This application is a 371 National Stage entry of PCT application no. PCT/US2020/060599, filed on Nov. 13, 2020, the entire content of which is incorporated by reference herein.
This disclosure relates generally to antenna arrays integrated with distributed beamformer integrated circuit (IC) chips.
Antenna arrays are in widespread use today in diverse applications at microwave and millimeter wave frequencies, such as in aircraft, satellites, vehicles, watercraft, and base stations for general land-based communications. Such antenna arrays typically include microstrip radiating elements driven with phase shifting beamforming circuitry to generate a phased array for beam steering. It is typically desirable for an entire antenna system, including the antenna array and beamforming circuitry, to occupy minimal space with a low profile.
An integrated antenna array may be defined as an antenna array constructed with antenna elements integrated with radio frequency (RF) integrated circuit chips (RFICs) (interchangeably called “beamformer ICs” (BFICs)) in a compact structure. An integrated antenna array may have a sandwich type configuration in which the antenna elements are disposed in an exterior facing component layer and the RFICs are distributed across the effective antenna aperture within a proximate, parallel component layer behind the antenna element layer. The RFICs may include RF power amplifiers (PAs) for transmit and/or low noise amplifiers (LNAs) for receive and/or phase shifters for beam steering. By distributing PAs/LNAs in this fashion, higher efficiency on transmit and/or improved noise performance on receive are attainable, along with higher reliability relative to non-distributed IC designs.
In an aspect of the present disclosure, an antenna apparatus includes an antenna substrate having opposite first and second surfaces. At least one antenna element is disposed at the first surface of the antenna substrate. At least one radio frequency integrated circuit (RFIC) chip has a lower surface attached to the second surface of the antenna substrate and has an RF contact coupled to the at least one antenna element through the antenna substrate. The at least one RFIC chip has an RF signal conductor at an upper surface thereof and beamforming circuitry coupled between the RF contact and the RF signal conductor. A transmission line section has a lower surface attached to the second surface of the antenna substrate, and has an upper surface at which a transmission line conductor is disposed and connected to the RF signal conductor of the RFIC chip through an upper surface interconnect such as a wirebond, ribbon bond or edge contact pair.
Thereby, the at least one RFIC chip within an integrated antenna structure has multiple surface interfaces, which may lead to performance and manufacturing advantages for the antenna apparatus.
A phased array antenna embodiment includes a plurality of antenna elements disposed at the first surface of the antenna substrate; and a plurality of RFIC chips each having a lower surface attached to the antenna substrate's second surface and an RF contact each coupled to at least one of the antenna elements. Each RFIC chip has an RF signal conductor at its upper surface and beamforming circuitry for beam steering coupled between the respective RF contact and the RF signal conductor. At least one transmission line section is disposed between the RFIC chips, and has a plurality of branch arm conductors of a beamforming network (BFN) at its upper surface, each connected to an RF signal conductor of a respective one of the RFIC chips through an upper surface interconnect.
The above and other aspects and features of the disclosed technology will become more apparent from the following detailed description, taken in conjunction with the accompanying drawings in which like reference characters indicate like elements or features. Various elements of the same or similar type may be distinguished by annexing the reference label with an underscore/dash and second label that distinguishes among the same/similar elements (e.g., _1, _2), or directly annexing the reference label with a second label. However, if a given description uses only the first reference label, it is applicable to any one of the same/similar elements having the same first reference label irrespective of the second label. Elements and features may not be drawn to scale in the drawings.
The following description, with reference to the accompanying drawings, is provided to assist in a comprehensive understanding of certain exemplary embodiments of the technology disclosed herein for illustrative purposes. The description includes various specific details to assist a person of ordinary skill the art with understanding the technology, but these details are to be regarded as merely illustrative. For the purposes of simplicity and clarity, descriptions of well-known functions and constructions may be omitted when their inclusion may obscure appreciation of the technology by a person of ordinary skill in the art.
Antenna substrate 110 may include a dielectric layer 190, a ground plane 210 for reflecting signal energy from antenna elements 125, and a layer region 220 (“redistribution layer (RDL) layer”) including conductive lines for DC and/or control signals supplied to RFIC chips 150. At least one transmission line (“TL”) section 180 has a lower surface attached to upper surface 111 of antenna substrate 110. TL section 180 has an upper surface at which a signal conductor 181_s of the transmission line is disposed and coupled at K locations to RF signal conductors 151_s through respective upper surface interconnects (“USINs”) 141. (Each of the K locations of signal conductor 181_s may be referred to as a branch arm of a combiner/divider.) An USIN 141 is an interconnect made directly between conductors at the upper surfaces of an RFIC chip 150 and TL section 180. Thus, an USIN 141 does not include vias in either the RFIC chip 150 or TL section 180 to interconnect conductors 151, 181 at the upper surfaces through conductive elements within antenna substrate 110. Some examples of an USIN 141 include a wirebond, a ribbon bond, and an edge contact pair (an edge contact on RFIC chip 150 fused with an edge contact on TL section 180.
