The present invention relates to sensors for eddy current testing to detect and characterize surface and sub-surface flaws in conductive materials, and more particularly, the present invention relates to an inductive sensor with improved measurement sensitivity and/or reduce the nonlinearity.
In general, Eddy current (EC) testing makes use of electromagnetic inductive principle to detect and characterize surface and sub-surface flaws in conductive materials. A standard pulse eddy current (PEC) method induces circular eddy currents into the surface layer of the metal target through the sudden change of the equilibrium magnetic field by fast switching off the stable charging current in the transmitter coil. The EC generates the magnetic field that can be detected by the receiver coil as an EC “echo signal”. The EC on the surface layer rapidly decreases in strength due to the thermal dissipation of the resistance from the target metal body. The changes of EC on the surface layer cause the magnetic field strength change that induces the secondary EC further into the deeper layer where the secondary EC starts decaying as well due to resistance. The process repeats and keeps going until all energy is burned out along time in the depth inside the metal body. This process is well known as EC diffusion and damping. During the process, EC goes deeper and becomes weaker along the depth. As the result, the associated magnetic field strength reduces over time. The detection signal from the magnetic strength change on the receiver coil is decayed accordingly as well. The received time transient signal can be analyzed to identify resistance changes along the time corresponding to the depth from the surface, which can then be used for detecting and locating the defects on the surface and under the surface of the metal target. The deeper the EC penetrates, the smaller the signal is received on the receiver coil. In principle, PEC has a very large signal dynamic range for deep detection applications, normally around 120 dB or more, from the target. In addition, the sensitivity of received signal depends on the sensor core ferromagnetic permeability which decreases gradually along the magnetic field strength decay corresponding to the Eddy Current decay. As the result, the signal along time for the depth from the target becomes lower and less sensible by the core as part of the sensor, resulting in a low Signal-to-Noise Ratio (SNR). In addition, the range of sensitivity changes (up to 40 dB in difference) corresponding to the core permeability decrease over the magnetic field strength shows a strong nonlinearity of the signal from the receiver coil measurements.
Thus, an industry need exists for an apparatus and method that is devoice of the drawbacks and limitations of the existing eddy current testing methods.
Hereinafter, the abbreviation “EC” refers to “eddy current(s)”, SNR refers to signal to noise ratio, and PEC refers to “Pulsed Eddy Current”, all are known in the art.
The following presents a simplified summary of one or more embodiments of the present invention in order to provide a basic understanding of such embodiments. This summary is not an extensive overview of all contemplated embodiments and is intended to neither identify key or critical elements of all embodiments nor delineate the scope of any or all embodiments. Its sole purpose is to present some concepts of one or more embodiments in a simplified form as a prelude to the more detailed description that is presented later.
The principal object of the present invention is therefore directed to an inductive sensor apparatus that statically or dynamically adjusts a magnetic bias level to achieve an optimal sensitivity response.
It is another object of the present invention that the inductive sensor apparatus has a stronger signal response with high sensitivity.
It is still another object of the present invention that the inductive sensor apparatus has higher linearity for the response signal.
It is yet another object of the present invention that the inductive sensor apparatus has a wider signal response dynamic range for higher measurement resolution.
It is a further object of the present invention that the inductive sensor apparatus has a higher signal-to-noise ratio (SNR).
In one aspect, disclosed is an inductive sensor apparatus for nondestructive testing of metallic objects. This inductive sensor apparatus has a ferromagnetic core, a transmitter coil and a receiver coil wound on the ferromagnetic core, and a magnetic bias coil positioned around the ferromagnetic coil. The receiver coil is separate from the transmitter coil. The magnetic bias coil is adapted to apply an electric current to build up a bias magnetic field inside the ferromagnetic core to shift permeability of the ferromagnetic core to a desired level. The magnetic bias coil is separated, normally, from the transmitter coil and the receiver coil. However, it can be shared entirely and partially with the transmitter coil by designs.
