High work-function and high conductivity compositions of electrically conducting polymers

Information

  • Patent Grant
  • 8491819
  • Patent Number
    8,491,819
  • Date Filed
    Friday, March 25, 2011
    13 years ago
  • Date Issued
    Tuesday, July 23, 2013
    11 years ago
Abstract
Provided are compositions having high conductivity and high work-function. The compositions comprise an aqueous dispersion or solution of an electrically conducting polymer and a perfluorinated polymeric acid. The conductive polymers may be made from conjugated monomers or comonomers and a non-fluorinated polymeric acid, and the perfluorinated polymeric acides may be derived from perfluoroolefins having perfluoro-ether-sulfonic acid side chains. Devices embodying such compositions are also provided.
Description
BACKGROUND

1. Field of the Disclosure


The disclosure relates in general to high-conductivity, high work function compositions and more particularly to such compositions and their use in electronic devices.


2. Discussion of Related Art


Organic electronic devices define a category of products that include an active layer. Such devices convert electrical energy into radiation, detect signals through electronic processes, convert radiation into electrical energy, or include one or more organic semiconductor layers.


Organic light-emitting diodes (OLEDs) are organic electronic devices comprising an organic layer capable of electroluminescence. OLEDs can have the following configuration:

    • anode/buffer layer/EL material/cathode


The anode is typically any material that is transparent and has the ability to inject holes into the EL material, such as, for example, indium/tin oxide (ITO). The anode is optionally supported on a glass or plastic substrate. EL materials include fluorescent compounds, fluorescent and phosphorescent metal complexes, conjugated polymers, and mixtures thereof. The cathode is typically any material (such as, e.g., Ca or Ba) that has the ability to inject electrons into the EL material. The buffer layer is typically an electrically conducting polymer and facilitates the injection of holes from the anode into the EL material layer. The buffer layer may also have other properties which facilitate device performance.


There is a continuing need for buffer materials with improved properties.


SUMMARY

This disclosure describes simultaneous enhancement of electrical conductivity and work-function of aqueous electrically conducting polymer dispersions made by adding a perfluorinated polymeric acid dissolved in a high boiling solvent or a mixture of a high boiling solvent and water. The conducting polymers are made by oxidative polymerization of a conjugated monomer and a non-fluorinated polymeric acid in water. The high conductivity and high work function conducting polymers are useful for OLEDs as anode, photovoltaic cells, transparent conductive coatings, capacitor cathode of Ta2O5 and Al2O3, among other uses.


Disclosed are high conductivity and high work-function compositions comprising an aqueous dispersion or solution comprising an electrically conducting polymer and a perfluorinated polymeric acid.


In some embodiments, the conducting polymer comprises a polymer made of conjugated monomers or comonomers, and at least one non-fluorinated polymeric acid. In some more particular embodiments, the conjugated monomers are selected from thiophenes, selenophenes, thienothiophenes, and thienoselenophenes.


In an embodiment, the conducting polymer comprises a polymer made of conjugated monomers or comonomers, and at least one non-fluorinated polymeric acid. The conjugated monomers may be selected from the group consisting of 3,4-ethylenedioxythiophene and 3,4-ethylenedioxyselenophene.


In some embodiments, the perfluorinated polymeric acids are selected from perfluoroolefins having perfluoro-ether-sulfonic acid side chains. In further embodiments, the perfluorinated polymeric acids are selected from high molecular weight of perfluorinated sulfonamides. In yet further embodiments, the perfluorinated polymeric acid is copolymer of TFE (tetrafluoroethylene) and PSEPVE (3,6-dioxa-4-methyl-7-octene)sulfonic acid. In a still further embodiment, the composition comprises poly(3,4-ethylenedioxythiophene)-polystyrenesulfonic acid.


There are provided compositions have a conductivity of at least 100 S/cm.


There are provided compositions having a work function of at least 5.1 eV.


There are also provided device components and devices comprising compositions presented in the disclosure.







DETAILED DISCLOSURE

Aqueous electrically conducting polymer dispersions are generally made by oxidative polymerization of a conjugated monomer in the presence of a non-fluorinated polymeric acid. The conducting polymers have low conductivity and low work function, which limit their use for many applications.


This disclosure presents techniques for addition of a perfluorinated polymeric acid (PFA) to the aqueous polymer dispersions to achieve the high conductivity and high work function. The PFA can be first dissolved or dispersed in a high boiling polar solvent, such as ethylene glycol, dimethylsulfoxide, dimethylacetamide, N-methyl pyrrolidine, and the like. Boiling point of the high boiling solvents is preferably above 120° C. The PFA can also be first dissolved or dispersed in a mixture of a high boiling polar solvent. The addition can also be carried out by first adding a high boiling solvent to the aqueous polymer dispersion followed with a PFA solution or dispersion in water or by a reverse order of addition.


Initial conductivity of an aqueous conducting polymer dispersion should be at least 0.1 S (Siemens)/cm to achieve conductivity greater than 100 S/cm and work function greater than 5.1 eV after addition of a PFA polymer. For purposes of the information conveyed in this disclosure, the acid equivalent ratio of PFA to the non-fluorinated polymeric acid should be no more than 1.


In this disclosure, conjugated monomer includes thiophene, selenophene, 3,4-ethylenedioxythiophene, 3,4-ethylenedioxyselenophene, thienothiophene, thienoselenophene, and the like, pyrroles, and their comonomers. The polymeric acids are perfluorinated. The perfluoropolymeric acids (PFA) are preferably perfluoroolefins having perfluoro-ether-sulfonic acid side chains. pKa of the acids in water is preferably less than −5. The perfluoropolymeric acids include Nafion® polymer, a registered trademark of E. I. du Pont de Nemours and Company, Wilmington, Del., for copolymer of TFE (tetrafluoroethylene) and PSEPVE (3,6-dioxa-4-methyl-7-octenesulfonic acid). The acid also includes high molecular weight of perfluorinated sulfonimides.


For illustration of an embodiment of the disclosure, aqueous Poly(3,4-ethylenedioxythiophene), PEDOT,/PSSA conducting polymer dispersion is added with a Nafion® polymer, P-(TFE-PSEPVE). Electrical conductivity greater than 100 S/cm and work function greater than 5.1 eV, as has been illustrated.


The high conductivity and high work function conducting polymer compositions can be used alone as anode without ITO. It is also useful as polymer solid cathodes in tantalum and aluminum capacitors. It should be also useful as a transparent conductor for photovoltaic cells and transparent coatings.


A) General Procedure of Sample Preparation and Workfunction Measurement:


The materials illustrated in Examples and Comparative Examples were spin-coated at a spin speed of 2,000 rpm for one minute on 30 mm×30 mm glass/indium/tin semiconductive oxide (ITO) substrates. The ITO/glass substrates consist of 15 mm×20 mm ITO area at the center having ITO thickness of 100 to 150 nm. At one corner of 15 mm×20 mm ITO area, ITO film surface extended to the edge of the glass/ITO serves as electrical contact with one of two Kelvin probe electrodes. Prior to spin coating, ITO/glass substrates were cleaned and the ITO side was subsequently treated with oxygen plasma for 15 minutes. Once spin-coated with an aqueous sample dispersion, the deposited layer on the corner of the extended ITO film was removed with a water-wetted cotton-swath tip. The exposed ITO pad was used to make contact with the one of two electrodes of a Kelvin probe. The deposited film was then dried in air at a hot-plate set at 200° C. for 10 minutes. The dried film samples in the range of ˜30 nm thickness were then placed in a glass jug filled with nitrogen before capped till measurement.


For energy potential measurement, ambient-aged gold film was measured first as a reference prior to measurement of samples. The gold film on a same size of glass was placed in a cavity cut out at the bottom of a square steel container. On the side of the cavity, there are four retention clips to keep sample piece firmly in place. One of the retention clips is attached with electrical wire. The retention clip attached with the electrical wire was clipped on the ITO at the corner for making contact with the one of two electrodes of the Kelvin probe. The gold film was facing up a Kelvin probe tip protruded from the center of a steel lid, which was lowered to slightly above the center of the gold film surface. The lid was then screwed tightly onto the square steel container at four corners. A side port on the square steel container was connected with a tubing to allow nitrogen to sweep the Kelvin probe cell while a nitrogen exit port was capped with a septum in which a steel needle was inserted to maintain ambient pressure. The probe settings were then optimized for the probe and only height of the tip was adjusted during the measurement. The Kelvin probe tip was part of the second electrode which was also connected to a McAllister KP6500 Kelvin Probe meter having the following parameters: 1) frequency (Hz): 230; 2) amplitude (arbitrary): 20; 3) DC offset (volt): varied from sample to sample; 4) upper backing potential (volt): 2 ; 5) lower backing potential (volt): −2 ; 6) scan step: 1; 7) trigger delay (degree per full cycle): 0; 8) acquisition(A)/data(D) points:1024; 9) ND rate (Hz): 12405 @19.0 cycles; 10) D/A delay (milliseconds): 200; 11) set point gradient (unitless): 0.2; 12) step size (volt): 0.001; 13) maximum gradient deviation (volt): 0.001. As soon as the tracking gradient stabilized, the contact potential differential or CPD (expressed in volts) between gold film and probe tip was recorded. The CPD of gold and the probe tip was checked periodically to ensure reliable reference for calculation of energy potential of samples. For CPD measurement of samples with the probe tip, each sample was loaded into the cavity in the same manner as gold film sample. On the retention clip that makes electrical contact with the sample, extra care was taken to ensure that good electrical contact was made with the exposed ITO pad. During the CPD measurement a small stream of nitrogen was flown through the cell without disturbing the probe tip. Once CPD of a sample was recorded, work function of the sample was calculated by adding CPD of the sample to the difference of 4.7 eV and CPD of gold. 4.7 eV is the work function of an ambient-aged gold film [Surface Science, 316, (1994), P380]. The measured work function of a material is thus determined as required energy for removing electron from the surface of the material.


