The present disclosure relates to integrated circuit inductors, and in particular, integrated circuit inductors which can be varied in inductance via the application of a control current.
On-chip inductors are receiving attention as semiconductor devices become increasingly compact. Inductors are particularly difficult to miniaturize due to the principles of electromagnetic fields on which they depend. Furthermore, semiconductor devices employing inductors are being designed to operate over increasingly high frequencies and broad bandwidths, yet also employ increasingly miniaturized components and system-on-a-chip architectures.
Prior approaches often fail to operate satisfactory under these parameters. One such approach is the co-location of a patterned magnetic film near a fixed value inductor. This approach helps to miniaturize the fixed value inductor by influencing the electromagnetic field that surrounds the inductor when operating. However, this approach fails to permit a sufficient degree of miniaturization for many system-on-a-chip applications.
Furthermore, such inductors are of fixed value. The use of fixed value inductors limits the operational frequency and bandwidth ranges of the parent device. In devices that operate at multiple frequencies or across wide bandwidths, it can be advantageous to use inductors of variable value. Thus, there is a need for an integrated inductor which is actively tunable and more highly miniaturizable.
According to various example embodiments, an integrated tunable inductor is disclosed. In an exemplary embodiment, an integrated tunable inductor comprises a substrate configured to receive an inductor, an inductor located proximate to the substrate, a magnetic material located proximate to the inductor, and a first control line located proximate to the magnetic material. The first control line is configured for the conduction of an electric current. The integrated tunable inductor further comprises a controller configured to tune the magnitude of the electric current.
In another exemplary embodiment, a method of varying the inductance of an integrated tunable inductor comprises passing a first current through a first control line located proximate to an inductor, and inducing a first electromagnetic field to radiate from the control line and traverse a first magnetic material located proximate to the inductor. The first magnetic material has a variable magnetic flux density. The method further comprises varying the magnitude of the first current in response to the inducing a first electromagnetic field, changing the variable magnetic flux density of the magnetic material in response to the varying the magnitude of the first current, and altering the capacity of the inductor to store energy in a second electromagnetic field radiating from the inductor and traversing the first magnetic material in response to the changing the variable magnetic flux density.
In another exemplary embodiment, a method of manufacturing a planar inductor comprises configuring a substrate to receive an inductor, forming an inductor on the substrate by depositing a conductive material on the substrate, and positioning a first control line proximate to the inductor. The first control line is configured for the conduction of a first electric current. The method further comprises connecting a controller in electrical communication with the first control line, and configuring the controller to tune the magnitude of the first electric current.
With reference to the following description, appended claims, and accompanying drawings as attached:
The following description is of various exemplary embodiments only, and is not intended to limit the scope, applicability or configuration of the present disclosure in any way. Rather, the following description is intended to provide a convenient illustration for implementing various embodiments including the best mode. As will become apparent, various changes may be made in the function and arrangement of the elements described in these embodiments without departing from the scope of the appended claims.
For the sake of brevity, conventional techniques for integrated circuit manufacturing and/or semiconductor preparation may not be described in detail herein. Furthermore, the connecting lines shown in various figures contained herein are intended to represent exemplary functional relationships and/or physical couplings between various elements. It should be noted that many alternative or additional functional relationships or physical connections may be present in a practical method of construction.
In accordance with principles of the present disclosure, an integrated tunable inductor may be constructed on an integrated circuit chip. Moreover, a substrate of the integrated circuit chip may comprise a planar inductor. The planar inductor may be located proximate to a permeable magnetic material and a control line. A controller may control an electric current passing through the control line, thus controllably inducing a magnetic field to traverse the permeable magnetic material and thereby affect the magnetic flux density of the permeable magnetic material. This in turn controllably affects the inductance of the planar inductor. Thus, in an example embodiment, the inductance of the inductor can be varied by varying a control current through the control line.
