LASER CONFOCAL SCANNING MICROSCOPE AND METHODS OF IMPROVING IMAGE QUALITY IN SUCH MICROSCOPE

Abstract

According to a first embodiment the invention provides for increasing the throughput and reducing the striping due to imperfections in the microlens and/or confocal aperture arrays of a Laser Confocal Scanning Microscope by increasing the number of repeat patterns in the microlens and confocal aperture arrays to more than one, and incorporating an intensity modulation function that ensures constant integrated image intensities at the image detector independent of the instantaneous speed of scanning. According to a second embodiment the invention provides for reducing the striping in a Laser Confocal Scanning Microscope by introducing a second galvanometer mirror such that the emitted laser light beam is descanned at the image (sample) plane. According to embodiments three to five, striping in a Laser Confocal Scanning Microscope is also reduced by destroying coherency in the emitted light beam by insertion of a small angle diffuser, by flattening the Gaussian intensity distribution of the emitted laser light beam and changing the characteristics of the beam expander. According to embodiment six the invention provides for changing the degree of confocality of a Laser Confocal Scanning Microscope by inserting a mechanism that offers a range of selectable confocal aperture sizes.

Description

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 Schematic of a typical Nipkow spinning disc confocal system with complementary microlens disc according to the prior art.

FIG. 2 Schematic of a 2-D array laser confocal scanning system according to the prior art.

FIG. 3 a Illustration showing how an imperfection in a single pattern scan creates a strong artefact in the image.

FIG. 3 b Illustration showing how an imperfection in a single pattern of a multiple pattern scan creates a weaker artefact in the image.

FIG. 4 Illustration of a current 2-D array laser confocal scan showing dead time at the end of each scan where scanning is performed bidirectionally. The array size is enlarged for clarity.

FIG. 5 a Illustration of a modified 2-D array laser confocal scan showing elimination of dead time at the end of each scan where scanning is performed bidirectionally and also showing that the gaussian illumination is also scanned over the field of view.

FIG. 5 b Illustration of a modified 2-D array laser confocal scan showing elimination of dead time at the end of each scan where scanning is performed bidirectionally, and also showing that the Gaussian illumination has been descanned with the addition of a second galvanometer mirror.

FIG. 5 c Simplified illustration of synchronisation between first and second galvanometer mirrors to achieve descan of the Gaussian illumination at the sample.

FIG. 6 Illustration of intensity modulation applied to maintain constant captured image intensities with changing scan speed.

FIG. 7 Illustration of extreme case of striping originating from Gaussian, distribution of illumination.

FIG. 8 Illustration of the principle of selectable pinholes using a sliding plate. Only partial rows and columns of pinholes are shown for clarity. Full implementation requires that the pattern of apertures is replicated both horizontally and vertically within the fixed and sliding plates as often as required.

FIG. 9 Overall schematic of 2D array scanning confocal module including the embodiments mentioned in the text.

DESCRIPTION OF PREFERRED EMBODIMENTS

Preferred embodiments of the present, invention are now described by reference to the drawing.

A first embodiment to overcome the lower throughput efficiency and to reduce the random ‘striping’ due to imperfections in the microlens or aperture arrays of the 2-D array laser confocal scanner design requires additional scan patterns to be incorporated into the microlens array and scanned by the galvanometer mirror. These additional repeat patterns along the axis of the scanning direction permit the scanning process to scan across the sample without the ‘dead’ time inherent in the original design. The patterns are arranged such that the patterns at each end of the array are fully superimposed over the field of view when the galvanometer mirror changes its scan direction. Thus it becomes possible to continuously illuminate the sample during the scanning process, without ‘dead’ time (compare FIG. 4 and FIG. 5a).

