This proposal requests two Hewlett Packard 4145B semiconductor parameter analyzers and two plotters provide the base for laboratory improvement in the area of integrated circuit design. The purposes of the laboratory improvement are to introduce modern measurement approaches to integrated device and circuit characterization and to improve the laboratory offerings associated with two recently introduced courses in the integrated circuit design area. One course emphasizes analog integrated circuit design, and the other emphasizes VLSI subsystems design and includes their fabrication. These courses were placed together to provide cross-fertilization between digital and analog design as well as between MOS and bipolar technologies. The equipment will be used to measure and plot semiconductor device parameters and the characteristics of basic circuits such as integrated resistors, amplifiers, sources, level shifters, logic gates, and nonlinear analog functional circuits. Input/output and transfer characteristics will be measured for devices and circuits.