TL section 180 may include 2:1 RF couplers 118_1, 118_2 and 118_3 such as Wilkinson or hybrid couplers to form an overall K:1 combiner/divider. In the embodiment illustrated, the transmission line medium of both TL section 180 and RFIC chips 150 is coplanar waveguide (CPW). In the CPW mediums, a pair of ground conductors 181_g1 and 181_g2 are arranged on opposite sides of signal conductor 181_s, and a pair of ground conductors 151_g1 and 151_g2 are arranged on opposite sides of signal conductor 151_s. Each ground conductor 151_g1 and 151_g2 is interconnected with an adjacent portion of ground conductor 181_g1 and 181_g2, respectively, through an USIN 141. Alternatively, the transmission line medium in RFIC chips 150 and TL section 180 is microstrip, in which case the ground conductors 151 and 181 are omitted. Herein, an RFIC chip 150 having CPW beamforming circuitry will be referred to as a CPW chip, and an RFIC chip 150 having microstrip beamforming circuitry will be referred to as a microstrip chip. Analogous terminology may be used for TL section 180. In an alternative embodiment to that illustrated in
With the interconnection structure and layout of antenna 100, the upper portions of RFIC chips 150 are active die sides (“active regions”) of the chips, where beamforming circuitry comprising amplifiers and/or phase shifters reside. For instance, doping regions and metallization of beamforming circuitry transistors, as well as combiner/divider 153 conductors are located within the active regions. By using upper surface interconnects 141 between RFICs 150 and transmission line section 180 to interconnect upper surface conductors, an extra transmission line layer within antenna substrate 110 to form the RF connections between RFICs 150 and TL section 180 can be avoided. Thus, the fabrication of antenna substrate 110 may be facilitated by omitting the process steps for forming another transmission line layer. Antenna substrate 110, which may thereby be formed with a single layer of dielectric 190, is referred to herein as a “single RF layer” substrate. Meanwhile, a polymer layer of layer region 220 may form the top surface 111 of antenna substrate 110. In an alternative embodiment to that shown in
Each ACU 130 includes an amplifier and/or a phase shifter to adjust a transmit signal and/or a receive signal provided to/from an antenna element 125. With RFIC chips 150 distributed across the effective aperture of antenna 100 and each coupled to one or more antenna elements 125, antenna 100 may be understood as an active antenna array. In embodiments where the ACUs 130 include phase shifters for dynamic phase shifting of the signals, antenna 100 functions as a phased array. In such a phased array embodiment, a beam formed by antenna 10 is steered to a desired beam pointing angle set mainly according to the phase shifts of the phase shifters. Additional amplitude adjustment capability within RFICs 150 may also be included to adjust the antenna pattern. In any case, antenna 100 may be configured as a transmitting antenna system, a receiving antenna system, or both a transmitting and receiving antenna system.
A connector 170 may be side mounted or top mounted and connect to signal conductor 181_s. In the transmit direction, an input RF transmit signal is applied to connector 170 and divided into K divided transmit signals by couplers 118 and the K divided transmit signals are applied to RFIC chips 150_1 to 150_K, respectively. (A schematic illustration of signal flow is shown in
A reverse signal flow occurs in the receive direction, in which an element signal is received by an ACU 130 from an antenna element 125, and adjusted by a receive amplifier and/or a phase shifter (and typically filtered). The adjusted receive signal is routed through combiner/dividers 153 and 118 to produce a composite receive signal at connector 170. It is noted here that a beam forming network (BFN) may be considered to encompass all of the signal paths between signal connector 170 and antenna elements 125_1 to 125_N. In the BFN, a single input transmit signal is divided into N element signals, and/or N element signals received from antenna elements 125 are combined into a single composite receive signal.
In
Antenna elements 125 may each be a microstrip patch antenna element printed on antenna substrate 190. Other types of antenna elements such as dipoles or monopoles may be substituted. When embodied as microstrip patches, antenna elements 125 may have any suitable shape such as circular (as exemplified in
In an example, antenna 100 is configured for operation over a millimeter (mm) wave frequency band, generally defined as a band within the 30 GHz to 300 GHz range. In other cases, antenna 100 operates in a microwave range from about 1 GHz to 30 GHz, or in a sub-microwave range below 1 GHz. Herein, a radio frequency (RF) signal denotes a signal with a frequency anywhere from below 1 GHz up to 300 GHz. Note that an RFIC configured to operate at microwave or millimeter wave frequencies is often referred to as a monolithic microwave integrated circuit (MMIC), and is typically composed of III-V semiconductor materials such as indium phosphate (InP) or gallium arsenide (GaAs), or other materials such as silicon-germanium (SiGe).