B) General Procedure of Film Sample Preparation, Four-probe Electrical Resistance Measurement and Calculation of Electrical Conductivity:


One drop of each dispersion sample was spread on a 3″×1″ microscope slide to cover 2/3 area of the slide. Excess of liquid was tilted to one edge of the slide to be soaked-up by a tissue. Once a smooth, homogeneous layer of liquid was ensured, the slide was placed on a flat surface for initial drying at room temperature. The slide was then placed on a hot plate set at 200° C. Once the hot plate reached the temperature monitored with a surface thermometer, it was kept at the temperature for additional 5 minutes. The whole operation was carried out in air. The slide was removed from the hot plate and the film was trimmed to a long strip with a razor blade. Width of the strip ranged from 0.2 cm to 0.7 cm and the length was about 3 cm. Silver paste was then painted perpendicular to the length of the strip to form four electrodes. The two inner parallel electrodes were about 0.3 cm to 0.5 cm apart and were connected to a Keithley model 616 electrometer for measurement of voltage when a known current supplied by a Keithley model 225 Current Source was applied to the two other parallel electrodes. A series of corresponding current/voltage data obtained at room temperature was recorded to see whether Ohm's law was followed. All the samples in Examples and Comparative Examples followed Ohm's law, which provided a more or less identical resistance for the corresponding current/voltage data. Once measured was done, the area in the two inner electrodes was measured for thickness with a Profilometer. Since resistance, thickness, separation length of the two inner electrodes and the width of the filmstrip are known, electrical conductivity is then calculated. The conductivity unit is expressed as S (Siemens)/cm.


EXAMPLES
Comparative Example 1

This example illustrates electrical conductivity and workfunction of an electrically conductive poly(3,4-ethylenedioxythiophene), PEDOT,/poly(styrenesulfonic acid), PSSA.


PEDOT-PSSA is a well-known electrically conductive polymer. The polymer dispersed in water is commercially available from H. C. Starck GmbH (Leverkuson, Germany) in several grades under a trade name of Baytron®-P (a registered trademark of H. C. Starck). Baytron®-P HCV4, one of the commercial aqueous dispersion products, purchased from Starck was used to establish baselines of electrical conductivity and work function. The Baytron®-P HCV4 sample was determined gravimetrically to have 1.01% (w/w) solid, which should be PEDOT/PSSA in water. According to the product brochure, weight ratio of PEDOT:PSSA is 1:2.5.


Viscosity of the PEDOT-PSSA was very high, therefore deionized water was used to reduce viscosity for convenience of making homogeneous films. 2.5026 g Baytron®-P HCV4 was slowly added with 2.5106 g deionized water. This dilution reduces PEDOT-PSSA solid to about 0.50% (w/w). The mixture was then stirred with a shaker for two hours to ensure thorough mixing. Film samples preparation and film baking for conductivity and work function measurements were described in both general procedures. Work function was determined to be 4.97 eV. Conductivity of four film samples was determined to be 6.9, 13.4, 5.3, and 14.4 S/cm. The work-function is quite low and will be compared with those in Examples, which show about 0.5 to 0.6 eV higher.


Comparative Example 2

This example illustrates effect of ethylene glycol, a high boiling solvent, on increase of electrical conductivity, but not on workfunction of Baytron®-P HCV4.


Unlike Comparative Example 1, which only used water, this comparative example used a ˜10% solution of ethylene glycol in water. The 10% solution was made by adding 0.9996 g ethylene glycol to 9.0098 g water. 2.53 g of the ethylene/water solution were added slowly to 2.5424 g HCV4. The amount of the solution also reduced PEDOT-PSSA to about 0.51%. The mixture was stirred with a shaker for two hours to ensure thorough mixing. The amount of ethylene glycol/water solution represents 5.0% (w/w) ethylene glycol in the diluted HCV4. Film preparation for conductivity measurement was described in the general procedure. Conductivity of two film samples was measured to be 303.14 S/cm, and 223.0 S/cm. This conductivity data is in line with the data cited by H. C. Starck GmbH in the Company's website where they report minimum conductivity of 200 S/cm by adding 5% dimethylsulfoxide (DMSO), which is a high boiling solvent. A more direct comparison will be shown in Comparative Example 3 where DMSO was used. It is well known in open arts that high boiling solvent such as ethylene glycol, dimethylsulfoxide and the like can greatly enhance electrical conductivity of PEDOT-PSSA.


A similar mixture prepared according to the same amount of each component and same recipe was used for work-function measurement. It was determined to have work-function of 4.95 eV. Although conductivity has increased to 10-20 times when compared with addition of water alone, but work-function remains the same as that in Comparative Example 1 where only water was used for dilution. The work-function is quite low and will be compared with those in Examples, which show about 0.5 eV to 0.6 eV higher.


Comparative Example 3

This example illustrates effect of dimethylsulfoxide, a high boiling solvent, on increase of electrical conductivity, but not on work-function of Baytron®-P HCV4.


Unlike Comparative Example 1, which only used water, this comparative example used a ˜10% solution of dimethylsulfoxide (DMSO) in water. The 10% solution was made by adding 1.0034g DMSO to 9.0033g water. 3.0097 g of the solution were added slowly to 3.0196 g HCV4. The amount of the solution also reduced PEDOT-PSSA to about 0.51%. The mixture was stirred with a shaker for two hours to ensure thorough mixing. The amount of DMSO/water solution represents 5.0% (w/w) DMSO in the diluted HCV4. Film preparation for conductivity measurement was described in the general procedure. Conductivity of two film samples was measured to be 219.2 S/cm, and 307.0 S/cm, respectively. This conductivity data is in line with the data cited by H. C. Starck GmbH in the Company's website where they report minimum conductivity of 200 S/cm by adding 5% dimethylsulfoxide (DMSO).


A similar mixture prepared according to the same amount of each component and same recipe shown above was used for work-function measurement. It was determined to have work-function of 4.97 eV. Although conductivity has increased to 10-20 times compared with addition of water alone, but work-function remains the same. The work-function is quite low and will be compared with those in Examples, which show about 0.5 eV to 0.6 eV higher.


Example 1

This example illustrates enhancement of work function without losing high electrical conductivity by adding a Nafion® polymer contained in ethylene glycol to Baytron®-P HCV4.


Nafion® polymer, a perfluoropolymeric acid, for copolymer of TFE (tetrafluoroethylene) and PSEPVE (3,6-dioxa-4-methyl-7-octenesulfonic acid). Nafion® polymer, P-(TFE-PSEPVE), used in this example was obtained by slow removing of water from an aqueous dispersion of Nafion® in vacuum at the temperature below 10° C. The aqueous dispersion of Nafion® was prepared by heating P-(TFE/PSEPVE) having EW (equivalent weight: weight of the polymer per one sulfonic acid group) of 1050 in water only to ˜270° C. The aqueous Nafion® dispersion had 25% (w/w) P-(TFE/PSEPVE) in water and was diluted to ˜12% with deionized water prior to removing water for collecting P-(TFE-PSEPVE). The collected P-(TFE-PSEPVE) solids were soluble or dispersible in many high polar solvents or mixture of the solvent with water. It should be pointed out that any perfluoropolymeric acids (PFA) could be obtained by removing liquid medium from aqueous or non-aqueous dispersion or solution at a temperature less than the “coalescence temperature” of the PFA. By “coalescence temperature” is meant the temperature at which a dried solid of the PFA is cured to a stable solid which is not redispersible in water, other polar solvent or mixture of the polar solvent.


Before mixing with Baytron®-P HCV4, a Nafion® polymer/ethylene glycol solution and an ethylene glycol/water solution were prepared first. The latter solution was for reducing PEDOT-PSSA solid % of HCV4 as done in the previous comparative examples, therefore reducing its viscosity. 0.7541g P-(TFE-PSEPVE) having EW of 1050 was added to 9.2534 g water n a glass vial. The mixture was heated to ˜120° C. until P-(TFE-PSEPVE) solids were all dissolved. Weight % (w/w) of P-(TFE-PSEPVE) in the ethylene glycol solution is 7.51%. A ˜10% (w/w) ethylene glycol in water was made by adding 0.9996g ethylene glycol to 9.0098g water. To 5.0833 g Baytron®-P HCV4 was first added slowly with 0.5872g poly(TFE-PSEPVE)/ethylene glycol solution. To the mixture, 5.5310 g ethylene glycol/water solution was added to reduce PEDOT-PSSA polymer solid %, which became 0.46%. The combined amount of water/ethylene glycol solution and P-(TFE-PSEPVE)/ethylene glycol represents 9.8% (w/w) ethylene glycol in the final formulation of HCV4. Based on the amount of PEDOT-PSSA and P-(TFE-PSEPVE), acid equivalent ratio of P-(TFE-PSEPVE) to PSSA is 0.21. This ratio is used for specifying optimal concentration of P-(TFE-PSEPVE) with respect to PSSA for overall consideration of desired electrical conductivity and work-function.


Film preparation for conductivity measurement was described in the general procedure. Conductivity of two film samples was measured to be 357.8 S/cm, and 291.1 S/cm. A similar mixture prepared according to the same amount of each component and same recipe shown above was used for work-function measurement. It was determined to have work-function of 5.54 eV. The work-function is about 0.5 eV higher than those in Comparative Examples 1, 2 and 3. It should be also pointed out that electrical conductivity retains at about the same as those in Comparative Examples 2 and 3.


Example 2

This example illustrates enhancement of work function without losing high electrical conductivity by adding a higher amount of Nafion® polymer contained in dimethylsulfoxide to Baytron®-P HCV4.


