 | B2 |
9246262 | Brown et al. | Jan 2016 | B2 |
9246278 | Dunwoody et al. | Jan 2016 | B1 |
9246280 | Neer et al. | Jan 2016 | B2 |
D750030 | Zerebilov et al. | Feb 2016 | S |
9257778 | Buck et al. | Feb 2016 | B2 |
9257794 | Wanha et al. | Feb 2016 | B2 |
9276358 | Ista et al. | Mar 2016 | B2 |
9312618 | Regnier et al. | Apr 2016 | B2 |
9350108 | Long | May 2016 | B2 |
9356401 | Homing et al. | May 2016 | B1 |
9362678 | Wanha et al. | Jun 2016 | B2 |
9373917 | Sypolt et al. | Jun 2016 | B2 |
9374165 | Zbinden et al. | Jun 2016 | B2 |
9385455 | Regnier et al. | Jul 2016 | B2 |
9389368 | Sharf | Jul 2016 | B1 |
9391407 | Bucher et al. | Jul 2016 | B1 |
9413112 | Helster et al. | Aug 2016 | B2 |
9450344 | Cartier, Jr. et al. | Sep 2016 | B2 |
9490558 | Wanha et al. | Nov 2016 | B2 |
9509101 | Cartier et al. | Nov 2016 | B2 |
9509102 | Sharf et al. | Nov 2016 | B2 |
9520689 | Cartier, Jr. et al. | Dec 2016 | B2 |
9531133 | Horning et al. | Dec 2016 | B1 |
9553381 | Regnier | Jan 2017 | B2 |
9559446 | Wetzel et al. | Jan 2017 | B1 |
9564696 | Gulla | Feb 2017 | B2 |
9608348 | Wanha et al. | Mar 2017 | B2 |
9651752 | Zbinden et al. | May 2017 | B2 |
9653829 | Long | May 2017 | B2 |
9660364 | Wig et al. | May 2017 | B2 |
9666961 | Horning et al. | May 2017 | B2 |
9671582 | Yeh et al. | Jun 2017 | B2 |
9685736 | Gailus et al. | Jun 2017 | B2 |
9711901 | Scholeno | Jul 2017 | B2 |
9735484 | Brubaker et al. | Aug 2017 | B2 |
9735495 | Gross | Aug 2017 | B2 |
9741465 | Gross et al. | Aug 2017 | B2 |
9774144 | Cartier, Jr. et al. | Sep 2017 | B2 |
9801301 | Costello | Oct 2017 | B1 |
9829662 | Kurashima | Nov 2017 | B2 |
9841572 | Zbinden et al. | Dec 2017 | B2 |
9843135 | Guetig et al. | Dec 2017 | B2 |
9929500 | Ista | Mar 2018 | B1 |
9929512 | Trout et al. | Mar 2018 | B1 |
D816044 | Zerebilov et al. | Apr 2018 | S |
9966165 | Gross et al. | May 2018 | B2 |
9985367 | Wanha et al. | May 2018 | B2 |
9985389 | Morgan et al. | May 2018 | B1 |
10020614 | Bucher | Jul 2018 | B1 |
10056706 | Wanha et al. | Aug 2018 | B2 |
10062984 | Regnier | Aug 2018 | B2 |
10069225 | Wanha et al. | Sep 2018 | B2 |
10096945 | Cartier, Jr. et al. | Oct 2018 | B2 |
10109937 | Zerebilov et al. | Oct 2018 | B2 |
10109968 | Khazen et al. | Oct 2018 | B2 |
10128627 | Kazav et al. | Nov 2018 | B1 |
10170869 | Gailus et al. | Jan 2019 | B2 |
10181663 | Regnier | Jan 2019 | B2 |
10205286 | Provencher et al. | Feb 2019 | B2 |
10276995 | Little | Apr 2019 | B2 |
10305224 | Girard | May 2019 | B2 |
10312638 | Girard, Jr. | Jun 2019 | B2 |
10374355 | Ayzenberg et al. | Aug 2019 | B2 |
20010012730 | Ramey et al. | Aug 2001 | A1 |
20010031579 | Fujino et al. | Oct 2001 | A1 |
20010042632 | Manov et al. | Nov 2001 | A1 |
20010046810 | Cohen et al. | Nov 2001 | A1 |
20020042223 | Belopolsky et al. | Apr 2002 | A1 |
20020088628 | Chen | Jul 2002 | A1 |
20020089464 | Joshi | Jul 2002 | A1 |
20020098738 | Astbury et al. | Jul 2002 | A1 |
20020111068 | Cohen et al. | Aug 2002 | A1 |
20020111069 | Astbury et al. | Aug 2002 | A1 |
20020136519 | Tinucci et al. | Sep 2002 | A1 |
20020157865 | Noda | Oct 2002 | A1 |
20020187688 | Edwards et al. | Dec 2002 | A1 |
20020197043 | Hwang | Dec 2002 | A1 |
20030045140 | Syed et al. | Mar 2003 | A1 |
20030073331 | Peloza et al. | Apr 2003 | A1 |
20030119362 | Nelson et al. | Jun 2003 | A1 |
20030186580 | Dambach et al. | Oct 2003 | A1 |
20040002262 | Murayama et al. | Jan 2004 | A1 |
20040005815 | Mizumura et al. | Jan 2004 | A1 |