Layer region 220 may include, in order from upper surface 111 to ground plane 210, a first isolation layer 302, a first conductive layer 304, a second isolation layer 306, a second conductive layer 308, and a third isolation layer 310. First and second conductive layers 304, 308 may be patterned to form signal lines such as 304_1 and 308_1 (see
Contact pad 369 is electrically connected to RF contact 157 through a conductive joint 363 such as a solder ball, gold bump, copper pillar with a solder cap, thermocompression bond or conductive epoxy. RF contact 157 is in turn connected to conductor 342 through the second via 355 which is formed within RFIC chip 150_j through the chip material 345, e.g., InP or GaAs. Conductor 342 may directly connect to, or form part of, metallization of a transistor terminal or other circuit element of the beamforming circuitry. Conductor 342 may be printed metallization atop upper surface 341 of RFIC chip 150_j, in which case second via 355 may be formed as a through substrate via (TSV) that extends completely through the chip material 345. Alternatively, conductor 342 is located below top surface 341 and second via 355 is formed as a blind via that connects on its upper end to conductor 342 within chip material 345. Conductor 342 corresponds to a circuit point p of the beamforming circuitry, where circuit point p may be an input node of ACU 130. The output of ACU 130, corresponding to a circuit point w, may connect to a branch arm port (output port) of combiner/divider 153 (if present).
An input port of combiner/divider 153 electrically connects to conductor 151_s at a circuit point “q”. USIN 141 connects conductor 151_s to conductor 181_s of TL section 180. If USIN 141 is a wire bond, it may have a cylindrical or circular cross-section. If USIN 141 is a ribbon bond, it may have an elliptical or rectangular cross-section. Conductor 181_s may be printed metallization on the upper surface of dielectric 185 of TL section 180. If TL section 180 is coplanar waveguide, the lower surface of dielectric 185 may be adhered to the top surface 111 of antenna substrate 110 (the upper surface of polymer layer 302) using a nonconductive or conductive epoxy 333.
In a typical embodiment, RFIC chip 150_j may have tens or over one hundred electrical contacts such as 357, 367 at its lower surface. These contacts may receive bias voltages and/or control signals from signal lines formed in first and second conductive layers 304 and 308, through interconnects with conductive joints 363. For instance, to connect a signal line formed in first conductive layer 304 to an electrical contact 357 of RFIC chip 150_j, an opening may have been made in first isolation layer 302 to expose the signal line of the first conductive layer 304, and a conductive well 387 may have been formed in the opening. The opening in first isolation layer 302 may have been made by placing resist material on layer 304 in the location of the subsequent opening and then depositing the isolation material of isolation layer 302 in regions that exclude the resist material. A contact pad 379 may have been formed on the well 387, and a conductive joint 363 formed by a heating/cooling process may connect contact pad 379 with contact 357. Alternatively, contact pad 379 is omitted and conductive joint 363 conductively adheres to well 387.
In a similar fashion, to connect a signal line formed in second conductive layer 308 to an electrical contact 367 of RFIC chip 150_j, an opening may have been formed in each of first isolation layer 302, first conductive layer 304 and second isolation layer 306. The process of forming the openings may have likewise involved placing resist material in the locations of the subsequent openings, one layer at a time, while the corresponding layer material is deposited. Additional isolation material 391 e.g., the same material as that of isolation layers 302, 306) may have been deposited in an annular region around the opening in first conductive layer 304. This material prevents shorting to a subsequent conductive well 377 formed by deposition or the like within a cavity produced by the series of openings. A contact pad 359 may have been formed on conductive well 377. A conductive joint 363 connects electrical contact 367 to contact pad 359, or electrical contact 367 directly to conductive well 377 if contact pad 359 is omitted.
In some cases it is desirable to form a direct electrical connection between an electrical contact of RFIC 150 and antenna ground plane 210. For instance, electrical contact 347 is electrically connected to ground plane 210 through a connection joint 363, a contact pad 399 and a conductive well 372 (connection joint 363 may directly interface with conductive well 372 if contact pad 399 is omitted). A ground surface 338 may be present at the lower surface of RFIC chip 150 and may conductively adhere to contact 347. Ground surface 338 may be a DC ground and/or a transmission line ground (e.g. a microstrip, CPW or stripline ground conductor). Note that in some cases there may be different types of transmission line mediums present in a single RFIC chip 150. Conductive well 372 may have been formed in a similar manner as conductive well 377, with a process that forms additional openings through second conductive layer 308 and third isolation layer 310 to expose a surface of ground plane 210. Additional isolation material 392 may have been deposited in an annular region surrounding the opening in second conductive layer 308 to prevent shorting to conductive well 372 which is subsequently formed.
