Claims
- 1. An insulated conducting wire comprising:
a metal microwire having an outer diameter; and an inorganic cladding having an inner diameter;
wherein the microwire is positioned within the cladding; wherein the outer diameter of the microwire is at least about 2 microns less then the inner diameter of the cladding; wherein the insulated conducting wire is substantially free of bonding between the microwire and the cladding.
- 2. The insulated conducting wire of claim 1, wherein the insulated conducting wire comprises at least one portion that is at least 30 cm long that is free of bonding between the microwire and the cladding.
- 3. The insulated conducting wire of claim 1, wherein the insulated conducting wire comprises at least one portion that is at least 600 m long that is free of bonding between the microwire and the cladding.
- 4. The insulated conducting wire of claim 1, wherein the difference between the inner diameter of the cladding and the outer diameter of the microwire is from about 2 microns to about 40 microns.
- 5. The insulated conducting wire of claim 1, wherein the inner diameter of the cladding is from about 3 to about 290 microns.
- 6. The insulated conducting wire of claim 1, wherein the outer diameter of the microwire is from about 1 to about 250 microns.
- 7. The insulated conducting wire of claim 1, wherein the microwire comprises one or more metals selected from the group consisting of copper, silver, gold, platinum, tungsten, molybdenum, rhenium, rhenium/platinum alloy, high temperature metals, and alloys and composites thereof.
- 8. The insulated conducting wire of claim 1, wherein the cladding comprises one or more materials selected from the group consisting of fused silica, fused quartz, alumina, and a glass.
- 9. The insulated conducting wire of claim 1, wherein the cladding comprises one or more materials selected from the group consisting of Ti4+ doped fused silica, Ce4+ doped fused silica, and phosphorous doped silica.
- 10. The insulated conducting wire of claim 1, wherein the cladding comprises one or more materials selected from the group consisting of a doped glass and F− doped silica.
- 11. The insulated conducting wire of claim 1, further comprising a coating over the cladding
- 12. The insulated conducting wire of claim 11, wherein the coating comprises one or more materials selected from the group consisting of polyimide, a polymer, an organic coating, and an inorganic coating.
- 13. A decoy towline comprising the insulated conducting wire of claim 1.
- 14. The insulated conducting wire of claim 1;wherein the insulated conducting wire is flexible; and wherein the inner diameter of the cladding is from about 3 to about 290 microns.
- 15. The insulated conducting wire of claim 14, wherein the insulated conducting wire is at least about 600 meters long.
- 16. The insulated conducting wire of claim 1, where the insulated conducting wire is a general purpose insulated conducting wire.
- 17. The insulated conducting wire of claim 1, where the insulated conducting wire has the properties of being at least about 30 centimeters in length and being capable of conducting current while subjected to a potential of at least about 1000 V and a temperature of at least about 500° C. without dielectric breakdown.
- 18. The insulated conducting wire of claim 17, wherein the insulated conducting wire has a bend radius at room temperature of about 0.0625 inches or below.
- 19. The insulated conducting wire of claim 1, wherein the wire is capable of conducting current while subjected to a potential of at least about 5000 V and a temperature of at least about 1,000° C. without dielectric breakdown.
- 20. The insulated conducting wire of claim 19, wherein the insulated conducting wire has a bend radius at room temperature of about 0.0625 inches or below.
- 21. The insulated conducting wire of claim 1, wherein the wire is capable of conducting current while subjected to a potential of at least about 10,000 V and a temperature of at least about 650° C. without dielectric breakdown.
- 22. The insulated conducting wire of claim 21, wherein the insulated conducting wire has a bend radius at room temperature of about 0.0625 inches or below.
- 23. The insulated conducting wire of claim 1, wherein the microwire comprises platinum and the wire is capable of conducting current while subjected to a potential of at least about 1000 V and a temperature of at least about 1500° C. without dielectric breakdown.
- 24. The insulated conducting wire of claim 23, wherein the insulated conducting wire has a bend radius at room temperature of about 0.0625 inches or below.
- 25. The insulated conducting wire of claim 1, wherein the microwire comprises a surface having a melting point higher than the softening temperature of the cladding.
- 26. A process of making an insulated conducting wire, comprising the steps of:
providing a metal microwire having a surface and an outer diameter; providing an inorganic tube having an inner diameter larger than the outer diameter of the microwire; drawing the tube through a heating zone at draw process parameters such that the inner diameter of the drawn portion of the tube is reduced; inserting the microwire into the drawn portion of the tube, whereby the drawn portion of the tube becomes a cladding around the microwire; and adjusting the draw process parameters such that the inner diameter of the cladding is larger than the outer diameter of the microwire, the surface of the microwire is not melted, and the microwire and the cladding are not in contact with each other under thermal conditions that would cause bonding between the microwire and the cladding.
- 27. The process of claim 26, further comprising the step of maintaining the draw process parameters of the adjusting step such that a continuous length of insulated conducting wire is produced that is free of bonding between the microwire and the cladding.
- 28. The process of claim 26, wherein drawing step comprises reducing the inner diameter to about the same size as the outer diameter.
- 29. The process of claim 26, wherein the inserting step comprises contacting the microwire to the inside of the drawn tube by adjusting the draw process parameters to further reduce the inner diameter of the drawn portion of the tube.
- 30. The process of claim 26, wherein the microwire comprises a leader.
- 31. The process of claim 30, wherein the leader is attached to the microwire during the process.
- 32. The process of claim 26, wherein the difference between the inner diameter of the cladding and the outer diameter of the microwire is from about 2 microns to about 40 microns.
- 33. The process of claim 26, wherein the inner diameter is from about 3 to about 290 microns.
- 34. The process of claim 26, wherein the outer diameter is from about 1 to about 250 microns.
- 35. The process of claim 26, wherein the microwire comprises one or more metals selected from the group consisting of copper, silver, gold, platinum, tungsten, molybdenum, conductors, and alloys thereof.
- 36. The process of claim 26, wherein the cladding comprises one or more materials selected from the group consisting of fused silica, fused quartz, alumina, and a glass.
- 37. The process of claim 26, wherein the cladding comprises one or more materials selected from the group consisting of Ti4+ doped fused silica, Ce4+ doped fused silica, and phosphorous doped silica.
- 38. The process of claim 26, wherein the cladding comprises one or more materials selected from the group consisting of a doped glass and F− doped silica.
- 39. The process of claim 26, further comprising the step of placing a coating over the cladding.
- 40. The process of claim 39, wherein the coating comprises a one or more materials selected from the group consisting of polyimide, polymer, organic coating, and inorganic coating.
Parent Case Info
[0001] This application is a continuation-in-part application of U.S. patent application Ser. No. 10/326,962 to Tonucci et al., filed on Dec. 20, 2002, the entire file wrapper of which is incorporated herein by reference.
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
10326962 |
Dec 2002 |
US |
Child |
10868446 |
Jun 2004 |
US |