20040018757 | Lang et al. | Jan 2004 | A1 |
20040020674 | McFadden et al. | Feb 2004 | A1 |
20040092164 | Lee | May 2004 | A1 |
20040094328 | Fjelstad et al. | May 2004 | A1 |
20040110421 | Broman et al. | Jun 2004 | A1 |
20040115968 | Cohen | Jun 2004 | A1 |
20040121633 | David et al. | Jun 2004 | A1 |
20040121652 | Gailus | Jun 2004 | A1 |
20040127078 | Tondreault et al. | Jul 2004 | A1 |
20040155328 | Kline | Aug 2004 | A1 |
20040185708 | Kuwahara | Sep 2004 | A1 |
20040196112 | Welbon et al. | Oct 2004 | A1 |
20040224559 | Nelson et al. | Nov 2004 | A1 |
20040229510 | Lloyd et al. | Nov 2004 | A1 |
20040259419 | Payne et al. | Dec 2004 | A1 |
20040264894 | Cooke et al. | Dec 2004 | A1 |
20050006126 | Aisenbrey | Jan 2005 | A1 |
20050032430 | Otsu et al. | Feb 2005 | A1 |
20050070160 | Cohen et al. | Mar 2005 | A1 |
20050087359 | Tachibana et al. | Apr 2005 | A1 |
20050093127 | Fjelstad et al. | May 2005 | A1 |
20050118869 | Evans | Jun 2005 | A1 |
20050133245 | Katsuyama et al. | Jun 2005 | A1 |
20050142944 | Ling et al. | Jun 2005 | A1 |
20050153584 | Bartley et al. | Jul 2005 | A1 |
20050176835 | Kobayashi et al. | Aug 2005 | A1 |
20050233610 | Tutt et al. | Oct 2005 | A1 |
20050239339 | Pepe | Oct 2005 | A1 |
20050283974 | Richard et al. | Dec 2005 | A1 |
20050287869 | Kenny et al. | Dec 2005 | A1 |
20060001163 | Kolbehdari et al. | Jan 2006 | A1 |
20060068640 | Gailus | Mar 2006 | A1 |
20060079119 | Wu | Apr 2006 | A1 |
20060091507 | Fjelstad et al. | May 2006 | A1 |
20060160429 | Dawiedczyk et al. | Jul 2006 | A1 |
20060216969 | Bright et al. | Sep 2006 | A1 |
20060228922 | Morriss | Oct 2006 | A1 |
20060249820 | Ice et al. | Nov 2006 | A1 |
20070004282 | Cohen et al. | Jan 2007 | A1 |
20070021001 | Laurx et al. | Jan 2007 | A1 |
20070021002 | Laurx et al. | Jan 2007 | A1 |
20070032104 | Yamada et al. | Feb 2007 | A1 |
20070037419 | Sparrowhawk | Feb 2007 | A1 |
20070042639 | Manter et al. | Feb 2007 | A1 |
20070054554 | Do et al. | Mar 2007 | A1 |
20070059961 | Cartier et al. | Mar 2007 | A1 |
20070099486 | Kameyama | May 2007 | A1 |
20070155241 | Lappöhn | Jul 2007 | A1 |
20070197095 | Feldman et al. | Aug 2007 | A1 |
20070207641 | Minich | Sep 2007 | A1 |
20070218765 | Cohen et al. | Sep 2007 | A1 |
20070243741 | Yang | Oct 2007 | A1 |
20070254517 | Olson et al. | Nov 2007 | A1 |
20070287332 | Gordon et al. | Dec 2007 | A1 |
20080026638 | Cohen et al. | Jan 2008 | A1 |
20080194146 | Gailus | Aug 2008 | A1 |
20080200955 | Tepic | Aug 2008 | A1 |
20080207023 | Tuin et al. | Aug 2008 | A1 |
20080246555 | Kirk et al. | Oct 2008 | A1 |
20080248658 | Cohen et al. | Oct 2008 | A1 |
20080248659 | Cohen et al. | Oct 2008 | A1 |
20080248660 | Kirk et al. | Oct 2008 | A1 |
20080264673 | Chi et al. | Oct 2008 | A1 |
20080267620 | Cole et al. | Oct 2008 | A1 |
20080297988 | Chau | Dec 2008 | A1 |
20080305689 | Zhang et al. | Dec 2008 | A1 |
20090011641 | Cohen et al. | Jan 2009 | A1 |
20090011645 | Laurx et al. | Jan 2009 | A1 |
20090011664 | Laurx et al. | Jan 2009 | A1 |
20090017682 | Amleshi et al. | Jan 2009 | A1 |
20090023330 | Stoner et al. | Jan 2009 | A1 |
20090051558 | Dorval | Feb 2009 | A1 |
20090098767 | Long | Apr 2009 | A1 |
20090117386 | Vacanti et al. | May 2009 | A1 |
20090130913 | Yi et al. | May 2009 | A1 |
20090130918 | Nguyen et al. | May 2009 | A1 |
20090166082 | Liu et al. | Jul 2009 | A1 |
20090176400 | Davis et al. | Jul 2009 | A1 |
20090188716 | Nagase | Jul 2009 | A1 |