In accordance with an example embodiment, the relative magnetic flux density of the permeable magnetic material proximate to the inductor is changed by adjusting the magnitude of current flowing in the control line. In turn, this adjusting alters the ability of the inductor to induce a second magnetic field within the permeable magnetic material, thereby adjusting the capacity of the inductor to store energy in this second magnetic field. Consequently, the inductance of the inductor is adjusted via tuning of the current flowing from the controller. Such a device is very useful in applications such as single-chip dc-dc converters, tunable filters, or tunable resonators, and may also be used in any application requiring miniaturized inductors of variable inductance. As a result, a physically small inductor may be made to behave as if it were an inductor of many different sizes, including a physically large inductor.
With reference now to
In some embodiments, the substrate 107 may comprise quartz or any other material or combination of materials suitable to receive the planar inductor 101. In some embodiments, substrate 107 may comprise a semiconductor substrate. For example, substrate 107 may comprise silicon, silicon germanium, gallium arsenide, silicon carbide, gallium nitride, and/or the like, or any other material suitable to receive planar inductor 101. In some embodiments, substrate 107 may comprise an insulating substrate. For example, substrate 107 may be quartz, polyimide, benzocyclobutene, polydimethylsiloxane, and/or the like, or any other material suitable to receive planar inductor 101.
Furthermore, in some embodiments, substrate 107 may be configured to interface with other on-chip integrated devices. For example, substrate 107 may be configured to receive other active or passive devices, or may be configured to support attached devices, or may be attachable to another circuit assembly.
In some embodiments, a planar inductor 101 may be patterned directly atop the substrate or may be affixed in any manner suitable to retain the planar inductor 101 in place. For example, an inductor may be formed by standard CMOS manufacturing processes. In particular, an inductor may be fabricated using electron beam lithography and magnetron sputtering. In some embodiments, standard CMOS manufacturing processes may be used to pattern a copper inductor on the substrate; however, any other conductive material with low resistivity may also be used. For example, planar inductor 101 may be made of copper, silver, gold, and/or the like.
In various example embodiments, planar inductor 101 may be spiral in shape. Furthermore, in various example embodiments, a spiral inductor may comprise four turns, though the planar inductor may comprise any number of turns adapted to achieve a desired inductance or a desired quality factor within a desired device size. For example, a four-turn spiral inductor may have an outer diameter of about 88 μm by 164 μm, with traces about 5 μm wide, about 2 μm thick, and spaced about 3.5 μm apart. Alternatively, an inductor may have any other dimensions suitable for a desired application. For example, in one embodiment, the inductor dimensions are chosen to maximize the range of inductance across which an exemplary integrated tunable inductor 100 may be tuned. In various example embodiments, the inductor dimensions are chosen to maximize the nominal inductance of planar inductor 101. In various embodiments, the inductor dimensions are chosen to achieve a desired quality factor. Moreover, in various embodiments, the inductor dimensions are chosen to achieve various other desired operational characteristics, for example, to satisfy voltage requirements, current requirements, parasitic capacitance requirements, or parasitic resistance requirements.
In some embodiments, planar inductor 101 is patterned according to a strip line structure, a solenoidal structure, a toroidal structure, a finger structure, a bar structure, and/or any other structure with desirable operational characteristics. For example, in one embodiment, a strip line structure may be selected in order to minimize the device size. In various example embodiments, a finger structure or a bar structure may be selected in order to reduce eddy current loss in the magnetic material, or to increase the device quality factor, or to achieve various other operational requirements and/or benefits.
With reference again to
For example, in accordance with the principles discussed herein, in various embodiments, magnetic material 103 may comprise CoZrTaB. Magnetic material 103 may be deposited on a quartz substrate by magnetron sputtering. The magnetic material 103 may be deposited as a film. Moreover, the magnetic material 103 may be deposited with uniaxial magnetic anisotropy, for example, through the application of an external DC magnetic field in the sputtering chamber during deposition.