With continuous illumination of the field of view, the detected intensity during the slowing, stationary and accelerating stages of the change of scan direction will increase over the detected intensity during the steady speed portion of the scan due to the integrating nature of most image detectors. This can be compensated by changing the illumination intensity of the input laser beam. This may be achieved, for example, by using an Acousto Optical Modulator (AOM), an Acousto Optical Tuneable Filter (AOTF), adjustable micro mirror array, a neutral density filter wheel or similar equivalent acousto optical, optical, or opto-mechanical device. Taking for the purposes of illustration an AOTF, which is a device frequently included in a confocal illumination system since it permits the rapid selection of wavelengths from the input beam and deflects the selected wavelengths out of the zero order exit beam position (where they are directed into a beam dump to absorb the unwanted laser energy) to the first order beam position (where they are directed into the input of the confocal system). The AOTF also has the property of controlling the proportion of the selected wavelengths that appear in the zero and first order beams and is also able to do this at very rapid rates. The control signal waveform that drives the galvanometer mirror position is extracted and modified for use as a modulation control input signal for the wavelengths selected by the AOTF (FIG. 6). Thus the system is able to maintain the integrated intensity of the illumination as the speed of the scan varies during the change of scan direction, thus eliminating any artefacts that would arise if such control was not implemented.

The result of combining these two techniques is an improvement of the throughput efficiency of the 2-D Array laser confocal scanner and a reduction in the random ‘striping’ due to the presence of any imperfections that may appear in a single repeat pattern (FIGS. 3a and 3b). Careful initial design and selection of the manufacturing process make it unlikely that the same imperfection will appear in every repeat of the pattern, therefore the effect of a single imperfection is reduced by a factor of 1/n where n is the number of repeat patterns in the scan sweep. Since all repeat patterns scan over the image (sample) for each image detected, image to image fluctuations are also eliminated.

In a second embodiment the coherency effects that give rise to a regular pattern of ‘striping’ in the detected images due to the scanning of the illumination source intensity distribution across the image (sample) with the scanning of the microlens generated points across the image is eliminated. The introduction of a second galvanometer mirror into the illumination path (FIG. 5c), between the laser Illuminator output and the input side of the microlens array, such that it is perfectly synchronised with the first galvanometer mirror and that the rotation of the second galvanometer mirror is arranged to descan the illumination source, causing the illumination source to remain stationary at the scanned image (sample) plane (FIG. 5b) while the microlens generated spots continue to be scanned over the image (sample). This reduces the appearance of the pattern of ‘striping’ in the detected images.

A third alternative embodiment for curing the coherency artefact is to reduce the degree of coherency in the input illumination beam by inserting a small angle diffuser prior to the illumination reaching the microlens array. To ensure that the diffuser does not introduce additional patterns in the illumination of the microlens array, the diffuser can be in the form of a disc rotated by a motor such that any patterns formed by the diffuser are randomised over the image plane during the duration of the exposure time of the image detection device.

A fourth alternative embodiment that introduces beam shaping optics into the illumination beam prior to the microlens array to correct the Gaussian intensity distribution and make it more uniform also results in a reduction of potential ‘striping’ in the image (sample) (FIG. 7). Such correcting optics may take a variety of forms such as flat top condensers; their only drawback is that they tend to be wavelength specific and therefore more useful in systems that operate at one wavelength or do not require rapid illumination wavelength switching.

A fifth alternative embodiment that changes the characteristics of a beam expander upstream of the input side of the microlens array to trade reduced Gaussian shading for reduced intensity at the microlenses also shows an improvement in the ‘striping’ in the image (sample) but at the expense of reduced captured image intensity. An appropriate balance between illumination throughput and Gaussian shading is necessary.

A sixth embodiment adapts the selectable size confocal aperture array to use air in place of oil (optical fluid) between the fixed and moving plates and is designed to maintain a small constant separation between the plates. Sliding the moving plate along one axis permits a selected aperture from an array of different sized apertures to he aligned with the aperture in the fixed plate. The fixed and sliding aperture plates are mounted so as to be recessed below the surface of their respective plate carriers, thus the surfaces of the aperture plates are prevented from rubbing against each other, thus eliminating a potential cause of damage.

