The present disclosure relates generally to AMOLED displays. More specifically, this disclosure relates to gate drivers suitable for integration into the back plane of an AMOLED display, which typically uses thin film transistors (TFTs).
Traditionally, when building AMOLED displays, it has been the practice to manufacture the display panel backplane and the gate drivers as separate devices. Doing so allows different manufacturing techniques to be applied to each case. If the same techniques could be used to manufacture the gate driver and the display itself, i.e., if the gate driver could be integrated into the back plane of the display, then they could be manufactured simultaneously with fewer components and less assembly required, leading to lower cost displays.
In accordance with one embodiment, a gate driver suitable for integration with the backplane of an active matrix organic light emitting diode (AMOLED) display comprises clock signal sources producing first and second clock signals each having alternating active and inactive portions configured such that when one of the clock signals is active the other of the clock signals is inactive, and active portions of the first and second clock signals do not overlap; a daisy chain of circuits for producing gate signals, each of the circuits except the last circuit in the chain having an output coupled to the input of an adjacent circuit in the daisy chain; and a source of a start token signal coupled to an input of a first circuit in the daisy chain; wherein each of the circuits is configured to produce a gate signal one clock cycle after an active portion of one of the clock signals is received.
In one implementation, the gate driver is configured for use with an AMOLED display comprising p-type transistors so that an active signal corresponds to a low voltage and an inactive signal corresponds to a high voltage. The gate signals are active low for selecting or addressing p-type thin film transistors, or active high for selecting or addressing n-type thin film transistors.
Adjacent circuits in the daisy chain produce consecutive gate signals with a predetermined time interval between each pair of consecutive gate signals. The active portions of the first and second clock signals preferably have a predetermined time interval between them, to produce the predetermined time interval between each pair of consecutive gate signals.
In accordance with another embodiment, an integrated gate driver for performing emission operations comprises a source of first and second clock signals each, having alternating active and inactive portions configured such that when one is active the other is inactive and active signals do not overlap; a start token signal source and an inverse start token signal source for input into a first circuit block. Alternating odd and even circuit blocks are daisy chained together such that the output of one circuit block is connected to the input of the next circuit block, and each circuit block receives as inputs both first and second clock signals, wherein each circuit block is configured to produce an active output one clock cycle after an active signal is received and an inactive output at all other times. This gate driver may be configured for use with a display comprising p-type transistors so that an active signal corresponds with a high voltage and an inactive signal corresponds with a low voltage. The alternating circuit blocks are configured to select a line of pixels for two clock cycles in order to allow time for the pixels to settle before being programmed.
The foregoing and additional aspects and embodiments of the present disclosure will be apparent to those of ordinary skill in the art in view of the detailed description of various embodiments and/or aspects, which is made with reference to the drawings, a brief description of which is provided next.
The foregoing and other advantages of the disclosure will become apparent upon reading the following detailed description and upon reference to the drawings.
While the present disclosure is susceptible to various modifications and alternative forms, specific embodiments or implementations have been shown by way of example in the drawings and will be described in detail herein. It should be understood, however, that the disclosure is not intended to be limited to the particular forms disclosed. Rather, the disclosure is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of an invention as defined by the appended claims.
Exemplary embodiments of select driver 100 are discussed below. In each case, it is assumed that all transistors are p-type transistors, and are therefore active low devices. Those of skill in the art will understand that complementary circuit designs can be used with active high or n-type transistors. Alternatively, a combination of p-type and n-type devices may be used to implement select signal driver 100.
Physically, the circuit elements in odd blocks 201 and even blocks 202 are identical. The difference between odd blocks 201 and even blocks 202 is the inputs. The signals clk1 and clk2 play complementary roles in odd and even circuit blocks. It should be noted that in this implementation only one of clk1 and clk2 may be active at any given time; active clock signals do not overlap, but inactive clock signals may overlap during periods where the signals are transitioning. Other combinations of clk1 and clk2 may be used to achieve similar or extra functionality.
In operation a sequence proceeds through several time periods, a subset of which is shown as 280 to 292 in
Referring to
At 280, Start Token (ST) and clk2 go low, therefore active, while clk1 goes high, therefore inactive. This causes transistor switches Tc, Te and Tg to close. The low ST signal will expose the bottom plate of capacitor Ca to a low signal, bring a low signal to point A 205 and cause transistor switches Ta and Tf to close. This allows a high signal to reach point B 207 which exposes the bottom plate of Cb to a high signal and causes transistor switches Tb and Td to open. Accordingly, SEL(1) goes out high as it is being fed from Vgh via Tc and high clk1 via Ta.
At 281, clk2 goes high, causing Tc, Te and Tg to open.
At 282, clk1 goes low while ST goes high. ST will stay high for the remainder of the sequence. Capacitor Ca will maintain a low signal at point A 205 and keep Ta and Tf closed. Capacitor Cb will maintain a high signal at point B 207 and keep Tb and Td open. Accordingly, SEL(1) output will be low as it is being fed from low clk1 via Ta.
At 283, clk1 goes high causing SEL(1) to go high.
At 284, clk2 goes low causing Tc, Te and Tg to close. The high ST signal will expose the bottom plate of capacitor Ca to a high signal, bring a high signal to point A 205 and cause transistor switches Ta and Tf to open. This brings a low signal, Vgl, to point B 207 which exposes Cb to a low signal and causes Tb and Td to close. Accordingly, SEL(1) goes out high as it is being fed from Vgh via Tb and Tc.
At 285, clk2 goes high causing Tc, Te and Tg to open.
At 286, clk1 goes low. Capacitor Ca will maintain a high signal at point A 205 and keep Ta and Tf open. Capacitor Cb will maintain a low signal at point B 207 and keep Tb and Td close. Accordingly, SEL(1) will remain high since it is being fed from Vgh via Tb.
At 287, clk1 goes high.
Since ST will not change again until the entire sequence needs to be repeated, block 1 will simply repeat the pattern of 284 to 287 until the ST is changed, regardless of the state of clk1 and clk2. For example, the circuit will proceed through the same states from 288-291 as it did from 284-287 and SEL(1) will remain high.
Referring to
At 282, SEL(1) and clk1 go low, therefore active, while clk2 is high, therefore inactive. This causes transistor switches Tc, Te and Tg to close. The low SEL(1) signal will expose the bottom plate of capacitor Ca to a low signal, bring a low signal to point A 206 and cause transistor switches Ta and Tf to close. This allows a high signal to reach point B 208 which exposes the bottom plate of Cb to a high signal and causes Tb and Td to open. Accordingly, SEL(2) goes out high as it is being fed from Vgh via Tc and high clk2 via Ta.
At 283, clk1 goes high, causing Tc, Te and Tg to open. SEL(1) will also go high and stay high for the remainder of the sequence. Capacitor Ca will maintain a low signal at point A 206 and keep Ta and Tf closed. Capacitor Cb will maintain a high signal at point B 208 and keep Tb and Td open.
At 284, SEL(2) and clk2 go low while SEL(1) remains high. Thus, there is a time interval (284-283) between clk1 going high and clk2 going low, and also between SEL(1) going high and SEL (2) going low.
At 285, clk2 goes high causing SEL(2) to go high.
At 286, clk1 goes low causing Tc, Te and Tg to close. The high SEL(1) signal will now expose the bottom plate of capacitor Ca to a high signal, bring a high signal to point A 206 and cause transistor switches Ta and Tf to open. This brings a low signal, Vgl, to point B 208 which exposes the bottom plate of Cb to a low signal and causes Tb and Td to close. Accordingly, SEL(2) goes out high as it is being fed from Vgh via Tb and Tc.
At 287, clk1 goes high causing Tc, Te and Tg to open. Capacitor Ca will maintain a high signal at point A 206 and keep Ta and Tf open. Capacitor Cb will maintain a low signal at point B 208 and keep Tb and Td closed.
