Claims
- 1. A high pressure chamber comprising upper and lower enclosures and a high pressure seal, wherein the high pressure seal is formed between two vertically aligned engaging parts of rigid elements which are secured to the upper and lower enclosures, and wherein the high pressure seal includes a coating of a noble metal over a contact surface of at least one of the engaging parts, and means for urging the vertically aligned engaging parts into direct contact with each other in a vertical direction only, wherein the high pressure seal is devoid of a separate gasket between the engaging parts when the engaging parts are in direct contact with each other wherein the upper and lower enclosures define a semiconductor materials processing chamber, and wherein at least one of the engaging parts has a curved contact surface.
- 2. A chamber as claimed in claim 1, wherein the rigid elements are made of steel or aluminium.
- 3. A chamber as claimed in claim 2, wherein a first of the two engaging parts is a rigid ring member sealingly secured to the upper enclosure, and wherein a second of the two engaging parts is an anvil sealingly secured to the lower enclosure.
- 4. A chamber as claimed in claim 2, wherein the coating is between 15 and 20 μm thick.
- 5. A chamber as claimed in claim 2, wherein the coating is gold, platinum, pallidium or copper or a combination of these.
- 6. A chamber as claimed in claim 2, wherein the high pressure seal further includes an underlayer beneath the coating of the noble metal.
- 7. A chamber as claimed in claim 6, wherein the underlayer is approximately 2 μm thick.
- 8. A chamber as claimed in claim 6, wherein the underlayer is nickel.
- 9. A chamber as claimed in claim 8, wherein the underlayer is approximately 2 μm thick.
- 10. A chamber as claimed in claim 9, wherein the coating is between 15 and 20 μm thick.
- 11. A chamber as claimed in claim 1, wherein the high pressure seal further includes an underlayer beneath the coating of the noble metal.
- 12. A chamber as claimed in claim 11, wherein the underlayer is nickel.
- 13. A chamber as claimed in claim 12, wherein the underlayer is approximately 2 μm thick.
- 14. A chamber as claimed in claim 11, wherein the underlayer is approximately 2 μm thick.
- 15. A chamber as claimed in claim 14, wherein the coating is between 15 and 20 μm thick.
- 16. A chamber as claimed in claim 1, wherein the coating is between 15 and 20 μm thick.
- 17. A chamber as claimed in claim 1, wherein the coating is gold, platinum, pallidium or copper or a combination of these.
- 18. A chamber as claimed in claim 1, wherein a first of the two engaging parts is a rigid ring member sealingly secured to the upper enclosure, and wherein a second of the two engaging parts, is an anvil sealingly secured to the lower enclosure.
- 19. The high pressure chamber of claim 1, wherein the upper and lower enclosures form a semiconductor wafer processing chamber.
Priority Claims (1)
Number |
Date |
Country |
Kind |
9616214 |
Aug 1996 |
GB |
|
CROSS-REFERENCE TO RELATED APPLICATION(S)
This is a Continuation of U.S. patent application Ser. No. 09/214,492, filed Jul. 30, 1999, now U.S. Pat. No. 6,279,917 granted Aug. 28, 2001, which is the U.S. national stage of International Application No. PCT/GB97/01963, filed Jul. 18, 1997. The entire contents of said U.S. application are incorporated herein by reference.
US Referenced Citations (8)
Foreign Referenced Citations (2)
Number |
Date |
Country |
57-167568 |
Oct 1982 |
JP |
WO 9308591 |
Apr 1993 |
WO |
Continuations (1)
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Number |
Date |
Country |
Parent |
09/214492 |
|
US |
Child |
09/901615 |
|
US |