Claims
- 1. A method for providing interactive representation of structural dependencies in a semiconductor design flow as implemented by an information handling system, comprising:
detecting a modified value of a parameter of the semiconductor design flow; and identifying at least one parameter dependent on the changed parameter, the dependent parameter previously entered by a user.
- 2. The method as described in claim 1, wherein the at least one parameter dependent on the modified parameter is identified through a design relational database, the design relational database indicating sets of relations between parameters of the design flow.
- 3. The method as described in claim 2, wherein the relational database indicates at least one of directional and interdependent parameters.
- 4. The method as described in claim 2, wherein the relational database is viewable by a user so that when the relational database is viewed by a user, the relational database shows indications of parameter relationships.
- 5. The method as described in claim 1, wherein the semiconductor design flow includes a plurality of stages, the detected changed value of the parameter at a later stage of the design flow than the at least one parameter which was identified as dependent on the modified parameter.
- 6. The method as described in claim 1, wherein exportation of a design of a semiconductor device resultant for the design flow is prevented until flow parameters and relationships specified by a flow designer are completed.
- 7. The method as described in claim 1, wherein modification to a subsequent parameter of the design flow is prevented until identified dependent parameters have been verified.
- 8. The method as described in claim 1, further comprising displaying the identified dependent parameter.
- 9. A system for providing interactive representation of structural dependencies in a semiconductor design flow having a plurality of stages, comprising:
a memory suitable for storing a program of instructions; a processor communicatively coupled to the memory, the processor suitable for performing the program of instructions; and a display device communicatively coupled to the processor, the display device suitable for displaying data; wherein the program of instructions configures the processor to detect a modified value of a parameter of the semiconductor design flow and identify at least one parameter dependent on the changed parameter through use of a design relational database, the dependent parameter modified at a stage of the design flow before the modification of the detected parameter.
- 10. The system as described in claim 9, wherein the at least one parameter dependent on the modified parameter is identified through a design relational database, the design relational database indicating sets of relations between parameters of the design flow.
- 11. The system as described in claim 9, wherein the relational database indicates at least one of directional and interdependent parameters.
- 12. The system as described in claim 9, wherein the relational database is viewable by a user so that when the relational database is viewed by a user, the relational database shows indications of parameter relationships.
- 13. The system as described in claim 9, wherein exportation of a design of a semiconductor device resultant for the design flow is prevented until flow parameters and relationships specified by a flow designer are completed.
- 14. The system as described in claim 9, wherein modification to a subsequent parameter of the design flow is prevented until identified dependent parameters have been verified.
- 15. The system as described in claim 9, further comprising displaying the identified dependent parameter on the display device.
- 16. A method for providing interactive representation of structural dependencies in a semiconductor design flow as implemented by an information handling system, comprising:
detecting a modified value of a parameter of the semiconductor design flow; and identifying at least one parameter dependent on the changed parameter, the dependent parameter identified through use of a design relational database indicating sets of relations between parameters of the design flow.
- 17. The method as described in claim 16, wherein the relational database indicates at least one of directional and interdependent parameters.
- 18. The method as described in claim 16, wherein the relational database is viewable by a user so that when the relational database is viewed by a user, the relational database shows indications of parameter relationships.
- 19. The method as described in claim 16, wherein the detected changed value of the parameter is at a later stage of the design flow than the at least one parameter which was identified as dependent on the modified parameter.
- 20. The method as described in claim 16, wherein exportation of a design of a semiconductor device resultant for the design flow is prevented until flow parameters and relationships specified by a flow designer are completed.
- 21. The method as described in claim 16, wherein modification to a subsequent parameter of the design flow is prevented until identified dependent parameters have been verified.
- 22. The method as described in claim 16, further comprising displaying the identified dependent parameter.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] The present application hereby incorporates the following U.S. patent applications by reference in their entirety:
1Attorney Docket NumberExpress Mail L.N./U.S.P.N.Filing DateLSI 01-39010/015,194Nov. 20, 2001LSI 01-48810/021,414Oct. 30, 2001LSI 01-48910/021,619Oct. 30, 2001LSI 01-49010/021,696Oct. 30, 2001LSI 01-524B10/044,781Jan. 10, 2002LSI 01-54310/135,189Apr. 30, 2002LSI 01-69509/842,335Apr. 25, 2001LSI 01-82710/034,839Dec. 27, 2001LSI 01-828B10/061,660Feb. 1, 2002LSI 02-016610/135,869Apr. 30, 2002LSI 02-0560EV 087 433 682 USJun. 27, 2002LSI 02-4372EV 087 433 696 USJun. 27, 2002LSI 02-0383EV 087 433 461 USJul. 31, 2002