20090205194 | Semba et al. | Aug 2009 | A1 |
20090215309 | Mongold et al. | Aug 2009 | A1 |
20090227141 | Pan | Sep 2009 | A1 |
20090239395 | Cohen et al. | Sep 2009 | A1 |
20090247012 | Pan | Oct 2009 | A1 |
20090291593 | Atkinson et al. | Nov 2009 | A1 |
20090305533 | Feldman et al. | Dec 2009 | A1 |
20090311908 | Fogg et al. | Dec 2009 | A1 |
20100009571 | Scherer et al. | Jan 2010 | A1 |
20100018738 | Chen et al. | Jan 2010 | A1 |
20100078738 | Chambers et al. | Apr 2010 | A1 |
20100081302 | Atkinson et al. | Apr 2010 | A1 |
20100099299 | Moriyama et al. | Apr 2010 | A1 |
20100112850 | Rao et al. | May 2010 | A1 |
20100144167 | Fedder et al. | Jun 2010 | A1 |
20100144168 | Glover et al. | Jun 2010 | A1 |
20100144175 | Helster et al. | Jun 2010 | A1 |
20100144201 | Defibaugh et al. | Jun 2010 | A1 |
20100144203 | Glover et al. | Jun 2010 | A1 |
20100177489 | Yagisawa | Jul 2010 | A1 |
20100183141 | Arai et al. | Jul 2010 | A1 |
20100203768 | Kondo et al. | Aug 2010 | A1 |
20100221951 | Pepe et al. | Sep 2010 | A1 |
20100248544 | Xu et al. | Sep 2010 | A1 |
20100291806 | Minich et al. | Nov 2010 | A1 |
20100294530 | Atkinson et al. | Nov 2010 | A1 |
20110003509 | Gailus | Jan 2011 | A1 |
20110059643 | Kuwahara et al. | Mar 2011 | A1 |
20110074213 | Schaffer et al. | Mar 2011 | A1 |
20110081114 | Togami et al. | Apr 2011 | A1 |
20110104948 | Girard, Jr. et al. | May 2011 | A1 |
20110130038 | Cohen et al. | Jun 2011 | A1 |
20110177699 | Crofoot et al. | Jul 2011 | A1 |
20110212632 | Stoke et al. | Sep 2011 | A1 |
20110212633 | Regnier et al. | Sep 2011 | A1 |
20110212649 | Stokoe et al. | Sep 2011 | A1 |
20110212650 | Amleshi et al. | Sep 2011 | A1 |
20110223807 | Jeon et al. | Sep 2011 | A1 |
20110230095 | Atkinson et al. | Sep 2011 | A1 |
20110230096 | Atkinson et al. | Sep 2011 | A1 |
20110230104 | Lang et al. | Sep 2011 | A1 |
20110263156 | Ko | Oct 2011 | A1 |
20110287663 | Gailus et al. | Nov 2011 | A1 |
20110300757 | Regnier et al. | Dec 2011 | A1 |
20120003848 | Casher et al. | Jan 2012 | A1 |
20120034820 | Lang et al. | Feb 2012 | A1 |
20120052712 | Wang et al. | Mar 2012 | A1 |
20120058665 | Zerebilov et al. | Mar 2012 | A1 |
20120064762 | Muroi et al. | Mar 2012 | A1 |
20120064779 | Wu | Mar 2012 | A1 |
20120077369 | Andersen | Mar 2012 | A1 |
20120077380 | Minich et al. | Mar 2012 | A1 |
20120094531 | Mathews | Apr 2012 | A1 |
20120094536 | Khilchenko et al. | Apr 2012 | A1 |
20120135643 | Lange et al. | May 2012 | A1 |
20120145429 | Nordin et al. | Jun 2012 | A1 |
20120156929 | Manter et al. | Jun 2012 | A1 |
20120164860 | Wang et al. | Jun 2012 | A1 |
20120184136 | Ritter | Jul 2012 | A1 |
20120202363 | McNamara et al. | Aug 2012 | A1 |
20120202386 | McNamara et al. | Aug 2012 | A1 |
20120214344 | Cohen et al. | Aug 2012 | A1 |
20120252266 | Ling et al. | Oct 2012 | A1 |
20120329294 | Raybold et al. | Dec 2012 | A1 |
20130012038 | Kirk et al. | Jan 2013 | A1 |
20130017712 | Liu et al. | Jan 2013 | A1 |
20130017715 | Laarhoven et al. | Jan 2013 | A1 |
20130017733 | Kirk et al. | Jan 2013 | A1 |
20130034977 | Cina et al. | Feb 2013 | A1 |
20130034999 | Szczesny et al. | Feb 2013 | A1 |
20130078870 | Milbrand, Jr. | Mar 2013 | A1 |
20130092429 | Ellison | Apr 2013 | A1 |
20130109232 | Paniaqua | May 2013 | A1 |
20130130547 | Simpson et al. | May 2013 | A1 |
20130143442 | Cohen et al. | Jun 2013 | A1 |
20130149899 | Schroll et al. | Jun 2013 | A1 |
20130188325 | Garman et al. | Jul 2013 | A1 |