An underfill material 364 may surround at least some of the connection joints 363 to provide mechanical support to the connection joints and thereby improve their reliability. Typically, underfill material 364 may be a mixed material composed primarily of amorphous fused silica.
The coplanar waveguide at the upper surface of RFIC chip 150_j includes signal conductor 342 and first and second ground conductors 344_1, 344_2 on opposite sides thereof. A first ground via 356_1 has an upper end connected to first ground conductor 344_1 to define a first ground point g1 (discussed in schematics below). First ground via 356_1 may connect at its lower end to a catch pad 327_1 at the lower surface of RFIC chip 150_j. An interconnect between catch pad 327_1 and a connection point of ground plane 210 at one side of first via 155 may include a conductive joint 363, a catch pad 369_1 and a conductive well 374_1. Likewise, a second ground via 356_2 has an upper end connected to second ground conductor 344_2 to define a second ground point g2. Second ground via 356_2 may connect at its lower end to a catch pad 327_2. An interconnect between catch pad 327_2 and a connection point of ground plane 210 at the opposite side of first via 155 may include a conductive joint 363, a catch pad 369_2 and a conductive well 374_2.
Isolation material 373 annularly surrounds a region between first via 155 and first and second conductive wells 374_1, 374_2 to prevent first via 155 from shorting to ground. With this configuration, a probe feed may be understood to be launched from the level (in the z direction) of the ground plane 210, such that unwanted radiation between ground plane 210 and the upper surface of RFIC chip 150_j is minimized. It is noted here that alternative configurations may employ only a single ground via 356 to form a ground-signal (GS) transition; or, three or more ground vias 356 surrounding second via 355 (which may still be considered a GSG transition). Yet another alternative employs a slotline transition as a substitute for second via 355 and the first and second ground vias 356_1, 356_2.
First and second ground vias 655_1 and 655_2 respectively connect ground pads 551_g1 and 551_g2 to microstrip ground surface 438.
RFIC chips 150 are separately fabricated with beamforming circuitry 130, 153; second vias 355; ground vias 356 (in the case of a CPW embodiment); RF contacts 157; and other electrical contacts such as 357, 367 (S808). Transmission line (TL) section(s) 180 may be separately formed with a BFN combiner/divider 780 (S810). Conductive joints 363 may be initially adhered to RF contacts 157 and other electrical contacts of RFIC chips 150 and/or to catch pads 369/other contacts at the upper surface of antenna substrate 110 (S812). The RFIC chips 150, other IC chips 160 and TL section(s) 180 may be placed on antenna substrate 110 (S814). A heating/cooling cycle may be performed to melt and cool solder or other conductive material of the conductive joints 363 and conductively adhere the RFIC chips, other IC chips, and the TL section(s) to the antenna substrate (S816). Upper surface interconnects 141 such as wirebonds or ribbon bonds may then be attached on opposite ends to RFIC chip conductors 151 or 551 and the TL section 180 conductors (branch arms) to interconnect the same (S818). A connector 170 may be attached to TL section 180, and a cover 107 or PWA may be attached to the resulting assembly (S820).
The above-described embodiments have been described in the context of antenna apparatus 100. Other implementations of the technology disclosed herein may be applied to non-antenna applications or to interconnect configurations in other parts of an antenna system. For instance, in other example configurations, antenna elements 125 are substituted with at least one other type of circuit components, e.g., second IC chips such as modems. The RFIC chips 150 may be coupled to the second IC chips using the same or similar interconnection structures as described above (e.g., using first vias 155, second vias 355, etc.). In such embodiments, RFIC chips 150 may be interconnected from the active die side to transmission line section 180 in the same manner as described herein, albeit transmission line section 180 may support circuitry other than a combiner/divider of a beamforming network. In other cases, transmission line section may be substituted with another RF circuit component, such as another RFIC chip configured to perform a function different from those of RFICs 150. The resulting configuration/electronic device is formed in a compact three dimensional stacked structure with analogous advantages to those described for antenna 100, e.g., a reduction in loss, a reduction/elimination of oscillations, and/or ease of fabrication.
While the technology described herein has been particularly shown and described with reference to example embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the claimed subject matter as defined by the following claims and their equivalents.
Filing Document | Filing Date | Country | Kind |
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PCT/US2020/060599 | 11/13/2020 | WO |
Publishing Document | Publishing Date | Country | Kind |
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WO2022/103402 | 5/19/2022 | WO | A |
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Number | Date | Country | |
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20230327320 A1 | Oct 2023 | US |