The present disclosure generally relates to photovoltaic devices, and more particularly to interconnection schemes for connecting photovoltaic cells.
Conventional photovoltaic cells, such as crystalline silicon solar cells, are generally inter-connected using a process referred to as “tabbing and stringing” whereby conducting contacts of adjacent photovoltaic cells are electrically connected (tabbed) to form a chain of devices connected in series (the string). A number of these strings are then packaged together to form a module that is installed on rooftops or other power generating locations. In a majority of conventional photovoltaic cells, one of the conducting contacts of each cell is positioned along the bottom surface of a silicon wafer in the form of a metallic layer, which is typically made up of aluminum metal or an aluminum alloy. The top contact of the photovoltaic cell is typically a screen-printed and baked conductive grid formed using a metallic paste, for example. The current collection portion of this grid and the part that is used for inter-connection is generally referred to as the bus-bar. As shown in
Not only do these interconnections (e.g., wires) require non-trivial additional space to be left between adjacent photovoltaic cells 102 but the distorted configuration (e.g., bends 110) can result in stresses and fatigue related failure during prolonged usage, particularly if subjected to significant thermal cycling. Additionally, this interconnection process (during module assembly of conventional silicon cells) is laborious and not readily automated. This has resulted in manufacturing inefficiencies and cost contributions.
The present disclosure is illustrated for example, and not by way of limitation, in the figures of the accompanying drawings and in which like reference numerals refer to similar elements and in which:
The present disclosure is now described in detail with reference to a few particular embodiments thereof as illustrated in the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure. It is apparent, however, to one skilled in the art, that particular embodiments of the present disclosure may be practiced without some or all of these specific details. In other instances, well known process steps and/or structures have not been described in detail in order to not unnecessarily obscure the present disclosure. In addition, while the disclosure is described in conjunction with the particular embodiments, it should be understood that this description is not intended to limit the disclosure to the described embodiments. To the contrary, the description is intended to cover alternatives, modifications, and equivalents as may be included within the spirit and scope of the disclosure as defined by the appended claims.
Particular embodiments relate to the formation, during nominal cell fabrication, of optimally sized and positioned electrode access contacts (EACs) coupled to the top and bottom contacts of, for example, a conventionally shaped and sized thin-film solar or photovoltaic (hereinafter photovoltaic) cell. In particular embodiments, the EACs are located and accessible on the top surface of each photovoltaic cell. Additionally, in particular embodiments, the EACs are distinctly formed such that they are readily identifiable by human or machine vision techniques, and thus can easily be distinguished for interconnection purposes. In various embodiments, the number, size, shape, and position of the EACs may vary according to whatever may be deemed optimal or most desirable for any particular photovoltaic cell.
In particular embodiments, the substrate 210 may be any suitable substrate capable of withstanding high temperatures and/or pressures. The substrate 210 may provide structural support for the film stack. For example, the substrate 210 may be soda-lime glass, a metal sheet or foil (e.g., stainless steel, aluminum, tungsten), a semiconductor (e.g., Si, Ge, GaAs), a polymer, another suitable substrate, or any combination thereof, and may have a thickness in the range of approximately 0.7 to 2.3 millimeters (mm), although other thicknesses may be suitable.
In particular embodiments, the substrate 210 may be coated with an electrical contact, such as a bottom-contact layer 212. The bottom-contact layer 212 may be any suitable electrode material, such as, for example, Mo, W, Al, Fe, Cu, Sn, Zn, another suitable electrode material, or any combination thereof, having a thickness in the range of approximately 500 to 2000 nanometers (nm), although other thicknesses may be suitable. If the substrate 210 is a non-transparent material, then the top-contact layer 220 and other layers may be transparent to allow light penetration into the absorber layer 214. In particular embodiments, the substrate 210 may be replaced by another suitable protective layer or coating, or may be added during construction of a solar module or panel. Alternatively, the layers of the photovoltaic cell 202 may be deposited on a flat substrate (such as a glass substrate intended for window installations), or directly on one or more surfaces of a non-imaging solar concentrator, such as a trough-like or Winston optical concentrator.