At 288, clk2 goes low. Accordingly, SEL(2) will remain high since it is being fed from Vgh via Tb.
At 289, clk2 goes high.
Since SEL(1) will not change again until the entire sequence needs to be repeated, block 2 will simply repeat the pattern of 286 to 289, regardless of the state of clk1 and clk2, until SEL(1) changes. For example, the circuit will proceed through the same states from 290-293 as it did from 286-289 and SEL(2) will remain high.
All the odd blocks with follow the same pattern described for block 1 and all even block will follow the same pattern described for block 2, only delayed since the input of each block is the output of the previous block. In this way, each row of the display 10 may be selected and driven exclusively.
A pixel circuit in an (m×n) array, such as display system 10, may require multiple select signals to operate. An example of typical SEL signals used in a display system is write (WR), read (RD) and emission (EM). The circuits described above in
Physically, the circuit elements in odd blocks 301 and even blocks 302 are identical. The difference between odd blocks 301 and even blocks 302 is the inputs. Clk1 and clk2 play complementary roles in odd/even blocks. It should be noted that only one of clk1 and clk2 may be active at any given time in this implementation; active clock signals do not overlap. Other combinations of clk1 and clk2 may be used to achieve similar or extra functionality.
In operation a sequence proceeds through several time periods, a subset of which are shown as 380 to 392 in
Referring to
At 380, ST_and clk2 go low, while ST and clk1 go high. This causes transistor switches T3, T6, T7 and T10 to close. The high ST signal will expose the bottom plate of capacitor C4 to a high signal, cause T4 to open and bring a high signal to point A 303 which exposes the bottom plate of C1 to a high signal and causes T11, T5 and T2 to open. The low ST_ signal will expose the bottom plate of capacitor C3 to a low signal and cause transistor switch T8 to close and bring a low signal to point B 305 which exposes the bottom plate of C2 to a low signal and causes T12, T9 and T1 to close. Accordingly, EM(1) will be high and EM_(1) will be low.
At 381, clk2 goes high, causing transistors T3, T6, T7 and T10 to close, effectively shutting out ST and ST_signals. Capacitor C4 will maintain a high signal and keep T4 open while C3 will maintain a low signal and keeps T8 closed. Capacitor C2 will maintain a low signal at point B 305 and keep transistors T12, T1 and T9 closed while C1 maintains a high signal at point A 303 and keeps T11, T2 and T5 open. Accordingly, EM(1) will remain high while EM_(1) will remain low.
At 382, clk1 goes low but has no effect on the output of block 1, EM(1) and EM_(1). Before 383, ST goes low and ST_ goes high, but has no effect since the transistors controlled by clk2 are closed.
At 383, clk1 goes high.
At 384, clk2 goes low causing transistor switches T3, T6, T7 and T10 to close. The low ST signal will expose the bottom plate of capacitor C4 to a low signal, cause T4 to close and bring a low signal to point A 303 which exposes the bottom plate of C1 to a low signal and causes T2, T5 and T11 to close. The high ST_signal will expose the bottom plate of capacitor C3 to a high signal, cause T8 to open and bring a high signal to point B 305 which exposes the bottom plate of C2 to a high signal and causes T1, T9 and T12 to open. Consequently, EM(1) will turn low while EM_(1) turns high.
At 385, clk2 goes high, causing T3, T6, T7 and T10 to close. Capacitor C4 will maintain a low signal and keep T4 closed while C3 maintains a high signal and keeps T8 open. Capacitor C2 will maintain a high signal at point B 305 and keep transistor switches T1, T9 and T12 open while C1 maintains a low signal at point A 303 and keeps T2, T5 and T11 closed. Accordingly, EM(1) will remain low while EM_(1) remains high.
At 386, clk1 goes low.
At 387, clk1 goes high but has not effect on the output of block 1, EM(1) and EM_(1).
Since ST and ST— inputs will not change again until the entire sequence needs to be repeated, block 1 will simply repeat the pattern of 384 to 387, regardless of the state of clk1 and clk2, until the inputs are changed. For example, the circuit will proceed through the same states from 388-391 as it did from 384-387. EM(1) will remain low and EM_(1) will remain high.
Referring to
At 382, EM_(1) and clk2 go low while EM(1) and clk1 go high. This causes T3, T6, T7 and T10 to close. The high EM(1) signal will expose the bottom plate of capacitor C4 to a high signal, cause T4 to open and bring a high signal to point A 304 which exposes the bottom plate of C1 to a high signal and causes T11, T5 and T2 to open. The low EM_(1) signal will expose the bottom plate of capacitor C3 to a low signal and cause transistor T8 to close and bring a low signal to point B 306 which exposes the bottom plate of C2 to a low signal and causes T12, T9 and T1 to close. Accordingly, EM(2) will go high and EM_(2) will turn low.
At 383, clk1 goes high, causing transistors T3, T6, T7 and T10 to open, effectively isolating the EM(1) and EM_(1) signals into block 2. Capacitor C4 will maintain a high signal and keep T4 open while C3 will maintain a low signal and keep T8 closed. Capacitor C2 will maintain a low signal at point B 306 and keep transistor switches T12, T1 and T9 closed while C1 maintains a high signal at point A 304 and keeps T11, T2 and T5 open. Accordingly, EM(2) will remain high while EM_(2) will remain low.
At 384, clk2 goes low but has not effect on the output, EM(2) and EM(_(2), of block 2.
At 385, clk2 goes high, which also has no effect on the output of block 2.
At 386 clk1 goes low causing transistor switches T3, T6, T7 and T10 to close. The low EM(1) signal will expose the bottom plate of capacitor C4 to a low signal, cause T4 to close and bring a low signal to point A 304 which exposes the bottom plate of C1 to a low signal and causes T2, T5 and T11 to close. The high EM_(1) signal will expose the bottom plate of capacitor C3 to a high signal, cause T8 to open and bring a high signal to point B 306 which exposes the bottom plate of C2 to a high signal and causes T1, T9 and T12 to open. Accordingly, EM(2) will turn low while EM_(2) turns high.
At 387, clk1 goes high, causing T3, T6, T7 and T10 to close. Capacitor C4 will maintain a low signal and keep T4 closed while C3 maintains a high signal and keeps T8 open. Capacitor C2 will maintain a high signal at point B 306 and keep transistors T1, T9 and T12 open while C1 maintains a low signal at point A 304 and keeps T2, T5 and T11 closed. Accordingly, EM(2) will remain low while EM_(2) remains high.
At 388, clk2 goes low and has no effect on the output of block 2.
At 389, clk1 goes high and also has no effect on the output of block 2.
Since EM(1) and EM_(1) inputs will not change again until the entire sequence needs to be repeated, block 2 will simply repeat the pattern of 386 to 389, regardless of the state of clk1 and clk2, until the inputs are changed. For example, the circuit will proceed through the same states from 390-393 as it did from 386-389. EM(2) will remain low and EM_(2) will remain high.
An analogous pattern will occur in subsequent odd blocks. A complementary analogous pattern, with clk1 and clk2 playing opposite roles, will occur in subsequent even blocks.
It has been found that the circuits of
Physically, the circuit elements in odd blocks 501 and even blocks 502 are identical. The difference between odd blocks 501 and even blocks 502 is the inputs. Clk1 and clk2 play complementary roles in odd/even blocks. It should be noted that only one of clk1 and clk2 may be active at any given time in this implementation; active clock signals do not overlap. Other combination of clk1 and clk2 may be used to achieve similar or extra functionality.
