BACKGROUND OF THE INVENTION
1. Field of the Invention
The invention generally relates to an integrated circuit (IC), and more particularly, to an information generating apparatus and an operation method thereof.
2. Description of Related Art
The layout and function inside an integrated circuit (IC) need to be modified along with the change of design requirement. Different modifications result in ICs of different versions. An IC should be able to provide related information to the system in order to allow the system to manage/determine the version of the IC. For example, a version information generating apparatus is disposed in a timing controller (TCON, used in a display) for generating corresponding version information. The system can read the version information of the TCON through an inter-integrated circuit (I2C) bus.
However, in a real application adopting the conventional technique, besides modifying the corresponding mask in the TCON according to the design requirement, the mask corresponding to the version information generating apparatus should also be modified, which increases the cost.
SUMMARY OF THE INVENTION
Accordingly, the invention is directed to an information generating apparatus and an operation method thereof, wherein when any metal layer mask of an integrated circuit (IC) is modified, logic information output by the information generating apparatus can be correspondingly modified without modifying any additional mask.
According to an embodiment of the invention, an information generating apparatus including a first logic contact, a second logic contact, an information output contact and a plurality of switches SW(i,j) is provided, wherein SWi,j) represents a jth switch in an ith layer, 1≦i≦L, 1≦j≦2(i−1), and L is an integer. The switch SW(i,j) has a first input terminal, a second input terminal and an output terminal. The output terminal of the switch SW(i,j) is selectively connected to the first input terminal or second input terminal of the switch SW(i,j). The first input terminals and the second input terminals of the switches SW(Lj) in the Lth layer are respectively connected to the first logic contact and the second logic contact. The first input terminal and the second input terminal of the switch SW(i,j) in other layers are respectively connected to the output terminals of the switches SW(i+1,2j-1) and SW(i+1,2j). The output terminal of the switch SW(1,1) in the 1st layer is connected to the information output contact.
According to an embodiment of the invention, an operation method of an information generating apparatus is provided, wherein the information generating apparatus is described above. The switches are disposed in different metal layers of an IC. A metal layer mask of the IC is modified according to a design requirement, wherein the metal layer mask is corresponding to the switches SW(i,j) in the ith layer. According to a design requirement, the output terminal and the first input terminal of an odd switch of the switches SW(i,j) in the ith layer are connected with each other, and the output terminal and the second input terminal of an even switch of the switches SW(i,j) in the ith layer are connected with each other. Or, according to a design requirement, the output terminal and the second input terminal of the odd switch of the switches SW(i,j) in the ith layer are connected with each other, and the output terminal and the first input terminal of the even switch of the switches SW(i,j) in the ith layer are connected with each other.
According to an embodiment of the invention, an operation method of an information generating apparatus is provided, wherein the information generating apparatus is described above. The switches are disposed in different metal layers of an IC. A metal layer mask of the IC is modified according to a design requirement, wherein the metal layer mask is corresponding to the switches SW(i,j) in the ith layer. According to a design requirement, the output terminals of the switches SW(i,j) in the ith layer are connected to the first input terminals of the switches SW(i,j) in the ith layer, respectively. Or, according to a design requirement, the output terminals of the switch SW(i,j) in the ith layer are connected to the second input terminals of the switch SW(i,j) in the ith layer, respectively.
These and other exemplary embodiments, features, aspects, and advantages of the invention will be described and become more apparent from the detailed description of exemplary embodiments when read in conjunction with accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
FIG. 1 is a functional block diagram of an integrated circuit (IC) according to an embodiment of the invention.
FIG. 2 is a functional block diagram of an information generating apparatus 11-1 in FIG. 1 according to an embodiment of the invention.
FIG. 3A and FIG. 3B are diagrams illustrating the layout of a switch in FIG. 2 according to an embodiment of the invention.
FIG. 4A is a functional block diagram of the infatuation generating apparatus 11-1 in FIG. 2 according to an embodiment of the invention.
FIGS. 4B-4D are diagrams illustrating how the information generating apparatus 11-1 in FIG. 4A is modified according to design requirements according to an embodiment of the invention.
