Patent Grant
7034515
This invention relates to an instantaneous voltage dip detection device for detecting an instantaneous voltage dip in distribution network that occurs due to lightning or the like.
As has been disclosed, for example, in the Japanese Patent Publication (unexamined) 2000-55947 and the Japanese Patent Publication (unexamined) 2002-171690 respectively, according to the publicly known instantaneous voltage dip detection devices, results of subtraction between an absolute value waveform of a reference sine wave and a reference cosine wave each synchronizing with a supply voltage and an absolute value waveform of a supply sine wave and a supply cosine wave are respectively obtained; the obtained results of subtraction are then integrated; and in the case where any of the results of integration exceeds a reference value, it is determined that a voltage dip has occurred.
In the aforementioned conventional system, however, since the integration is utilized for the detection of voltage dip, a problem exists in that it takes a time of about ¼ cycle of an AC waveform in the detection and determination. Moreover, another problem exists in that if arranging an instantaneous voltage dip compensating device using such an instantaneous voltage dip detection device, service interruption over ¼ cycle takes place from the start of voltage dip up to the switching to the voltage dip compensating operation.
This invention was made to solve the above-discussed problems and has an object of providing a system for detecting a voltage dip at a high speed.
To accomplish the foregoing object, an instantaneous voltage dip detection device according to this invention is characterized by including:
Another instantaneous voltage dip detection device according to this invention is characterized by including:
According to this invention, since the detection device not using any integration but using an instantaneous comparison is used for detection of a voltage dip, it is possible to detect voltage dip at a high speed. Further, since the detection device not using any integration taking a long time (over ¼ cycle) is used for the detection of voltage dip, it is possible to detect voltage dip at a high speed. Switching a phase to be detected makes it possible to carry out a determination processing with a high level signal at all times, enabling to perform a stable detection. Further, carrying out an operation for a short time in a low-level signal region (near zero voltage phase) makes it possible to perform a stable detection. Furthermore, even in the state of superimposed harmonics, a stable detection can be performed by relieving the threshold conforming to a level of the harmonics and carrying out a comparative determination in comparison with the recorded waveforms.
Now Embodiment 1 is hereinafter described with reference to
For example, in a manufacturing apparatus driven at a supply voltage of which effective value is 200V, when an input voltage has dipped to not higher than 160V, a set value is 0.8 (=160/200) in order to detect the instantaneous voltage dip. That is, the threshold 12 and the threshold 14 are prepared and outputted so that amplitude is 0 when phase is 0π (=200×√{square root over (2)}×sin(0π)×0.8), amplitude is 80√{square root over (2)} when phase is π/6 (=200×√{square root over (2)}×sin(π/6)×0.8), amplitude is 160 when phase is π/4 (=200×√{square root over (2)}×sin(π/4)×0.8), and amplitude is 160√{square root over (2)} when phase is π/2 (=200×√{square root over (2)}×sin(π/2)×0.8).
Determination region setting means 6 is provided to set, in synchronization with the phase lock means, a part of the supply voltage waveform threshold 12 and phase shift voltage waveform threshold 14 that are larger than a predetermined value, e.g., apart in which amplitude of each threshold is larger than about 70% of a peak value line 100 (sin(nπ/4)=0.707 . . . , n=1, 3, 5, 7 . . . ), as being a comparative determination effective region. Further, supply voltage waveform comparing means 7 and phase shift voltage waveform comparing means 8 are provided. The supply voltage waveform comparing means 7 makes a comparison in magnitude between a supply voltage waveform 11 and a supply voltage waveform threshold 12 in the case where the determination region setting means 6 has determined a comparative determination region 70 (for example, π/4 to 3π/4, 5π/4 to 7π/4 in
Furthermore, there are provided logical addition (OR) means 9 for outputting a logical addition (OR) of output of the supply voltage waveform comparing means 7 and output of the phase shift voltage waveform comparing means 8, and voltage dip signal detection output means 10 for outputting a voltage dip signal in the case where any voltage dip has been detected by the supply voltage waveform comparing means 7 or by the phase shift voltage waveform comparing means 8 upon receiving the output of the logical addition (OR) means 9.
Operations of the instantaneous voltage dip detection device according to Embodiment 1 arranged as described above are hereinafter described with reference to
Further, the phase shift voltage waveform comparing means 8 makes a comparison in magnitude between the phase shift voltage waveform 13 and phase shift voltage waveform threshold 14 being in synchronization with each other in a region where the phase shift voltage waveform threshold 14 determined by the determination region setting means 6 is not smaller than a predetermined value, for example, at the phases of 0 to π/4, 3π/4 to 5π/4 and 7π/4 to 2π (in repeating fashion) of
As shown in
As described above, since the supply voltage waveform comparing means 7 determines the instantaneous voltage dip continuously at an instantaneous value, any instantaneous voltage dip can be detected at a high speed, for example, at a cycle of not more than 1/10 of one wavelength. Further, since the voltage dip can be determined using only a region where voltage waveform level for detecting the voltage dip is larger, stable and constant detection can be performed. Accordingly, when arranging a voltage compensation apparatus in combination of the instantaneous voltage dip detection device, it becomes possible to compensate an instantaneous voltage dip in a very short time.