In operation, a sequence proceeds through several time periods, a subset of which are shown as 380 to 392 in
Referring to
At 380, ST_goes low, while ST and clk1 go high. Clk2 is also low at this time. This causes transistors T3, T6 and T7 to close. The high ST signal will expose the bottom plate of capacitor C4 to a high signal and cause T4 to open. The low ST signal will expose the bottom plate of capacitor C3 to a low signal and cause T8 to close and bring a low signal to point B 505 which exposes the bottom plate of C2 to a low signal and causes T12, T9 and T1 to close. Since T8 and T9 are closed, and by design the on-resistance of T8 and T9 is much less than R, a high signal reaches point A, exposes the bottom plate of C1 to a high signal and causes T11, T5 and T2 to open. Accordingly, EM(1) will be high and EM_(1) will be low.
At 381, clk2 goes high, causing transistors T3, T6 and T7 to open, effectively shutting out ST and ST_ signals. Capacitor C4 will maintain a high signal and keep T4 open while C3 will maintain a low signal and keep T8 closed. Capacitor C2 will maintain a low signal at point B 505 and keep T12, T1 and T9 closed. Since T8 and T9 are closed, and by design the on-resistance of T8 and T9 is much less than R, a high signal reaches point A 503, exposes the bottom plate of C1 to a high signal and causes T11, T5 and T2 to open. Accordingly, EM(1) will remain high while EM_(1) will remain low.
At 382, clk1 goes low. Before 383, ST goes low and ST— goes high, but has no effect since the transistors controlled by clk2 are open.
At 383, clk1 goes high.
At 384 clk2 goes low causing T3, T6 and T7 to close. The low ST signal will expose the bottom plate of capacitor C4 to a low signal and cause T4 to close. The high ST_signal will expose the bottom plate of capacitor C3 to a high signal, cause T8 to open and bring a high signal to point B 505 which exposes the bottom plate of C2 to a high signal and causes T1, T9 and T12 to open. Since T8 and T9 are open, V1 is the only signal source able to reach point A 503. This brings a low signal to point A 503 which causes T2, T5 and T11 to close. Accordingly, EM(1) will turn low while EM_(1) turns high.
At 385, clk2 goes high, causing T3, T6 and T7 to open. Capacitor C4 will maintain a low signal and keep T4 closed while C3 maintains a high signal and keeps T8 open. Capacitor C2 will maintain a high signal at point B 505 and keep T1, T9 and T12 open. Since T8 and T9 are open, V1 is the only signal source able to reach point A 503. This brings a low signal to point A 503 which causes T2, T5 and T11 to close. Accordingly, EM(1) will remain low while EM_(1) remains high.
At 386, clk1 goes low.
At 387, clk1 goes high and has no effect on the outputs of block 1.
Since ST and ST_ inputs will not change again until the entire sequence needs to be repeated, block 1 will simply repeat the pattern of 384 to 387, regardless of the state of clk1 and clk2, until the inputs are changed. For example, the circuit will proceed through the same states from 388-391 as it did from 384-387. EM(1) will remain low and EM_(1) will remain high.
Referring to
At 382, clk1 goes low, while EM(1) and clk2 are high. EM_(1) is also low at this time. This causes T3, T6 and T7 to close. The high EM(1) signal will expose the bottom plate of capacitor C4 to a high signal and cause T4 to open. The low EM_(1) signal will expose the bottom plate of capacitor C3 to a low signal, cause T8 to close and bring a low signal to point B 506 which exposes the bottom plate of C2 to a low signal and causes T12, T9 and T1 to close. Since T8 and T9 are closed, and by design the on-resistance of T8 and T9 is much less than R, a high signal reaches point A 504, exposes the bottom plate of C1 to a high signal and causes T11, T5 and T2 to open. Accordingly, EM(2) will go high and EM_(2) will turn low.
At 383, clk1 goes high, causing transistors T3, T6 and T7 to open, effectively isolating the EM(1) and EM_(1) signals. Capacitor C4 will maintain a high signal and keep T4 open while C3 will maintain a low signal and keep T8 closed. Capacitor C2 will maintain a low signal at point B 506 and keep transistors T12, T1 and T9 closed. Since T8 and T9 are closed, and by design the on-resistance of T8 and T9 is much less than R, a high signal reaches point A 504, exposes the bottom plate of C1 to a high signal and causes T11, T5 and T2 to open. Accordingly, EM(2) will remain high while EM_(2) remains low.
At 384, clk2 goes low and has no effect on the output of block 2.
At 385, clk2 goes high which also has no effect on the output of block 2.
At 386 clk1 goes low causing T3, T6 and T7 to close. The low EM(1) signal will expose the bottom plate of capacitor C4 to a low signal and cause T4 to close. The high EM_(1) signal will expose capacitor the bottom plate of C3 to a high signal, cause T8 to open and bring a high signal to point B 506 which exposes the bottom plate of C2 to a high signal and causes T1, T9 and T12 to open. Since T8 and T9 are open, V1 is the only signal source able to reach point A 504. This brings a low signal to point A 504 which causes T2, T5 and T11 to close. Accordingly, EM(2) will turn low while EM_(2) turns high.
At 387, clk1 goes high, causing T3, T6 and T7 to open. Capacitor C4 will maintain a low signal and keep T4 closed while C3 maintains a high signal and keeps T8 open. Capacitor C2 will maintain a high signal at point B 506 and keep T1, T9 and T12 open. Since T8 and T9 are open, V1 is the only signal source able to reach point A 504. This brings a low signal to point A 504 which causes T2, T5 and T11 to close. Accordingly, EM(2) will remain low while EM_(2) remains high.
At 388, clk2 goes low and has no effect on the output of block 2.
At 389, clk1 goes high and also has no effect on the output of block 2.
Since EM(1) and EM (1) inputs will not change again until the entire sequence needs to be repeated, block 2 will simply repeat the pattern of 386 to 389, regardless of the state of clk1 and clk2, until the inputs are changed. For example, the circuit will proceed through the same states from 390-393 as it did from 386-389. EM(2) will remain low and EM_(2) will remain high.
An analogous pattern will occur in subsequent odd blocks. A complementary analogous pattern, with clk1 and clk2 playing opposite roles, will occur in subsequent even blocks.
Other permutations of the circuits shown in
In a display system 10 implementing the integrated gate driver described in
Additional functionality can be achieved by varying the inputs. For example, a power-on function, a light-on function and a gate output enable (GOE) function are all possible with any of the circuits described above.
A power-on function can be used whenever display system 10 is first powered up or at any other time that a simultaneous reset of all SEL outputs is desired. In the circuits of
A light-on function can be used to test the functionality of all the pixels by selecting and driving all rows simultaneously. In the circuits of
A GOE (gate output enable) function allows an active SEL line to be momentarily deactivated even when a token is present. This can be achieved by altering the clk1 signal input for odd blocks or the clk2 signal input for even blocks. For example, consider the circuit of
While particular implementations and applications of the present disclosure have been illustrated and described, it is to be understood that the present disclosure is not limited to the precise construction and compositions disclosed herein and that various modifications, changes, and variations can be apparent from the foregoing descriptions without departing from the spirit and scope of an invention as defined in the appended claims.