FIG. 5A is a functional block diagram of the information generating apparatus 11-1 in FIG. 2 according to another embodiment of the invention.
FIGS. 5B-5D are diagrams illustrating how the information generating apparatus 11-1 in FIG. 5A is modified according to design requirements according to another embodiment of the invention.
DESCRIPTION OF THE EMBODIMENTS
Reference will now be made in detail to the present preferred embodiments of the invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts.
FIG. 1 is a functional block diagram of an integrated circuit (IC) according to an embodiment of the invention. The IC includes a core circuit 10 and a chip information module 11. The chip information module 11 generates an N-bit logic information I[0:N−1] according to its configuration, wherein N is an integer. The logic information I[0:N−1] can be served as an operation parameter, a customized setting value, a version information, or any other parameter of the core circuit 10. For example, if the logic information I[0:N−1] is served as the version information of the core circuit 10, the logic information I[0:N−1] may be a version number of the core circuit 10. The configuration of the chip information module 11 has to be modified according to the modification of the core circuit 10 so as to generate the corresponding logic information I[0:N−1] for the core circuit 10. When an external system issues a “version inquiry” request to the core circuit 10, the core circuit 10 outputs its version number VV to the external system according to the logic information I[0:N−1]. Thus, the external system can determine the version of the core circuit 10 according to the logic information I[0:N−1].
Referring to FIG. 1, the chip information module 11 includes N information generating apparatuses 11-1, 11-2, . . . , and 11-N. Each of the information generating apparatuses provides one bit of the logic information I[0:N−1]. For example, the first information generating apparatus 11-1 provides the bit I[0] of the logic information, the second information generating apparatus 11-2 provides the bit I[1] of the logic information, and the Nth information generating apparatus 11-N provides the bit I[N−1] of the logic information.
During the modification process of the core circuit 10, one or more metal layer masks of the IC are usually modified. Regardless of which metal layer mask is modified, in the present embodiment, a chip designer is allowed to modify the configurations of the information generating apparatuses 11-1, 11-2, . . . , and 11-N without modifying any additional mask. For example, if the chip designer needs to modify the layout of a first metal layer M1 during the modification process of the core circuit 10, the chip designer can adjust the logic information I[0:N−1] by modifying the configurations of the information generating apparatuses 11-1, 11-2, . . . , and 11-N in the first metal layer M1. Namely, the chip designer can modify the logic information I[0:N−1] without modifying the mask of any metal layer other than the first metal layer M1.
Below, an implementation example of the information generating apparatus 11-1 will be described, and the implementations of other information generating apparatuses 11-2, . . . , and 11-N illustrated in FIG. 1 can be referred to the description related to the information generating apparatus 11-1. FIG. 2 is a functional block diagram of the information generating apparatus 11-1 in FIG. 1 according to an embodiment of the invention. In the present embodiment, it is assumed that the IC has at least L metal layers, wherein L is an integer. The information generating apparatus 11-1 includes a first logic contact IN1, a second logic contact IN2, an information output contact OUT, and a plurality of switches SW(i,j), wherein SW(i,j) represents the jth switch in the ith layer, 1≦i≦L, and 1≦j≦2(i−1). All the switches belonging to the same layer (for example, the switches SW(i,j) in the ith layer) are disposed in the same metal layer (any metal layer) in the IC. For example, the switch SW(1,1) in the 1st layer may be disposed in a first metal layer M1, a second metal layer M2, or any other metal layer in the IC. The switches belonging to different layers (for example, the switches SW(i,j) in the ith layer and the switches SW(i+1,j) in the (i+1)th layer) are disposed in different metal layers of the IC. For example, the switches SW(i,j) in the ith layer are disposed in the (L−i+1)th metal layer.
In the present embodiment, the first logic contact IN1 is connected to a first logic value source (for example, a system voltage source VDD), and the second logic contact IN2 is connected to a second logic value source (for example, a ground voltage source GND). In other embodiments, the first logic contact IN1 may also be connected to the ground voltage source GND, while the second logic contact IN2 may also be connected to the system voltage source VDD.
