Claims
- 1. In an integrated circuit, the improvement comprising:a self-test device for carrying out a self-test of the integrated circuit, said self-test device having a control output; and a program memory connected to said self-test device for storing at least one test program supplied from outside the integrated circuit and executed while said self-test device carries out a self-test; said self-test device using said control output to control loading of a respective test program to be executed, from outside the integrated circuit into said program memory.
- 2. The integrated circuit according to claim 1, wherein said self-test device executes a plurality of the test programs in succession and, after completion of a preceding test program, automatically loads a respective next test program into said program memory from outside the integrated circuit, by control through said control output.
- 3. The integrated circuit according to claim 2, wherein said self-test device has a result signal output through which a common result signal for tests having been carried out in accordance with the executed test programs is supplied outside the integrated circuit after execution of a plurality of test programs having been loaded in succession into said program memory from outside the integrated circuit.
Priority Claims (1)
Number |
Date |
Country |
Kind |
198 33 208 |
Jul 1998 |
DE |
|
CROSS-REFERENCE TO RELATED APPLICATION
This application is a continuation of copending International Application No. PCT/DE99/02069, filed Jul. 5, 1999, which designated the United States.
US Referenced Citations (10)
Foreign Referenced Citations (2)
Number |
Date |
Country |
0 018 736 |
Nov 1980 |
EP |
0 827 080 |
Mar 1998 |
EP |
Continuations (1)
|
Number |
Date |
Country |
Parent |
PCT/DE99/02069 |
Jul 1999 |
US |
Child |
09/767393 |
|
US |