Claims
- 1. A high rigidity glass-ceramic substrate having a predominant crystal phase or phases, said predominant crystal phase comprising MgTi2O5 or MgTi2O5 solid solution as a first crystal phase having the largest ratio of precipitation, and glass-ceramic constituting the glass-ceramic substrate having a Young's modulus within a range from 115 GPa to 160 GPa and containing less than 20 weight percent of an Al2O3 ingredient.
- 2. A high rigidity glass-ceramic as defined in claim 1 wherein said glass-ceramic has a predominant crystal phase or phases, said predominant crystal phase comprising MgTi2O5 or MgTi2O5 solid solution as a first crystal phase having the largest ratio of precipitation and at least one selected from the group consisting of enstatite (MgSiO3) or enstatite solid solution (MgSiO3 solid solution), spinel and spinel solid solution as a second crystal phase having a smaller ratio of precipitation than the first crystal phase, and glass-ceramic constituting the glass-ceramic substrate having a Young's modulus within a range of 115 GPa to 160 GPa and containing less than 20 weight percent of an Al2O3 ingredient.
- 3. A high rigidity glass-ceramic as defined in claim 1 wherein said glass-ceramic is substantially free from Li2O Na2O and K2O.
- 4. A high rigidity glass-ceramic substrate as defined in claim 1 having a surface roughness Ra (arithmetic mean roughness) after polishing of 8 Å or below and a maximum surface roughness Rmax after polishing of 100 Å or below.
- 5. A high rigidity glass-ceramic substrate as defined in claim 1 having a coefficient of thermal expansion within a range from 40×10−7/° C. to 60×10−7/° C. within a temperature range of −50° C. to +70° C.
- 6. A high rigidity glass-ceramic substrate as defined in claim 1 wherein said predominant crystal phase has a crystal grain diameter within a range from 0.05 μm to 0.30 μm.
- 7. A high rigidity glass-ceramic substrate as defined in claim 1 having a Vickers hardness within a range from 6860 N/mm2 to 8330 N mm2.
- 8. A high rigidity glass-ceramic substrate as defined in claim 1 wherein said glass-ceramic comprises in weight percent on the oxide basis:SiO240-60%MgO10-20%Al2O310% to less than 20%CaO0.5-4% SrO0.5-4% BaO0.5-5% ZrO20-5%TiO2more than 8% to 12%Bi2O30-6%Sb2O30-1%As2O30-1%
- 9. A high rigidity glass-ceramic substrate as defined in claim 1 further comprising an element selected from the group consisting of P, W, Nb, La, Y and Pb in an amount up to 3 weight percent on the oxide basis and/or an element selected from the group consisting of Cu, Co, Fe, Mn, Cr, Sn and V in an amount up to 2 weight percent on the oxide basis.
- 10. A high rigidity glass-ceramic substrate as defined in claim 1 which is provided by melting glass materials, forming and annealing a base glass and subjecting the base glass to heat treatment for crystallization under a nucleation temperature within a range from 650° C. to 750° C., a nucleation time within a range from one hour to twelve hours, a crystallization time within a range from one hour to twelve hours, a crystallization temperature within a range from 850° C. to 1000° C. and a crystallization time within a range from one hour to twelve hours.
- 11. A magnetic information storage disk provided by forming a film of a magnetic information storage medium on the high rigidity glass-ceramic substrate as defined in claim 1.
Priority Claims (2)
Number |
Date |
Country |
Kind |
11-154052 |
Jun 1999 |
JP |
|
2000-133213 |
May 2000 |
JP |
|
Parent Case Info
This application is a divisional of U.S. application Ser. No. 09/577,720, filed May 23, 2000, now U.S. Pat. No. 6,429,160.
US Referenced Citations (7)
Foreign Referenced Citations (4)
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0939395 |
Dec 1998 |
EP |
0941973 |
Mar 1999 |
EP |
11278864 |
Oct 1999 |
JP |
11278865 |
Oct 1999 |
JP |