This application claims the benefit of U.S. Provisional Application No. 61/969,533, filed Mar. 24, 2014, and U.S. Provisional Application No. 61/975,321, filed Apr. 4, 2014, each of which is hereby incorporated by reference herein in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
4354162 | Wright | Oct 1982 | A |
4758831 | Kasahara et al. | Jul 1988 | A |
4963860 | Stewart | Oct 1990 | A |
4975691 | Lee | Dec 1990 | A |
4996523 | Bell et al. | Feb 1991 | A |
5051739 | Hayashida et al. | Sep 1991 | A |
5222082 | Plus | Jun 1993 | A |
5266515 | Robb et al. | Nov 1993 | A |
5498880 | Lee et al. | Mar 1996 | A |
5589847 | Lewis | Dec 1996 | A |
5619033 | Weisfield | Apr 1997 | A |
5648276 | Hara et al. | Jul 1997 | A |
5670973 | Bassetti et al. | Sep 1997 | A |
5684365 | Tang et al. | Nov 1997 | A |
5686935 | Weisbrod | Nov 1997 | A |
5712653 | Katoh et al. | Jan 1998 | A |
5714968 | Ikeda | Feb 1998 | A |
5747928 | Shanks et al. | May 1998 | A |
5748160 | Shieh et al. | May 1998 | A |
5784042 | Ono et al. | Jul 1998 | A |
5790234 | Matsuyama | Aug 1998 | A |
5815303 | Berlin | Sep 1998 | A |
5870071 | Kawahata | Feb 1999 | A |
5874803 | Garbuzov et al. | Feb 1999 | A |
5880582 | Sawada | Mar 1999 | A |
5903248 | Irwin | May 1999 | A |
5917280 | Burrows et al. | Jun 1999 | A |
5923794 | McGrath et al. | Jul 1999 | A |
5952789 | Stewart et al. | Sep 1999 | A |
5990629 | Yamada et al. | Nov 1999 | A |
6023259 | Howard et al. | Feb 2000 | A |
6069365 | Chow et al. | May 2000 | A |
6081131 | Ishii | Jun 2000 | A |
6091203 | Kawashima et al. | Jul 2000 | A |
6097360 | Holloman | Aug 2000 | A |
6144222 | Ho | Nov 2000 | A |
6157583 | Starnes et al. | Dec 2000 | A |
6166489 | Thompson et al. | Dec 2000 | A |
6177915 | Beeteson et al. | Jan 2001 | B1 |
6225846 | Wada et al. | May 2001 | B1 |
6229508 | Kane | May 2001 | B1 |
6232939 | Saito et al. | May 2001 | B1 |
6246180 | Nishigaki | Jun 2001 | B1 |
6252248 | Sano et al. | Jun 2001 | B1 |
6259424 | Kurogane | Jul 2001 | B1 |
6274887 | Yamazaki et al. | Aug 2001 | B1 |
6288696 | Holloman | Sep 2001 | B1 |
6300928 | Kim | Oct 2001 | B1 |
6303963 | Ohtani et al. | Oct 2001 | B1 |
6306694 | Yamazaki et al. | Oct 2001 | B1 |
6307322 | Dawson et al. | Oct 2001 | B1 |
6316786 | Mueller et al. | Nov 2001 | B1 |
6320325 | Cok et al. | Nov 2001 | B1 |
6323631 | Juang | Nov 2001 | B1 |
6323832 | Nishizawa et al. | Nov 2001 | B1 |
6345085 | Yeo et al. | Feb 2002 | B1 |
6348835 | Sato et al. | Feb 2002 | B1 |
6365917 | Yamazaki | Apr 2002 | B1 |
6373453 | Yudasaka | Apr 2002 | B1 |
6384427 | Yamazaki et al. | May 2002 | B1 |
6392617 | Gleason | May 2002 | B1 |
6399988 | Yamazaki | Jun 2002 | B1 |
6414661 | Shen et al. | Jul 2002 | B1 |
6420758 | Nakajima | Jul 2002 | B1 |
6420834 | Yamazaki et al. | Jul 2002 | B2 |
6420988 | Azami et al. | Jul 2002 | B1 |
6433488 | Bu | Aug 2002 | B1 |
6445376 | Parrish | Sep 2002 | B2 |
6468638 | Jacobsen et al. | Oct 2002 | B2 |
6489952 | Tanaka et al. | Dec 2002 | B1 |
6501098 | Yamazaki | Dec 2002 | B2 |
6501466 | Yamagashi et al. | Dec 2002 | B1 |
6512271 | Yamazaki et al. | Jan 2003 | B1 |
6518594 | Nakajima et al. | Feb 2003 | B1 |
6524895 | Yamazaki et al. | Feb 2003 | B2 |
6531713 | Yamazaki | Mar 2003 | B1 |
6559594 | Fukunaga et al. | May 2003 | B2 |
6573195 | Yamazaki et al. | Jun 2003 | B1 |
6573584 | Nagakari et al. | Jun 2003 | B1 |
6576926 | Yamazaki et al. | Jun 2003 | B1 |
6580408 | Bae et al. | Jun 2003 | B1 |
6580657 | Sanford et al. | Jun 2003 | B2 |
6583775 | Sekiya et al. | Jun 2003 | B1 |
6583776 | Yamazaki et al. | Jun 2003 | B2 |
6587086 | Koyama | Jul 2003 | B1 |
6593691 | Nishi et al. | Jul 2003 | B2 |
6594606 | Everitt | Jul 2003 | B2 |
6597203 | Forbes | Jul 2003 | B2 |
6611108 | Kimura | Aug 2003 | B2 |
6617644 | Yamazaki et al. | Sep 2003 | B1 |
6618030 | Kane et al. | Sep 2003 | B2 |
6641933 | Yamazaki et al. | Nov 2003 | B1 |
6661180 | Koyama | Dec 2003 | B2 |
6661397 | Mikami et al. | Dec 2003 | B2 |
6670637 | Yamazaki et al. | Dec 2003 | B2 |
6677713 | Sung | Jan 2004 | B1 |
6680577 | Inukai et al. | Jan 2004 | B1 |
6687266 | Ma et al. | Feb 2004 | B1 |
6690344 | Takeuchi et al. | Feb 2004 | B1 |
6693388 | Oomura | Feb 2004 | B2 |
6693610 | Shannon et al. | Feb 2004 | B2 |
6697057 | Koyama et al. | Feb 2004 | B2 |
6720942 | Lee et al. | Apr 2004 | B2 |
6734636 | Sanford et al. | May 2004 | B2 |
6738034 | Kaneko et al. | May 2004 | B2 |
6738035 | Fan | May 2004 | B1 |
6771028 | Winters | Aug 2004 | B1 |
6777712 | Sanford et al. | Aug 2004 | B2 |
6780687 | Nakajima et al. | Aug 2004 | B2 |
6806638 | Lih et al. | Oct 2004 | B2 |
6806857 | Sempel et al. | Oct 2004 | B2 |
6809706 | Shimoda | Oct 2004 | B2 |
6859193 | Yumoto | Feb 2005 | B1 |
6861670 | Ohtani et al. | Mar 2005 | B1 |
6873117 | Ishizuka | Mar 2005 | B2 |
6873320 | Nakamura | Mar 2005 | B2 |
6878968 | Ohnuma | Apr 2005 | B1 |
6909114 | Yamazaki | Jun 2005 | B1 |
6909419 | Zavracky et al. | Jun 2005 | B2 |
6919871 | Kwon | Jul 2005 | B2 |
6937215 | Lo | Aug 2005 | B2 |
6940214 | Komiya et al. | Sep 2005 | B1 |
6943500 | LeChevalier | Sep 2005 | B2 |
6954194 | Matsumoto et al. | Oct 2005 | B2 |
6956547 | Bae et al. | Oct 2005 | B2 |
6995510 | Murakami et al. | Feb 2006 | B2 |
6995519 | Arnold et al. | Feb 2006 | B2 |
7022556 | Adachi | Apr 2006 | B1 |
7023408 | Chen et al. | Apr 2006 | B2 |
7027015 | Booth, Jr. et al. | Apr 2006 | B2 |
7034793 | Sekiya et al. | Apr 2006 | B2 |
7088051 | Cok | Aug 2006 | B1 |
7106285 | Naugler | Sep 2006 | B2 |
7116058 | Lo et al. | Oct 2006 | B2 |
7129914 | Knapp et al. | Oct 2006 | B2 |
7129917 | Yamazaki et al. | Oct 2006 | B2 |
7141821 | Yamazaki et al. | Nov 2006 | B1 |
7161566 | Cok et al. | Jan 2007 | B2 |
7193589 | Yoshida et al. | Mar 2007 | B2 |
