Patent Application
20140167906
Not Applicable.
Not Applicable.
This invention relates generally to fuses used in integrated circuits, and, more particularly, to an integrated circuit fuse that blows more reliably and with less chance of reconnection.
Fuses used in integrated circuits are known. Some conventional integrated fuses use a conductor within a metal layer of an integrated circuit.
Conventional integrated circuit fuses are subject to a variety of types of failure. In one type of failure, cracks in and an interlayer dielectric (ILD) structure, for example, the ILD isolation between metal layers in which the integrated circuit fuse is formed, sometimes fractures when the integrated circuit fuse is blown. Fracture/cracking of the ILD is very undesirable and leads to shorts and unwanted leakage in the overall integrated circuit.
In another type of failure, when an integrated circuit fuse is fused, debris from the fusing sometimes remains in electrical contact with the fused portion of the fuse, and the fuse is not fully blown. This type of failure is sometimes referred to as regrowth or reconnection of the fuse,
It would be desirable to provide an integrated circuit fuse that has reduced failure characteristics, for example, a reduced likelihood that fusing of the integrated, circuit fuse causes fracture of an interlayer dielectric (ILD) structure, and a reduced likelihood that fusing of the integrated circuit fuse results in regrowth of the fuse.
The present invention provides an integrated circuit fuse that has reduced failure characteristics, for example, a reduced likelihood that fusing of the integrated circuit fuse causes fracture of an interlayer dielectric (ILD) structure, and a reduced likelihood that fusing of the integrated circuit fuse results in regrowth of the fuse.
In accordance with one aspect of the present invention, a fuse disposed over a substrate of an integrated circuit includes a conductive trace in a fuse-level metal layer of the integrated circuit, wherein the conductive trace comprises a fusible portion having a higher resistance than other portions of the conductive trace. The fuse further includes a dielectric structure disposed over the fusible portion and beyond the fusible portion in a direction parallel to a major surface of the substrate. The fuse further includes a first cavity into the dielectric structure. The first cavity is proximate to the fusible portion and separated from the fusible portion by a first separation wall. The first cavity has a depth to at least a depth of the fuse-level metal layer with a deeper direction being in a direction of the substrate. The entire first cavity is disposed to a first side of the fusible portion in a direction parallel to a major surface of the substrate such that no part of the first cavity is over the fusible portion. The first separation wall has a thickness selected to result in facture of the first separation wall and capture of debris from the fusible portion when the fusible portion is fused.
In accordance with another aspect of the present invention, a method of fabricating a fuse over a substrate of an integrated circuit includes forming a conductive trace in a fuse-level metal layer of the integrated circuit, wherein the fuse-level metal layer is disposed over a substrate of the integrated circuit, and wherein the conductive trace comprises a fusible portion having a higher resistance than other portions of the conductive trace. The method also includes forming a dielectric structure over the fusible portion and beyond the fusible portion in a direction parallel to a major surface of the substrate. The method also includes etching a first cavity into the dielectric structure. The first cavity is proximate to the fusible portion and separated from the fusible portion by a first separation wall. The first cavity has a depth to at least a depth of the fuse-level metal layer with a deeper direction being in a direction of the substrate. The entire first cavity is disposed to a first side of the fusible portion in a direction parallel to a major surface of the substrate such that no part of the first cavity is over the fusible portion. The first separation wall has a thickness selected to result in facture of the first separation wall and capture of debris from the fusible portion when the fusible portion is fused
The foregoing features of the invention, as well as the invention itself may be more fully understood from the following detailed description of the drawings, in which:
Before describing the present invention, it should be noted that reference is sometimes made herein to integrated fuse assemblies having features with sizes and with particular shapes (e.g., rectangular). One of ordinary skill in the art will appreciate, however, that the techniques described herein are applicable to a variety of sizes and shapes.
Referring to
The fuse structure 10 can also include at least one cavity, e.g., a cavity 14 disposed to the side of the fusible portion 12b. The cavity 14 has a spacing 22 from the fusible portion 12b and the cavity 14 also has a size, shape, and depth all selected to capture debris from the fusible portion 12b when the fusible portion 12b is fused.
In some embodiments, the fuse structure 10 includes a second cavity 16, which, in some embodiments, can have a spacing 24 from the fusible portion 12b and the cavity 16 also a size, shape, and depth all selected to capture debris from the fusible portion 12b when the fusible portion 12b is fused. However, it will be understood that, when the fusible portion 12b is fused, most or all of the debris from the fusing will tend to move into one of the two cavities 14, 16. The spacing 24 can be the same as or similar to the spacing 22.
