Number | Name | Date | Kind |
---|---|---|---|
3395290 | Farina et al. | Jul 1968 | |
3403270 | Pace | Sep 1968 | |
3673427 | McCoy et al. | Jun 1972 | |
3712995 | Steudel | Jan 1973 | |
4061928 | Kessler | Dec 1977 | |
4449158 | Taira | May 1984 | |
4481521 | Okumura | Nov 1984 |
Number | Date | Country |
---|---|---|
55552 | Jul 1982 | EPX |
136278 | Oct 1979 | JPX |
159188 | Dec 1979 | JPX |
90555 | Jul 1981 | JPX |
Entry |
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"Electrical Overstress/Electrostatic Discharge Symposium Proceedings", 1980, Reliability Analysis Center, pp. 73-80, EOS-2. |
"Gate Protection of MIS Devices", Martin Lenzlinger, IEEE Transactions on Electron Device, vol. ED-18, No. 4, Apr. 1971. |