Each switch SW(i,j) (for example, the switch SW(1,1)) has a first input terminal A, a second input terminal B, and an output terminal C. The output terminal C of the switch SW(i,j) is selectively connected to the first input terminal A or the second input terminal B of the switch SW(i,j).
The first input terminals A and the second input terminals B of the switches SW(Lj) in the Lth layer (i.e., the switches SW(L,1), SW(L,2), . . . , SW(L,2̂(L-1)-1), and SW(L,2̂(L-1))) are respectively connected to the first logic contact IN1 and the second logic contact IN2. The first input terminals A and the second input terminals B of the switches SW(i,j) in other layers are respectively connected to the output terminals C of the switches SW(i+1,2j-1) and the switches SW(i+1,2j). For example, the first input terminal A and the second input terminal B of the switch SW(L-1,1) are respectively connected to the output terminal C of the switch SW(L,1) and the output terminal C of the switch SW(L,2). The first input terminal A and the second input terminal B of the switch SW(L-1,2̂(L-2)) are respectively connected to the output terminal C of the switch SW(L,2̂(L-1)-1) and the output terminal C of the switch SW(L,2 (L-1)). The first input terminal A and the second input terminal B of the switch SW(1,1) are respectively connected to the output terminal C of the switch SW(2,1) and the output terminal C of the switch SW(2,2). The output terminal C of the switch SW(1,1) in the 1St layer is connected to the information output contact OUT. The information output contact OUT outputs a logic information I[0] to the core circuit 10.
Aforementioned switches SW(i,j) may be switches or multiplexers. FIG. 3A and FIG. 3B are diagrams illustrating the layout of the SW(1,1) in FIG. 2 according to an embodiment of the invention. The implementations of other switches SW(i,j) in FIG. 2 can be referred to the description related to the switch SW(1,1). The switch SW(1,1) in FIG. 3A and FIG. 3B may be disposed in any metal layer (for example, the Lth metal layer) of the IC. The switch SW(1,1) includes a first connecting terminal, a second connecting terminal, a third connecting terminal, and a conductive line 310. In the present embodiment, the first connecting terminal, the second connecting terminal, the third connecting terminal, and the conductive line 310 are all disposed in the Lth metal layer of the IC. The first connecting terminal, the second connecting terminal, and the third connecting terminal are respectively served as the first input terminal A, the second input terminal B, and the output terminal C of the switch SW(1,1). FIG. 3A illustrates a layout in which the conductive line 310 is connected between the second input terminal B and the output terminal C. FIG. 3B illustrates a layout in which the conductive line 310 is connected between the first input terminal A and the output terminal C.
An implementation example of the information generating apparatus 11-1 in FIG. 2 will be described by assuming the number of layers is 4 (i.e., L=4). FIG. 4A is a functional block diagram of the information generating apparatus 11-1 in FIG. 2 according to an embodiment of the invention. The switch SW(1,1) in the 1st layer is disposed in a 4th metal layer M4 of the IC. The switches SW(2,1) and SW(2,2) in the 2nd layer are disposed in a 3rd metal layer M3 of the IC. The switches SW(3,1), SW(3,2), SW(3,3), and SW(3,4) in the 3rd layer are disposed in a 2nd metal layer M2 of the IC. The switches SW(4,1), SW(4,2), SW(4,3), SW(4,4), SW(4,5), SW(4,6), SW(4,7), and SW(4,8) in the 4th layer are disposed on the 1st metal layer M1 of the IC.
According to the design requirement of a chip designer, the output terminals C and the first input terminals A of the odd switches in the ith layer are connected with each other, and the output terminals C and the second input terminals B of the even switches in the ith layer are connected with each other. Or, according to the design requirement of the chip designer, the output terminals C and the second input terminals B of the odd switches in the ith layer are connected with each other, and the output terminals C and the first input terminals A of the even switches in the ith layer are connected with each other.