Further, since a phase shift voltage waveform shifting a supply voltage waveform by 90° is also utilized in the detection of the instantaneous voltage dip, the instantaneous voltage dip detection device can be used for detecting any region, where voltage waveform level is large, of at least either the supply voltage waveform or the phase shift voltage waveform, and a determination region that is continuous in time can be obtained.
In addition, although an example in which phase shift voltage waveform is one is described above, it is possible that there are two or more phase shift voltage waveforms. For example, in the case of two phase shift voltage waveforms, phase is shifted by every 60°. In this case, however, circuit arrangement will be complicated and therefore one phase shift voltage waveform is preferably.
In this Embodiment 2, even if there is any variation in phase shift amount of the phase shift means 2, since a threshold is generated by the phase shift voltage waveform threshold generating means 5 on the basis of zero voltage phase of the output voltage waveform of the phase shift means 2, the variation in phase shift amount can be compensated, and stable and constant detection can be performed.
In this Embodiment 3, even if there is any variation in phase shift amount of the phase shift means 2, a phase difference from the phase lock means 3 is detected by the phase difference detection means 16 and a phase of the threshold generated by the phase shift voltage waveform threshold generating means 5 is controlled by the output thereof. Therefore, even if there is any variation in phase shift amount of the phase shift means 2, the variation in phase shift amount can be compensated, and stable and constant detection can be performed.
In this embodiment, referring to the arrangements shown in
Generally, a differentiation circuit is sometimes employed as a method of phase shifting a waveform by 90°. However, in the case of using a differentiation circuit, a gain of high frequency component contained in the supply voltage waveform becomes large, and a waveform of which out of alignment is large and which is not suitable for the voltage dip detection is outputted (for example, see a phase shift voltage waveform 13b at the time of superimposition of harmonics shown in
According to this Embodiment 5, since an all-pass filter consisting of resistors, capacitor and amplifier is used as phase shift means, it becomes possible to establish the supply voltage waveform 11 and the gain of the phase shift voltage waveform 13 after the phase shifting by about 90° to be almost equal. There is no need of reducing such a gain by combining a low-pass filter circuit to eliminate the high frequency component as is required in the case of using a differentiation circuit. Thus, an advantage exists in that a phase shift waveform can be generated with a simple circuit arrangement.
This embodiment shows an example of circuit arrangement of
In this Embodiment, the phase difference detection means 16 of
Referring to
Specifically, in the case of using an all-pass filter shown in
Therefore accuracy in the detection of instantaneous voltage dip is lowered as compared with that in
According to Embodiment 6 of the invention, even in the case of superimposing the harmonics on the supply voltage, level of the harmonics are detected and threshold is reduced, thereby making it possible to perform a stable detection of voltage dip.
This embodiment relates to an instantaneous voltage dip detection device of which circuit arrangement is based on
A predetermined value, for example, 20% of a recorded value is added to or subtracted from the recorded supply voltage waveform 11 or phase shift voltage waveform 13 to obtain an upper limit threshold and a lower limit threshold. For example, a value of which waveform is shifted by ±20% with respect to the previous waveform is established as an upper limit threshold and a lower limit threshold.
The supply voltage waveform comparing means 7 and phase shift voltage waveform comparing means 8 determines that an instantaneous voltage dip has occurred when the supply voltage waveform 11 or phase shift voltage waveform 13 varies over the mentioned upper limit threshold and the lower limit threshold.
In this manner, an advantage is obtained such that even under the condition that determination of a threshold is difficult, it is possible to perform a stable detection of voltage dip. Although 20% is taken as a predetermined value is in the foregoing description, the percentage can be changed depending upon the phase.
This embodiment relates to an instantaneous voltage dip detection device of the circuit arrangement shown in
In the phase shift means 2 according to Embodiment 5 (see
At this predetermined phase, the phase shift voltage waveform threshold generating means 5 generates not only a determination threshold of voltage dip but also a determination threshold of voltage rising, and the phase shift voltage waveform comparing means 8 determines the voltage dip based on both of the mentioned thresholds. In the case of a sharp change in voltage, the determination is carried out based on the voltage rising threshold and in the case of a slow change in voltage, the determination is carried out based on the voltage dip threshold.
According to this Embodiment 8, an advantage is obtained such that it is possible to perform a speedy detection of instantaneous voltage dip over a wide range of phase.