In some embodiments, a magnetic material 103 may be located proximate to the planar inductor 101. For example, a continuous ring of magnetic material 103 may physically wrap a portion of the planar inductor 101. For example, with reference to
In various example embodiments, any construction may be used wherein magnetic material 803 is sufficiently proximate to planar inductor 801 to provide a relative increase in permeability of the inductor. In some embodiments, a continuous ring of magnetic material 803 is about 40 μm wide and about 80 μm thick, though any dimensions suitable for limiting the eddy current at a desired operating frequency may be chosen.
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In various embodiments, a bar structure may be formed according to a process wherein a film of magnetic material 103 is deposited and then is patterned into a bar structure 1002 via electron beam lithography and a lift-off process, for example, an acetone soaking of the device to remove a polymer layer used in the lithography process.
In some embodiments, a magnetic material 103 does not comprise a continuous ring of magnetic material, but comprises a finger structure. For example, a finger structure may be utilized for large signal applications, such as voltage regulators. The finger structure may be configured to increase the magnetic field strength at which the magnetic material reaches a state of full saturation magnetic flux density.
In some embodiments, an integrated tunable inductor comprises a magnetic material 103 made of a combination of structures. For example, with reference to
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In some embodiments, control line 105 is about 5 μm wide and about 5 μm thick. However, control line 105 may have any suitable width and thickness capable of passing a desired magnitude of electrical current at a desired potential. For example, control line 105 may have a width ranging from about 5 μm to about 100 μm, and a thickness ranging from about 0.5 μm to about 20 μm, though any suitable width and thickness capable of passing a desired magnitude of electrical current at a desired potential may be implemented. In some embodiments, the control line may be made of copper, or silver, or gold, or any other conductive material with low resistivity.
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While the principles of this disclosure have been shown in various embodiments, many modifications of structure, arrangements, proportions, the elements, materials and components, used in practice, which are particularly adapted for a specific environment and operating requirements may be used without departing from the principles and scope of this disclosure. These and other changes or modifications are intended to be included within the scope of the present disclosure and may be expressed in the following claims.
The present disclosure has been described with reference to various embodiments. However, one of ordinary skill in the art appreciates that various modifications and changes can be made without departing from the scope of the present disclosure. Accordingly, the specification is to be regarded in an illustrative rather than a restrictive sense, and all such modifications are intended to be included within the scope of the present disclosure. Likewise, benefits, other advantages, and solutions to problems have been described above with regard to various embodiments. However, benefits, advantages, solutions to problems, and any element(s) that may cause any benefit, advantage, or solution to occur or become more pronounced are not to be construed as a critical, required, or essential feature or element of any or all the claims.
As used herein, the terms “comprises,” “comprising,” or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Also, as used herein, the terms “proximate,” “proximately,” or any other variation thereof, are intended to cover a physical connection, an electrical connection, a magnetic connection, an optical connection, a communicative connection, a functional connection, and/or any other connection. When language similar to “at least one of A, B, or C” or “at least one of A, B, and C” is used in the claims, the phrase is intended to mean any of the following: (1) at least one of A; (2) at least one of B; (3) at least one of C; (4) at least one of A and at least one of B; (5) at least one of B and at least one of C; (6) at least one of A and at least one of C; or (7) at least one of A, at least one of B, and at least one of C.
This application is a continuation of U.S. Ser. No. 14/094,173 filed on Dec. 2, 2013, now published as U.S. Patent Application Publication No. 2014-0152410 entitled “INTEGRATED TUNEABLE INDUCTORS”. U.S. Ser. No. 14/094,173 claims priority to, and the benefit of, U.S. Provisional Application Ser. No. 61/732,631 entitled “INTEGRATED TUNABLE INDUCTORS” filed on Dec. 3, 2012. Each of the foregoing applications are hereby incorporated herein by reference in their entirety.
Number | Date | Country | |
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61732631 | Dec 2012 | US |
Number | Date | Country | |
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Parent | 14094173 | Dec 2013 | US |
Child | 15182358 | US |