Referring to FIG. 4A, the output terminals C and the second input terminals B of the odd switches SW(4,1), SW(4,3), SW(4,5), and SW(4,7) in the 4th layer are connected with each other, and the output terminals C and the first input terminals A of the even switches SW(4,2), SW(4,4), SW(4,6), and SW(4,8) in the 4th layer are connected with each other. The output terminals C and the second input terminals B of the odd switches SW(3,1) and SW(3,3) in the 3rd layer are connected with each other, and the output terminals C and the first input terminals A of the even switches SW(3,2) and SW(3,4) in the 3rd layer are connected with each other. The output terminal C and the second input terminal B of the odd switch SW(2,1) in the 2nd layer are connected with each other, and the output terminal C and the first input terminal A of the even switch SW(2,2) in the 2nd layer are connected with each other. The output terminal C and the second input terminal B of the odd switch SW(1,1) in the 1St layer are connected with each other. Herein the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT is a system voltage VDD (i.e., a logic value “1”).
Assuming that the chip designer modifies the mask(s) of one or more metal layers of the IC according to a design requirement, regardless of which metal layer the modified mask(s) belongs to, the chip designer can always modify the corresponding switches SW(i,j) in the same metal layer. FIGS. 4B-4D are diagrams illustrating how the information generating apparatus 11-1 in FIG. 4A is modified according to design requirements according to an embodiment of the invention. For example, if according to a design requirement, the chip designer needs to modify the mask of the 2nd metal layer M2 in the IC and the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT needs to be changed to the ground voltage GND (i.e., a logic value “0”), the chip designer can connect the output terminals C of the odd switches SW(3,1) and SW(3,3) in the 3rd layer to the first input terminals A of the odd switches SW(3,1) and SW(3,3) in the 3rd layer and connect the output terminals C of the even switches SW(3,2) and SW(3,4) in the 3rd layer to the second input terminals B of the even switches SW(3,2) and SW(3,4) in the 3rd layer according to the design requirement, as shown in FIG. 4B. Thereby, the chip designer can change the logic information I[0] output by the information generating apparatus 11-1 from the system voltage VDD to the ground voltage GND without modifying any additional metal layer mask.
Referring to FIG. 4B, if according to a design requirement, the chip designer needs to modify the mask of the 4th metal layer M4 in the IC and the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT needs to be changed back to the system voltage VDD, the chip designer can connect the output terminal C of the odd switch SW(1,1) in the 1st layer corresponding to the 4th metal layer M4 to the first input terminal A of the odd switch SW(1,1) in the 1st layer according to the design requirement, as shown in FIG. 4C. Thereby, the chip designer can change the logic information I[0] output by the information generating apparatus 11-1 from the ground voltage GND to the system voltage VDD without modifying any additional metal layer mask.
Referring to FIG. 4C, if according to a design requirement, the chip designer needs to modify the mask of the 1st metal layer M1 in the IC and the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT needs to be changed back to the ground voltage GND, the chip designer can connect the output terminals C of the odd switches SW(4,1), SW(4,3), SW(4,5), and SW(4,7) in the 4th layer corresponding to the 1st metal layer M1 to the first input ten finals A of the odd switches SW(4,1), SW(4,3), SW(4,5), and SW(4,7) in the 4th layer and connect the output terminals C of the even switches SW(4,2), SW(4,4), SW(4,6), and SW(4,8) in the 4th layer to the second input terminals B of the even switches SW(4,2), SW(4,4), SW(4,6), and SW(4,8) in the 4th layer according to the design requirement, as shown in FIG. 4D. Thereby, the chip designer can change the logic information I[0] output by the information generating apparatus 11-1 from the system voltage VDD to the ground voltage GND without modifying any additional metal layer mask.
FIG. 5A is a functional block diagram of the information generating apparatus 11-1 in FIG. 2 according to another embodiment of the invention. In FIGS. 4A to 4D, the switches SW(i,j) in the ith layer are disposed in the (L-i+1)th metal layer. In FIGS. 5A to 5D, the switches SW(i,j) in the ith layer are disposed in the ith metal layer. The switch SW(1,1) in the 1st layer is disposed in the 1st metal layer M1 of the IC. The switches SW(2,1) and SW(2,2) in the 2nd layer are disposed in the 2nd metal layer M2 of the IC. The switches SW(3,1), SW(3,2), SW(3,3), and SW(3,4) in the 3rd layer are disposed in the 3rd metal layer M3 of the IC. The switches SW(4,1), SW(4,2), SW(4,3), SW(4,4), SW(4,5), SW(4,6), SW(4,7), and SW(4,8) in the 4th layer are disposed in the 4th metal layer M4 of the IC.
