Interposer assemblies with molded plastic plates and inserted metal contacts in the plates are used for forming electrical connections between contact pads on opposed substrates. The contacts are spaced very close together in land grid array rows and columns to establish a large number of differential pair signal and ground connections extending through the plate.
Increased circuit speed requires transmission of differential signals through interposer plates at signal frequencies of 10 or more gigahertz. Transmission of high-frequency signals through conventional interposer plates with short, closely spaced single circuit path contacts and very fast rise times for the signals increases signal impedance and degrades signal strength. High-frequency signaling can cause cross-talk between adjacent pairs of signal circuit path contacts.
The prior art interposer assembly shown in
An interposer assembly is disclosed with improved contacts for forming redundant electrical connections between contact pads on opposed substrates. Each contact in the assembly has two separate circuit paths between contact points which engage opposed substrate pads. The two circuit paths in each contact reduce inductance and contact resistance. The redundant circuit path eliminates the electrical contact stub that significantly contributes to signal degradation at high speeds.
The improved contacts with redundant circuit paths are inserted into a conventional dielectric plate without the need to tool and manufacture a specialized plate. Manufacturing cost of the improved assembly is reduced by use of the conventional plate.
Interposer assembly 10 has a flat dielectric plate 12 with parallel top and bottom surfaces 14 and 16, a uniform thickness 18 and closely spaced contact passages 20 arranged in intersecting land grid array rows and columns. The plate may have a thickness of 1.22 mm. Formed metal contacts 22 are positioned in contact passages 20.
In plate 12, each contact passage 20 has a wide end wall 24 and an opposed narrow end wall 26. End wall 24 is flat and extends perpendicularly between the parallel top and bottom surfaces 14 and 16. Narrow end wall 26 includes a contact retention protrusion 28 which extends into passage 20. The protrusion 28 has two flat and inwardly angled cam surfaces 30 and 31 and a tip 32 at the intersection of surfaces 30 and 31 located equidistant between top and bottom surfaces 14 and 16.
The flat cam surfaces 30 and 31 on wall 26 extend from tip toward the top and bottom surfaces 14 and 16 at a shallow outward angle. As shown in
Passages 20 have opposed sidewalls 34 extending between end walls 24 and 26. Each sidewall 34 includes a flat portion 36 extending perpendicularly between the top and bottom surfaces 14 and 16 and perpendicularly from one edge of wide end wall 24. Flat, inwardly tapered sidewall portions 38 extend from the edge of narrow end wall 26 away from end wall 26 to portion 36. Portions 36 and 38 are perpendicular to top and bottom surfaces 14 and 16. As illustrated in
Plate 12 is identical to the plate used in the prior art interposer assembly shown in
Metal contacts 22 are stamp formed from uniform thickness gold coated beryllium copper strip stock. The stock may have a thickness of 0.043 mm. Each contact has a rigid vertical spine 40 with rounded upper contact support 42 and rounded lower contact support 44 at the ends of the spine.
A first flat spring arm 46 angles upwardly and inwardly from support 42 to contact point 48 at the top of contact 22. A second flat spring arm 50 angles downwardly and outwardly from point 48 to support bend 52 which faces away from spine 40. End strip 54 extends downwardly and inwardly from bend 52 to rounded end 56. The contact is vertically symmetrical to either side of the center of spine 40 so that the lower half of the contact has flat spring arm 58, lower contact point 60, flat spring arm 62, support bend 64, end strip 66 and rounded end 68. A pair of contact tips 70 are provided on the opposed edges of contact points 48 and 60. Tips 70 are disclosed in U.S. Pat. No. 6,905,343.
Flat spring arm 58 extends downwardly and inwardly from lower contact support 44 to lower contact point 60, opposite from point 48. Flat spring arm 62 extends upwardly and outwardly from contact point 60 to rounded support bend 64. Contact end strip 66 extends up and in from bend 64 to rounded end 68. The widths of arms 46 and 58 decrease away from spine 40 to distribute stresses when the arms are stressed.
Contact 22 is formed from a long and relatively narrow length of uniform thickness metal strip stock bent in the form of an elongate circumferential band 72 with a gap 74 in the band 72 between contact rounded ends 56 and 68. The band 72 has a continuous circumferential inner surface 76 and a continuous circumferential outer surface 78. Surfaces 76 and 78 are perpendicular to a transverse plane 80 extending through the center of the band, illustrated in
Contacts 22 are inserted into passages 20 by positioning the contacts above the passages, as shown in
Assembly 10 with contacts inserted and in the gravity down position as shown in
With the contacts in the position of
As contacts 22 are compressed, the support bends 52 and 64 are moved inward along cam sides 30 and 31 to bend the upper and lower portions of contact 52 toward wide end wall 24 until rounded contact ends 56 and 68 engage each other and, with further lowering of the upper substrate 90 towards the lower substrate 86 and collapse of the contact, the contact is bent toward wall 24 and out of engagement with wall 26. See
Further downward movement of substrate 90 collapses the substrates against the top and bottom surfaces 14 and 16 of plate 12 as shown in
A first continuous metal circuit path between the contact points extends from upper contact point 48 through arm 46, spine 40 and arm 58 to lower contact point 60. A second or redundant continuous metal circuit path extends from contact point 48 through arm 50 and strip 54, ends 56 and 68 and arms 66 and 62 to contact point 60.
During compression of the contacts in passages 20, the bends 52 and 64 rotate out of engagement with cam sides 30 and 31. The contacts are free to move vertically in the passage with the spine supports 42 and 44 sliding along wall 24. This freedom of vertical movement desirably equalizes the contact pressures at the top and bottom of the contact to ensure that a reliable electrical connection is formed between each contact point 48, 60 and the pad on the adjacent substrate.
The redundant circuit paths between the two contact points 48 and 60 reduce electrical resistance between the contacts and reduce high speed inductance between contacts in plate 12.
During collapse of contacts 22 and formation of the second, redundant electrical connections between points 48 and 60, variables inherent in the manufacture of interposer assemblies, their components and the location and movements of the components affect the connections between the contact ends 56 and 68. Mating with contact pads on the opposed substrates is never perfectly symmetrical. Parts have dimensional tolerances which affect mating. The result of these variables is that during collapse of the contacts and formation of the connections between ends 56 and 68, the support bends 52 and 64 engage the cam sides 30 and 31 at different times so that the rounded ends 56 and 68 move along each other to form wiped pressure connections between the ends. The wiped connections at ends 56 and 68 reduce resistance in the second or redundant contact path formed between points 48 and 60 shown in
As illustrated in
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Entry |
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International Search Report dated Dec. 17, 2015 in corresponding PCT Application No. PCT/US15/50935, ISA—US Patent and Trademark Office, 10 pages. |
Drawings of prior art interposer assembly—Figures 10 and 11. |
Number | Date | Country | |
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20160087360 A1 | Mar 2016 | US |
Number | Date | Country | |
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62053266 | Sep 2014 | US |