A Nafion® polymer, P-(TFE-PSEPVE), used Example 1 was used here. Before mixing with Baytron®-P HCV4, a Nafion® polymer/dimethyl sulfoxide (DMSO) solution and a DMSO/water solution were prepared first. The latter solution was for reducing PEDOT-PSSA solid % of HCV4 as done in the previous comparative examples and Examples, therefore reducing its viscosity. 1.0510 g P-(TFE-PSEPVE) having EW of 1050 was added to 8.9686 g water in a glass vial. The mixture was heated to ˜120° C. until P-(TFE-PSEPVE) solids were all dissolved. Weight % (w/w) of P-(TFE-PSEPVE) in the DMSO solution is 10.49%. A ˜10% (w/w) DMSO in water was made by adding 1.0034g DMSO to 9.0035g water. To 2.5048 g Baytron-P HCV4 was first added slowly with 2.5192 g DMSO/water solution to reduce PEDOT-PSSA solid %, which became 0.48%. To the mixture, 0.2023 g DMSO/P-(TFE-PSEPVE) solution was added. The combined amount of water/DMSO solution and P-(TFE-PSEPVE)/DMSO represents 8.3% (w/w) DMSO in the final formulation of HCV4. Based on the amount of PEDOT-PSSA and P-(TFE-PSEPVE), acid equivalent ratio of P-(TFE-PSEPVE) to PSSA is 0.21. This ratio is used for specifying optimal concentration of P-(TFE-PSEPVE) with respect to PSSA for overall consideration of desired electrical conductivity and work-function.


Film preparation for conductivity measurement was described in the general procedure. Conductivity of two film samples was measured to be 267.3S/cm, and 231.3 S/cm. This data shows that adding a P-(TFE-PSEPVE) polymer to HCV4 still preserve the conductivity. Work function of this material has not been performed, but I should expect a value similar to 5.54 eV presented in Example 1, but will be slightly lower than that (5.64 eV) in Example 3.


Example 3

This example illustrates enhancement of work function without losing high electrical conductivity by adding a higher (compared with that of Examples 1 and 2) amount of Nafion® polymer to Baytron®-P HCV4.


A Nafion® polymer, P-(TFE-PSEPVE), used Example 1 was used here. Before mixing with Baytron®-P HCV4, a Nafion® polymer/ethylene solution and a DMSO/water solution were prepared first. The latter solution was for reducing PEDOT-PSSA solid % of HCV4 as done in the previous comparative examples and Examples, therefore reducing its viscosity. 0.7541g P-(TFE-PSEPVE) having EW of 1050 was added to 9.2534 g water in a glass vial. The mixture was heated to ˜120° C. until P-(TFE-PSEPVE) solids were all dissolved. Weight % (w/w) of P-(TFE-PSEPVE) in the DMSO solution is 7.51%. A ˜10% (w/w) DMSO in water was made by adding 1.0034 g DMSO to 9.0035g water. To 2.5066 g Baytron®-P HCV4 was first added slowly with 3.0132 g DMSO/water solution to reduce PEDOT-PSSA solid %, which became 0.48%. To the mixture, 0.0.5666 g P-(TFE-PSEPVE)/ethylene glycol solution was added. The combined amount of water/DMSO solution and P-(TFE-PSEPVE)/ethylene glycol represents 14.2% (w/w) of combined DMSO and ethylene glycol in the final formulation of HCV4. Based on the amount of PEDOT-PSSA and P-(TFE-PSEPVE), acid equivalent ratio of P-(TFE-PSEPVE) to PSSA is 0.41. This ratio is used for specifying optimal concentration of P-(TFE-PSEPVE) with respect to PSSA for overall consideration of desired electrical conductivity and work-function.


Film preparation for conductivity measurement was described in the general procedure. Conductivity of two film samples was measured to be 153.9 S/cm, and 191.7 S/cm. This data shows that adding a P-(TFE-PSEPVE) polymer to HCV4 still has the conductivity, but may start to lose ground if equivalent ratio of P-(TFE-PSEPVE) to PSSA gets much higher than 0.41. A similar mixture prepared according to the same amount of each component and same recipe shown above was used for work-function measurement. It was determined to have work-function of 5.64 eV. The work-function is about 0.6 eV higher than those in Comparative Examples 1, 2 and 3 and shows that 0.41 equivalent ratio of P-(TFE-PSSA) to PSSA provides a slightly higher work-function than 0.21 equivalent ratio. This again, points out that equivalent ratio should be kept below 1, preferably below 0.6.


Comparative Example 4

This example illustrates minimum conductivity of an electrically conductive polymer for conductivity enhancement with addition of a high boiling solvent.


In this Comparative Example, Baytron®-P PH500, an aqueous dispersion of PEDOT-PSSA from H. C. Starck GmbH (Leverkuson, Germany) was used to establish minimum conductivity requirement for reaching conductivity higher than 100 S/cm with a high boiling solvent. The Baytron®-P PH500 sample was determined gravimetrically to have 1.0% (w/w) solid, which should be PEDOT/PSSA in water. According to the product brochure, weight ratio of PEDOT:PSSA is 1:2.5.


Viscosity of Baytron®-P PH500 is much lower than that of Baytron®-P HCV4, therefore there is no need to dilute for preparing thin films for conductivity measurement. Conductivity of two film samples was determined to be 0.85 and 0.53 S/cm. The conductivity is also much lower than that of Baytron®-P HCV4. However, Example 4 shown below will demonstrate increased conductivity by adding a Nafion® polymer, P-(TFE-PSEPVE), dissolved in ethylene glycol.


Example 4

This example illustrates conductivity enhancement of Baytron®-P PH500 by adding a Nafion® polymer contained in ethylene glycol.


A Nafion® polymer, P-(TFE-PSEPVE), used Example 1 was used here. Before mixing with Baytron®-P PH500, a Nafion® polymer/ethylene glycol solution was prepared first. 1.0512 g P-(TFE-PSEPVE) having EW of 1050 was added to 8.8.9517 g ethylene glycol in a glass vial. The mixture was heated to ˜120° C. until P-(TFE-PSEPVE) solids were all dissolved. Weight % (w/w) of P-(TFE-PSEPVE) in the ethylene glycol solution is 10.51%. To 5.0012 g Baytron®-P PH500 was first added slowly with 0.3680 g P-(TFE-PSEPVE)/ethylene glycol solution. The amount of P-(TFE-PSEPVE)/ethylene glycol represents 6.13% (w/w) ethylene glycol in the final formulation of PH500. Based on the amount of PEDOT-PSSA and P-(TFE-PSEPVE), acid equivalent ratio of P-(TFE-PSEPVE) to PSSA is 0.19.


Film preparation for conductivity measurement was described in the general procedure. Conductivity of two film samples was measured to be 288.7 S/cm, and 449.4 S/cm. This data shows that adding a P-(TFE-PSEPVE) polymer to PH500 has greatly enhanced conductivity of PH500. This data shows that minimum conductivity for conductivity enhancement to greater than 100 S/cm should be greater than 0.1 S/cm. Work function of this material has not been performed, but I should expect a value similar to 5.54 eV presented in Example 1, but will be slightly lower than that (5.64 eV) in Example 3.


Note that not all of the activities described above in the general description or the examples are required, that a portion of a specific activity may not be required, and that one or more further activities may be performed in addition to those described. Still further, the order in which activities are listed is not necessarily the order in which they are performed.


In the foregoing specification, the concepts have been described with reference to specific embodiments. However, one of ordinary skill in the art appreciates that various modifications and changes can be made without departing from the scope of the invention as set forth in the claims below. Accordingly, the specification and figures are to be regarded in an illustrative rather than a restrictive sense, and all such modifications are intended to be included within the scope of invention.


Benefits, other advantages, and solutions to problems have been described above with regard to specific embodiments. However, the benefits, advantages, solutions to problems, and any feature(s) that may cause any benefit, advantage, or solution to occur or become more pronounced are not to be construed as a critical, required, or essential feature of any or all the claims.


It is to be appreciated that certain features are, for clarity, described herein in the context of separate embodiments, may also be provided in combination in a single embodiment. Conversely, various features that are, for brevity, described in the context of a single embodiment, may also be provided separately or in any subcombination. Further, reference to values stated in ranges include each and every value within that range.


In some embodiments, the invention herein can be construed as excluding any element or process step that does not materially affect the basic and novel characteristics of the composition or process. Additionally, in some embodiments, the invention can be construed as excluding any element or process step not specified herein.


The use of numerical values in the various ranges specified herein is stated as approximations as though the minimum and maximum values within the stated ranges were both being preceded by the word “about.” In this manner slight variations above and below the stated ranges can be used to achieve substantially the same results as values within the ranges. Also, the disclosure of these ranges is intended as a continuous range including every value between the minimum and maximum average values including fractional values that can result when some of components of one value are mixed with those of different value. Moreover, when broader and narrower ranges are disclosed, it is within the contemplation of this invention to match a minimum value from one range with a maximum value from another range and vice versa.

Claims
  • 1. High conductivity and high work-function compositions comprising an aqueous dispersion or solution comprising an electrically conducting polymer and a perfluorinated polymeric acid, wherein the conducting polymer comprises a polymer made of conjugated monomers or comonomers, and at least one non-fluorinated polymeric acid; andthe conjugated monomers are selected from thiophenes, and thienothiophenes;the perfluorinated polymeric acids are selected are selected from high molecular weight of per fluorinated sulfonimides; andthe perfluorinated polymeric acid is dissolved or dispersed in a high boiling polar solvent having a boiling point above 120° C.
  • 2. A composition of claim 1 wherein the conjugated monomers are selected from the group consisting of 3,4-ethylenedioxythiophene.
  • 3. A composition of claim 1 wherein the conductivity is at least 100 S/cm.
  • 4. A composition of claim 1 wherein the work-function is at least 5.1 eV.
  • 5. A composition of claim 1, wherein the solvent is selected from the group consisting of ethylene glycol, dimethylsulfoxide, dimethylacetamide, and N-methylpyrrolidone.
RELATED APPLICATION DATA

This application claims priority under 35 U.S.C. § 120 to U.S. application Ser. No. 11/960,412 (now abandoned), filed Dec. 19, 2007, which claims priority under 35 U.S.C. §119(e) from U.S. Provisional Application No. 60/878,033 filed on Dec. 29, 2006 which is incorporated by reference herein in its entirety.