20130196553 | Gailus | Aug 2013 | A1 |
20130210246 | Davis et al. | Aug 2013 | A1 |
20130223036 | Herring et al. | Aug 2013 | A1 |
20130225006 | Khilchenko et al. | Aug 2013 | A1 |
20130270000 | Buck et al. | Oct 2013 | A1 |
20130273781 | Buck et al. | Oct 2013 | A1 |
20130288521 | McClellan et al. | Oct 2013 | A1 |
20130288525 | McClellan et al. | Oct 2013 | A1 |
20130288539 | McClellan et al. | Oct 2013 | A1 |
20130340251 | Regnier et al. | Dec 2013 | A1 |
20140004724 | Cartier, Jr. et al. | Jan 2014 | A1 |
20140004726 | Cartier, Jr. et al. | Jan 2014 | A1 |
20140004746 | Cartier, Jr. et al. | Jan 2014 | A1 |
20140017944 | Wu et al. | Jan 2014 | A1 |
20140030905 | Phillips et al. | Jan 2014 | A1 |
20140035755 | Ward et al. | Feb 2014 | A1 |
20140041937 | Lloyd et al. | Feb 2014 | A1 |
20140057493 | De Geest et al. | Feb 2014 | A1 |
20140057494 | Cohen | Feb 2014 | A1 |
20140057498 | Cohen | Feb 2014 | A1 |
20140065883 | Cohen et al. | Mar 2014 | A1 |
20140073174 | Yang | Mar 2014 | A1 |
20140073181 | Yang | Mar 2014 | A1 |
20140099844 | Dunham | Apr 2014 | A1 |
20140154927 | Nonen et al. | Jun 2014 | A1 |
20140182885 | Gross et al. | Jul 2014 | A1 |
20140182890 | Gross et al. | Jul 2014 | A1 |
20140193993 | Meng et al. | Jul 2014 | A1 |
20140206230 | Rost et al. | Jul 2014 | A1 |
20140242844 | Wanha et al. | Aug 2014 | A1 |
20140273551 | Resendez et al. | Sep 2014 | A1 |
20140273557 | Cartier, Jr. et al. | Sep 2014 | A1 |
20140273627 | Cartier, Jr. et al. | Sep 2014 | A1 |
20140287627 | Cohen | Sep 2014 | A1 |
20140308852 | Gulla | Oct 2014 | A1 |
20140335707 | Johnescu et al. | Nov 2014 | A1 |
20140335736 | Regnier et al. | Nov 2014 | A1 |
20150056856 | Atkinson et al. | Feb 2015 | A1 |
20150079829 | Brodsgaard | Mar 2015 | A1 |
20150079845 | Wanha et al. | Mar 2015 | A1 |
20150093083 | Tsai et al. | Apr 2015 | A1 |
20150180578 | Leigh et al. | Jun 2015 | A1 |
20150194751 | Herring | Jul 2015 | A1 |
20150200496 | Simpson et al. | Jul 2015 | A1 |
20150207247 | Regnier et al. | Jul 2015 | A1 |
20150214666 | Schumacher | Jul 2015 | A1 |
20150236450 | Davis | Aug 2015 | A1 |
20150236451 | Cartier, Jr. et al. | Aug 2015 | A1 |
20150236452 | Cartier, Jr. et al. | Aug 2015 | A1 |
20150255926 | Paniagua | Sep 2015 | A1 |
20150280351 | Bertsch | Oct 2015 | A1 |
20150288108 | Fischer | Oct 2015 | A1 |
20150303608 | Zerebilov et al. | Oct 2015 | A1 |
20150357736 | Tran et al. | Dec 2015 | A1 |
20150357761 | Wanha et al. | Dec 2015 | A1 |
20160004022 | Ishii et al. | Jan 2016 | A1 |
20160013594 | Costello et al. | Jan 2016 | A1 |
20160013596 | Regnier | Jan 2016 | A1 |
20160018606 | Xue et al. | Jan 2016 | A1 |
20160028189 | Resendez et al. | Jan 2016 | A1 |
20160049746 | Gross | Feb 2016 | A1 |
20160054527 | Tang et al. | Feb 2016 | A1 |
20160056553 | Brubaker et al. | Feb 2016 | A1 |
20160104948 | Droesbeke et al. | Apr 2016 | A1 |
20160104956 | Santos et al. | Apr 2016 | A1 |
20160111825 | Wanha et al. | Apr 2016 | A1 |
20160118745 | Droesbeke et al. | Apr 2016 | A1 |
20160131859 | Ishii et al. | May 2016 | A1 |
20160141807 | Gailus et al. | May 2016 | A1 |
20160149343 | Atkinson et al. | May 2016 | A1 |
20160149362 | Ritter et al. | May 2016 | A1 |
20160150633 | Cartier, Jr. | May 2016 | A1 |
20160150639 | Gailus et al. | May 2016 | A1 |
20160150645 | Gailus et al. | May 2016 | A1 |
20160181713 | Peloza et al. | Jun 2016 | A1 |
20160181732 | Laurx et al. | Jun 2016 | A1 |