7199516 | Seo et al. | Apr 2007 | B2 |
7220997 | Nakata | May 2007 | B2 |
7235810 | Yamazaki et al. | Jun 2007 | B1 |
7245277 | Ishizuka | Jul 2007 | B2 |
7248236 | Nathan et al. | Jul 2007 | B2 |
7264979 | Yamagata et al. | Sep 2007 | B2 |
7274345 | Imamura et al. | Sep 2007 | B2 |
7274363 | Ishizuka et al. | Sep 2007 | B2 |
7279711 | Yamazaki et al. | Oct 2007 | B1 |
7304621 | Oomori et al. | Dec 2007 | B2 |
7310092 | Imamura | Dec 2007 | B2 |
7315295 | Kimura | Jan 2008 | B2 |
7317429 | Shirasaki et al. | Jan 2008 | B2 |
7319465 | Mikami et al. | Jan 2008 | B2 |
7321348 | Cok et al. | Jan 2008 | B2 |
7339636 | Voloschenko et al. | Mar 2008 | B2 |
7355574 | Leon et al. | Apr 2008 | B1 |
7358941 | Ono et al. | Apr 2008 | B2 |
7402467 | Kadono et al. | Jul 2008 | B1 |
7414600 | Nathan et al. | Aug 2008 | B2 |
7432885 | Asano et al. | Oct 2008 | B2 |
7474285 | Kimura | Jan 2009 | B2 |
7485478 | Yamagata et al. | Feb 2009 | B2 |
7502000 | Yuki et al. | Mar 2009 | B2 |
7535449 | Miyazawa | May 2009 | B2 |
7554512 | Steer | Jun 2009 | B2 |
7569849 | Nathan et al. | Aug 2009 | B2 |
7619594 | Hu | Nov 2009 | B2 |
7619597 | Nathan et al. | Nov 2009 | B2 |
7697052 | Yamazaki et al. | Apr 2010 | B1 |
7825419 | Yamagata et al. | Nov 2010 | B2 |
7859492 | Kohno | Dec 2010 | B2 |
7868859 | Tomida et al. | Jan 2011 | B2 |
7876294 | Sasaki et al. | Jan 2011 | B2 |
7948170 | Striakhilev et al. | May 2011 | B2 |
7969390 | Yoshida | Jun 2011 | B2 |
7995010 | Yamazaki et al. | Aug 2011 | B2 |
8044893 | Nathan et al. | Oct 2011 | B2 |
8115707 | Nathan et al. | Feb 2012 | B2 |
8378362 | Heo et al. | Feb 2013 | B2 |
8493295 | Yamazaki et al. | Jul 2013 | B2 |
8497525 | Yamagata et al. | Jul 2013 | B2 |
20010002703 | Koyama | Jun 2001 | A1 |
20010004190 | Nishi et al. | Jun 2001 | A1 |
20010013806 | Notani | Aug 2001 | A1 |
20010015653 | De Jong et al. | Aug 2001 | A1 |
20010020926 | Kujik | Sep 2001 | A1 |
20010026127 | Yoneda et al. | Oct 2001 | A1 |
20010026179 | Saeki | Oct 2001 | A1 |
20010026257 | Kimura | Oct 2001 | A1 |
20010030323 | Ikeda | Oct 2001 | A1 |
20010033199 | Aoki | Oct 2001 | A1 |
20010038098 | Yamazaki et al. | Nov 2001 | A1 |
20010043173 | Troutman | Nov 2001 | A1 |
20010045929 | Prache et al. | Nov 2001 | A1 |
20010052606 | Sempel et al. | Dec 2001 | A1 |
20010052898 | Osame et al. | Dec 2001 | A1 |
20020000576 | Inukai | Jan 2002 | A1 |
20020011796 | Koyama | Jan 2002 | A1 |
20020011799 | Kimura | Jan 2002 | A1 |
20020011981 | Kujik | Jan 2002 | A1 |
20020015031 | Fujita et al. | Feb 2002 | A1 |
20020015032 | Koyama et al. | Feb 2002 | A1 |
20020030528 | Matsumoto et al. | Mar 2002 | A1 |
20020030647 | Hack et al. | Mar 2002 | A1 |
20020036463 | Yoneda et al. | Mar 2002 | A1 |
20020047852 | Inukai et al. | Apr 2002 | A1 |
20020048829 | Yamazaki et al. | Apr 2002 | A1 |
20020050795 | Imura | May 2002 | A1 |
20020053401 | Ishikawa et al. | May 2002 | A1 |
20020070909 | Asano et al. | Jun 2002 | A1 |
20020080108 | Wang | Jun 2002 | A1 |
20020084463 | Sanford et al. | Jul 2002 | A1 |
20020101172 | Bu | Aug 2002 | A1 |
20020101433 | McKnight | Aug 2002 | A1 |
20020113248 | Yamagata et al. | Aug 2002 | A1 |
20020122308 | Ikeda | Sep 2002 | A1 |
20020130686 | Forbes | Sep 2002 | A1 |
20020154084 | Tanaka et al. | Oct 2002 | A1 |
20020158823 | Zavracky et al. | Oct 2002 | A1 |
20020163314 | Yamazaki et al. | Nov 2002 | A1 |
20020167471 | Everitt | Nov 2002 | A1 |
20020180369 | Koyama | Dec 2002 | A1 |
20020180721 | Kimura et al. | Dec 2002 | A1 |
20020186214 | Siwinski | Dec 2002 | A1 |
20020190332 | Lee et al. | Dec 2002 | A1 |
20020190924 | Asano et al. | Dec 2002 | A1 |
20020190971 | Nakamura et al. | Dec 2002 | A1 |
20020195967 | Kim et al. | Dec 2002 | A1 |
20020195968 | Sanford et al. | Dec 2002 | A1 |
20030020413 | Oomura | Jan 2003 | A1 |
20030030603 | Shimoda | Feb 2003 | A1 |
20030062524 | Kimura | Apr 2003 | A1 |
20030063081 | Kimura et al. | Apr 2003 | A1 |
20030071804 | Yamazaki et al. | Apr 2003 | A1 |
20030076048 | Rutherford | Apr 2003 | A1 |
20030090445 | Chen et al. | May 2003 | A1 |
20030090447 | Kimura | May 2003 | A1 |
20030090481 | Kimura | May 2003 | A1 |
20030095087 | Libsch | May 2003 | A1 |
20030107560 | Yumoto et al. | Jun 2003 | A1 |
20030111966 | Mikami et al. | Jun 2003 | A1 |
20030122745 | Miyazawa | Jul 2003 | A1 |
20030140958 | Yang et al. | Jul 2003 | A1 |
20030151569 | Lee et al. | Aug 2003 | A1 |
20030169219 | LeChevalier | Sep 2003 | A1 |
20030174152 | Noguchi | Sep 2003 | A1 |
20030179626 | Sanford et al. | Sep 2003 | A1 |
20030197663 | Lee et al. | Oct 2003 | A1 |
20030206060 | Suzuki | Nov 2003 | A1 |
20030230980 | Forrest et al. | Dec 2003 | A1 |
20040027063 | Nishikawa | Feb 2004 | A1 |
20040056604 | Shih et al. | Mar 2004 | A1 |
20040066357 | Kawasaki | Apr 2004 | A1 |
20040070557 | Asano et al. | Apr 2004 | A1 |
20040080262 | Park et al. | Apr 2004 | A1 |
20040080470 | Yamazaki et al. | Apr 2004 | A1 |
20040090400 | Yoo | May 2004 | A1 |
20040108518 | Jo | Jun 2004 | A1 |
20040113903 | Mikami et al. | Jun 2004 | A1 |
20040129933 | Nathan et al. | Jul 2004 | A1 |
20040130516 | Nathan et al. | Jul 2004 | A1 |
20040135749 | Kondakov et al. | Jul 2004 | A1 |
20040145547 | Oh | Jul 2004 | A1 |
20040150592 | Mizukoshi et al. | Aug 2004 | A1 |
20040150594 | Koyama et al. | Aug 2004 | A1 |
20040150595 | Kasai | Aug 2004 | A1 |
20040155841 | Kasai | Aug 2004 | A1 |
20040174347 | Sun et al. | Sep 2004 | A1 |
20040174349 | Libsch | Sep 2004 | A1 |
20040183759 | Stevenson et al. | Sep 2004 | A1 |
20040189627 | Shirasaki et al. | Sep 2004 | A1 |
20040196275 | Hattori | Oct 2004 | A1 |
20040201554 | Satoh | Oct 2004 | A1 |
20040207615 | Yumoto | Oct 2004 | A1 |
20040233125 | Tanghe et al. | Nov 2004 | A1 |