US Referenced Citations (249)
Number Name Date Kind
3282875 Connolly et al. Nov 1966 A
3784399 Grot Jan 1974 A
3849458 Dinh Nov 1974 A
4321114 MacDiarmid et al. Mar 1982 A
4356429 Tang Oct 1982 A
4358545 Ezzell et al. Nov 1982 A
4433082 Grot et al. Feb 1984 A
4442187 MacDiarmid et al. Apr 1984 A
4539507 VanSlyke et al. Sep 1985 A
4552927 Warren Nov 1985 A
4568483 Naarmann et al. Feb 1986 A
4731408 Jasne Mar 1988 A
4795543 Stetter et al. Jan 1989 A
4869979 Ohtani et al. Sep 1989 A
4889659 Genies Dec 1989 A
4933106 Sakai et al. Jun 1990 A
4940525 Ezzell Jul 1990 A
4959430 Jonas et al. Sep 1990 A
4973391 Madou et al. Nov 1990 A
4987042 Jonas et al. Jan 1991 A
5002700 Otagawa et al. Mar 1991 A
5035926 Jonas et al. Jul 1991 A
5066731 Feldhues et al. Nov 1991 A
5069820 Jen et al. Dec 1991 A
5115057 Ono et al. May 1992 A
5126017 Nakama et al. Jun 1992 A
5160457 Elsenbaumer et al. Nov 1992 A
5185100 Han et al. Feb 1993 A
5233000 Yodice et al. Aug 1993 A
5247190 Friend et al. Sep 1993 A
5254633 Han Oct 1993 A
5258461 Facci et al. Nov 1993 A
5281363 Shacklette et al. Jan 1994 A
5281680 Grot Jan 1994 A
5286413 Hannecart et al. Feb 1994 A
5294504 Otagawa et al. Mar 1994 A
5300575 Jonas et al. Apr 1994 A
5312681 Muys May 1994 A
5317169 Nakano et al. May 1994 A
5354613 Quintens et al. Oct 1994 A
5370981 Krafft et al. Dec 1994 A
5372924 Quintens Dec 1994 A
5378402 Cross et al. Jan 1995 A
5378403 Shacklette et al. Jan 1995 A
5408109 Heeger et al. Apr 1995 A
5463005 Desmarteau Oct 1995 A
5489400 Liu et al. Feb 1996 A
5537000 Alivisatos et al. Jul 1996 A
5554179 Stroetmann et al. Sep 1996 A
5567356 Kinlen Oct 1996 A
5578249 Ohtani et al. Nov 1996 A
5585038 Kirmanen et al. Dec 1996 A
5705888 Staring et al. Jan 1998 A
5716550 Gardner et al. Feb 1998 A
5723873 Yang Mar 1998 A
5766515 Jonas et al. Jun 1998 A
5773150 Tong et al. Jun 1998 A
5792830 Noding et al. Aug 1998 A
5798170 Zhang et al. Aug 1998 A
5863465 Kinlen Jan 1999 A
5869350 Heeger et al. Feb 1999 A
5910385 Gardner et al. Jun 1999 A
5911918 Shacklette et al. Jun 1999 A
5917279 Elschner et al. Jun 1999 A
5932144 Shimizu et al. Aug 1999 A
5965281 Cao Oct 1999 A
5986400 Staring et al. Nov 1999 A
5994496 Van Haare et al. Nov 1999 A
6004483 Jonas et al. Dec 1999 A
6018018 Samuelson et al. Jan 2000 A
6030550 Angelopoulos et al. Feb 2000 A
6083635 Jonas et al. Jul 2000 A
6097147 Baldo et al. Aug 2000 A
6136909 Liao et al. Oct 2000 A
6150426 Curtin et al. Nov 2000 A
6197418 Cloots et al. Mar 2001 B1
6205016 Niu Mar 2001 B1
6210790 Crivello Apr 2001 B1
6225040 Muys et al. May 2001 B1
RE37370 Cao Sep 2001 E
6303238 Thompson et al. Oct 2001 B1
6303943 Yu et al. Oct 2001 B1
6319428 Michot et al. Nov 2001 B1
6324091 Gryko et al. Nov 2001 B1
6337370 Bae et al. Jan 2002 B1
6340496 Cloots et al. Jan 2002 B1
6358437 Jonas et al. Mar 2002 B1
6376105 Jonas et al. Apr 2002 B1
6391481 Jonas et al. May 2002 B1
6452711 Heuer et al. Sep 2002 B1
6507428 Heuer et al. Jan 2003 B1
6515314 Duggal et al. Feb 2003 B1
6593690 McCormick et al. Jul 2003 B1
6611096 McCormick et al. Aug 2003 B1
6632472 Louwet et al. Oct 2003 B2
6670645 Grushin et al. Dec 2003 B2
6685853 Angelopoulos et al. Feb 2004 B1
6706963 Gaudiana et al. Mar 2004 B2
6710123 Amin-Sanayei Mar 2004 B1
6713567 Bekiarian et al. Mar 2004 B2
6717358 Liao et al. Apr 2004 B1
6756474 Hsu Jun 2004 B2
6759441 Kerres et al. Jul 2004 B1
6777515 Bekiarian et al. Aug 2004 B2
6830828 Thompson et al. Dec 2004 B2
6875523 Grushin et al. Apr 2005 B2
6923881 Tateishi et al. Aug 2005 B2
6924047 Radu et al. Aug 2005 B2
6955772 Van den Bogaert Oct 2005 B2
6955773 Hsu Oct 2005 B2
6963005 Lecloux et al. Nov 2005 B2
6967236 Angelopoulos et al. Nov 2005 B1
7071289 Sotzing Jul 2006 B2
7112369 Wang et al. Sep 2006 B2
7166010 Lamansky et al. Jan 2007 B2
7189771 Hsu Mar 2007 B2
7202369 Baik et al. Apr 2007 B2
7211202 Korzhenko et al. May 2007 B2
7211824 Lazarev May 2007 B2
7244797 Kurihara et al. Jul 2007 B2
7250461 Hsu et al. Jul 2007 B2
7307276 Andriessen Dec 2007 B2
7317047 Hsu Jan 2008 B2
7318982 Gozdz et al. Jan 2008 B2
7338620 Hsu et al. Mar 2008 B2
7341801 Reuter et al. Mar 2008 B2
7351358 Hsu et al. Apr 2008 B2
7354532 Hsu et al. Apr 2008 B2
7371336 Hsu et al. May 2008 B2
7390438 Hsu et al. Jun 2008 B2
7431866 Hsu et al. Oct 2008 B2
7455793 Hsu et al. Nov 2008 B2
7462298 Hsu et al. Dec 2008 B2
7569158 Waller et al. Aug 2009 B2
7593004 Spath et al. Sep 2009 B2
7638072 Hsu et al. Dec 2009 B2
7722785 Hsu et al. May 2010 B2
7727421 Hsu et al. Jun 2010 B2
7749407 Hsu et al. Jul 2010 B2
7837901 Hsu et al. Nov 2010 B2
8088499 Wang et al. Jan 2012 B1
20010016303 Majumdar et al. Aug 2001 A1
20010019782 Igarashi et al. Sep 2001 A1
20010038937 Suzuki et al. Nov 2001 A1
20020009680 Majumdar et al. Jan 2002 A1
20020017612 Yu et al. Feb 2002 A1
20020038999 Cao et al. Apr 2002 A1
20020041151 Park et al. Apr 2002 A1
20020045713 Feiring et al. Apr 2002 A1
20020076576 Li Jun 2002 A1
20020098377 Cao et al. Jul 2002 A1
20020099119 Craig Jul 2002 A1
20020127381 Will et al. Sep 2002 A1
20020132164 Kaneko et al. Sep 2002 A1
20020136923 Jonas et al. Sep 2002 A1
20020146442 Sendelbach et al. Oct 2002 A1
20020190250 Grushin et al. Dec 2002 A1
20020192476 Kambe et al. Dec 2002 A1
20030008190 Chisholm et al. Jan 2003 A1
20030020073 Long et al. Jan 2003 A1
20030108771 Lecloux et al. Jun 2003 A1
20030118829 Hsu Jun 2003 A1
20030146436 Parker et al. Aug 2003 A1
20030176628 Groenendaal et al. Sep 2003 A1
20030213952 Iechi et al. Nov 2003 A1
20030222250 Hsu Dec 2003 A1
20030227001 Li et al. Dec 2003 A1
20040009346 Jang et al. Jan 2004 A1
20040010115 Sotzing Jan 2004 A1
20040036067 Andriessen Feb 2004 A1
20040044214 Andriessen Mar 2004 A1
20040064152 Zvuloni Apr 2004 A1
20040072987 Groenendaal et al. Apr 2004 A1
20040092700 Hsu May 2004 A1
20040097741 Groenendaal et al. May 2004 A1
20040102577 Hsu et al. May 2004 A1
20040124504 Hsu Jul 2004 A1
20040126666 Cao et al. Jul 2004 A1
20040127637 Hsu et al. Jul 2004 A1
20040147765 Baik et al. Jul 2004 A1
20040149952 DePenning et al. Aug 2004 A1
20040149962 Andriessen Aug 2004 A1
20040181011 Korzhenko et al. Sep 2004 A1
20040206942 Hsu Oct 2004 A1
20040214985 Martin et al. Oct 2004 A1
20040217877 Kokonaski et al. Nov 2004 A1
20040222413 Hsu et al. Nov 2004 A1
20040254297 Hsu et al. Dec 2004 A1
20040262599 Bernds et al. Dec 2004 A1
20040266924 Yang Dec 2004 A1
20050033015 Pei Feb 2005 A1
20050035335 Han et al. Feb 2005 A1
20050049319 Stone et al. Mar 2005 A1
20050052027 Priem Mar 2005 A1
20050059168 Bazan Mar 2005 A1
20050064152 Aylward et al. Mar 2005 A1
20050069726 Douglas et al. Mar 2005 A1
20050070654 Hsu Mar 2005 A1
20050089679 Ittel et al. Apr 2005 A1
20050124784 Sotzing Jun 2005 A1
20050175861 Elschner et al. Aug 2005 A1
20050184287 Herron et al. Aug 2005 A1
20050202274 Elschner et al. Sep 2005 A1
20050205860 Hsu et al. Sep 2005 A1
20050208328 Hsu et al. Sep 2005 A1
20050209388 Hsu et al. Sep 2005 A1
20050209392 Luo et al. Sep 2005 A1
20050222333 Hsu Oct 2005 A1
20050224765 Hsu et al. Oct 2005 A1
20050224788 Hsu et al. Oct 2005 A1
20050272214 Chiang et al. Dec 2005 A1
20060051401 Manohar Mar 2006 A1
20060076050 Williams et al. Apr 2006 A1
20060076557 Waller et al. Apr 2006 A1
20060076577 Boos et al. Apr 2006 A1
20060113510 Luo et al. Jun 2006 A1
20060180810 Lee et al. Aug 2006 A1
20060202171 Yoshida et al. Sep 2006 A1
20060274049 Spath et al. Dec 2006 A1
20060289843 Hsu et al. Dec 2006 A1
20060292362 Hsu et al. Dec 2006 A1
20070045591 Hsu et al. Mar 2007 A1
20070066755 Hsu et al. Mar 2007 A1
20070069184 Hsu et al. Mar 2007 A1
20070069185 Hsu et al. Mar 2007 A1
20070096082 Gaynor et al. May 2007 A1
20070129534 Ohata et al. Jun 2007 A1
20070172702 Elschner et al. Jul 2007 A1
20070215864 Luebben et al. Sep 2007 A1
20080023676 Hsu Jan 2008 A1
20080128662 Hsu et al. Jun 2008 A1
