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Metrology tools that utilize X-rays require detector windows which separate the harsh plasma environment of an X-ray source from the ultraclean environment of the metrology tool.
Detector window films are thin and must be supported by structures typically comprised of ribs supported by a frame. The ribs, frames, or a combination thereof is known as a support structure. Support structures prevents window films from sagging or breaking. However, a support structure can also interfere with the passage of X-rays. Consequently, support structures must be optimized to have the lowest possible thickness and width while providing the largest amount of strength to the thin window.
Large-area soft X-ray windows, up to 100 mm, are needed for emerging technologies that have large apertures such as cryo-detector arrays, semiconductor lithography, and pulsed light sources. Known detector windows cannot be proportionally scaled. Increasing film thickness will increase X-ray absorption. Further, if film thickness is increased, then support structure must be made proportionally larger to support the larger film. However, increasing the dimensions of the support structure causes shadowing of pixels near the edges of the support structure.
It has been recognized that it would be advantageous to provide a detector window that will have low failure rates for apertures up to 100 mm. Desirable characteristics of the detector window include minimal X-ray attenuation, ability to withstand high strength and high pressure differentials, typically 1 atmosphere.
Other features and advantages of the present invention will become apparent in the following detailed descriptions of the preferred embodiment with reference to the accompanying drawings, of which:
In the following detailed description, reference is made to the accompanying drawings, which form a part hereof. In the drawings, the use of similar or the same symbols in different drawings typically indicate similar or identical items, unless context dictates otherwise. The illustrative embodiments described in the detailed description, drawings, and claims are not meant to be limiting. Other embodiments may be utilized, and other changes may be made, without departing from the spirit or scope of the subject matter presented here. One skilled in the art will recognize that the herein described components (e.g., operations), devices, objects, and the discussion accompanying them are used as examples for the sake of conceptual clarity and that various configuration modifications are contemplated. Consequently, as used herein, the specific exemplars set forth and the accompanying discussion are intended to be representative of their more general classes. In general, use of any specific exemplar is intended to be representative of its class, and the non-inclusion of specific components (e.g., operations), devices, and objects should not be taken as limiting.
The present application may use formal outline headings for clarity of presentation. However, it is to be understood that the outline headings are for presentation purposes, and that different types of subject matter may be discussed throughout the application (e.g., device(s)/structure(s) may be described under process(es)/operations heading(s) and/or process(es)/operations may be discussed under structure(s)/process(es) headings; and/or descriptions of single topics may span two or more topic headings). Hence, the use of the formal outline headings is not intended to be in any way limiting. By way of overview, embodiments provide improved detector windows for apertures up to 100 mm.
Grid supports have been used for soft X-ray windows. However, grid supports are expensive to fabricate. Poorly made grid supports cause shadowing, florescence, and/or are fragile. Properly fabricated grid supports may provide the strength needed to support large-area detector windows. Stacking grid supports reduces peak bending moments and achieves geometric aspect ratios of at least 1 but, preferably between 1 and 5. Geometric aspect ratio is defined as the total thickness of a grid support in the direction of the incident beam divided by the width of a grid bar. Grid supports may be fabricated by any known method such as etching of single crystal silicon, photoetching, or machine operations, amongst others.
Referring to
The thin film may be comprised of beryllium, aluminum, Polyimide, carbon, boron nitride, or a combination thereof. The thin film may be operably attached to the grid supports using any known method such as adhesives, metallic bonding, chemical bonding with a reactive polymer. Preferably, the grid supports are fabricated from stainless steel, aluminum, carbon, titanium, beryllium, or a combination thereof. The stacked grid supports may be operably attached to each other using epoxy or any other know attachment method.
Referring to
In one embodiment, the pitch (17a) of one dome grid support (15a) is different than the pitch (17b) of the other dome grid support (15a). Preferably, the pitches (17a, 17b) of the dome grid support (15a, 15b) are between 200 and 500. Preferably, the dome grid supports (15) are fabricated using soft, diffusion joined grids. Preferably, the dome grid supports (15) defines an open area (16) of at least 80%. Any thin film may be attached to the stacked dome grid supports (15) using any know method such as adhesives, metallic bonding, chemical bonding with a reactive polymer, amongst others.
In one embodiment the thin film is the commercially available LEX® Light Element X-ray thin film which is attached to a 25 mm window, and the dome grid supports (15) are fabricated from stainless steel. In this embodiment, the detector window (10) has a geometric transmittance of 80% for a point source located 50 mm from the detector window face.
Confocal microscope XYZ scans of the domed grid supports allows direct computation of strain, curvature, and surface tension on a detector window (10). In this embodiment, the stainless steel grid support is deformed by 4%, and the average bar stress is 220 MPa. Bar stress is defined as the uniaxial stress at a bar which is part of a grid support; average bar stress is the average of the bar stress over the volume of an entire grid support.
Referring to
The stacked focus grid (18) geometry places lower grid bars into the shadow of the top grid bars consequently, negligible grid occlusion occurs as grid supports are added. The thin film may be comprised of beryllium, aluminum, Polyimide, carbon, boron nitride, or a combination thereof. The thin film may be operably attached to the stacked focus grids (18) using any known method such as adhesives, metallic bonding, chemical bonding with a reactive polymer, for example. Preferably, the stacked focus grids (18) are fabricated from stainless steel, aluminum, carbon, titanium, beryllium, or a combination thereof.
The quality of alignment and mesh lithography are assessed by transmitted imaging of the stacked focus grids (18) and grids supports that were not stacked. Typical results can be seen in
In this embodiment, the stacked focus grids (18) have an open area (16) of 88% and an average bar width (33) of 25 microns. For a source 20 mm from the detector window (10), the transmittance is approximately 87% at the center and 78% at the edge of the detector window (10). In this embodiment, transmittance at the edge of the detector window (10) falls to 70% for a source at an infinite distance. The transmittance at the center is 87% and 74% at the edge of the detector window (10) when the X-ray source is approximately 30 mm from the detector window (10).
Referring to
The slotted gird support (30) provides an open area of at least 80%. In comparison, a typical hexagonal grid support (
In one embodiment the bar width (33) is at least 30 microns. In one embodiment, each slot (32) has at least a 210 micron opening. In one embodiment, the slot grid support (30) may be fabricated from stainless steel. In one embodiments, the slot grid support (30) may be fabricated from ultra-strong, low Z materials such as carbon fiber or Vectran. The thin film may be comprised of beryllium, aluminum, Polyimide, carbon, boron nitride, or a combination thereof. The thin film may be operably attached to the slotted support grid (30) using any known method such as adhesives, metallic bonding, chemical bonding with a reactive polymer, for example.
This application takes priority to PCT/US16/14599, filed on 22 Jan. 2016 which takes priority to provisional application No. 62/106,337 filed on Jan. 22, 2015 and incorporated herein, in its entirety, by reference.
Filing Document | Filing Date | Country | Kind |
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PCT/US16/14599 | 1/22/2016 | WO | 00 |
Number | Date | Country | |
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62106337 | Jan 2015 | US |