Modern-day electronic and other types of devices are often manufactured by assembling multiple components together. A defect or other anomaly within any component, or as a result of attaching components together, can result in failure of the overall device. Therefore, constituent components of a device are often tested for anomalies before inclusion in the device, and after manufacture the device itself is also tested.
As noted in the background, devices and device components, which are more generally physical objects, are often tested for defects and other anomalies. As one example, an inkjet printhead die may be attached to an inkjet cartridge body during assembly of an inkjet cartridge. As part of this attachment process, a flexible ribbon cable may be secured to the printhead die and encapsulated with a material at the connection point between the cable and the die to form what is known as an encap. The encap protects the electrical connection between the cable and the printhead die from ink during usage of the inkjet cartridge in a printing device to eject ink.
One way by which components may be tested for anomalies like defects is to use machine vision, due to the large number of components that have to be inspected and the small size of potential anomalies. Machine vision involves capturing an image of a component and then performing image processing to detect whether the component has any anomalies. For example, with respect to the encap of an inkjet cartridge, machine vision may be used to detect defects in the encap that may permit ink to reach the electrical connections between the cable and the printhead die, which can result in the failure of the cartridge or even the printing device of which it is a part.
Techniques described herein permit anomalies of physical objects to be detected, and their locations on the objects to be identified. A region of interest (ROI) is extracted from a captured image of a physical object, and an autoencoder model is applied to the extracted ROI to reconstruct the ROI. The location of an anomaly of the physical object, if any, is identified within the extracted ROI based on the extracted and reconstructed ROIs.
Physical objects detected as having anomalies may be separated from anomaly-free objects so that they are discarded and not subsequently used, or so that they can be inspected at the locations of the detected anomalies for potential repair or manufacturing process analysis. For example, there may be an expected defect rate during the manufacture of physical objects. If the defect rate suddenly increases or exceeds a threshold, the manufacturing process may be analyzed and modified in an automated or manual manner to return the defect rate back to normal.
Therefore, the method 100 provides for technological improvements in a number of different ways. For instance, the method 100 can ensure that manufactured physical objects are less likely to include defects and other anomalies. The method 100 can similarly ensure that subsequently manufactured devices are less likely to be defective due to the inclusion of defective constituent components. The method 100 can also improve the manufacturing process of physical objects, by providing an automated or manual feedback loop as to the quality of the objects being manufactured. The method 100 has proven to be more accurate and faster than competing machine vision-based defect identification techniques.
The method 100 includes extracting an ROI from a captured image of a physical object (102). The ROI is a prespecified area within the captured image that is to be inspected for potential anomalies of the physical object. The captured image may include other parts of the physical object that are not of interest, for instance, and may similarly include background regions that are not of interest. Therefore, the ROI is extracted from the captured image to focus the part of the image that is subsequently analyzed.
The ROI may be extracted from the captured image on one of two ways, by performing parts 104A and 104B, collectively referred to as the parts 104, or by performing parts 106A and 106B, collectively referred to as the parts 106. As to the former, the method 100 can include aligning the captured image against a reference image of another physical object of the same type (104A). For example, a transformation matrix may be calculated that aligns the captured image to the reference image. The method 100 can include then cropping the aligned image based on a bounding box identifying a corresponding ROI within the reference image (104B). For example, an inverse of the calculated transformation matrix may be applied to the bounding box as defined on the reference image and the captured image then cropped using the inverse-applied bounding box. The cropped aligned image constitutes the ROI.
As to the second way in which the ROI may be extracted from the captured image, the method 100 can include applying an object segmentation model to the captured image to generate a segmentation mask (106A), and then applying the segmentation mask to the captured image. The object segmentation model may instead output the ROI of the captured image, instead of a segmentation mask that is then applied to the captured image. The object segmentation model may be a regional convolutional neural network (R-CNN) trained using training images of physical objects of the same type as the physical object of the captured image, and on which corresponding ROIs have been preidentified. When an objection segmentation model is used to extract the ROI from the captured image, no reference image has to be provided, as compared to the first way in which the ROI may be extracted.
A transformation matrix can be calculated that aligns the captured image 200 to the reference image 210, and an inverse of the transformation matrix applied to the bounding box 212 as preidentified within the reference image 210. The captured image 200 can then be cropped in correspondence with resulting inverse-applied bounding box 212 to extract the ROI from the captured image 200.