According to a design requirement of the chip designer, the output terminals C and the first input terminals A of the switches SW(i,j) in the ith layer are connected with each other. Or, according to a design requirement of the chip designer, the output terminals C and the second input terminals B of the switches SW(i,j) in the ith layer are connected with each other.
Referring to FIG. 5A, the output terminals C and the first input terminals A of the switches SW(4,1), SW(4,2), SW(4,3), SW(4,4), SW(4,5), SW(4,6), SW(4,7), and SW(4,8) in the 4th layer are connected with each other. The output terminals C and the first input terminals A of the switches SW(3,1), SW(3,2), SW(3,3), and SW(3,4) in the 3rd layer are connected with each other. The output terminals C and the first input terminals A of the switches SW(2,1) and SW(2,2) in the 2nd layer are connected with each other. The output terminal C and the first input terminal A of the switch SW(1,1) in the 1st layer are connected with each other. Herein the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT is the system voltage VDD (i.e., the logic value “1”).
Assuming that the chip designer modifies the mask(s) of one or more metal layers of the IC according to a design requirement, regardless of which metal layer the modified mask(s) belongs to, the chip designer can always modify the corresponding switches SW(i,j) in the same metal layer. FIGS. 5B-5D are diagrams illustrating how the information generating apparatus 11-1 in FIG. 5A is modified according to design requirements according to another embodiment of the invention. For example, if according to a design requirement, the chip designer needs to modify the mask of the 3rd metal layer M3 in the IC and the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT needs to be changed to the ground voltage GND (i.e., the logic value “0”), the chip designer can connect the output terminals C of the switches SW(3,1), SW(3,2), SW(3,3), and SW(3,4) in the 3rd layer to the second input terminals B of the switches SW(3,1), SW(3,2), SW(3,3), and SW(3,4) in the 3rd layer according to the design requirement, as shown in FIG. 5B. Thereby, the chip designer can change the logic information I[0] output by the information generating apparatus 11-1 from the system voltage VDD to the ground voltage GND without modifying any additional metal layer mask.
Referring to FIG. 5B, if according to a design requirement, the chip designer needs to modify the mask of the 1st metal layer M1 in the IC and the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT needs to be changed back to the system voltage VDD, the chip designer can connect the output terminal C of the switch SW(1,1) in the 1st layer corresponding to the 1st metal layer M1 to the second input terminal B of the switch SW(1,1) in the 1st layer according to the design requirement, as shown in FIG. 5C. Thereby, the chip designer can change the logic information I[0] output by the information generating apparatus 11-1 from the ground voltage GND to the system voltage VDD without modifying any additional metal layer mask.
Referring to FIG. 5C, if according to a design requirement, the chip designer needs to modify the mask of the 4th metal layer M4 in the IC and the logic information I[0] provided by the information generating apparatus 11-1 through the information output contact OUT needs to be changed back to the ground voltage GND, the chip designer can connect the output terminals C of the switches SW(4,1), SW(4,2), SW(4,3), SW(4,4), SW(4,5), SW(4,6), SW(4,7), and SW(4,8) in the 4th layer corresponding to the 4th metal layer M4 to the second input terminals B of the switches SW(4,1), SW(4,2), SW(4,3), SW(4,4), SW(4,5), SW(4,6), SW(4,7), and SW(4,8) in the 4th layer according to the design requirement, as shown in FIG. 5D. Thereby, the chip designer can change the logic information I[0] output by the information generating apparatus 11-1 from the system voltage VDD to the ground voltage GND without modifying any additional metal layer mask.
In summary, according to embodiments of the invention, regardless of which metal layer a modified mask belongs to, a chip designer is allowed to modify the corresponding switches SW(i,j) in the same metal layer, so as to adjust the logic information provided by the information generating apparatuses 11-1-11-N correspondingly.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.