BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a diagram for explaining potential unevenness which is a target of the present invention;
FIG. 2 is a diagram for explaining potential unevenness which is a target of the present invention;
FIG. 3 is a diagram for explaining potential unevenness which is a target of the present invention;
FIG. 4 is a diagram and a graph for explaining potential unevenness which is a target of the present invention;
FIG. 5 is graphs for explaining a correction method which is an object of the present invention;
FIG. 6 is a schematic diagram showing a configuration of an image forming apparatus of one embodiment;
FIG. 7 is a schematic diagram showing a configuration of exposing means of one embodiment;
FIG. 8 is a schematic diagram showing a configuration of a laser driving circuit of one embodiment;
FIG. 9 is a flowchart of a correction method of one embodiment;
FIG. 10 is a schematic diagram showing a configuration for potential measurement of one embodiment;
FIG. 11 is graphs for explaining the correction method which is an object of the present invention;
FIG. 12A is graphs for explaining the correction method of one embodiment;
FIG. 12B is graphs for explaining the correction method of one embodiment;
FIG. 13 is a schematic diagram showing a configuration for potential measurement of one embodiment;
FIG. 14A is diagrams for explaining the correction method of one embodiment;
FIG. 14B is diagrams for explaining the correction method of one embodiment;
FIG. 15 is a schematic diagram showing a configuration of a potential measurement apparatus of one embodiment;
FIG. 16 is a schematic diagram showing a configuration for potential measurement of one embodiment; and
FIG. 17 is a schematic diagram showing a configuration of an image forming apparatus of one embodiment.