20160190747 | Regnier et al. | Jun 2016 | A1 |
20160197423 | Regnier | Jul 2016 | A1 |
20160218455 | Sayre et al. | Jul 2016 | A1 |
20160233598 | Wittig | Aug 2016 | A1 |
20160268714 | Wanha et al. | Sep 2016 | A1 |
20160268739 | Zerebilov et al. | Sep 2016 | A1 |
20160274316 | Verdiell | Sep 2016 | A1 |
20160308296 | Pitten et al. | Oct 2016 | A1 |
20160322770 | Zerebilov | Nov 2016 | A1 |
20160344141 | Cartier et al. | Nov 2016 | A1 |
20170025783 | Astbury et al. | Jan 2017 | A1 |
20170033478 | Wanha et al. | Feb 2017 | A1 |
20170042070 | Baumler et al. | Feb 2017 | A1 |
20170047692 | Cartier et al. | Feb 2017 | A1 |
20170077643 | Zbinden et al. | Mar 2017 | A1 |
20170093093 | Cartier, Jr. et al. | Mar 2017 | A1 |
20170098901 | Regnier | Apr 2017 | A1 |
20170162960 | Wanha et al. | Jun 2017 | A1 |
20170294743 | Gailus et al. | Oct 2017 | A1 |
20170302011 | Wanha et al. | Oct 2017 | A1 |
20170302030 | Chiang et al. | Oct 2017 | A1 |
20170338595 | Girard, Jr. | Nov 2017 | A1 |
20170346234 | Girard | Nov 2017 | A1 |
20170365942 | Regnier | Dec 2017 | A1 |
20170365943 | Wanha et al. | Dec 2017 | A1 |
20180006416 | Lloyd et al. | Jan 2018 | A1 |
20180034175 | Lloyd et al. | Feb 2018 | A1 |
20180034190 | Ngo | Feb 2018 | A1 |
20180040989 | Chen | Feb 2018 | A1 |
20180062323 | Kirk et al. | Mar 2018 | A1 |
20180089966 | Ward et al. | Mar 2018 | A1 |
20180109043 | Provencher et al. | Apr 2018 | A1 |
20180145438 | Cohen | May 2018 | A1 |
20180212385 | Little | Jul 2018 | A1 |
20180219331 | Cartier, Jr. et al. | Aug 2018 | A1 |
20180219332 | Brungard et al. | Aug 2018 | A1 |
20180278000 | Regnier | Sep 2018 | A1 |
20180287280 | Ratkovic et al. | Oct 2018 | A1 |
20180309214 | Lloyd et al. | Oct 2018 | A1 |
20180366880 | Zerebilov et al. | Dec 2018 | A1 |
20190013617 | Ayzenberg et al. | Jan 2019 | A1 |
20190013625 | Gailus et al. | Jan 2019 | A1 |
20190020155 | Trout et al. | Jan 2019 | A1 |
20190044284 | Dunham | Feb 2019 | A1 |
20190044285 | Dunham | Feb 2019 | A1 |
20190157812 | Gailus et al. | May 2019 | A1 |
20190173236 | Provencher et al. | Jun 2019 | A1 |
20190252832 | Girard | Aug 2019 | A1 |
20190337472 | Nakai | Nov 2019 | A1 |
20200021045 | Sato | Jan 2020 | A1 |
20200244025 | Winey et al. | Jul 2020 | A1 |
Number | Date | Country |
---|---|---|
1168547 | Dec 1997 | CN |
2519434 | Oct 2002 | CN |
1127783 | Nov 2003 | CN |
101164204 | Apr 2008 | CN |
101312275 | Nov 2008 | CN |
101752700 | Jun 2010 | CN |
201562814 | Aug 2010 | CN |
101841107 | Sep 2010 | CN |
201781115 | Mar 2011 | CN |
102598430 | Jul 2012 | CN |
202678544 | Jan 2013 | CN |
103178408 | Jun 2013 | CN |
104011937 | Aug 2014 | CN |
105390857 | Mar 2016 | CN |
105406286 | Mar 2016 | CN |
106104933 | Nov 2016 | CN |
201480017853.4 | Feb 2017 | CN |
201580069567.7 | Jun 2019 | CN |
201780046854.5 | Nov 2019 | CN |
3447556 | Jul 1986 | DE |
0 997 756 | May 2000 | EP |
1 207 587 | May 2002 | EP |
1 779 472 | May 2007 | EP |
2 169 770 | Mar 2010 | EP |
11166820.8 | Jan 2012 | EP |
14773438.8 | Oct 2016 | EP |
14855318.3 | Apr 2017 | EP |
1272347 | Apr 1972 | GB |
02-079571 | Jun 1990 | JP |
7302649 | Nov 1995 | JP |
2000-311749 | Nov 2000 | JP |
2003-109708 | Apr 2003 | JP |
2003-208928 | Jul 2003 | JP |
2004-031257 | Jan 2004 | JP |
2004-071404 | Mar 2004 | JP |
2006-108115 | Apr 2006 | JP |
2006-260850 | Sep 2006 | JP |
2010-153191 | Jul 2010 | JP |
2010-211937 | Sep 2010 | JP |
2010-266729 | Nov 2010 | JP |
2011-018651 | Jan 2011 | JP |