20040239596 | Ono et al. | Dec 2004 | A1 |
20040252089 | Ono et al. | Dec 2004 | A1 |
20040257355 | Naugler | Dec 2004 | A1 |
20040263437 | Hattori | Dec 2004 | A1 |
20050007357 | Yamashita et al. | Jan 2005 | A1 |
20050030267 | Tanghe et al. | Feb 2005 | A1 |
20050035709 | Furuie et al. | Feb 2005 | A1 |
20050067970 | Libsch et al. | Mar 2005 | A1 |
20050067971 | Kane | Mar 2005 | A1 |
20050068270 | Awakura | Mar 2005 | A1 |
20050088085 | Nishikawa et al. | Apr 2005 | A1 |
20050088103 | Kageyama et al. | Apr 2005 | A1 |
20050110420 | Arnold et al. | May 2005 | A1 |
20050117096 | Voloschenko et al. | Jun 2005 | A1 |
20050140598 | Kim et al. | Jun 2005 | A1 |
20050140610 | Smith et al. | Jun 2005 | A1 |
20050145891 | Abe | Jul 2005 | A1 |
20050156831 | Yamazaki et al. | Jul 2005 | A1 |
20050168416 | Hashimoto et al. | Aug 2005 | A1 |
20050206590 | Sasaki et al. | Sep 2005 | A1 |
20050225686 | Brummack et al. | Oct 2005 | A1 |
20050260777 | Brabec et al. | Nov 2005 | A1 |
20050269959 | Uchino et al. | Dec 2005 | A1 |
20050269960 | Ono et al. | Dec 2005 | A1 |
20050285822 | Reddy et al. | Dec 2005 | A1 |
20050285824 | Shin | Dec 2005 | A1 |
20050285825 | Eom et al. | Dec 2005 | A1 |
20060007072 | Choi et al. | Jan 2006 | A1 |
20060012310 | Chen et al. | Jan 2006 | A1 |
20060027807 | Nathan et al. | Feb 2006 | A1 |
20060030084 | Young | Feb 2006 | A1 |
20060038758 | Routley et al. | Feb 2006 | A1 |
20060044227 | Hadcock | Mar 2006 | A1 |
20060066527 | Chou | Mar 2006 | A1 |
20060092185 | Jo et al. | May 2006 | A1 |
20060221042 | Cho | Oct 2006 | A1 |
20060232522 | Roy et al. | Oct 2006 | A1 |
20060261841 | Fish | Nov 2006 | A1 |
20060264143 | Lee et al. | Nov 2006 | A1 |
20060273997 | Nathan et al. | Dec 2006 | A1 |
20060284801 | Yoon et al. | Dec 2006 | A1 |
20070001937 | Park et al. | Jan 2007 | A1 |
20070001939 | Hashimoto et al. | Jan 2007 | A1 |
20070008268 | Park et al. | Jan 2007 | A1 |
20070008297 | Bassetti | Jan 2007 | A1 |
20070046195 | Chin et al. | Mar 2007 | A1 |
20070069998 | Naugler et al. | Mar 2007 | A1 |
20070080905 | Takahara | Apr 2007 | A1 |
20070080906 | Tanabe | Apr 2007 | A1 |
20070080908 | Nathan et al. | Apr 2007 | A1 |
20070080918 | Kawachi et al. | Apr 2007 | A1 |
20070103419 | Uchino et al. | May 2007 | A1 |
20070182671 | Nathan et al. | Aug 2007 | A1 |
20070273294 | Nagayama | Nov 2007 | A1 |
20070285359 | Ono | Dec 2007 | A1 |
20070296672 | Kim et al. | Dec 2007 | A1 |
20080042948 | Yamashita et al. | Feb 2008 | A1 |
20080055209 | Cok | Mar 2008 | A1 |
20080074413 | Ogura | Mar 2008 | A1 |
20080088549 | Nathan et al. | Apr 2008 | A1 |
20080101529 | Tobita | May 2008 | A1 |
20080122803 | Izadi et al. | May 2008 | A1 |
20080230118 | Nakatani et al. | Sep 2008 | A1 |
20090032807 | Shinohara et al. | Feb 2009 | A1 |
20090051283 | Cok et al. | Feb 2009 | A1 |
20090160743 | Tomida et al. | Jun 2009 | A1 |
20090162961 | Deane | Jun 2009 | A1 |
20090174628 | Wang et al. | Jul 2009 | A1 |
20090213046 | Nam | Aug 2009 | A1 |
20100052524 | Kinoshita | Mar 2010 | A1 |
20100078230 | Rosenblatt et al. | Apr 2010 | A1 |
20100079711 | Tanaka | Apr 2010 | A1 |
20100097335 | Jung et al. | Apr 2010 | A1 |
20100133994 | Song et al. | Jun 2010 | A1 |
20100134456 | Oyamada | Jun 2010 | A1 |
20100156279 | Tamura et al. | Jun 2010 | A1 |
20100237374 | Chu et al. | Sep 2010 | A1 |
20100328294 | Sasaki et al. | Dec 2010 | A1 |
20110090210 | Sasaki et al. | Apr 2011 | A1 |
20110133636 | Matsuo et al. | Jun 2011 | A1 |
20110180825 | Lee et al. | Jul 2011 | A1 |
20120212468 | Govil | Aug 2012 | A1 |
20130009930 | Cho et al. | Jan 2013 | A1 |
20130032831 | Chaji et al. | Feb 2013 | A1 |
20130113785 | Sumi | May 2013 | A1 |
Number | Date | Country |
---|---|---|
1294034 | Jan 1992 | CA |
2109951 | Nov 1992 | CA |
2 249 592 | Jul 1998 | CA |
2 368 386 | Sep 1999 | CA |
2 242 720 | Jan 2000 | CA |
2 354 018 | Jun 2000 | CA |
2 436 451 | Aug 2002 | CA |
2 438 577 | Aug 2002 | CA |
2 483 645 | Dec 2003 | CA |
2 463 653 | Jan 2004 | CA |
2498136 | Mar 2004 | CA |
2522396 | Nov 2004 | CA |
2443206 | Mar 2005 | CA |
2472671 | Dec 2005 | CA |
2567076 | Jan 2006 | CA |
2526782 | Apr 2006 | CA |
1381032 | Nov 2002 | CN |
1448908 | Oct 2003 | CN |
20 2006 005427 | Jun 2006 | DE |
0 940 796 | Sep 1999 | EP |
1 028 471 | Aug 2000 | EP |
1 103 947 | May 2001 | EP |
1 130 565 | Sep 2001 | EP |
1 184 833 | Mar 2002 | EP |
1 194 013 | Apr 2002 | EP |
1 310 939 | May 2003 | EP |
1 335 430 | Aug 2003 | EP |
1 372 136 | Dec 2003 | EP |
1 381 019 | Jan 2004 | EP |
1 418 566 | May 2004 | EP |
1 429 312 | Jun 2004 | EP |
1 439 520 | Jul 2004 | EP |
1 465 143 | Oct 2004 | EP |
1 467 408 | Oct 2004 | EP |
1 517 290 | Mar 2005 | EP |
1 521 203 | Apr 2005 | EP |
2317499 | May 2011 | EP |
2 205 431 | Dec 1988 | GB |
09 090405 | Apr 1997 | JP |
10-153759 | Jun 1998 | JP |
10-254410 | Sep 1998 | JP |
11 231805 | Aug 1999 | JP |
11-282419 | Oct 1999 | JP |
2000056847 | Feb 2000 | JP |
2000-077192 | Mar 2000 | JP |
2000-089198 | Mar 2000 | JP |
2000-352941 | Dec 2000 | JP |
2002-91376 | Mar 2002 | JP |
2002-268576 | Sep 2002 | JP |
2002-278513 | Sep 2002 | JP |
2002-333862 | Nov 2002 | JP |
2003-022035 | Jan 2003 | JP |
2003-076331 | Mar 2003 | JP |
2003-150082 | May 2003 | JP |
2003-177709 | Jun 2003 | JP |
2003-271095 | Sep 2003 | JP |
2003-308046 | Oct 2003 | JP |
2005-057217 | Mar 2005 | JP |
2006065148 | Mar 2006 | JP |
2009282158 | Dec 2009 | JP |
485337 | May 2002 | TW |
502233 | Sep 2002 | TW |
538650 | Jun 2003 | TW |
569173 | Jan 2004 | TW |
WO 9425954 | Nov 1994 | WO |
WO 9948079 | Sep 1999 | WO |
WO 0127910 | Apr 2001 | WO |
WO 02067327 | Aug 2002 | WO |
WO 03034389 | Apr 2003 | WO |
WO 03063124 | Jul 2003 | WO |
WO 03077231 | Sep 2003 | WO |
WO 03105117 | Dec 2003 | WO |