In particular embodiments, the absorber layer 214 may be a CIS layer, a CIS2 layer, a CIGS layer, a CZTS layer, another suitable photoactive conversion layer, or any combination thereof. The absorber layer 214 may be either a p-type or an n-type semiconductor layer. In some embodiments, absorber layer 214 may actually include a plurality of stacked layers. In particular embodiments, the photovoltaic cell 202 may include multiple absorber layers 214. The plurality of absorber layers 214 or the plurality of stacked layers may vary between, for example, CIS, CIS2, CIGS, CZTS layers. In particular embodiments, absorber layer 214 may have a total thickness in the range of approximately 0.5 to 3 micrometers (μm). Although this disclosure describes particular types of absorber layers 214, this disclosure contemplates any suitable type of absorber layers 214.
In particular embodiments, while depositing absorber layer 214 and the subsequent layers described below, one or more portions of a peripheral edge of the substrate may be selectively masked such that a portion of the bottom-contact layer 212 may be left exposed. As described below, the exposed portion of the bottom-contact layer 212 serves as the bottom EAC 236 for the photovoltaic cell 202. The masking may be accomplished in a number of ways including relatively more complex ones such as photo-lithography, which is customarily used for semiconductor processing. However one preferred embodiment would utilize specially designed sample holders 440, as illustrated in
In particular embodiments, sample holder 440 includes integrally formed (with sample holder 440) masking protrusions or tabs (hereinafter “tabs”) 442. Masking tabs 442 selectively mask desired portions of bottom-contact layer 212 that will subsequently form the bottom EACs 236. Although in the described embodiment, masking tabs 442 integral with the sample holder are used to selectively mask the desired portions of bottom-contact layer 212, it should be appreciated that any suitable means may be used to mask the desired portions of bottom-contact layer 212 to form the bottom EACs 236. In various embodiments, bottom-contact layer 212 may be selectively masked to produce one or more bottom EACs 236 having any desired shape or size (although it may be desirable to maximize the area of the subsequently deposited absorber layer to maximize the light absorbed by the photovoltaic cell 202). For example, in the illustrated embodiment, two bottom EACs 236 will be formed. In an alternate embodiment, an entire peripheral edge of the bottom-contact layer 212 may be masked by a masking tab 442. It should be appreciated that, in this way, the bottom EACs 236 may be formed integrally or concurrently with the conventional fabrication of the photovoltaic cell 202.
Following deposition of the absorber layer 214, the substrate 210, bottom-contact layer 212, and absorber layer 214 may be annealed at step 308 and subsequently cooled. In particular embodiments, a buffer (window) layer 216 may be then grown or otherwise deposited over absorber layer 214 at step 310. Again, buffer layer 216 and the subsequently deposited layers described below are masked by masking tabs 442 thereby leaving portions of the bottom-contact layer 212 exposed to form the bottom EACs 236 of the photovoltaic cell 202. For example, buffer layer 216 may be an n-type semiconducting layer formed from, for example, CdS or In2S3, among other suitable materials, and have a thickness in the range of approximately 30 to 70 nm.
In particular embodiments, an i-type layer 218 may be grown or otherwise deposited over buffer layer 216 at step 312. For example, i-type layer 218 may be formed from ZnO and have a thickness in the range of approximately 70 to 100 nm. At step 314, a top-contact layer 220 may then be deposited over the i-type layer 218. In particular embodiment, top-contact layer 220 may be formed from a conducting material such as, for example, AZO (Al2O3 doped ZnO), IZO (Indium Zinc Oxide, e.g., 90 wt % In2O3/10 wt % ZnO), ITO (Indium Tin Oxide or tin-doped indium oxide, e.g., 90 wt % In2O3/10% SnO2), or any combination thereof, and have a thickness in the range of approximately 0.2 to 1.5 μm.
In particular embodiments, an optional conducting grid 222 including bus-bars 224 (which may be integrally formed with grid 222) may be also deposited at step 316 over the top-contact layer 220. Any of the aforementioned layers may be deposited by any suitable means such as, for example, physical-vapor deposition (PVD), including sputtering or evaporation, chemical-vapor deposition (CVD), electroplating, plasma spraying, printing, solution coating, another suitable deposition process, or any combination thereof, while being held by sample holder 440 and selectively masked by masking tabs 442. Conventional processes such as edge isolation, deposition of an anti-reflective coating, and light soaking, among others, may then follow prior to pre-testing, sorting, packaging, and shipping.