The cavities 14, 16 extend in a direction into the page, to depths that will be apparent from the discussion below in conjunction with
In some embodiments, the fusing operation is used in an integrated circuit to provide a permanent change of state, for example, a high voltage to a low voltage, or a low-voltage to a high voltage, upon one side of the fuse structure 12. In some embodiments, the fuse structure 10 is one of a plurality of such fuse structures used in a programmable read-only memory (PROM).
The cavity 14 can have a width 26 and in length 28. The cavity 16 can have a width 30 and a length 32, which can be the same as or similar to the width 26 and length 28 of the cavity 14.
Under the cavity 14 is shown a so-called “blanket” 34. The blanket 34 can be comprised of a portion of a metal layer. Similarly, under the cavity 16 is shown another blanket 36. It will become apparent from discussion below in conjunction with
In one exemplary embodiment, the dimension 18 is about 1.0 micrometers, the dimensions 22, 24 are about 1.2 micrometers, the dimensions 28, 32 are about 6.0 micrometers, the dimensions 26, 30 are about 4.0 micrometers, and the dimension 20 is about 3.4 micrometers.
However, in other embodiments, the dimension 18 is in r range of about 0.5 to about 1.5 micrometers, the dimensions 22, 24 are in a range of about 1.0 to about 1.5 micrometers, the dimensions 28, 32 are in a range of about 3.0 to about 12.0 micrometers, the dimensions 26, 30 are in a range of about 3.0 to about 10.0 micrometers, and the dimension 20 is in a range of about 2.0 to about 5.0 micrometers.
In some embodiments, the blankets 34, 36 are larger than the cavities 14, 16 by about 0.25 micrometers in all directions in the plane shown. However, in other embodiments, the blankets 34, 36 can be within a range of about 0.1 to about 0.5 micrometers larger than the cavities 14, 60.
It will be understood that some dimensions, in particular, the dimensions 22, 24, are particularly important for proper operation of the fuse structure 10. It will be understood that regions represented by the dimensions 22, 24 either must be open or must open, i.e., break open, when the fusible portion 12b fuses. Furthermore, no fracture of the underlying substrate must occur.
Referring to
In each of
In each of
Referring now to
Other layers are also shown, which can be any variety of active or passive layers.
The fusible portion 12b of the fuse conductor 12 is shown on the same metal layer M2 as the blankets 34, 36. The cavities 14, 16 extend from an outer surface, i.e., above a passivation layer, and past various layers, including other metal layers, of the integrated circuit structure 200. The cavities 14, 16 extend to and are essentially capped by or terminated by the blankets 34, 36. The blankets 34, 36 are comprised of metal in the same metal layer the same as the fusible portion 12b and can be fabricated in the same fabrication step as the fusible portion 12b.
An interlayer dielectric (ILD) surrounds the fusible portion 12b, the blankets 34, 36, and the cavities 14, 16, and the cavities 14, 16 extend into the ILD. As described above, the ILD can be formed in a plurality of fabrication steps. The ILD is referred to herein as a dielectric structure.
With proper selection of dimensions, upon fusing of the fusible portion 12b, debris from the fusible portion 12b will fracture the ILD in at least one of regions 202, 204 (i.e., separation walls) between the fusible portion 12b and the cavities 14, 16, and the debris will move through a respective at least one of the regions 202, 204, becoming captured in a respective at least one of the cavities 14, 16. The ILD layer must yield in at least one of the regions 202, 204 before more extensive damage to the integrated circuit ensues, including, but not limited to, fracture of the ILD in other regions.
Referring now to
Other layers are also shown, which can be any variety of active or passive layers.
The fusible portion 12b of the fuse conductor 12 is shown on the metal layer M2 and the blankets 34, 36 are shown on the metal layer M1. The cavities 14, 16 extend from an outer surface, i.e., above a passivation layer, and past various layers, including other metal layers, of the integrated circuit structure 300. The cavities 14, 16 extend to and are essentially capped by or terminated by the blankets 34, 36. The blankets 34, 36 are comprised of metal on a metal layer different than the fusible portion 12b, and thus, are fabricated in a different fabrication step then the fusible portion 12b.
Interlayer dielectric (ILD) surrounds the fusible portion 12b, the blankets 34, 36, and the cavities 14, 16, and the cavities 14, 16 extend into the ILD structure.
With proper selection of dimension, upon fusing of the fusible portion 12b, debris from the fusible portion 12b will fracture the ILD in at least one of regions 302, 304 (Le., separation walls) between the fusible portion 12b and the cavities 14, 16, and the debris move through a respective at least one of the regions 302, 304, becoming captured in a respective at least one of the cavities 14, 16. The ILD layer must yield in at least one of the regions 302, 304 before more extensive damage to the integrated ensues, including, but not limited to, fracture of the ILD in other regions.
Referring now to
Other layers are also shown, which can be any variety of active or passive layers.
