Number | Date | Country | Kind |
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3-262842 | Sep 1991 | JPX |
Number | Name | Date | Kind |
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4866002 | Shizukuishi et al. | Sep 1989 | |
4890144 | Teng et al. | Dec 1989 | |
5122846 | Haken | Jun 1992 |
Entry |
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"Static-Noise Margin Analysis of MOS SRAM Cells", by E. Seevinck, IEEE Journal of Solid State Circuits, vol. SC-22, No. 5, Oct. 1987, pp. 748-754. |