Those of skill in the art will appreciate that
As illustrated in
As illustrated in
Furthermore, in some embodiments, an entire peripheral edge of the bottom-contact layer 212 may be masked by a masking tab 442 such that the bottom EAC 236 extends along most or all of one or more sides of the photovoltaic cell 202. In such an embodiment, a single tab may be used to electrically connect an entire side of the bottom-contact layer 212 of one cell with an entire side (e.g. bus-bar 224) of the adjacent cell. Not only would this interconnection arrangement be even less susceptible to stresses, but it may also provide a physical barrier that seals the space between the adjacent cells. In one embodiment, this sealed space may then be injected or otherwise filled with a filler material.
The interconnects 234 may be applied with any suitable means including soldering, adhesive bonding, ultrasonic bonding/welding, etc. One advantage of using the EACs described may be that it would be amenable to novel interconnection schemes in which the interconnections 234 are embedded in a top cover material, for example, in some designated pattern. For example, the interconnections 234 may be laid out in a pattern that corresponds to the desired layout of the chain of photovoltaic cells 202. The pattern of interconnects 234 may then be positioned simultaneously over the pattern of photovoltaic cells, or vice versa. In this case all of the photovoltaic cells 202 of a given module may be interconnected in a single-step process through laser-welding, ultrasonic-welding, or another suitable process. As another example, the interconnections 234 may be screen-printed patterns, embedded wires, or strips, which may be pre-coated with a conductive epoxy or low-temperature solder to facilitate adhesion and connectivity with the relevant EACs.
In conclusion, a major advantage of this interconnection scheme would be its ease of automation and the fact that the interconnections 234 themselves would be co-planar and relatively stress-free. The EACs and interconnections 234 would also permit very high packing densities to be achieved due to the absence of connections running over and under adjacent cells.
In particular embodiments, photovoltaic cells 202 may be fabricated on relatively smaller-sized substrates such that they will have the general appearance and dimensions of conventional silicon solar cells (for example, square or pseudo-square 157 mm2 or 210 mm2 cells), although other arrangements may be suitable. This may facilitate their use as drop-in replacements for equivalent sized and shaped silicon-based cells and, as such, may be compatible with the large global installed base of solar module manufacturers. In particular embodiments, photovoltaic cells 202 may be fabricated in non-standard substrate sizes and shapes. For example, photovoltaic cells 202 may be fabricated in a rectangular louvre configuration that may extend partially or wholly over the width of the resulting module. As another example, one or more substrates 210 may be bonded together to form a monolithic shape equivalent to that of the final module. In this example, the interconnection could be undertaken in a single operation on the monolithically connected cells. This could be via the standard tabbing and stringing process, through screen printing or through the use of a patterned encapsulant.
In particular embodiments, the transparent sheet 702 may comprise multiple layers, such as, for example, a support layer 704 and an interface layer 706. The support layer 704 may be a transparent thermoplastic material protect the photovoltaic cell from weathering and other physical damage without interfering with the collection and transmission of incident light. For example, the support layer 704 may comprise ethylene-vinyl acetate (EVA), polyethylene terephthalate (PET), another suitable transparent protective material, or any combination thereof. Support layer 704 may then be bonded to interface layer 706. The conducting grid 222 and interconnects 234 may be attached or partially embedded into the interface layer 706. Interface layer 706 may be comprised of a material of suitable dimensional stability such that the embedded conducting grid 222 and interconnects 234 will not substantially shift position during the module lamination process where the interconnect sheet 700 is applied to the plurality of photovoltaic cells 202.
In particular embodiments, the interconnection sheet 700 may include a conducting grid 222. The conducting grid 222 may include a series of electrically-conductive wires, such as, for example, low-temperature solder-coated wires, that are attached or partially embedded into the interface layer 706 in such a way that the conducting grid 222 is in electrical contact with top-contact layer 220 of the underlying photovoltaic cell 202. The specific dimensions and spacing of the wires comprising conducting grid 222 may be determined by balancing the resistive losses that arise as conducting grid 222 conducts current against the shading losses suffered as conducting grid 222 blocks incident light from reaching the photovoltaic cell 202 located beneath the interconnect sheet 700. The conducting grid 222 may be composed of Cu, Ag, Ni, stainless steel, another suitable electrically-conductive material, any alloys thereof, or any combination thereof.
