This patent application generally relates to a structure for imaging a scene. More particularly, it relates to a stack structure. Even more particularly it relates to a compact stack structure.
Imaging devices have required significant space either for optical input or for optical display or both. Applicants recognized that better schemes than those available are needed and such solutions are provided by the following description.
One aspect of the present patent application is an optical system for displaying light from a scene. The optical system includes an active optical component that includes a first plurality of light directing apertures, an optical detector, a processor, a display, and a second plurality of light directing apertures. The first plurality of light directing apertures is positioned to provide an optical input to the optical detector. The optical detector is positioned to receive the optical input and convert the optical input to an electrical signal corresponding to intensity and location data. The processor is connected to receive the data from the optical detector and process the data for the display. The second plurality of light directing apertures is positioned to provide an optical output from the display.
The foregoing will be apparent from the following detailed description, as illustrated in the accompanying drawings, in which:
In one embodiment, the system uses light directing apertures, such as micro-lens arrays 30a, 30b for both the input and output optical elements and uses stacked component 31 including optical detector 32, processor 34, and display 36 located between the two light directing apertures 30a, 30b, to provide active optical component 40, as shown in
Light directing apertures are fabricated of a material such as molded glass, fused silica, acrylic plastic, polycarbonate, Uvex, CR39, and Trivex.
Optical detector 32 includes an array of receptors that receive photons from the scene outside through light directing apertures 30a and converts the photons to electrical signals corresponding to intensity and location in the scene outside. Optical detector 32 can include a charge coupled device, a complementary metal-oxide semiconductor sensor chip, and such low light detectors as a microchannel amplifier imaging chip combination and an electron bombarded integrated circuit (EBIC), and for short wave infrared at low light level, an InGaAs focal plane array.
In one embodiment optical detector 32 has serial electrical connections for storing image data in memory 42 of processor 34. In another embodiment, optical detector 32 has multiple parallel connections 58 for storing this image data in memory 42 of processor 34.
Processor 34 also includes input assembler 44, arithmetic logic units 46 with data caches 48, execution manager 50, central processing unit 52, and local cache 54 that digitally process the image data from detector 32 and formats the data for display 36, providing an output through either a wire connector or multiple connectors 54 to display 36. The images provided on display 36 are seen by the eye of the viewer through optical output light directing apertures 30b.
In one embodiment, optical detector 32, processor 34, and display 36 share a common interconnect surface, which is back surface 60 of display 36, as shown in
In another alternative, detector 32, processor 34 and display 36 are on separate layers, as shown in
In one experiment an assembly of input side optics was built and tested with light directing apertures 30a that were micro-lenses that each had a focal length f=9.3 mm and with 3.2 mm apertures in a 3×3 array. The field of view was 20°, the display resolution was 2048 pixels×2048 pixels, and each pixel was 5.5×5.5 microns on a side with an optical resolution of 55 line pairs per degree)(lp/°). Each lens of the micro-lens array was a compound lens. Total thickness of the input optics micro lens array was 8.5 mm and the spacing to detector 32 was 1 mm. The lens array was custom diamond turned in Zeonex plastic.
In one experiment an assembly of output side optics was purchased and tested. The resolution was 2 line pairs/degree. The field of view was 17 degrees. The focal length was 3.3 mm. The aperture was 1 mm diameter. Each lens was 3 mm thick molded polycarbonate. The micro lenses were purchased from Fresnel Technologies, Fort Worth, Tex. and were part number 630. The display was a 15×11 mm Sony OLED micro-display, part number ECX322A.
As in the experiment, light directing apertures 30a can have different dimensions than light directing apertures 30b.
While light directing apertures 30a, 30b are illustrated as micro-lenses, as shown in
In one embodiment, adjacent ones of the light directing apertures are configured to provide redundant scene elements on detector 32. Processor 34 includes a program to superimpose data from redundant scene elements, such as data derived from adjacent ones of the plurality of light directing optical apertures, to create a single image with such changes as higher resolution, better signal to noise ratio, and higher contrast, as described in a paper, “Thin observation module by bound optics (TOMBO): concept and experimental verification,” by Jun Tanida et al, Applied Optics, Vol. 40, No. 11, 10 Apr. 2001 (“the Tanida paper”), in a paper, “PiCam: An Ultra-Thin High Performance Monolithic Camera Array,” by Venkatarama et al, ACM Transactions on Graphics, Proceedings of ACM SIGGRATH Asia, 32 (5) 2013, both of which are incorporated herein by reference and as described in U.S. Pat. Nos. 5,754,348 and 8,013,914, both of which are incorporated herein by reference. Processor 34 can also include a program to provide a higher magnification.
Detail of display 36 and output portion 30b located close to a user's eye is shown in
In one embodiment, an external electronic device is connected to processor 34 through connector 56 for providing information on display 36. The external electronic device may be a communications system, a wifi, a GPS, a remote camera, another wearable optical system, a microphone, a digital compass, an accelerometer, a vehicle instrument, and an external computer. In one embodiment, the external information is provided on the display to overlay information from the scene, as described in U.S. Pat. No. 7,250,983, incorporated herein by reference. The system can thus augment what the viewer is seeing with overlaid information, for example, information about the subject or object being viewed. The overlaid information can be data that was previously stored.
In one embodiment, the system augments a user's vision by displaying images captured in wavelength bands including visible (0.4 to 0.7 microns), near infrared (0.7 to 1.0 microns), and short wave infrared (1.0 to 2.5 microns). With appropriate detectors, the system can also display images showing combinations, such as visible and near infrared, visible and short wave infrared, near infrared and short wave infrared, and visible, near infrared and short wave infrared. With appropriate detectors the system can also display images from objects providing light in other bands, including ultraviolet (0.2 to 0.4 micron), mid-wave infrared (2.5 to 6 micron), and long-wave infrared (6 to 14 micron). The system can thus augment user's vision by displaying images of the subject or object in a non-visible wavelength band. Well known detectors in the various wavelength bands can be used, as described in “Infrared Detectors: an overview,” by Antoni Rogalski, in Infrared Physics & Technology 43 (2002) 187-210.
