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The micromirror device 27 comprises an image forming surface 27a provided with a large number of mirror elements, which compose pixels for forming a two-dimensional pattern image and are arranged in matrix. An image-signal input part 28 inputs an image signal of the pattern image into the micromirror device 27. The pattern image is patterned on digital information as a binary image. Inclination of each mirror element of the micromirror device 27 is electrically controlled on the basis of the inputted image signal. The inclination of each mirror element is changed between an on-position where the incident light is reflected in a normal direction of the image forming surface 27a to display white, and an off-position where the incident light is reflected in the other direction to display black. In virtue of this, brightness information of white pixel and black pixel is given to the light emitted from the first light-source unit 25.
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The quarter-wave plate 33 converts the incident light of linear polarization into circularly-polarized light. The linearly-polarized light advancing from the micromirror device 27 toward the recording medium 11 passes through the quarter-wave plate 33 one time, and then, is reflected by the recording medium 11 to enter the quarter-wave plate 33 again. As to the linearly-polarized light passing through the quarter-wave plate 33 two times in opposite directions along the identical optical pass, a polarization plane thereof rotates by 90 degrees. The objective lens 34 condenses the information light and the reference light, and makes them interfere with each other to produce interference fringes on the recording layer 20 of the recording medium 11. On the basis of servo information obtained by reading the emboss pit 16, tracking control and focus servo control of the objective lens 34 are performed. Further, the objective lens 34 is driven in an optical-axis direction and in a perpendicular direction thereto by receiving drive force of an actuator and so forth.
When the reference light for reproduction is applied to the interference fringes recorded in the recording layer 20 and the information light is reproduced from the interference fringes, a CMOS image sensor 38 detects the reproduced information light as a two-dimensional reproduction pattern image. In this regard, the reproduced information light has been converted into the S-polarized light by the quarter-wave plate 33. Therefore, the reproduced information light is reflected by the first polarization beam splitter 30 to enter the CMOS image sensor 38. A reproduction pattern image analyzer 39 decodes the detected reproduction pattern image to restore the digital information. In addition, the reproduction pattern image analyzer 39 calculates contrast of the reproduction pattern image on the basis of brightness information thereof. The contrast of the reproduction pattern image acts as a parameter for judging whether the information light is properly reproduced or not.
A second light-source unit 41 emits the red light R1, a wavelength of which is different from the first light-source unit 25, as pit readout light. The second light-source unit 41 includes a laser source and a polarization converter. The laser source emits a red laser beam having a wavelength of 655 nm, for example. The polarization converter converts the red laser beam into polarized light of S-polarization. The pit readout light emitted from the second light-source unit 41 is reflected by a second polarization beam splitter 42. The pit readout light reflected by the second polarization beam splitter 42 enters the dichroic mirror 32 via a reflective mirror 43. Since the dichroic mirror 32 reflects the pit readout light of the red light, the pit readout light is synthesized with the information light and the reference light. The pit readout light advances toward the recording medium 11 in the optical path identical with that of the information light and the reference light.
The pit readout light is condensed by the objective lens 34 and enters the recording medium 11. The pit readout light is reflected by the reflecting layer 17 wherein the emboss pit is formed. And then, the pit readout light is returned to the same optical path through which the pit readout light has entered the recording medium 11. Since the pit readout light passes through the quarter-wave plate 33 two times, a polarization plane thereof rotates by 90 degrees. In virtue of this, the pit readout light passes through the second polarization beam splitter 42 and reaches a photodetector 44, which detects the pit readout light returned from the recording medium 11 to produce an electrical signal. This electrical signal includes servo information for performing servo control of the objective lens 34, and positional information for detecting the recording position of the interference fringes.
On the basis of the contrast of the reproduction pattern image calculated by the reproduction pattern image analyzer 39, a pattern-image forming-position adjuster 46 judges whether or not the reference light for reproduction is correctly applied to the interference fringes. When the reference light is not applied to the correct position, an instruction is sent to the image-signal input part 28 to change the position of the reference-light pattern image P1 formed on the image forming surface 27a of the micromirror device 27, such as shown in
Next, positional adjustment of the information light, the reference light and the pit readout light is described below. At a time of manufacturing the information recording/reproducing device 10, the reference recording medium 11 in which interference fringes are recorded in advance is used for performing a reproduction test. In the information recording/reproducing device 10 to be adjusted, the reference-light pattern image P1 is formed on the image forming surface 27a of the micromirror device 27. The reference-light pattern image P1 is initially formed at the center of the image forming surface 27a. When the reference light is applied to the recording medium 11 and the information light is reproduced from the interference fringes, the CMOS image sensor 38 detects the reproduction pattern image and the reproduction pattern image analyzer 39 calculates the contrast of the reproduction pattern image.