In one aspect, a network with a current source supported by a power supply and a controllable switch is connected to the transmitter coil such that a current is applied to and can be switched off on the ferromagnetic core in order to induce an eddy current on the surface layer of the metallic object. A separate current source can be connected to the magnetic bias coil. The electric current can be applied to the magnetic bias coil to shift the permeability of the ferromagnetic core when receiving the EC echo signal from the metal target.
In one implementation of the inductive sensor apparatus, the receiver coil, the transmitter coil, and magnetic bias coil, all can be positioned into separate sections along the core or overlapped with each other in layers over the core as dictated by designs for various applications. The ferromagnetic core can be a single ferromagnetic core.
These and other objects and advantages of the present invention will become apparent from reading attached specifications and appended claims. Also, the foregoing Section is intended to describe, with particularity, the preferred embodiments of the present invention. It is understood that modifications to these preferred embodiments can be made within the scope of the present claims. As such, this section should not be construed, in any way, as limiting of the broad scope of the present invention. The present invention should only be limited by the following claims and their legal equivalents.
The accompanying figures, which are incorporated herein, form part of the specification and illustrate embodiments of the present invention. Together with the description, the figures further explain the principles of the present invention and to enable a person skilled in the relevant arts to make and use the invention.
Subject matter will now be described more fully hereinafter with reference to the accompanying drawings, which form a part hereof, and which show, by way of illustration, specific exemplary embodiments. Subject matter may, however, be embodied in a variety of different forms and, therefore, covered or claimed subject matter is intended to be construed as not being limited to any exemplary embodiments set forth herein; exemplary embodiments are provided merely to be illustrative. Likewise, a reasonably broad scope for claimed or covered subject matter is intended. Among other things, for example, the subject matter may be embodied as methods, devices, components, or systems. The following detailed description is, therefore, not intended to be taken in a limiting sense.
The word “exemplary” is used herein to mean “serving as an example, instance, or illustration.” Any embodiment described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other embodiments. Likewise, the term “embodiments of the present invention” does not require that all embodiments of the invention include the discussed feature, advantage, or mode of operation.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of embodiments of the invention. As used herein, the singular forms “a”, “an” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms “comprises”, “comprising,”, “includes” and/or “including”, when used herein, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
The following detailed description includes the best currently contemplated mode or modes of carrying out exemplary embodiments of the invention. The description is not to be taken in a limiting sense but is made merely for the purpose of illustrating the general principles of the invention, since the scope of the invention will be best defined by the allowed claims of any resulting patent.
Disclosed is an inductive sensor apparatus and method for nondestructively evaluating metallic surfaces using a PEC principle with enhanced signal acquisition topology. The disclosed inductive sensor apparatus may comprise a transmitter coil to generate a static magnetic field by the means of exciting the coil with a certain amount of current, and then switching off the current. The initial EC is induced on the surface of the metal object and gradually decays inside the target due to diffusion and damping processes. Those skilled in the art will recognize that the eddy currents can be induced by any other means without departing from the scope of the present invention. The inductive sensor apparatus may also include a separate receiver coil which can detect decaying magnetic field due to EC decaying. The receiver coil generates a voltage signal in response to the EC magnetic field change which, when analyzed further, reveals the target's features, such as thickness or defects that alter the metal resistances. The inductive sensor apparatus also includes an adaptive bias coil that is utilized to boost the signal working range to an optimal working region which results in a higher SNR, sensitivity, dynamic range, and linearity. The following description of the illustrations will further provide a thorough understanding of the invention.