This embodiment relates to an instantaneous voltage dip detection device of the circuit arrangement shown in
At a voltage dip determination threshold and at a predetermined phase, for example, at 3π/4 to π, the phase shift voltage waveform threshold generating means 5 determines a voltage rising determination threshold by adding or subtracting a predetermined value to or from a recorded waveform value of the recorded phase shift voltage waveform 13, for example, 20% of the value. The phase shift voltage waveform comparing means 8 determines a voltage dip based on the mentioned both thresholds. In the case of a sharp change in voltage, the determination is carried out based on the voltage rising threshold and in the case of a slow change in voltage, the determination is carried out based on the voltage dip threshold. Although 20% is taken as a predetermined value is in the foregoing description, the percentage can be changed depending upon the phase.
According to this Embodiment 9, an advantage is obtained such that it is possible to perform a speedy detection of instantaneous voltage dip over a wide range of phase.
In this Embodiment 10, a phase lock means 3 is provided for detecting zero voltage phase (zero-cross point) of the supply voltage waveform 11 which is a signal waveform of the supply voltage 1. In synchronization with an output of this phase lock means 3, the supply voltage waveform threshold generating means 4 generates the supply voltage waveform threshold 12 acting as a voltage dip determination reference with respect to the supply voltage waveform 11.
The supply voltage waveform comparing means 7 determines that an instantaneous voltage dip has occurred, in the case where the supply voltage waveform 11 is below the supply voltage waveform threshold (i.e., goes down beyond the threshold in the direction of AC zero voltage) in a region where the determination region setting means 6 has determined a comparative determination effective region (for example, π/10 to 9π/10, 11π/10 to 19π/10).
Waveform recording means 22 records sequentially the supply voltage waveform in synchronization with the phase lock means 3, and recorded waveform threshold generating means 23 establishes an upper limit threshold and a lower limit threshold by adding and/or subtracting a predetermined value, for example, 20% based on a recorded waveform value of the recorded supply voltage waveform. For example, a value of which waveform is shifted by ±20% with respect to the previous waveform is established as an upper limit threshold and a lower limit threshold. a value of which waveform is shifted by ±20% with respect to the previous waveform. Although the same value is taken as a predetermined value over the all phase region in the foregoing description, any value different depending upon the phase can be set.
Recorded waveform comparing means 24 determines that an instantaneous voltage dip has occurred in the case where the supply voltage waveform 11 has changed over the mentioned upper limit threshold and lower limit threshold in a region where the mentioned determination region setting means 6 determines as being a comparative determination effective region. In this regard, although both upper limit threshold and lower limit threshold are used, it is preferable to use only the lower limit threshold.
Continuity determination means 25 determines that a voltage dip in which voltage is reduced gently has occurred in the case where the supply voltage waveform comparing means 7 has determined occurrence of an instantaneous voltage dip continuously for a predetermined time period (for example, for ¼ cycle).
Logical multiplication (AND) means 26 determines that an instantaneous voltage dip has occurred in the case where both recorded waveform comparing means 24 and supply voltage waveform comparing means 7 have determined occurrence of an instantaneous voltage dip. Thus, an advantage is such that even in the case where high harmonics are mixed at a high level and occurrence of an instantaneous voltage dip is erroneously determined in the voltage waveform comparison, the recorded waveform comparing means 24 determines the voltage dip rightly, enabling to perform a stable voltage dip detection. In the case of very gentle voltage reduction, there may be a case where a difference between the current waveform and the waveform preceding by 1 cycle is so small that the recorded waveform comparing means 24 cannot determine the voltage dip. Even in such a case, the continuity determination means 25 can detect the voltage dip.
Logical addition (OR) means 27 determines that an instantaneous voltage dip has occurred when either the logical multiplication (AND) means 26 or the continuity determination means 25 has determined occurrence of an instantaneous voltage dip.
As a result, even in the case where harmonics are mixed at a high level and an instantaneous voltage dip of gentle voltage has occurred, it is possible to perform a stable detection.
In this Embodiment 11, a phase lock means 3 is provided for detecting zero voltage phase (zero-cross point) of the supply voltage waveform 11 that is a signal waveform of the supply voltage 1. In synchronization with an output of this phase lock means 3, the supply voltage waveform threshold generating means 4 generates the supply voltage waveform threshold 12 acting as a voltage dip determination reference with respect to the supply voltage waveform 11.
The supply voltage waveform comparing means 7 determines that an instantaneous voltage dip has occurred, in the case where the supply voltage waveform 11 is below the supply voltage waveform threshold (i.e., goes down beyond the threshold in the direction of AC zero voltage in a region where the determination region setting means 6 has determined a comparative determination effective region (for example, π/10 to 9π/10, 11π/10 to 19π/10).
