Instrument for Electrical Surface Characterization During Processing

Information

• NSF Award
• 8860687

Owner

• Energy Science Laboratories, Inc.

• Award Id

  8860687

• Award Effective Date

  4/1/1989 - 35 years ago

• Award Expiration Date

  12/31/1989 - 35 years ago

• Award Amount

  $ 49,787.00

• Award Instrument

  Standard Grant

The research will develop an instrument for monitoring the work function of surfaces during surface processing. The instrument measures the contact potential difference between the surface and an inert reference electrode by a variable capacitance technique. A novel method for capacitance modulation between the unknown and the reference electrode is used. The measurement can be done in vacuum or ambient gas. The probe design would allow it to be moved away during sample annealing, or over-coating of the sample surface, and then repositioned for measurement. Provision can be made to clean or remove sample surface layers in order to expose fresh bulk material. Specifically, the instrument is designed to monitor changes in the surface electrical properties of high critical temperature oxide superconductors that are being processed for superconducting quantum interference devices (SQUIDS) and radio frequency cavity structures. The instrument is also suitable for monitoring semiconductor surfaces during processing.

• Program Officer

  Ritchie B. Coryell

• Min Amd Letter Date

  4/10/1989 - 35 years ago

• Max Amd Letter Date

  4/10/1989 - 35 years ago

• ARRA Amount

• Name

  Energy Science Laboratories Inc

• City

  SAN DIEGO

• State

  CA

• Country

  United States

• Address

  6888 NANCY RIDGE DR.

• Postal Code

  921212232

• Phone Number

  6195877092

• First Name

  George

• Last Name

  Webb

• Email Address

  gwwebb@ucsd.edu

• Start Date

  4/1/1989 12:00:00 AM

• Name

  Other Applications NEC

• Code

  99