The pattern-image forming-position adjuster 46 judges whether or not the calculated contrast of the reproduction pattern image satisfies a prescribed level. When the reproduction pattern image satisfies the prescribed level, adjustment is judged to be unnecessary. In contrast, when the reproduction pattern image does not satisfy the prescribed level, the pattern-image forming-position adjuster 46 sends the instruction to the image-signal input part 28 to input the image signal, by which the position of the reference-light pattern image P1 is changed, into the micromirror device 27. For example, the reference-light pattern image P1 is formed on the image forming surface 27a at the respective positions shifted in vertical and horizontal directions by one pixel. The CMOS image sensor 38 detects the four reproduction pattern images in which the reference-light pattern image P1 is shifted in the respective directions, and the reproduction pattern image analyzer 39 calculates the contrast of the respective four reproduction pattern images.
From among the respective reproduction pattern images changing the position of the reference-light pattern image P1 in four ways, the pattern-image forming-position adjuster 46 specifies the reproduction pattern image from which the best contrast is obtained. Then, the pattern-image forming-position adjuster 46 judges whether or not the contrast of the specified reproduction pattern image satisfies the prescribed level. When the contrast of the reproduction pattern image satisfies the prescribed level, it is judged that the position of the current reference-light pattern image P1 is proper, and then, the adjustment is terminated. In contrast, when the reproduction pattern image having the contrast satisfying the prescribed level is not obtained, the position of the reference-light pattern image P1 is further changed. For example, the position of the reference-light pattern image P1 is vertically and horizontally changed by two pixels or is obliquely changed. Similarly to the above, the reproduction pattern image P1 from which the best contrast is obtained is specified, and it is judged whether or not the obtained contrast satisfies the prescribed level.
In the information recording/reproducing device 10 for which the adjustment has been performed, the reference-light pattern image P1 is formed at a position shifted from the initial central position of the image forming surface 27a by a predetermined number of pixels. Obtainment of the reproduction pattern image satisfying the contrast of the prescribed level means that the positional relationship of the pit readout light and the reference light is uniformed relative to the other information recording/reproducing device in which the recording medium 11 for reproduction test has been produced. Incidentally, since the center of the information-light pattern image P2 is identical with that of the reference-light pattern image P1, the position of the information-light pattern image P2 is also shifted by the same amount as the reference-light pattern image P1. In virtue of this, the position for recoding the interference fringe coincides with the position for reproducing the information light. Thus, it is possible to secure reproduction compatibility of the information recoding/reproducing device 10.
In the above embodiment, the micromirror device is used as a spatial light modulator for forming the two-dimensional pattern image. Instead of this, it is possible to use a liquid-crystal display panel, a magneto-optical modulator and so forth. Moreover, in the above embodiment, the pit readout light is synthesized with the reference light and the information light, and is applied to the recording medium. The present invention, however, may be adopted to an information reproducing/recoding device using, for example, a recording medium to which the pit readout light is applied from an opposite surface of a surface to which the reference light and the information light are applied. Further, the present invention may be adopted to an information reproducing device performing only reproduction of the information light. In the above description, the application position of the reference light is adjusted when the information recording/reproducing device is manufactured. However, this is not exclusive. The application position of the reference light may be adjusted whenever the information light is reproduced. In this case, it is possible to reproduce the information light from the recording medium 11 in which the interference fringes are recoded by an information recording/reproducing device having no reproduction compatibility.
Although the present invention has been fully described by way of the preferred embodiments thereof with reference to the accompanying drawings, various changes and modifications will be apparent to those having skill in this field. Therefore, unless otherwise these changes and modifications depart from the scope of the present invention, they should be construed as included therein.
Number | Date | Country | Kind |
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2006-196766 | Jul 2006 | JP | national |