20080135809 Hsu Jun 2008 A1
20080191172 Hsu Aug 2008 A1
20080191614 Kim et al. Aug 2008 A1
20080193773 Hsu et al. Aug 2008 A1
20080210910 Hsu et al. Sep 2008 A1
20080213594 Hsu Sep 2008 A1
20080248314 Hsu et al. Oct 2008 A1
20080251768 Hsu et al. Oct 2008 A1
20080258605 Yukinobu Oct 2008 A1
20080283800 Hsu Nov 2008 A1
20080286605 Takeda Nov 2008 A1
20080296536 Hsu et al. Dec 2008 A1
20090008609 Yeisley et al. Jan 2009 A1
20090072201 Hsu et al. Mar 2009 A1
20090114884 Hsu May 2009 A1
20090154059 Wessling et al. Jun 2009 A1
20090318710 Brassat et al. Dec 2009 A1
20100127222 Hsu et al. May 2010 A1
Foreign Referenced Citations (218)
Number Date Country
1274869 Nov 2000 CN
1276388 Dec 2000 CN
1439029 Aug 2003 CN
1934725 Mar 2007 CN
2029556 Dec 1971 DE
3938094 May 1991 DE
4211459 Oct 1993 DE
4334390 Apr 1995 DE
10018750 Jan 2001 DE
102004006583 Sep 2005 DE
102004010811 Sep 2005 DE
245987 Oct 1991 EP
560721 Sep 1993 EP
269090 Feb 1994 EP
356239 Feb 1995 EP
517379 Jun 1995 EP
361322 Nov 1995 EP
440957 Mar 1996 EP
488321 Oct 1997 EP
817540 Jan 1998 EP
828184 Mar 1998 EP
593111 Jun 1998 EP
1026152 Aug 2000 EP
1079397 Feb 2001 EP
761691 Jan 2002 EP
1191612 Mar 2002 EP
1191614 Mar 2002 EP
1227529 Jul 2002 EP
1231251 Aug 2002 EP
1286569 Feb 2003 EP
1054414 Mar 2003 EP
1061530 Mar 2003 EP
962943 Dec 2003 EP
1371709 Dec 2003 EP
1384739 Jan 2004 EP
1408563 Apr 2004 EP
1428857 Jun 2004 EP
949283 Apr 2005 EP
949308 Apr 2005 EP
1 564 251 Jun 2005 EP
1546237 Jun 2005 EP
1564250 Aug 2005 EP
1564251 Aug 2005 EP
1615971 Jan 2006 EP
1647566 Apr 2006 EP
1726051 Nov 2006 EP
1730212 Dec 2006 EP
1 810 986 Jul 2007 EP
2632979 Dec 1989 FR
2124635 Feb 1984 GB
62119237 May 1987 JP
62138582 Jun 1987 JP
62164717 Jul 1987 JP
63135453 Jun 1988 JP
63215772 Sep 1988 JP
64065123 Mar 1989 JP
01138237 Sep 1989 JP
02160823 Jun 1990 JP
02209931 Aug 1990 JP
02249221 Oct 1990 JP
04234453 Aug 1992 JP
04306230 Oct 1992 JP
05129162 May 1993 JP
05255576 Oct 1993 JP
05262981 Oct 1993 JP
06073271 Mar 1994 JP
06264024 Sep 1994 JP
06306280 Nov 1994 JP
06313038 Nov 1994 JP
07010973 Jan 1995 JP
07090060 Apr 1995 JP
07157549 Jun 1995 JP
07165892 Jun 1995 JP
08048850 Feb 1996 JP
08048858 Feb 1996 JP
09176310 Jul 1997 JP
10261418 Sep 1998 JP
10509751 Sep 1998 JP
11186103 Jul 1999 JP
11353934 Dec 1999 JP
2000091081 Mar 2000 JP
2000505249 Apr 2000 JP
2000336154 Dec 2000 JP
2001006878 Jan 2001 JP
2001035276 Feb 2001 JP
2001106782 Apr 2001 JP
2001504872 Apr 2001 JP
2001270999 Oct 2001 JP
2001325831 Nov 2001 JP
2002500408 Jan 2002 JP
2002505356 Feb 2002 JP
2002082082 Mar 2002 JP
2002246177 Aug 2002 JP
2002293888 Oct 2002 JP
2003040856 Feb 2003 JP
2003158043 May 2003 JP
2003187983 Jul 2003 JP
2003217862 Jul 2003 JP
2003261749 Sep 2003 JP
2003264083 Sep 2003 JP
2003297582 Oct 2003 JP
2003301116 Oct 2003 JP
2004500449 Jan 2004 JP
2004501494 Jan 2004 JP
2004502004 Jan 2004 JP
2004082395 Mar 2004 JP
2004099678 Apr 2004 JP
2004107552 Apr 2004 JP
2004197095 Jul 2004 JP
2004231939 Aug 2004 JP
2004523623 Aug 2004 JP
2004532307 Oct 2004 JP
2004534892 Nov 2004 JP
2004537612 Dec 2004 JP
2005108504 Apr 2005 JP
2005120363 May 2005 JP
2005139376 Jun 2005 JP
2005145987 Jun 2005 JP
2005226072 Aug 2005 JP
2005232452 Sep 2005 JP
2005536595 Dec 2005 JP
2005537348 Dec 2005 JP
2006500461 Jan 2006 JP
2006500463 Jan 2006 JP
2006502254 Jan 2006 JP
2006108064 Apr 2006 JP
2006515315 May 2006 JP
2006152251 Jun 2006 JP
2006225658 Aug 2006 JP
2006527277 Nov 2006 JP
2007502531 Feb 2007 JP
2007191715 Aug 2007 JP
2007529607 Oct 2007 JP
2007531802 Nov 2007 JP
2008546898 Dec 2008 JP
2008546899 Dec 2008 JP
2008546900 Dec 2008 JP
2008547185 Dec 2008 JP
2009502025 Jan 2009 JP
2009270117 Nov 2009 JP
2010534739 Nov 2010 JP
20030096385 Dec 2003 KR
100613311 Aug 2006 KR
2035803 May 1995 RU
463524 Nov 2001 TW
505927 Oct 2002 TW
200304238 Sep 2003 TW
I327152 Jul 2010 TW
9305519 Mar 1993 WO
9801909 Jan 1998 WO
9831716 Jul 1998 WO
9934371 Jul 1999 WO
9945048 Sep 1999 WO
9952954 Oct 1999 WO
0070655 Nov 2000 WO
0138219 May 2001 WO
0141230 Jun 2001 WO
0141512 Jun 2001 WO
0199192 Dec 2001 WO
0199207 Dec 2001 WO
0200759 Jan 2002 WO
0202714 Jan 2002 WO
0205354 Jan 2002 WO
0215645 Feb 2002 WO
0242352 May 2002 WO
02065484 Aug 2002 WO
02079316 Oct 2002 WO
02080627 Oct 2002 WO
02092646 Nov 2002 WO
02099907 Dec 2002 WO
03006515 Jan 2003 WO
03006537 Jan 2003 WO
03008424 Jan 2003 WO
03012908 Feb 2003 WO
03040257 May 2003 WO
03046540 Jun 2003 WO
03048228 Jun 2003 WO
03050824 Jun 2003 WO
03063555 Jul 2003 WO
03074601 Sep 2003 WO
03091688 Nov 2003 WO
2004016710 Feb 2004 WO
2004018544 Mar 2004 WO
2004019345 Mar 2004 WO
2004020444 Mar 2004 WO
2004020502 Mar 2004 WO
2004029128 Apr 2004 WO
2004029133 Apr 2004 WO
2004029176 Apr 2004 WO
2004031192 Apr 2004 WO
2004094501 Nov 2004 WO
WO 2004094501 Nov 2004 WO
2004105150 Dec 2004 WO
2004106404 Dec 2004 WO
2004106409 Dec 2004 WO
2005003083 Jan 2005 WO
2005018012 Feb 2005 WO
2005024853 Mar 2005 WO
2005041217 May 2005 WO
2005052027 Jun 2005 WO
2005080525 Sep 2005 WO
2005090434 Sep 2005 WO
2005090435 Sep 2005 WO
2005090436 Sep 2005 WO
2005093872 Oct 2005 WO
WO 2005098872 Oct 2005 WO
2005121217 Dec 2005 WO
2006073968 Jul 2006 WO
2006078264 Jul 2006 WO
2007002681 Jan 2007 WO
2007002682 Jan 2007 WO
2007002683 Jan 2007 WO
2007002737 Jan 2007 WO
2007002740 Jan 2007 WO
WO 2007002681 Jan 2007 WO
2007092296 Aug 2007 WO
2007120143 Oct 2007 WO
2009018009 Feb 2009 WO
Non-Patent Literature Citations (200)
Entry
PCT International Search Report for International Application No. PCT/US2007/026512.
Extended European Search Report for Application No. EP10 01 2649; Rafael Kiebooms, Mar. 1, 2011.
EPO Official Action for Application No. 05725618.2; May 31, 2011.
EPO Official Action for Application No. 07863277.5, counterpart to U.S. Appl. No. 11/960,381; Mar. 7, 2013
EPO Official Action for Application No. EP 03770524.1, counterpart to U.S. Appl. No. 10/669,577; Feb. 25, 2010.
EPO Official Action for Application No. EP 06 774 120.7; Nov. 16, 2011.
EPO Official Letter regarding Application No. EP 05736268.3; Nov. 11, 2011.
PCT International Search Report for Application No. PCT/US2003/030512, counterpart to U.S. Appl. No. 10/669,577; R. Kiebooms Authorized Officer, Feb. 19, 2004.
PCT International Search Report for International Application No. PCT/US2003/030026; R. Kiebooms Authorized Officer, Mar. 24, 2004.
PCT International Search Report for International Application No. PCT/US2004/012564, counterpart to U.S. Appl. No. 10/802,704; R. Kiebooms, Authorized Officer; Jan. 14, 2005.
PCT International Search Report for Application No. PCT/US2005/008563; R. Kiebooms, Authorized Officer; Jun. 17, 2005.
PCT International Search Report for Application No. PCT/US2005/012461, counterpart to U.S. Appl. No. 10/823,320; C. Meiners, Authorized Officer; Jul. 29, 2005.
PCT International Search Report for International Application No. PCT/US2005/008764, counterpart to U.S. Appl. No. 10/803,114; F. Rousseau, Authorized Officer; Aug. 3, 2005.
PCT International Search Report for International Application No. PCT/US2006/25013; Lee W. Young, Authorized Officer; Jan. 16, 2007.
PCT International Search Report for International Application No. PCT/US2006/25013, counterpart to U.S. Appl. No. 11/475,715; Lee W. Young, Authorized Officer; Jan. 16, 2007.
PCT International Search Report for International Application No. PCT/US2006/025014, counterpart to U.S. Appl. No. 11/475,710; Lee W. Young, Authorized Officer; Jul. 25, 2007.
PCT International Search Report for International Application No. PCT/US2006/025012, counterpart to U.S. Appl. No. 11/475,702; Lee W. Young, Authorized Officer; ISA/US; Oct. 26, 2007.
PCT International Search Report for International Application No. PCT/US2007/015323, counterpart to U.S. Appl. No. 11/770,822; D. Marsitzky Authorized Officer; Dec. 18, 2007.