The fusible portion 12b of the fuse conductor 12 is shown on the metal layer M1 and the blankets 34, 36 are also shown on the metal layer M1. The cavities 14, 16 extend from an outer surface, i.e., above a passivation layer, and past various layers, including other metal layers, of the integrated circuit structure 400. The cavities 14, 16 extend to and are essentially capped by or terminated by the blankets 34, 36. The blankets 34, 36 are comprised of metal in the same metal layer the same as the fusible portion 12b and can be fabricated in the same fabrication step as the fusible portion 12b.
An interlayer dielectric (ILD) surrounds the fusible portion 12b, the blankets 34, 36, and the cavities 14, 16, and the cavities 14, 16 extend into the ILD structure.
Regions 402, 404 will be understood from the above discussion of regions 202, 204 of
As described above, this not a particularly desirable arrangement, but it is possible. The fusible portion 12b is close to the substrate and could result in fracture of the substrate.
Referring now to
Other layers are also shown, which can be any variety of active or passive layers.
The fusible portion 12b of the fuse conductor 12 is shown on the metal layer M1 and the integrated circuit structure 500 has no blankets. The cavities 14, 16 extend from an outer surface, i.e., above a passivation layer, and past various layers, including other metal layers, of the integrated circuit structure 500. The cavities 14, 16 extend to and are essentially capped by or terminated by the silicon substrate. There are no metal blankets.
An interlayer dielectric (ILD) surrounds the fusible portion 12b and the cavities 14, 16, and the cavities 14, 16 extend into the ILD structure.
Regions 502, 504 will be understood from the above discussion of regions 202, 204 of
As described above, this not a particularly desirable arrangement, but it is possible. The fusible portion 12b is close to the substrate and could result in fracture of the substrate, particularly where no blankets are used.
Referring now to
Other layers are also shown, which can be any variety of active or passive layers.
The fusible portion 12b of the fuse conductor 12 is shown on the top metal layer M3 and the blankets 34, 36 are also shown on the metal layer M1. The cavities 14, 16 extend from an outer surface, i.e., above a passivation layer, and past various layers of the integrated circuit structure 500. The cavities 14, 16 extend to and are essentially capped by or terminated by the blankets 34, 36. The blankets 34, 36 are comprised of metal in the same metal layer the same as the fusible portion 12b and can be fabricated in the same fabrication step as the fusible portion 12b.
An interlayer dielectric (ILD) surrounds the fusible portion 12b, the blankets 34, 36, and the cavities 14, 16, and the cavities 14, 16 extend into the ILD structure.
Regions 602, 604 will be understood from the above discussion of regions 202, 204 of
As described above, this not a particularly desirable arrangement, but it is possible. In general, a top metal layer, of which the M3 layer is representative, is often thicker than other metal layers. Integrated circuit design rules can also require larger feature dimension in the top metal layer. Thus, the fusible portion 12b, if formed in a top metal layer, may be thicker and wider than desirable, and accordingly, may require a higher power to blow the fuse, possibly resulting in damage to the integrated circuit.
Referring now to
Other layers are also shown, which can be any variety of active or passive layers.
The fusible portion 12b of the fuse conductor 12 is shown on the top metal layer M3 and the blankets 34, 36 are also shown on the metal layer M2. The cavities 14, 16 extend from an outer surface, i.e., above a passivation layer, and past various layers of the integrated circuit structure 500 including other metal layers. The cavities 14, 16 extend to and are essentially capped by or terminated by the blankets 34, 36. The blankets 34, 36 are comprised of metal on a metal layer different than the fusible portion 12b, and thus, are fabricated in a different fabrication step then the fusible portion 12b.
While the cavities are shown to extend to blankets 34, 36 at the M2 layer, in other embodiments, the cavities could be deeper and extend to blankets at the M1 layer. In still other embodiments, the cavities could extend to the substrate and there would be no metal blankets.
An interlayer dielectric (ILD) surrounds the fusible portion 12b, the blankets 34, 36, and the cavities 14, 16, and the cavities 14, 16 extend into the ILD structure.
Regions 702, 704 will be understood from the above discussion of regions 202, 204 of
As described above, this not a particularly desirable arrangement, but it is possible.
From discussion above, it should be understood that, for a semiconductor structure having any number of metal layers, the fusible portion 12b and the blankets can be at the same metal layer, or the metal blankets can be at any metal layer deeper than the fusible portion 12b. In some embodiments, the cavities extend all the way to the substrate.
All references cited herein are hereby incorporated herein by reference in their entirety.
Having described preferred embodiments of the invention, it will now become apparent to one of ordinary skill in the art that other embodiments incorporating their concepts may be used. It is felt therefore that these embodiments should not be limited to disclosed embodiments, but rather should be limited only by the spirit and scope of the appended claims.