Referring to
As EC diffuses and dampens inside the body of the metallic object 109, the strength of the EC is reduced as illustrated above. In principle, the time and the depth can be mapped with respect to each other. As the result, the signal decay along time measured from receiver coil 104 can be translated into the signal decay along the depth. Eventually the measured signal from receiver coil 104 decreases along the depth to an unmeasurable level and the signal acquisition time is over, which corresponds to a one-round measurement process of PEC detection sequence. The measurement process may be repeated at a stationary position to measure the same location multiple times to acquire multiple data frames. This combined data would then be stacked and averaged to obtain higher Signal-to-Noise Ratio (SNR) than a single frame of acquired data. The measurement process may also be repeated while in motion, shown by an arrow 111 in
on the surface of the metallic object 109. Then the process of EC 107/108 decaying starts as illustrated in
where, μm is the magnetic permeability and ρm is the resistivity of the metallic object 109.
The equation (2) shows that when the resistivity of the target region increases, the τ decreases, and the EC 108 decay is faster along the time. In this case, EC 108 shall be smaller than in the region of the defect 110 after the certain time point when EC reaches the depth where the defect 110 is located, compared to the region without any defects. The EC 108 generates the secondary magnetic field BEC 112 that can be sensed by the receiver coil 104 along the time as the received voltage signal νEC shown as curve 207 following in
where, N is the number of turns of the receiver coil 104; A is the section area of the core 102; BEC is the magnetic field inside the core 102; μC is the magnetic permeability of the core 102; and HEC is the magnetic strength distribution generated by EC 108. From the equation (3), the changes of EC 108 decay are sensed by the receiver coil 104 as the received signal νEC that represents the EC 108 decaying process. From the equation (2), the EC 108 decaying along time is linked to the local properties, such as the resistivity, of the measurement target, such as the metallic object 109. There is the time gap 208 right after the charging window and before the acquisition window for measuring the EC decaying. Within the time gap 208, the sudden change of the magnetic field B0 inside the core generates the high voltage on the transmitter coil 103 through self-inductive process as well as the high voltage on the receiver coil 104 through mutual-inductive process. Both high voltages, normally called “switching interferences”, can be sensed on the receiver coil 104 as the received signal that is not from the target EC 107/108 decaying process measured as voltage signal 207. As a result, the initial portion of EC 107/108 decay in received signal 207 within the time gap 208 is heavily contaminated by the switching interferences. Normally, those interference signal voltages are damped close to zero in short time within the time gap 208 by using active and/or passive damping networks. After the time gap 208, the EC 108 decay from the target without the switching interferences can be detected reliably as the voltage signal 207 received from the receiver coil 104. The RX duration 202 is for the signal 207 acquisition duration in which EC 108 decaying is measurable. After 202, the magnetic BEC change in the core 102 along the time,
can no longer be sensible and measurable.
When scanning across the defect 110 area, the νVDL, can be presented in gray scales as 2D B-Mode Scan Image coordinated in distance and depth mapped from the time of the EC decaying process. Without system noises, the B-Mode Scan Image is shown in 305. The depth and width of the defect 110 can be viewed and estimated. The time point 303 is mapped in depth in the B-Mode Scan Image 305. When the system noise 304 is present, which is always the case in the real-world environment, the SNR of the measurement signal 302 may change from high in positive to low or even negative along the time after the point of SNR=0 dB while EC decays continuously. As the decaying signals 302 and 301 cross the noise floor 304, they suffer from noise interference as shown on the B-Mode Scan Image 306, resulting in difficulties for viewing and estimating, both in accuracy and precision, the depth and width of the defect 110. In addition, the defects may be buried very deep inside the metallic object 109 and the decaying signal responses may be very small, which requires exceptionally high sensitivity as well as wide signal dynamic range from the transducer 101 for measurements.
On the B-H curve 401, the μ2 at the point 405 is larger than the μ1 at the point 406, given the same amount of EC decaying magnetic 112 strength change in ΔH1 at the point 406 and ΔH2 at the point 405 where ΔH1=ΔH2. It then follows that the corresponding ΔB1 at the point 406 and ΔB2 at the point 405 are different where ΔB2>ΔB1 due to μ2>μ1. From Equation (3), ν2>ν1 for the same EC decaying changes in ΔH depending upon the magnetic field B level inside the core. It is clear that B2>B1 at points 405 and 406 on the B-H curve 401. Because of the B-H curve of ferromagnetic cores, the received voltage signal νEC may have reduced sensitivity and exhibit high nonlinearity due to core permeability behavior against a wide dynamic range of the decaying EC 108 along time.