2012-516021 | Jul 2012 | JP |
2013-021600 | Jan 2013 | JP |
2014-229597 | Dec 2014 | JP |
2016-528688 | Sep 2016 | JP |
10-1989-0007458 | Jun 1989 | KR |
10-2015-0067010 | Jun 2015 | KR |
10-2015-0101020 | Sep 2015 | KR |
10-2016-0038192 | Apr 2016 | KR |
M357771 | May 2009 | TW |
M441942 | Nov 2012 | TW |
201334318 | Aug 2013 | TW |
WO 8805218 | Jul 1988 | WO |
WO 9712428 | Apr 1997 | WO |
WO 9956352 | Nov 1999 | WO |
WO 2004059794 | Jul 2004 | WO |
WO 2004059801 | Jul 2004 | WO |
PCTUS2005034605 | Jan 2006 | WO |
WO 2006002356 | Jan 2006 | WO |
WO 2006039277 | Apr 2006 | WO |
WO 2007005597 | Jan 2007 | WO |
WO 2007005599 | Jan 2007 | WO |
PCTUS2006025562 | Oct 2007 | WO |
WO 2008072322 | Jun 2008 | WO |
WO 2008124057 | Oct 2008 | WO |
WO 2010039188 | Apr 2010 | WO |
PCTUS2010056495 | Jan 2011 | WO |
PCTUS2010056482 | Mar 2011 | WO |
WO 2011073259 | Jun 2011 | WO |
PCTUS20110234747 | Jul 2011 | WO |
PCTUS2011026139 | Nov 2011 | WO |
WO 2012078434 | Jun 2012 | WO |
PCTUS2012023689 | Sep 2012 | WO |
WO 2013006592 | Jan 2013 | WO |
PCTUS2012060610 | Mar 2013 | WO |
PCTUS2014031448 | Jul 2014 | WO |
PCTUS2014026381 | Aug 2014 | WO |
PCTUS2014061681 | Jan 2015 | WO |
WO 2015013430 | Jan 2015 | WO |
PCTUS2015012542 | Apr 2015 | WO |
PCTUS2015012463 | May 2015 | WO |
WO 2015112717 | Jul 2015 | WO |
PCTUS2014026381 | Sep 2015 | WO |
PCTUS2014031448 | Oct 2015 | WO |
PCTUS2015060472 | Mar 2016 | WO |
PCTUS2014061681 | May 2016 | WO |
PCTUS2016043358 | Nov 2016 | WO |
PCTUS2016065271 | Mar 2017 | WO |
PCTUS2015060472 | May 2017 | WO |
PCTUS2017033122 | Aug 2017 | WO |
PCTUS2017035178 | Aug 2017 | WO |
PCTUS2017057402 | Jan 2018 | WO |
PCTUS2016065271 | Jun 2018 | WO |
PCTUS2017033122 | Nov 2018 | WO |
PCTUS2018039919 | Nov 2018 | WO |
PCTUS2018045201 | Nov 2018 | WO |
PCTUS2018045207 | Nov 2018 | WO |
PCTUS2017035178 | Dec 2018 | WO |
PCTUS2017057402 | May 2019 | WO |
PCTUS2018039919 | Jan 2020 | WO |
PCTUS2018045201 | Feb 2020 | WO |
PCTUS2018045207 | Feb 2020 | WO |
PCTUS2020014799 | May 2020 | WO |
PCTUS2020014826 | May 2020 | WO |
PCTUS2020019019 | Jun 2020 | WO |
Entry |
---|
Difference Between Weld Metal and Heat Affected Zone (HAZ), http://www.difference.minaprem.com/joining/difference-between-weld-metal-and-heat-affected-zone-haz/, retrieved Dec. 20, 2021. |
What is the Heat Affected Zone (HAZ)?, https://www.twi-global.com/technical-knowledge/faqs/what-is-the-heat-affected-zone, retrieved Dec. 20, 2021. |
Lehto et al, Characterization of local grain size variation of welded structural steel, https://link.springer.com/content/pdf/10.1007/s40194-016-0318-8.pdf. |
U.S. Appl. No. 16/054,807, filed Aug. 3, 2018, Dunham. |
U.S. Appl. No. 16/054,831, filed Aug. 3, 2018, Gailus et al. |
U.S. Appl. No. 16/391,013, filed Apr. 22, 2019, Girard. |
U.S. Appl. No. 16/750,967, filed Jan. 23, 2020, Zerebilov et al. |
U.S. Appl. No. 16/751,013, filed Jan. 23, 2020, Winey et al. |
International Search Report and Written Opinion for International Application No. PCT/US2010/056482 dated Mar. 14, 2011. |
International Search Report and Written Opinion for International Application No. PCT/US2010/056495 dated Jan. 25, 2011. |
International Search Report and Written Opinion for International Application No. PCT/US2011/026139 dated Nov. 22, 2011. |
International Search Report and Written Opinion for International Application No. PCT/US2012/023689 dated Sep. 12, 2012. |
International Search Report and Written Opinion for International Application No. PCT/US2012/060610 dated Mar. 29, 2013. |
