Number | Date | Country | Kind |
---|---|---|---|
63-221290 | Sep 1988 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4670879 | Okino | Jun 1987 | |
4759021 | Kawaguchi | Jul 1988 | |
4797886 | Imada | Jan 1989 |
Number | Date | Country |
---|---|---|
57-111471 | Jul 1982 | JPX |
Entry |
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1980 IEEE Test Conference article, "100 MHz Algorithmic Pattern Generator for Memory Testing", by Masao Shimizu, et al., pp. 56-67. |