PCT International Search Report for Application No. PCT/US2007/026438, counterpart to U.S. Appl. No. 11/960,381; Dirk Marsitzky, Authorized Officer; Apr. 22, 2008.
PCT International Search Report for Application No. PCT/US2008/070718, counterpart to U.S. Appl. No. 12/177,359; Benedikt Schlicke, Authorized Officer; Oct. 31, 2008.
PCT International Search Report for Application No. PCT/US2009/035079; Lee W. Young, Authorized Officer; Apr. 9, 2009.
PCT International Search Report for Application No. PCT/US2010/061680, counterpart to U.S. Appl. No. 12/643,556; KIPO; Sep. 29, 2011.
Opposition Against EP 1 546 237 B1, H. C. Starck Clevios GmbH, Goslar, Germany, May 13, 2009 (English Translation).
Opposition Against EP 1 546 237 B1, H. C. Starck Clevios GmbH, Goslar, Germany, May 13, 2009 (German Original).
Opposition Against EP 1 546 237 B1, E. I. du Pont de Nemours and Company, Wilmington, Delaware, Observations of the Patent Proprietor, Mar. 1, 2010.
Opposition Against EP 1 546 237 B1, E. I. du Pont de Nemours and Company, Wilmington, Delaware, Observations of the Patent Proprietor, Mar. 1, 2010, Annex, Declaration of Dr Hjalti Skulason dated Feb. 24, 2010.
Opposition Against EP 1 546 237 B1, E. I. du Pont de Nemours and Company, Wilmington, Delaware, Observations of the Patent Proprietor, Mar. 1, 2010, Annex, Experimental Data, Sep. 21-Oct. 6, 2009.
Opposition Against EP 1 546 237; Decision Revoking European Patent; EPO Opposition Division; Dec. 8, 2011.
Opposition Against EP 1 546 237 B1; Patentee's Grounds for Appeal; Apr. 18, 2012.
Opposition Against EP 1546237: Proposed Main Request—Claims; Apr. 2012.
Opposition Against EP 1546237: First Auxiliary Request—Claims; Apr. 18, 2012.
Opposition Against EP 1546237: Second Auxiliary Request—Claims; Apr. 18, 2012.
Opposition Against EP 1546237: Third Auxiliary Request—Claims; Apr. 18, 2012.
Opposition Against EP 1546237: Fourth Auxiliary Request—Claims; Apr. 18, 2012.
Opposition Against EP 1546237: Fifth Auxiliary Request—Claims; Apr. 18, 2012.
Opposition Against EP 1546237; Declaration of Hjalti Skulason; Apr. 30, 2012.
Opposition Against EP 1615971 B1, H. C. Starck Clevios GmbH, Goslar, Germany, Mar. 2, 2010 (English Translation).
Opposition Against EP 1615971 B1, H. C. Starck Clevios GmbH, Goslar, Germany, Mar. 2, 2010 (German Original).
Opposition Against EP 1615971; Summons to Oral Proceedings before the EPO; Sep. 19, 2011.
Opposition Against EP 1615971; Observations of the Patent Proprietor; Dec. 6, 2011.
Opposition Against EP 1615971; Main Request—Claims; Nov. 24, 2011.
Opposition Against EP 1615971; First Auxiliary Request—Claims; Dec. 6, 2011.
Opposition Against EP 1615971; Second Auxiliary Request—Claims; Dec. 6, 2011.
Opposition Against EP 1615971; Third Auxiliary Request—Claims; Dec. 6, 2011.
Opposition Against EP 1615971; Fourth Auxiliary Request—Claims; Dec. 6, 2011.
Opposition Against EP 1615971; Fifth Auxiliary Request—Claims; Dec. 6, 2011.
Opposition Against EP 1615971; Letter from Opponent; Dec. 22, 2011 (English Translation).
Opposition Against EP 1615971; Grounds of Appeal of the Opposition; Appeal No. T1708/12-3.4.02; Sep. 27, 2012 (English Trans).
Opposition Against EP 1615971; Grounds of Appeal of the Opposition; Appeal No. T1708/12-3.4.02; Sep. 27, 2012 (German Original).
Opposition Against EP 1615971; Grounds of Appeal of the Patentee; Appeal No. T1708/12-3.4.02; Sep. 28, 2012.
“DuPont Fuel Cells—DuPont Nafion PFSA Membranes NE-1135, N-115, N-117, NE-1110,” Jan. 1, 2005, pp. 1-4.
“Colloid,” Definition from IUPAC Gold Book, Apr. 17, 2012.
“Colloid,” Wikipedia entry, Nov. 4, 2012.
“Conductive Polymer,” Definition from WIKIPEDIA, The Free Encyclopedia (Date unknown).
“Dispersion Chemistry”, Wikipedia entry, Nov. 4, 2012.
Agibalova et al., “Supramolecular Organization of Polyfluorinated Copolymers in Solutions,” Polymer Science, Ser. A, 1998, vol. 40, No. 6, pp. 615-621 (Translated from Vysokomolkuyarnye Soedineniya, Seriya A I Seriya B, 40 [6], pp. 1009-1016, 1998).
Aldrich Catalog, Germany; 1994-95; p. 1137; as evidence of product with catalog No. 27,740-4.
Aleshin et al., “Transport Properties of Poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate),” Synthetic Metals, 1998, vol. 94, pp. 173-177.
Angelopoulos et al., “Polyaniline: Solutions, Films and Oxidation State,” Molecular Crystals and Liquid Crystals, 1988, vol. 160, pp. 151-163.
Appleby et al., “Polymeric Perfluoro Bis-Sulfonomides as Possible Fuel Cell Electrolytes,” Journal of the Electrochemical Society, 1993, vol. 140, No. 1, pp. 109-111.
Arnautov et al., “New Dopant-Solvent System for Conductive PAN Films Production,” Synthetic Metals, 1997, vol. 84, No. 1-3, pp. 133-134, Elsevier Science S.A.
ASTM, Standard Practice for Testing the Shelf Life of Ink Jet Printer Cartridges (Date unknown).
Barthet et al., “Aspects of the Conducting Properties of Nafion Doped Polyaniline”, Electrochimica Acta, 1996, vol. 41, No. 18, pp. 2791-2798.
Barthet et al., “Mixed electronic and ionic conductors: a new route to Nafion-doped polyaniline” in Journal of Electroanalytical Chemistry, 1995, vol. 388, pp. 45-44.
Baytron Coating Guide Issue Oct. 2002—Obtained From www.hcstarck-echemicals.com.
Baytron H. C. Stark GmbH (Brochure) No Date.
Baytron P VAP A1 4083 and Baytron P VP CH 8000 Product Information for Electronic Grades Designed For Use As Hole-Injection Material in OLEDS—Obtained From www.hcstarckechemicals.com.
Baytron Product info from baytron.com; Aug. 1, 2007.
Bharathan et al., “Polymer/metal Interfaces and the Performance of Polymer Light-Emitting Diodes, ” Journal of Applied Physics, 1998, vol. 84(6), pp. 3207-3211.
Boix et al., “Efficient H-D Exchange of Aromatic Compounds in Near-Critical D20 Catalysed by a Polymer-Supported Sulphonic Acid,” Tetrahedron Letters 40, 1999, pp. 4433-4436.
Brown et al, “Built-in field electroabsorbtion spectroscopy of plymer light-emitting diodes incorporating a doped poly (3,4-ethylene dioxythiophene) hole injection layer,” Applied Physics Letters, AIP, American Institute of Physics, 1999, vol. 75, No. 12, pp. 1679-1681.
Campbell, I.H. et al., “Excitation Transfer Processes in a Phosphor-Doped Poly 9p-phenylene vinylene) Light-Emitting Diode,” Physical Review B., vol. 65, 085210-1-085210-8.
Caras-Quintero et al., “Efficient Synthesis of 3, 4-ethylenedioxythiophenes by Mitsunobu Reaction” Chemical Communications, Chemcom, Royal Society of Chemistry, GB, vol. 22, Nov. 4, 2002, pp. 2690-2691.
Caras-Quintero et al., “Synthesis of the First Enantiomerically Pure and Chiral, Disubstituted 3,4ethylenedioxythiophenes (EDOTs) and Corresponding Stereo- and Regioregular PEDOTs,” Chemical Communication, 2004, pp. 926-927.
CAS reg. No. 126213-51-2, Apr. 6, 1990 [Chemical registry].
CAS reg. No. 31175-20-9, Nov. 16, 1984 [chemical registry].
Cassel et al., “Original Synthesis of Linear, Branched and Cyclic Oligoglycerol Standards,” European Journal of Organic Chemistry, 2001, No. 5, pp. 875-896.
Cen et al., “1,1,2,2-Tetrafluoro-2-(polyfluoroalkoxy)ethanesulfonic Acids, 1,1,2,2-Tetrafluoro-2-(perfluoroalkoxy) ethanesulfonic Acids, and 2,2'-Oxybis(1,1,2,2-tetrafluoroethanesulfonic acid),” Inorganic Chemistry, 1988, vol. 27, pp. 1376-1377, American Chemical Society.
Colvin et al., “Light-Emitting Diodes Made from Cadmium Selenide Nanocrystals and a Semiconducting Polymer,” Nature, 1994, vol. 370, pp. 354-357.
Constantini et al., “Infrared Spectroscopic Study of Polaron Formation in Electrochemically Synthesized Poly(3-alkylpyrroles),” Phys. Chem. Chem. Phys.,2003 vol. 5, pp. 749-757.
Desmarteau, Novel Periluoinated lonomers and lonenes, Journal of Fluorine Chemistry, 1995, vol. 72, pp. 203-208.
Downs et al., “Efficient Polymerization of Aniline at Carbon Nanotube Electrodes”, Advanced Materials, 1999, vol. 11, No. 12, pp. 1028-1031.