As to the second way in which the ROI may be extracted from a captured image, an object segmentation model may instead be applied to the captured image 200 of
For instance, the preidentified ROI 312 of
Referring back to
Corresponding high-frequency components of the extracted ROI will thus be well represented within the reconstructed ROI output by the autoencoder model upon application of the model to the extracted ROI. However, high-frequency components of the extracted ROI that correspond to defects and other anomalies will not be well represented within the reconstructed ROI output by the autoencoder model. Usage of the autoencoder model to detect anomalies may therefore assume that the anomalies have high frequency—i.e., that the anomalies are not represented as relatively large amorphous regions of slowly changing intensity in the captured image. Usage of the model may further assume that the captured image has a similar background to that of the training images.
The decoder phase 402 in turn receives as input the internal representation 425 of the extracted ROI 424 and provides as output the reconstructed ROI 426. The reconstructed ROI 426 will faithfully correspond to the extracted ROI 424 at locations at which the ROI 424 does include anomalies like defects, since the autoencoder model 400 is trained on anomaly-free training images. However, at locations at which the extracted ROI 424 includes anomalies, the resulting reconstructed ROI 426 will less likely mirror the extracted ROI 424. The decoder phase 402 includes a number of upsampling convolutional layer groups 414, such as three in the example of
Referring back to
The method 100 can include next removing any pixel of the residual map having a value less than a threshold (114). The threshold may be a static threshold or an adaptive threshold that is based on the residual map itself. As an example of an adaptive threshold, the threshold may be calculated as the mean of the values of the pixels of the residual map, plus a product of a parameter and the standard deviation of the values of the pixels of the residual map. The parameter may be prespecified, and governs the reconstruction error severity that is considered anomalous. For example, a higher parameter value indicates that less severe errors in the reconstructed ROI as compared to the extracted ROI are not considered anomalies, whereas a lower parameter values indicates that such less severe errors are considered anomalies.
The method 100 can include then applying a morphological operation to the residual map from which pixels having values less than the threshold have been removed (116). The morphological operation that is performed can include an opening morphological operation (118) and/or a closing morphological operation (120). The opening operation, which may also be considered an erosion operation, denoises the residual map of isolated extraneous pixels having values greater than the threshold but which may not in actuality correspond to anomalies. By comparison, the closing operation, which may be considered a dilation operation, connectively groups discontiguous pixels having values greater than the threshold and located near one another, so that they are considered as corresponding to the same anomaly.
The method 100 can include, if after morphological operation application the residual map includes any pixels having values greater than the threshold (122), determining that the physical object has anomalies like defects (124). The location the anomaly of the anomaly within the extracted ROI corresponds to the locations of the pixels having values greater than the threshold within the residual map. For instance, the location of each group of contiguous pixels having values greater than the threshold within the residual map may be considered as the location of a corresponding anomaly. The method 100 can include, if after morphological operation application the residual map does not include any pixels having values greater than the threshold (124), by comparison determining that the physical object does not have anomalies (126).
The method 100 can include outputting a segmentation mask that identifies the location of the anomaly of the physical object within the extracted ROI, if any (128). For example, the result of parts 112, 114, and 116 is a post-processed version of the residual map, in which there are white areas and black areas. The white areas correspond to the identified location of the anomaly of the physical object within the extracted ROI of the captured image of the physical object, whereas the black areas do not. This post-processed version of the residual map constitutes the segmentation mask. Therefore, the segmentation mask can be applied to the extracted ROI of the captured image to highlight the location of the anomaly of the physical object, if any.
Techniques have been described for detecting anomalies of physical objects within captured images and identifying the locations of the anomalies within the captured images. The techniques have been described in relation to encaps of inkjet cartridges as one type of physical object. However, the techniques are applicable to other types of physical objects as well, including other types of manufactured device components. The techniques provide for an automated manner of anomaly detection using an autoencoder model, in which a captured image is preprocessed to extract an ROI thereof and is postprocessed to better distinguish between noise and actual anomalies like defects.
Filing Document | Filing Date | Country | Kind |
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PCT/US2020/062125 | 11/25/2020 | WO |