The comparison of the received signal with different measurement sensitivity and dynamic range with and without adding the biased magnetic field BB is shown in 301 in the region with defect 110 embedded in and 302 in the region without any defects, respectively. With the corresponding noise floor, the SNR of the received signal 303 in the work zone 605 is higher than the received signal 304 in the work zone of 606.
Also, illustrated in
As illustrated from the graph in
In summary,
and the measurement signal νEC directly related to EC 108 decaying will be νEC=νr, shown in 804. When the biased magnetic field BB is linearly incremented as shown in 807 which corresponds to the linear current increase IB=Ct along the acquisition time as in 815, the received signal νR is boosted from 808 to 809, and measurement signal νEC directly related to the EC 108 decaying will be νEC=νr−C since
shown in 806. A further control function can be chosen to adapt and compress the EC decaying signal dynamic range for the received signal working within a relatively small permeability region to achieve both high sensitivity and high linearity. For example, the biased magnetic field BB may be generated by IB according to a special predefined quadratic function as in 811. The change of BB is known and controlled in 813, where the received signal νr is pushed from 816 to 810, and the measurement signal νEC directly related to the EC 108 decaying will be νEC=νr−Ct for
shown in 812. In that case, the received signal ν, has higher voltage level due to the high signal sensitivity, less dynamic range in a better linear permeability region that has further less nonlinearity, and high improvement in SNR. Point 814 serves as an example, when the system noise floor 803 is present compared to the original received signal 816 at the same point of 814. A method for removing the biased field can be employed in the case of linear and functional bias current IB applications so as to remove the artifacts of the changing biased magnetic field from the output signal 207. As the function of the biased magnetic field BB can be mapped in a controlled environment, the artifacts of this field appearing on the output signal can be cancelled out in the signal post-processing domain if needed. The constant bias current case where IB=C and
does not require this step as the receiver coil 104 is only sensitive to a changing magnetic field where
In one exemplary embodiment, IB and I0 are different, I0 is the charging current to build up the initial magnetic field B0 in the target, working in the TX duration. Once the charging current IB is switched off, dB0/dt generates the high Eddy Current IEC,0 in the target. Then the EC decays due to the diffusion and damping processes inside the target. Normally, the higher the I0, the higher the IECO, the higher the measurement signal νEC, the higher the SNR for measurement signal. As a result, I0 can be high in the level of amperes to several hundreds of amperes. IB is the bias current, working in the RX duration when transducer measures
According to ferromagnetic core B-H curve shown in
in order to boost SNR. It can also be referred to as boosting the sensitivity of the inductive transducer to make the outside signal much higher given the same EC decaying
input corresponding to the same level of EC decaying inside the target. The bias current IB may not be high in value that can charge the target but the bias current IB can be much smaller in the range of small fraction of ampere.
In one exemplary embodiment, the transmitter coil also acts as the magnetic bias coil, wherein the inductive sensor apparatus further includes a switching mechanism configured to alternately connect the transmitter coil to the first current source and the second current source.
While the foregoing written description of the invention enables one of ordinary skill to make and use what is considered presently to be the best mode thereof, those of ordinary skill will understand and appreciate the existence of variations, combinations, and equivalents of the specific embodiment, method, and examples herein. The invention should therefore not be limited by the above-described embodiment, method, and examples, but by all embodiments and methods within the scope and spirit of the invention as claimed.
The present application claims priority from the U.S. Provisional Patent Application Ser. No. 63/141,467, filed on Jan. 25, 2021, and entitled “Gain Configurable Inductive Sensor Biased Actively by a Magnetic Field For High Sensitivity and Linearity”, which is incorporated herein by reference in its entirety.
Number | Date | Country | |
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63141467 | Jan 2021 | US |