Claims
- 1. A ceramic sensor as an integral device which comprises:a metal foil as a substrate; a single-crystalline thin film of a piezoelectric ceramic material formed on one surface of the metal foil wherein said single-crystalline thin film of a piezoelectric ceramic material has a thickness in the range from 0.2 to 10 μm and wherein the piezoelectric ceramic material is selected from the group consisting of aluminum nitride, zinc oxide nod lithium niobate; an electrode formed on the surface of the thin film of the piezoelectric ceramic material, and an external electric circuit connecting the metal foil and the electrode.
- 2. The ceramic sensor as claimed in claim 1 in which the metal foil has a thickness in the range from 5 to 1000 μm.
- 3. The ceramic sensor as claimed in claim 1 wherein the single crystalline thin film of a piezoelectric material is formed by a sputtering method.
Priority Claims (1)
Number |
Date |
Country |
Kind |
2000-243053 |
Aug 2000 |
JP |
|
Parent Case Info
This is a continuation of Ser. No. 09/733,924, filed Dec. 12, 2000, now abandoned.
US Referenced Citations (15)
Continuations (1)
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Number |
Date |
Country |
Parent |
09/733924 |
Dec 2000 |
US |
Child |
10/237121 |
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US |