"Test Generation Using an Efficient Weight Generator", by IBM, IBM Tech. Disc. Bull, vol. 32, #4B, Sep. 1989, pp. 429-433. |
"Weighted Random Pattern Generation for Self-Test" IBM TDB, vol. 32, No. 10A, Mar. 1990, pp. 140-143. |
"Design for Testability and Diagnosis in a VLSI CMOS System/370 Processor", Starke, pp. 355-362, IBM J. Res. Develop. vol. 34, No. 2/3, Mar./May 1990. |
"Low-Cost LTesting of High-Density Logic Components" Bassett et al, IEEE, Apr. 1990, pp. 15-28. |
"A New Procedure for Weighted Random Built-in Self-Test" Muradali et al, IEEE, Sep. 1990, pp. 660-669. |
"Hardware-Based Weighted Random Pattern Generation for Boundary Scan" Brglez et al, IEEE Aug. 1989, pp. 264-274. |