The present applicants found that with the multi-aperture array there is no change in the solid angle subtended as compared with using a single input lens. Nor is there a change in the flux of light collected by each pixel of the detector as compared with using a single input lens. They found that noise reduction was accomplished and resolution improved by using weighted averages of surrounding pixels as described in the Tanida paper.
The thickness of active optical component 40 is sufficiently reduced in this embodiment compared to previously existing devices, while the output light directing aperture 30b allows the system to be located near the user's eye, so a pair of active optical components 40 can be mounted to replace the ordinary lenses in a pair of glasses 74, as shown in
Curved semiconductor components are described in U.S. Pat. Nos. 6,027,958, 6,953,735, and 8,764,255 and US patent application 21040004644, all of which are incorporated herein by reference. Curved stacked components may include thinned crystalline silicon for detector and processor. Thinned silicon will roll up. It is sufficiently flexible that it can have different curvature in each of two dimensions. Other semiconductors are similarly flexible when thinned. Thinning is also advantageous for through silicon contacts. Display 36 is fabricated on a flexible substrate. Arrays of light directing apertures 30a, 30b, can also be fabricated with curves.
A process to fabricate curved stacked component 31′ is shown in
Processor 34 is grown epitaxially on the sacrificial oxide insulator surface of silicon-on-insulator substrate 90, as shown in
Display 36 is grown epitaxially on the sacrificial oxide insulator surface of silicon-on-insulator substrate 100, as shown in
In the next step electrical contacts between detector wafer 32 and processor wafer 34 are aligned, as shown in
In the next step detector-processor stack 110 is released from processor substrate wafer 90 using a process such as hydrofluoric acid or zenon difluoride, as shown in
In the next step the now exposed electrical connections of processor 34 are aligned and bonded to display 36 electrical contacts using a process such as solder bonding or compression bonding, as shown in
In the next step detector-processor-display stack 120 is released from both display substrate wafer 100 and from detector substrate wafer 80, as shown in
In the next step the detector-processor-display stack is aligned with and connected with rigid input curved lens array 130a and output curved lens array 130b fabricated as molded optics, conforming to their curvature, as shown in
While several embodiments, together with modifications thereof, have been described in detail herein and illustrated in the accompanying drawings, it will be evident that various further modifications are possible without departing from the scope of the invention as defined in the appended claims. Nothing in the above specification is intended to limit the invention more narrowly than the appended claims. The examples given are intended only to be illustrative rather than exclusive.
This application claims the benefit of U.S. Provisional Patent Application 61/963,928, filed Dec. 17, 2013, “Integrated MicroOptic Imager, Processor, and Display,” incorporated herein by reference.
Number | Name | Date | Kind |
---|---|---|---|
5754348 | Soohoo | May 1998 | A |
6027958 | Vu | Feb 2000 | A |
6953735 | Yamazaki | Oct 2005 | B2 |
7250983 | Lin | Jul 2007 | B2 |
7978210 | Jetha | Jul 2011 | B2 |
7995078 | Baar | Aug 2011 | B2 |
8013914 | Egawa | Sep 2011 | B2 |
8764255 | Hack | Jul 2014 | B2 |
9242596 | Thomson | Jan 2016 | B2 |
20060192869 | Yoshino et al. | Aug 2006 | A1 |
20080211737 | Kim et al. | Sep 2008 | A1 |
20100045844 | Yamamoto et al. | Feb 2010 | A1 |
20120212406 | Osterhout | Aug 2012 | A1 |
20130021226 | Bell | Jan 2013 | A1 |
20140004644 | Roy | Jan 2014 | A1 |
20140168783 | Luebke | Jun 2014 | A1 |
Number | Date | Country |
---|---|---|
2 494 939 | Mar 2013 | GB |
Entry |
---|
PCT International Preliminary Report on Patentability dated Jun. 21, 2016. |
PCT International Search Report dated Jun. 25, 2015. |
Shankar, Mohan, “Thin infrared imaging systems through multichannel sampling,” published Jan. 8, 2008, vol. 47, No. 10 Applied Optics. |
Oberdörster, Alexander, “Resolution and sensitivity of wafer-level multi-aperture cameras,” Journal of Electronic Imaging 22(1), 011001 (Jan.-Mar. 2013). |
Portnoy, Andrew David, “Coded Measurement for Imaging and Spectroscopy,” An abstract of a dissertation submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in the Department of Electrical and Computer Engineering in the Graduate School of Duke University 2009. |
Venkataraman, Kartik, “PiCam: An Ultra-Thin High Performance Monolithic Camera Array,” ACM Transactions on Graphics (TOG)—Proceedings of ACM SIGGRAPH Asia 2013, vol. 32 Issue 6, Nov. 2013 Article No. 166. |
Brady, David J., “Multiscale lens design,” Jun. 22, 2009 / vol. 17, No. 13 / Optics Express. |
Rogalski, Antoni, “Infrared detectors: an overview,” Infrared Physics & Technology 43 (2002) 187-210. |
Number | Date | Country | |
---|---|---|---|
20160370588 A1 | Dec 2016 | US |
Number | Date | Country | |
---|---|---|---|
61963928 | Dec 2013 | US |
Number | Date | Country | |
---|---|---|---|
Parent | PCT/US2014/070991 | Dec 2014 | US |
Child | 15185437 | US |