International Search Report and Written Opinion for International Application No. PCT/US2014/026381 dated Aug. 12, 2014. |
International Preliminary Report on Patentability for International Application No. PCT/US2014/026381 dated Sep. 24, 2015. |
International Search Report and Written Opinion for International Application No. PCT/US2015/012463 dated May 13, 2015. |
Chinese Office Action for Application No. CN201580069567.7 dated Jun. 17, 2019. |
International Preliminary Report on Patentability for International Application No. PCT/US2015/060472 dated May 26, 2017. |
International Search Report and Written Opinion for International Application No. PCT/US2015/060472 dated Mar. 11, 2016. |
International Search Report and Written Opinion for International Application No. PCT/US2015/012542 dated Apr. 30, 2015. |
International Search Report and Written Opinion for International Application No. PCT/US2016/043358 dated Nov. 3, 2016. |
Chinese communication in connection with Chinese Application No. 201780046854.5 dated Nov. 28, 2019. |
International Search Report and Written Opinion for International Application No. PCT/US2017/035178 dated Aug. 18, 2017. |
International Preliminary Report on Patentability for International Application No. PCT/US2017/035178 dated Dec. 13, 2018. |
International Search Report and Written Opinion for International Application No. PCT/US2017/033122 dated Aug. 8, 2017. |
International Preliminary Report on Patentability for International Application No. PCT/US2017/033122 dated Nov. 29, 2018. |
International Search Report and Written Opinion for International Application No. PCT/US2017/057402 dated Jan. 19, 2018. |
International Preliminary Report on Patentability for International Application No. PCT/US2017/057402 dated May 2, 2019. |
International Search Report and Written Opinion for International Application No. PCT/US2018/045207 dated Nov. 29, 2018. |
International Preliminary Report on Patentability for International Application No. PCT/US2018/045207 dated Feb. 13, 2020. |
International Search Report and Written Opinion for International Application No. PCT/US2018/039919, dated Nov. 8, 2018. |
International Preliminary Report on Patentability for International Application No. PCT/US2018/039919, dated Jan. 16, 2020. |
International Search Report and Written Opinion for International Application No. PCT/US2018/045201 dated Nov. 26, 2018. |
International Preliminary Report on Patentability for International Application No. PCT/US2018/045201 dated Feb. 13, 2020. |
International Search Report and Written Opinion dated Jun. 24, 2020 in connection with International Application No. PCT/US2020/019019. |
Chinese Office Action for Chinese Application No. 201480017853.4 dated Feb. 4, 2017. |
Extended European Search for European Application No. 14773438.8 dated Oct. 12, 2016. |
International Search Report and Written Opinion for International Application No. PCT/US2014/031448 dated Jul. 10, 2014. |
International Preliminary Report on Patentability for International Application No. PCT/US2014/031448 dated Oct. 8, 2015. |
Extended European Search Report for European Application No. 14855318.3 dated Apr. 21, 2017. |
International Search Report and Written Opinion for International Application No. PCT/US2014/061681 dated Jan. 27, 2015. |
International Preliminary Report on Patentability for International Application No. PCT/US2014/061681 dated May 6, 2016. |