WO 2004003877 | Jan 2004 | WO |
WO 2004034364 | Apr 2004 | WO |
WO 2005022498 | Mar 2005 | WO |
WO 2005029455 | Mar 2005 | WO |
WO 2005055185 | Jun 2005 | WO |
WO 2006053424 | May 2006 | WO |
WO 2006063448 | Jun 2006 | WO |
WO 2006137337 | Dec 2006 | WO |
WO 2007003877 | Jan 2007 | WO |
WO 2007079572 | Jul 2007 | WO |
WO 2010023270 | Mar 2010 | WO |
Entry |
---|
Ahnood et al.: “Effect of threshold voltage instability on field effect mobility in thin film transistors deduced from constant current measurements”; dated Aug. 2009 (3 pages). |
Alexander et al.: “Pixel circuits and drive schemes for glass and elastic AMOLED displays”; dated Jul. 2005 (9 pages). |
Alexander et al.: “Unique Electrical Measurement Technology for Compensation, Inspection, and Process Diagnostics of AMOLED HDTV”; dated May 2010 (4 pages). |
Ashtiani et al.: “AMOLED Pixel Circuit With Electronic Compensation of Luminance Degradation”; dated Mar. 2007 (4 pages). |
Chaji et al.: “A Current-Mode Comparator for Digital Calibration of Amorphous Silicon AMOLED Displays”; dated Jul. 2008 (5 pages). |
Chaji et al.: “A fast settling current driver based on the CCII for AMOLED displays”; dated Dec. 2009 (6 pages). |
Chaji et al.: “A Low-Cost Stable Amorphous Silicon AMOLED Display with Full V˜T- and V˜O˜L˜E˜D Shift Compensation”; dated May 2007 (4 pages). |
Chaji et al.: “A low-power driving scheme for a-Si:H active-matrix organic light-emitting diode displays”; dated Jun. 2005 (4 pages). |
Chaji et al.: “A low-power high-performance digital circuit for deep submicron technologies”; dated Jun. 2005 (4 pages). |
Chaji et al.: “A novel a-Si:H AMOLED pixel circuit based on short-term stress stability of a-Si:H TFTs”; dated Oct. 2005 (3 pages). |
Chaji et al.: “A Novel Driving Scheme and Pixel Circuit for AMOLED Displays”; dated Jun. 2006 (4 pages). |
Chaji et al.: “A novel driving scheme for high-resolution large-area a-Si:H AMOLED displays”; dated Aug. 2005 (4 pages). |
Chaji et al.: “A Stable Voltage-Programmed Pixel Circuit for a-Si:H AMOLED Displays”; dated Dec. 2006 (12 pages). |
Chaji et al.: “A Sub-μA fast-settling current-programmed pixel circuit for AMOLED displays”; dated Sep. 2007. |
Chaji et al.: “An Enhanced and Simplified Optical Feedback Pixel Circuit for AMOLED Displays”; dated Oct. 2006. |
Chaji et al.: “Compensation technique for DC and transient instability of thin film transistor circuits for large-area devices”; dated Aug. 2008. |
Chaji et al.: “Driving scheme for stable operation of 2-TFT a-Si AMOLED pixel”; dated Apr. 2005 (2 pages). |
Chaji et al.: “Dynamic-effect compensating technique for stable a-Si:H AMOLED displays”; dated Aug. 2005 (4 pages). |
Chaji et al.: “Electrical Compensation of OLED Luminance Degradation”; dated Dec. 2007 (3 pages). |
Chaji et al.: “eUTDSP: a design study of a new VLIW-based DSP architecture”; dated My 2003 (4 pages). |
Chaji et al.: “Fast and Offset-Leakage Insensitive Current-Mode Line Driver for Active Matrix Displays and Sensors”; dated Feb. 2009 (8 pages). |
Chaji et al.: “High Speed Low Power Adder Design With a New Logic Style: Pseudo Dynamic Logic (SDL)”; dated Oct. 2001 (4 pages). |
Chaji et al.: “High-precision, fast current source for large-area current-programmed a-Si flat panels”; dated Sep. 2006 (4 pages). |
Chaji et al.: “Low-Cost AMOLED Television with IGNIS Compensating Technology”; dated May 2008 (4 pages). |
Chaji et al.: “Low-Cost Stable a-Si:H AMOLED Display for Portable Applications”; dated Jun. 2006 (4 pages). |
Chaji et al.: “Low-Power Low-Cost Voltage-Programmed a-Si:H AMOLED Display”; dated Jun. 2008 (5 pages). |
Chaji et al.: “Merged phototransistor pixel with enhanced near infrared response and flicker noise reduction for biomolecular imaging”; dated Nov. 2008 (3 pages). |
Chaji et al.: “Parallel Addressing Scheme for Voltage-Programmed Active-Matrix OLED Displays”; dated May 2007 (6 pages). |
Chaji et al.: “Pseudo dynamic logic (SDL): a high-speed and low-power dynamic logic family”; dated 2002 (4 pages). |
Chaji et al.: “Stable a-Si:H circuits based on short-term stress stability of amorphous silicon thin film transistors”; dated May 2006 (4 pages). |
Chaji et al.: “Stable Pixel Circuit for Small-Area High- Resolution a-Si:H AMOLED Displays”; dated Oct. 2008 (6 pages). |
Chaji et al.: “Stable RGBW AMOLED display with OLED degradation compensation using electrical feedback”; dated Feb. 2010 (2 pages). |
Chaji et al.: “Thin-Film Transistor Integration for Biomedical Imaging and AMOLED Displays”; dated 2008 (177 pages). |
European Search Report and Written Opinion for Application No. 08 86 5338 dated Nov. 2, 2011 (7 pages). |
European Search Report for European Application No. EP 04 78 6661 dated Mar. 9, 2009. |
European Search Report for European Application No. EP 05 75 9141 dated Oct. 30, 2009. |
European Search Report for European Application No. EP 05 82 1114 dated Mar. 27, 2009. |
European Search Report for European Application No. EP 07 71 9579 dated May 20, 2009. |
European Search Report dated Mar. 26, 2012 in corresponding European Patent Application No. 10000421.7 (6 pages). |
Extended European Search Report dated Apr. 27, 2011 issued during prosecution of European patent application No. 09733076.5 (13 pages). |
Goh et al., “A New a-Si:H Thin Film Transistor Pixel Circul for Active-Matrix Organic Light-Emitting Diodes”, IEEE Electron Device Letters, vol. 24, No. 9, Sep. 2003, 4 pages. |
International Search Report for International Application No. PCT/CA02/00180 dated Jul. 31, 2002 (3 pages). |
International Search Report for International Application No. PCT/CA2004/001741 dated Feb. 21, 2005. |
International Search Report for International Application No. PCT/CA2005/001844 dated Mar. 28, 2006 (2 pages). |