England et al; “Nucleophilic Reactions of Fluoro-olefins,” Journal of American Chemical Society (1960) v. 82, p. 5116.
Esaki et al., “Efficient H/D Exchange Reactions of Alkyl-Substituted Benzene Derivatives by Means of the Pd/C-H2-D20 System,” Chemistry: A European Journal, 2007, vol. 13, pp. 4052-4063.
Feiring et al., “Aromatic Monomers with Pendant Fluoroalkylsulfonate and Sulfonimide Groups,” Journal of Fluorine Chemistry, 2000, vol. 105, No. 1, pp. 129-135.
Feiring et al., “Novel Aromatic Polymers with Pendant Lithium Periluoroalkylsulfonate or Sulfinimide Groups,” Macromolecules, 2000, vol. 33, pp. 9262-9271.
Fowler et al., “Hydrogen detection by Polyaniline nanofibers on gold and platinum electrodes”, The Journal of Physical Chemistry C, 2001, vol. 113, No. 16, pp. 6444-6449.
Gao et al., “Soluble polypyrrole as the transparent anode in polymer light-emitting diodes,” Synthetic Metals, 1996, vol. 82, pp. 221-223, 82, Elsevier Science S.A.
Guo et al., “Aromatic H/D Exchange Reaction Catalyzed by Groups 5 and 6 Metal Chlorides,” Chinese Journal of Chemistry, 2005, vol. 23, pp. 341-344.
Gustafsson et al., “Flexible Light-Emitting Diodes Made from Soluble Conducting Polymers,” Nature, 1992, vol. 357, pp. 477-479.
Hackley et al., The Use of Nomenclature in Dispersion Science and Technology, NIST, Aug. 2001, pp. 2-4, 10, 11.
Hansen et al., “Work Function Measurements in Gas Ambient,” Surface Science, 1994, vol. 316, pp. 372-382.
Hirai et al; “Electrochemical Behaviors of Polypyrrole, Poly-3-Methyl-thiophene, and Polyaniline Deposited on NafionCoated Electrodes,” Journal of the Electrochemical Society, vol. 135, No. 5, 1 May 1988, pp. 1132-1137, Electrochemical Society, Manchester, NH.
Hong et al, “Association of Nafion with Polypyrrole Nanoparticles in a Hydrophilic Polymer Network: Effects on Proton Transport,” Journal of Colloid and Interface Science, 1999, vol. 218 pp. 233-242.
Hsu, “Novel Preparation and Properties of Conductive Polyaniline/Nafion® Film,” Synthetic Metals, 1991, vol. 41-43, pp. 671-674.
Huang et al., “Well-Dispersed Single-Walled Carbon Nanotube/Polyaniline Composite Films,” Carbon, vol. 41, 2003, pp. 2731-2736.
Iijima et al., Single-Shell Carbon Nanotube of 1-nm Diameter, Nature, 1993, vol. 363, pp. 603-605.
Ivanov et al., “The Study of Carbon Nanotubules Produced by Catalytic Method,” Chemical Physics Letters, 1994, vol. 223, pp. 329-335.
Jiang et al., “Preparation of a Nafion Composite Membrane using a Porous Teflon Support,” Journal of Membrane Science, Elsevier Scientific Publ. Co., Amsterdam, NL, vol. 132, No. 2, Sep. 3, 1997, pp. 273-276.
Jong et al., “Stability of the Interface between Indium-tin-oxide and Poly(3,4-ethylenedioxythiophene)/poly (styrenesulfonate) in Polymer Light-Emitting Diodes,” Applied Physics Letters, 2000, vol. 77, No. 14, pp. 2255-2257.
Journet et al., “Large-Scale Production of Single-Walled Carbon Nanotubes by the Electric-Arc Technique,” Nature, 1997, vol. 388, pp. 756-758.
Kim et al., “Enhancement of Electrical Conductivity of Poly(3,4-ethylenedioxythiophene)/Poly(4-styrenesulfonate) by a Change of Solvents,” Synthetic Metals, 2002, vol. 126, No. 2/3, pp. 311-316.
Kitani et al., “Properties of Elastic Polyaniline,” Synthetic Metals, 1997, vol. 84, No. 1-3, pp. 83-84, Elsevier Science S.A.
Laha, S.C. et al., “Highly Selective Epoxidation of Olefinic Compounds Over TS-1 and TS-2 Redox Molecular Sieves using Anhydrous Urea-Hydrogen Peroxide as Oxidizing Agent,” Journal of Catalysis, 2002, 208(2), 339-344.
Lee et al., Poly(thieno(3,4-b)thiophene) A New Stable Low Band Gap Conducting Polymer, Macromolecules, 2001, vol. 34, pp. 5746-5747.
Lefebvre et al., “Chemical Synthesis, Characterization, and Electrochemical Studies of Poly(3,4-ethylenedioxythiophene)/Poly(styrene-4-sulfonate) Composites,” Chem. Mater., 1999, vol. 11, pp. 262-268, American Chemical Society.
Levi et al., “Polymer and Cathode Emission Studies of Polymer-Based Light-Emitting Diodes Under Strong Electrical Pulse Excitation,” Journal of Applied Physics, 2000, vol. 88, No. 5, pp. 2548-2552.
Lewis, Hawley's Condensed Chemical Dictionary, 12th Ed., 1993, pp. 300-301.
Li et al., “Large-Scale Synthesis of Aligned Carbon Nanotubes,” Science, 1996, vol. 274, pp. 1701-1703.
Lim et al., “Degradation of Organic Light-Emitting Devices Due to Formation and Growth of Dark Spots,” Materials Science and Engineering, 2001, pp. 154-159.
Lima, A., “Electropolymerization of and 3,4-ethylenedioxtyiophene and 3,4-Ethylenedioxythiophene Methanol in the Persence of Dodecylbenezenesulfonate,” Synthetic Metals, 1998, 93, 33-41.
Madler et al., “Visibly Transparent and Radiopaque Inorganic Organic Composites from Flame-Made Mixed-Oxide Fillers,” Journal of Nanoparticle Research, 2005, vol. 8, No. 3-4, pp. 323-333.
Markus et al., Electronics and Nucleonics Dictionary, pp. 470-471 & 476 (McGraw-Hill 1966).
Marrion, “Binders for Waterborne Coatings,” The Chemistry and Physics of Coatings, Second Edition, 2004.
Moeller et al., “A Polymer/Semiconductor Write-Once Read-Many-Times Memory,” Nature, 2003, vol. 426, pp. 166-169.
Morrison & Boyd, Organic Chemistry, 6th Ed., 1994, pp. 312-317 (First Half).
Nafion Definition; Wikipedia; 20090513 (German).
Nafion Definition; Wikipedia; 20100218 (English).
O'Brien et al., “Electrophosphorescence From a Doped Polymer Light Emitting Diode,” Synthetic Metals, 2001, vol. 116(1-3), pp. 379-383.
Pickup et al., “Electronically conducting cation-exchange polymer powders: synthesis, characterization and applications in PEM fuel cells and supercapacitors,” Journal of New Materials for Electrochemical Systems, vol. 3, 2000, pp. 21-26.
Qi et al., “Size Control of Polypyrrole Particles,” Chem. Mater., 1997, vol. 9, pp. 2934-2939, American Chemical Society.
Riedel et al., “Tailored Highly Transparent Composite Hole-Injection Layer Consisting of Pedot:PSS and SiO2 Nanoparticles for Efficient Polymer Light-Emitting Diodes,” Advanced Materials, 2011, vol. 23, pp. 740-745.
Römpp Chemistry Dictionary, 9th Edition, 1993, pp. 2459-2460 (German and English Translation).
Sajiki et al., “Efficient C-H/C-D Exchange Reaction on the Alkyl Side Chain of Aromatic Compounds Using Heterogeneous Pd/C in D2O,” Org. Lett., 2004, vol. 6(9), pp. 1485-1487.
Schottland P. et al., “Synthesis and Polymerization of New Monomers Derived From 3, 4-Ethylenedioxythiophene” Journal De Chimie Physique, Societe De Chimie Physique, Paris, Fr. vol. 95, No. 6, Jan. 1, 1998, pp. 1258-1261.
Schroedner et al., “Organische Feldeffekttransisoren auf Basis Halbleitender Polymere/Organic Field-Effect Transistors Based on Semiconducting Polymers,” Electrotechnik and Informationstechnik, Springer Verlag, 2003, vol. 120, No. 6, pp. 205-209 (German Original and English Translation).
Schwendeman et al; “Perfluoroalkanoate-substituted PEDOT for Electronic Device Applications,” Advanced Functional Materials, vol. 13, No. 7, 2003, pp. 541-547.
Segura, J.L., et al., “Synthesis and Electropolymerization of a Perylenebisimide-Functionalized 3, 4-Ethylenedioxythiophene Derivative,” Organic Letters, vol. 7, No. 12, 2005, pp. 2345-2348.
Sharpe et al., “Improved Cationic Conductive Polymer,” Calgon Corp. Coating Conference (Proceeding), 1981, pp. 83-87.
Simpson et al., “Advances and Applications of Inherently Conductive Polymer Technologies Based on Poly(3,4-Ethylenedioxythiophene),” 2005 AIMCAL Fall Technical Conference.
Sotzing et al., “Poly(thieno(3,4-b)thiophene): A p- and n-Dopable Polythiophene Exhibiting High Optical Transparency in the Semiconducting State,” Macromolecules, 2002, vol. 35, pp. 7281-7286.
Stejskal et al., “Polyaniline Dispersions 10. Coloured Microparticles of Variable Density Prepared Using Stabilizer Mixtures,” Colloid Polymer Science, vol. 278, 2000, pp. 654-658.