International Search Report and Written Opinion for International Application No. PCT/US2016/065271 dated Mar. 24, 2017. |
International Preliminary Report on Patentability for International Application No. PCT/US2016/065271 dated Jun. 21, 2018. |
International Search Report and Written Opinion for International Application No. PCT/US2020/014799, dated May 27, 2020. |
International Search Report and Written Opinion for International Application No. PCT/US2020/014826, dated May 27, 2020. |
Extended European Search Report for European Application No. EP 11166820.8 dated Jan. 24, 2012. |
International Search Report and Written Opinion for International Application No. PCT/US2005/034605 dated Jan. 26, 2006. |
International Search Report and Written Opinion for International Application No. PCT/US2006/25562 dated Oct. 31, 2007. |
International Search Report and Written Opinion for International Application No. PCT/US2011/034747 dated Jul. 28, 2011. |
[No Author Listed], Amphenol TCS expands the Xcede Platform with 85 Ohm Connectors and High-Speed Cable Solutions. Press Release. Published Feb. 25, 2009. http://www.amphenol.com/about/news_archive/2009/58 [Retrieved on Mar. 26, 2019 from Wayback Machine]. 4 pages. |
[No Author Listed], Agilent. Designing Scalable 10G Backplane Interconnect Systems Utilizing Advanced Verification Methodologies. White Paper, Published May 5, 2012. 24 pages. |
[No Author Listed], Carbon Nanotubes for Electromagnetic Interference Shielding. SBIR/STTR. Award Information. Program Year 2001. Fiscal Year 2001. Materials Research Institute, LLC. Chu et al. Available at http://sbir.gov/sbirsearch/detail/225895. Last accessed Sep. 19, 2013. 2 pages. |
[No Author Listed], File:Wrt54gl-layout.jpg Sep. 8, 2006. Retrieved from the Internet: https://xinu.mscs.mu.edu/File:Wrt54gl-layout.jpg [retrieved on Apr. 9, 2019]. 2 pages. |
[No Author Listed], Hitachi Cable America Inc. Direct Attach Cables. 8 pages. Retrieved Aug. 10, 2017 from http://www.hca.hitachi-cable.com/products/hca/catalog/pdfs/direct-attach-cable-assemblies.pdf [last accessed Mar. 6, 2019]. |
[No Author Listed], Size 8 High Speed Quadrax and Differential Twinax Contacts for Use in MIL-DTL-38999 Special Subminiature Cylindrical and ARINC 600 Rectangular Connectors. Published May 2008. 10 pages. Retrieved from https://www.peigenesis.com/images/content/news/amphenol_quadrax.pdf. |
Beaman, High Performance Mainframe Computer Cables. 1997 Electronic Components and Technology Conference. 1997;911-7. |
Fjelstad, Flexible Circuit Technology. Third Edition. BR Publishing, Inc. Sep. 2006. 226 pages. ISBN 0-9667075-0-8. |
Shi et al., Improving Signal Integrity in Circuit Boards by Incorporating Absorbing Materials. 2001 Proceedings. 51st Electronic Components and Technology Conference, Orlando FL. 2001:1451-56. |
Lloyd et al., High Speed Bypass Cable Assembly, U.S. Appl. No. 15/715,939, filed Sep. 26, 2017. |
Lloyd et al., High Speed Bypass Cable Assembly, U.S. Appl. No. 15/271,903, filed Sep. 21, 2016. |
Montemayor, Electrically Conductive Silicone Adhesive. Dow Corning Corp. SMTA International Conference, Sep. 2002. 7 pages. |
Zerebilov et al., I/O Connector Configured for Cable Connection to a Midboard, U.S. Appl. No. 16/750,967, filed Jan. 23, 2020. |
Number | Date | Country | |
---|---|---|---|
20200274301 A1 | Aug 2020 | US |
Number | Date | Country | |
---|---|---|---|
62809381 | Feb 2019 | US |