International Search Report for International Application No. PCT/CA2005/001007 dated Oct. 18, 2005. |
International Search Report for International Application No. PCT/CA2007/000652 dated Jul. 25, 2007. |
International Search Report for International Application No. PCT/CA2008/002307, dated Apr. 28. 2009 (3 pages). |
International Search Report for International Application No. PCT/IB2011/055135, Canadian Patent Office, dated Apr. 16, 2012 (5 pages). |
International Search Report dated Jul. 30, 2009 for International Application No. PCT/CA2009/000501 (4 pages). |
Jafarabadiashtiani et al.: “A New Driving Method for a-Si AMOLED Displays Based on Voltage Feedback”; dated 2005 (4 pages). |
Lee et al.: “Ambipolar Thin-Film Transistors Fabricated by PECVD Nanocrystalline Silicon”; dated 2006 (6 pages). |
Ma e y et al: “Organic Light-Emitting Diode/Thin Film Transistor Integration for foldable Displays” Conference record of the 1997 International display research conference and international workshops on LCD technology and emissive technology. Toronto, Sep. 15-19, 1997 (6 pages). |
Matsueda y et al.: “35.1: 2.5-in. AMOLED with Integrated 6-bit Gamma Compensated Digital Data Driver”; dated May 2004. |
Nathan et al.: “Backplane Requirements for Active Matrix Organic Light Emitting Diode Displays”; dated 2006 (16 pages). |
Nathan et al.: “Call for papers second international workshop on compact thin-film transistor (TFT) modeling for circuit simulation”; dated Sep. 2009 (1 page). |
Nathan et al.: “Driving schemes for a-Si and LTPS AMOLED displays”; dated Dec. 2005 (11 pages). |
Nathan et al.: “Invited Paper: a -Si for AMOLED—Meeting the Performance and Cost Demands of Display Applications (Cell Phone to HDTV)”, dated 2006 (4 pages). |
Nathan et al.: “Thin film imaging technology on glass and plastic” ICM 2000, Proceedings of the 12th International Conference on Microelectronics, (IEEE Cat. No. 00EX453), Tehran Iran; dated Oct. 31-Nov. 2, 2000, pp. 11-14, ISBN: 964-360-057-2, p. 13, col. 1, line 11-48; (4 pages). |
Nathan et al., “Amorphous Silicon Thin Film Transistor Circuit Integration for Organic LED Displays on Glass and Plastic”, IEEE Journal of Solid-State Circuits, vol. 39, No. 9, Sep. 2004, pp. 1477-1486. |
Office Action issued in Chinese Patent Application 200910246264.4 dated Jul. 5, 2013; 8 pages. |
Patent Abstracts of Japan, vol. 2000, No. 09, Oct. 13, 2000—JP 2000 172199 A, Jun. 3, 2000, abstract. |
Patent Abstracts of Japan, vol. 2002, No. 03, Apr. 3, 2002 (Apr. 4, 2004 & JP 2001 318627 A (Semiconductor EnergyLab DO LTD), Nov. 16, 2001, abstract, paragraphs '01331-01801, paragraph '01691, paragraph '01701, paragraph '01721 and figure 10. |
Philipp: “Charge transfer sensing” Sensor Review, vol. 19, No. 2, Dec. 31, 1999 (Dec. 31, 1999), 10 pages. |
Rafati et al.: “Comparison of a 17 b multiplier in Dual-rail domino and in Dual-rail D L (D L) logic styles”; dated 2002 (4 pages). |
Safavaian et al.: “Three-TFT image sensor for real-time digital X-ray imaging”; dated Feb. 2, 2006 (2 pages). |
Safavian et al.: “3-TFT active pixel sensor with correlated double sampling readout circuit for real-time medical x-ray imaging”; dated Jun. 2006 (4 pages). |
Safavian et al.: “A novel current scaling active pixel sensor with correlated double sampling readout circuit for real time medical x-ray imaging”; dated May 2007 (7 pages). |
Safavian et al.: “A novel hybrid active-passive pixel with correlated double sampling CMOS readout circuit for medical x-ray imaging”; dated May 2008 (4 pages). |
Safavian et al.: “Self-compensated a-Si:H detector with current-mode readout circuit for digital X-ray fluoroscopy”; dated Aug. 2005 (4 pages). |
Safavian et al.: “TFT active image sensor with current-mode readout circuit for digital x-ray fluoroscopy [5969D-82]”; dated Sep. 2005 (9 pages). |
Sanford, James L., et al., “4.2 TFT AMOLED Pixel Circuits and Driving Methods”, SID 03 Digest, ISSN/0003, 2003, pp. 10-13. |
Stewart M. et al., “Polysilicon TFT technology for active matrix OLED displays” IEEE transactions on electron devices, vol. 48, No. 5; dated May 2001 (7 pages). |
Tatsuya Sasaoka et al., 24.4L; Late-News Paper: A 13.0-inch AM-Oled Display with Top Emitting Structure and Adaptive Current Mode Programmed Pixel Circuit (TAC), SID 01 Digest, (2001), pp. 384-387. |
Vygranenko et al.: “Stability of indium-oxide thin-film transistors by reactive ion beam assisted deposition”; dated 2009. |
Wang et al.: “Indium oxides by reactive ion beam assisted evaporation: From material study to device application”; dated Mar. 2009 (6 pages). |
Written Opinion dated Jul. 30, 2009 for International Application No. PCT/CA2009/000501 (6 pages). |
Yi He et al., “Current-Source a-Si:H Thin Film Transistor Circuit for Active-Matrix Organic Light-Emitting Displays”, IEEE Electron Device Letters, vol. 21, No. 12, Dec. 2000, pp. 590-592. |
Zhiguo Meng et al; “24.3: Active-Matrix Organic Light-Emitting Diode Display implemented Using Metal-Induced Unilaterally Crystallized Polycrystalline Silicon Thin-Film Transistors”, SID 01Digest, (2001), pp. 380-383. |
International Search Report for Application No. PCT/IB2014/059409, Canadian Intellectual Property Office, dated Jun. 12, 2014 (4 pages). |
Written Opinion for Application No. PCT/IB2014/059409, Canadian Intellectual Property Office, dated Jun. 12, 2014 (5 pages). |
Extended European Search Report for Application No. EP 14181848.4, dated Mar. 5, 2015, (9 pages). |
Number | Date | Country | |
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20150269883 A1 | Sep 2015 | US |
Number | Date | Country | |
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61975321 | Apr 2014 | US | |
61969533 | Mar 2014 | US |