Sun et al, “Catalytic Oxidation Polymerization of Aniline in an H202-Fe2+ System,” Journal of Applied Polymer Science, 1999, vol. 72, pp. 1077-1084.
Sze, S.M., Physics of Semiconductor Devices, 2nd Edition, 1981, John Wiley & Sons, p. 492 Tang et al., “Organic/Inorganic Material for Coating on Metals,” Materials Research Society Symp. Proc., vol. 734, 2003, pp. B.9.57.1-7.
Thelakkat et al., “Poly(triarylamine)s- Synthesis and Application in Electroluminescent Devices and Photovoltaics,” Synthetic Metals, 1999, vol. 102, pp. 1125-1128.
Thess et al., “Crystalline Ropes of Metallic Carbon Nanotubes,” Science, 1996, vol. 273, pp. 483-487.
Unknown, The Experimental Chemistry Course, 4th Ed., vol. 20, Organic Synthesis II—Alcohol and Amines, 1992, pp. 49-51 (Japanese Only).
Venturello, C. et al., “A Convenient Catalytic Method for the Dihydroxylation of Alkenes by Hydrogen Peroxide,” Synthesis, 1989, 4, 295-297.
Wang, “Photoconductive Materials,” Kirk-Othmer Encyclopedia of Chemical Technology, Fourth Edition, 1996, vol. 18, pp. 837-860.
Watts et al., “A novel deuterium effect on dual charge-transfer and ligand-field emission of the cis-dichlorobis(2,2'-bipyndine)iridium(III) ion,” Journal of the American Chemical Society, 1979, vol. 101(10), pp. 2742-2743.
Wu et al., “Transparent, Conductive Carbon Nanotube Films,” Science, 2004, vol. 305, pp. 1273-1276.
Yang et al., “The photoelectrochemical properties of TiO2 electrodes modified by quantum sized PbS and thiols”, Synthetic Metals, 2001, vol. 123, No. 2, pp. 267-272.
Yuan et al., “Size and morphology effects of ZnO anode nanomaterials for Zn/Ni secondary batteries; Size and morphology effects of ZnO anode nanomaterials for Zn/Ni secondary batteries”, Nanotechnology, 2005, vol. 16, No. 6, pp. 803-808.
Decision of the Boards of Appeal of the European Patent Office in Case No. T0860/93; Application No. 88115147.6; Dec. 29, 1993; Cited in the Opposition to Application No. EP 1546237.
Decision of the Boards of Appeal of the European Patent Office in Case No. T1078/93-3.3.5; Application No.90905154.2; Publication No. 0462216; Process for Improving the Physical and Catalytic Properties of a Fluid Cracking.Catalyst; Nov. 20, 1997; Cited in the Opposition to Application No. EP 1546237.
Decision of the Boards of Appeal of the European Patent Office in Case No. T0939/98-3.3.3; Application No. 95910871.3; Publication No. 0742800; Two-phase Acidic Aqueous Compositions for Diffusion Transfer Products; Jan. 17, 2002; Cited in the Opposition to Application No. EP 1546237.
Decision of the Boards of Appeal of the European Patent Office in Case No. T0114/06-3.3.02; Application No. 04013422.3; Publication No. 1452171; Pharmaceutical Liquid Suspensions; Jul. 29, 2008; Cited in the Opposition to Application No. EP 1546237.
Extended European Search Report for Application No. EP 0677120.7, counterpart to U.S. Appl. No. 11/475,702; Jan. 27, 2010.
European Search Report and Opinion for Application No. EP06785660, counterpart to U.S. Appl. No. 11/475,715; Munich, Germany; Feb. 4, 2010.
Extended European Search Report from EP 06774121.5, counterpart to U.S. Appl. No. 11/960,790; Feb. 12, 2010.
Opposition Against EP 1615971; (E9) Experimental Data: Effect of pH on Buffer Layer Materials Containing Co-Dispersing Liquids; Sep. 28, 2012.
Opposition Against EP 1615971; Main Request—Claims; Sep. 28, 2012.
Opposition Against EP 1615971; First Auxiliary Request—Claims; Sep. 28, 2012.
Opposition Against EP 1615971; Second Auxiliary Request—Claims; Sep. 28, 2012.
Opposition Against EP 1615971; Third Auxiliary Request—Claims; Sep. 28, 2012.
Opposition Against EP 1615971; Fourth Auxiliary Request—Claims; Sep. 28, 2012.
Opposition Against EP 1615971; Grounds of Complaint of the Opposition; Appeal No. T1708/12-3.4.02; Apr. 11, 2013 (English Machine Translation).
Opposition Against EP 1615971; Patentee's Response to the Appeal; Appeal No. T1708/12-3.3.03; Apr. 15, 2013.
Opposition Against EP 1615971; (E11) Experimental Data: Effect of Co-Dispersing Liquid on PEDOT Polymerization in the Presence of Nafion; Apr. 15, 2013.
Opposition Against EP 1615971; Main Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; First Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Second Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Third Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Fourth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Fifth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Sixth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Seventh Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Eighth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Ninth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Tenth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Eleventh Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Twelfth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Thirteenth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1615971; Fourteenth Auxiliary Request—Claims; Apr. 15, 2013.
Opposition Against EP 1730212, Opposition Document from Herzog Fiesser & Partner; Heraeus Precious Metals GmbH; Aug. 10, 2011 [English Translation].
Opposition Against EP 1730212, Opposition Document from Herzog Fiesser & Partner; Heraeus Precious Metals GmbH; Aug. 10, 2011 [German].
Opposition Against EP 1730212; Observations of the Patentee; Jun. 25, 2012.
Opposition Against EP 1730212; Experimental Data I (D23); Jun. 25, 2012.
Opposition Against EP 1730212; Experimental Data II (D24); Jun. 25, 2012.
Opposition Against EP 1730212; Main Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; First Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Second Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Third Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Fourth Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Fifth Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Sixth Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Seventh Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Eighth Auxiliary Request—Claims; Jun. 25, 2012.
Opposition Against EP 1730212; Ninth Auxiliary Request—Claims; Jun. 25, 2012.
U.S. Appl. No. 10/803,114 (Issued as US Patent 7,250,461; Jul. 31, 2007; This is the US counterpart to EP1730212) [Not submitted but granted patent listed on IDS].
U.S. Appl. No. 10/802,704 (Issued as US Patent 7,390,438; Jun. 24, 2008; This is the US counterpart to EP1615971) [Not submitted but granted patent listed on IDS].
U.S. Appl. No. 60/413,202 [Related to granted patent US 7,431,866; listed on IDS; Provisional document not submitted].
U.S. Appl. No. 60/464,369 (Issued as granted patent US 7,431,866, listed on IDS; Provisional document not submitted).
U.S. Appl. No. 60/464,370 [Provisional document not submitted].
Opposition to EP1546237: Report on the Attempted Reproduction of the Synthesis in D4 (PICKUP) and Example 7 of the opposed patent (D31).
Sze, S.M., Physics of Semiconductor Devices, 2nd Edition,1981, John Wiley & Sons, p. 492.
Tang et al., “Organic/Inorganic Material for Coating on Metals,” Materials Research Society Symp. Proc., vol. 734, 2003, pp. B.9.57.1-7.
Extended European Search Report for Application No. EP 06774120.7, counterpart to U.S. Appl. No. 11/475,702; Jan. 27, 2010.
Opposition Against EP 1615971; Letter from Opponent; Dec. 22, 2011 (German original and English translation).
Opposition Against EP 1615971; Grounds of Complaint of the Opposition; Appeal No. T1708/12-3.4.02; Apr. 11, 2013 (German original and English Machine Translation).
Related Publications (1)
Number Date Country
20110168952 A1 Jul 2011 US
Provisional Applications (1)
Number Date Country
60878033 Dec 2006 US
Divisions (1)
Number Date Country
Parent 11960412 Dec 2007 US
Child 13072423 US