In particular embodiments, the interconnection sheet 700 may include one or more interconnects 234. Each interconnect 234 may be an electrically-conductive wire or ribbon that is attached or partially embedded into the interface layer 706 in such a way that the interconnect 234 is in electrical contact with the bottom-contact layer 212 of the underlying photovoltaic cell 202. In particular embodiments, the interconnection sheet 700 may include two or more interconnects 234 that are positioned in parallel and spaced at such a distance that when the interconnect sheet 700 is positioned over a row of photovoltaic cells 202, the two interconnects 234 each physically align with and can make electrical contact with an exposed area of a bottom-contact layer 212 of photovoltaic cells 202, such as, for example, an EAC 236 created by a recessed surface 230 of the photovoltaic cell 202.
In particular embodiments, the interconnection sheet 700 may include a plurality of bus-bars 224. Each bus-bar 224 may be an electrically conductive wire or ribbon that is attached or partially embedded into the interface layer 706 in such a way that the bus-bar 224 is in electrical contact with the conducting grid 222 and the interconnects 234. For example, as illustrated in
In selecting photovoltaic cells 202 for solar module assembly, the electrical responses of the photovoltaic cells 202 may be matched as much as possible to prevent the performance of the solar module from being limited by the lowest common denominator in a mismatched assembly of photovoltaic cells 202. To facilitate testing of current collection of photovoltaic cells 202 in a solar module interconnected with a monolithic interconnect sheet 700, access points 1006 can be created (for example, by laser-drilling or some other suitable method) to expose areas of the top-contact layer 220 and the bottom-contact layer 212 for probing. When testing individual photovoltaic cells 202 in this manner, the effect of all other interconnected photovoltaic cells 202 may be factored out through selective illumination of the specific photovoltaic cell 202, avoidance of grounding, and any other appropriate measures.
One advantage of using an embossed interconnect sheet 700 over traditional methods of electrically connecting photovoltaic cells 202 is that it may accomplishes in one step (the application of the interconnect sheet 700 to facilitate cell interconnection and current collection) what takes two or three steps to accomplish by conventional methods (screen-printing a current-collecting grid, attaching ribbons between cells, and stringing and tabbing during module assembly), which may result in substantial cost and time savings. Another advantage of the interconnect sheet 700 is that it may eliminate the appreciable resistive losses that can arise due to the use of low-temperature screen-printed inks used to deposit the current-collecting top grids of temperature-sensitive thin-film solar cells.
This disclosure encompasses all changes, substitutions, variations, alterations, and modifications to the example embodiments herein that a person having ordinary skill in the art would comprehend. Similarly, where appropriate, the appended claims encompass all changes, substitutions, variations, alterations, and modifications to the example embodiments herein that a person having ordinary skill in the art would comprehend. Moreover, this disclosure encompasses any suitable combination of one or more features from any example embodiment with one or more features of any other example embodiment herein that a person having ordinary skill in the art would comprehend. Furthermore, reference in the appended claims to an apparatus or system or a component of an apparatus or system being adapted to, arranged to, capable of, configured to, enabled to, operable to, or operative to perform a particular function encompasses that apparatus, system, component, whether or not it or that particular function is activated, turned on, or unlocked, as long as that apparatus, system, or component is so adapted, arranged, capable, configured, enabled, operable, or operative.
Herein, “or” is inclusive and not exclusive, unless expressly indicated otherwise or indicated otherwise by context. Moreover, “and” is both joint and several, unless expressly indicated otherwise or indicated otherwise by context. Furthermore, “a”, “an,” or “the” is intended to mean “one or more,” unless expressly indicated otherwise or indicated otherwise by context.
This application is a continuation-in-part under 35 U.S.C. §120 of U.S. patent application Ser. No. 13/447,066, filed 13 Apr. 2012, which is a continuation-in-part under 35 U.S.C. §120 of U.S. patent application Ser. No. 12/783,412, filed 19 May 2010, which claims the benefit under 35 U.S.C. §119(e) of U.S. Provisional Patent Application No. 61/230,241, filed 31 Jul. 2009, which is incorporated herein by reference.
Number | Date | Country | |
---|---|---|---|
61230241 | Jul 2009 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 13447066 | Apr 2012 | US |
Child | 13486891 | US | |
Parent | 12783412 | May 2010 | US |
Child | 13447066 | US |