Waveform recording means 22 records sequentially the supply voltage waveform in synchronization with the phase lock means 3, and recorded waveform threshold generating means 23 establishes an upper limit threshold and a lower limit threshold by adding and/or subtracting a predetermined value, for example, 20% based on a recorded waveform value of the recorded supply voltage waveform. For example, a value of which waveform is shifted by ±20% with respect to the previous waveform is established as an upper limit threshold and a lower limit threshold. Although the same value is taken as a predetermined value over the all phase region in the foregoing description, any value different depending upon the phase can be set.
Recorded waveform comparing means 24 determines that an instantaneous voltage dip has occurred in the case where the supply voltage waveform 11 has changed over the mentioned upper limit threshold and lower limit threshold in a region where the mentioned determination region setting means 6 determines as being a comparative determination effective region. In this regard, although both upper limit threshold and lower limit threshold are used, it is preferable to use only the lower limit threshold.
Continuity determination means 25 determines that a voltage dip in which voltage is reduced gently has occurred in the case where the supply voltage waveform comparing means 7 has determined occurrence of an instantaneous voltage dip continuously for a predetermined time period (for example, for ¼ cycle).
Waveform integrating means 28, in synchronization with the phase lock means 3, integrates and outputs a predetermined calculation value (for example, absolute value) of the supply voltage waveform 11 during the phase of 0 to π/10, 9π/10 to π, 19π/10 to 2π being near zero voltage phase.
Integrated threshold generating means 29 generates an integrated value during the mentioned phase (in this case 0 to π/10, 9π/10 to π, 19π/10 to 2π) of sine wave of a voltage value detected as an instantaneous voltage dip, the integrated value being an integration waveform threshold serving as a voltage dip determination reference. The integration waveform threshold is preferably selected so that noise detection sensitivity is low as compared with the recorded waveform threshold from the viewpoint of preventing malfunction due to noise because there are much noise components in the region near zero voltage phase. For example, it is preferable that the integrated waveform threshold is established to be a value that is 50% of a value of an ideal waveform or previous waveform.
Integrated value comparing means 30 determines that an instantaneous voltage dip has occurred in the case that an output of the waveform integrating means 28 is below the integrated waveform threshold (i.e., goes down beyond the threshold in the direction of AC zero voltage) in a region where the determination region setting means 6 has determined a comparative determination effective region (in this case, 0 to π/10, 9π/10 to π, 19π/10 to 2π).
Logical addition (OR) means 31 determines that an instantaneous voltage dip has occurred when either the voltage waveform comparing means 7 or the integrated value comparing means 30 has determined occurrence of an instantaneous voltage dip.
The logical multiplication (AND) means 26 determines that an instantaneous voltage dip has occurred in the case where both recorded waveform comparing means 24 and logical addition (OR) means 31 have determined occurrence of an instantaneous voltage dip.
In the region near zero voltage phase, influence of noise can re reduced by integration, enabling to perform stable voltage dip detection. Furthermore, an advantage is such that even in the case where harmonics are mixed at a high level and occurrence of an instantaneous voltage dip is erroneously determined in the voltage waveform comparison, the recorded waveform comparing means 24 determines the voltage dip rightly, enabling to perform a stable voltage dip detection. In the case of very gentle voltage reduction, there may be a case where a difference between the current waveform and the waveform preceding by 1 cycle is so small that the recorded waveform comparing means 24 cannot determine the voltage dip. Even in such a case, the continuity determination means 25 can detect the voltage dip.
Logical addition (OR) means 27 determines that an instantaneous voltage dip has occurred when either the logical multiplication (AND) means 26 or the continuity determination means 25 has determined occurrence of an instantaneous voltage dip.
As a result, even in the case where harmonics are mixed at a high level and an instantaneous voltage dip of gentle voltage has occurred, it is possible to perform a stable detection.
The present invention enables a voltage dip to be detected at a high speed, and is effective for detection of instantaneous voltage dip in distribution network occurring due to lightning.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2003-161120 | Jun 2003 | JP | national |
| Filing Document | Filing Date | Country | Kind | 371c Date |
|---|---|---|---|---|
| PCT/JP03/16315 | 12/19/2003 | WO | 00 | 12/6/2004 |
| Publishing Document | Publishing Date | Country | Kind |
|---|---|---|---|
| WO2004/109303 | 12/16/2004 | WO | A |
| Number | Name | Date | Kind |
|---|---|---|---|
| 3648070 | Eicher | Mar 1972 | A |
| 5512837 | Ohnishi | Apr 1996 | A |
| 6628125 | Fazakas | Sep 2003 | B1 |
| 6850237 | Nakayama | Feb 2005 | B1 |
| Number | Date | Country |
|---|---|---|
| 2000-55947 | Feb 2000 | JP |
| 2002-171690 | Jun 2002 | JP |
| Number | Date | Country | |
|---|---|---|---|
| 20060012379 A1 | Jan 2006 | US |
