The present invention relates to means for protecting circuits from damage due to temperature, and more particularly to a circuit for measuring the junction temperature of a MOSFET in real time.
It is an object of the present invention to provide a method for protecting a MOSFET switch from overheating. The method is achieved by determining a ratio of ON resistance of a switch (RDS(ON)) to the resistance of a sense resistor, the sense resistor being series coupled with the source-drain circuit of the switch. Further, the ratio is compared to a reference signal and an output signal is generated when the ratio exceeds the reference signal.
Other features and advantages of the present invention will become apparent from the following description of the invention that refers to the accompanying drawings.
With reference to
To compare the voltage across the sense resistor RS to the voltage across RDS(ON), outputs of the first and second amplifiers 12 and 14 are provided to a divider circuit 16. The divider circuit 16 provides a ratio signal of VDS to VS to a comparator 18. The comparator 18 is also provided with a reference signal Tj limit so that it may determine the temperature at which an overtemperature signal should be issued. An overtemperature signal is issued from the comparator 18 if the ratio received from the divider 16 exceeds a predetermined threshold TJ limit (the reference signal), for example, a ratio of 5. The junction temperature information can also be provided to another circuit by line 20. A switch 17 coupled the divider circuit 16 output and the comparator 18 input and is divided whenever there is gate drive to switch Q1.
The output of the amplifier 34 having an amplification factor of A=1 is A. This output, i.e., A, is fed to the amplifier 30. The inverting input of the amplifier 30 is provided to the output of the multiplier stage 32, which provides a closed loop output B*X. Therefore X is equal to A/B.
The signal X, which is equal to A/B, is provided to a comparator 36, which in turn issues a fault condition when the junction temperature exceeds the limit set at the reference input. An overcurrent comparator 38 is also provided to generate a fault signal if A or VDS has exceeded some predetermined current limit, e.g., ID, which is provided to the overcurrent comparator 38 as the second input.
Although the present invention has been described in relation to particular embodiments thereof, many other variations and modifications and other uses will become apparent to those skilled in the art. It is preferred, therefore, that the present invention not be limited by the specific disclosure herein.
This application is based on and claims the benefit of U.S. Provisional Application Ser. No. 60/699,178, filed on Jul. 14, 2005, entitled JUNCTION TEMPERATURE SENSING FOR MOSFET, to which a claim of priority is hereby made and the disclosure of which is incorporated by reference.
Number | Name | Date | Kind |
---|---|---|---|
5959464 | Qualich | Sep 1999 | A |
6917503 | Dai et al. | Jul 2005 | B2 |
6987655 | Kesler et al. | Jan 2006 | B2 |
20060028257 | Huang et al. | Feb 2006 | A1 |
Number | Date | Country | |
---|---|---|---|
20070014067 A1 | Jan 2007 | US |
Number | Date | Country | |
---|---|---|---|
60699178 | Jul 2005 | US |