Claims

1. A laser confocal scanning microscope comprising: a laser light source for emitting laser light at one or more different wavelengths;a laser beam expander for expanding the laser beam;a first galvanometer mirror for scanning and directing the laser light beam into a scanned image (sample) plane via a microscope, and for de-scanning a return light from the scanned image (sample) plane,an array of microlenses positioned between said laser beam expander and said first galvanometer mirror, constructed and orientated such that a single scan of the first galvanometer mirror causes each microlens of the array to trace a separate scan line across the image (sample) plane,an array of confocal apertures, which duplicates the pattern position of said array of microlenses pre-aligned such that each confocal aperture coincides with the matching microlens in said array of microlenses;a dichromatic mirror or a beam splitter, positioned between said first galvanometer mirror and said array of microlenses for separating the return light from the incident light path and directing the return light to said array of confocal apertures;an image detector, wherein the arrangement of said array of confocal apertures and of said first galvanometer mirror is such that light transmitted by said array of confocal apertures is directed to the rear face of said first galvanometer mirror, which is also a mirror, and as a result is scanned into said image detector;a means for driving said first galvanometer mirror to scan the laser light beam emerging from said array microlenses over the image (sample) plane, to descan the returned light from the image (sample) plane, and to rescan the light passing through said confocal apertures into said image detector; andone or more of the following elements:a means to modify the illumination intensity distribution over the sample scanning beams,a means to modify the coherency in the sample scanning beams,a means to reduce variations in the illumination intensity distribution in the sample plane, anda means to modify the confocality of the scanned image (sample).

2. The laser confocal scanning microscope according to claim 1 wherein said array of confocal apertures is a pinhole array.

3. The laser confocal scanning microscope according to claim 1 wherein the means to reduce variations in the illumination intensity distribution in the image (sample) plane comprises a second galvanometer mirror that is positioned in the emitted laser light beam upstream of said laser beam expander and arranged so as to scan said emitted laser light beam over said array of microlenses, wherein said means for driving said first galvanometer mirror is also adapted to drive said second galvanometer mirror to scan the emitted laser light beam over said array of microlenses, such that the scans of the first and second galvanometer mirrors are perfectly synchronised and said first galvanometer mirror now de-scans the emitted laser light beam causing it to remain stationary in the image (sample) plane, thus reducing the appearance of striping in the image (sample) plane.

4. The laser confocal scanning microscope according to claim 2 in combination with claim 2, wherein the means to reduce variations in the illumination intensity distribution in the image (sample) plane comprises two or more matched pattern repeats of the microlens and pinhole arrays, such that a single galvanometer sweep scans the image (sample) two or more times; andan intensity modulation means coupled to said means for driving the galvanometer mirror(s) and adapted to act on the emitted laser light beam by controlling the intensity of the scanning light beam in proportion to the instantaneous scan speed of said galvanometer mirror(s), to maintain constant integrated intensities in said image detector and to allow said galvanometer mirror(s) to change its/their direction of scan while the extreme end patterns of the said array of microlenses are still superimposed over the image (sample) plane.

5. The laser confocal scanning microscope according to claim 4 wherein said intensity modulation means is an acousto optical modulator (AOM), an acousto optical tuneable filter (AOTF), an adjustable micro mirror array, a motorised neutral density disc, or a means for directly modulating the laser light beam source.

6. The laser confocal scanning microscope according to claim 1 wherein the means to modify the coherency in the sample scanning beams comprises a small angle diffuser that is inserted into the emitted laser light beam in order to reduce coherency effects of the laser light at the output of said array of microlenses.

7. The laser confocal scanning microscope according to claim 6 wherein said small angle diffuser is rotatably mounted such that it does not introduce stationary illumination shading patterns into the image (sample) plane.

8. The laser confocal scanning microscope according to claim 1wherein the means to modify the illumination intensity distribution over the sample scanning beams comprises: a beam shaping optic, such as for example a flat top optical condenser, that is inserted into the emitted laser light beam path, ora matching Gaussian neutral density filter that is inserted into the illuminating laser light path, ora means for changing characteristics of said laser beam expander that is provided to increase the beam expansion in order to reduce the gaussian intensity shading at the cost of a reduced light intensity.

9. The laser confocal scanning microscope according to claim 1 wherein the means to modify the confocality of the scanned image (sample) comprises an additional plate containing multiple sets of arrays of apertures smaller than the apertures in said array of confocal apertures and positioned immediately adjacent and parallel to the said array of confocal apertures; said additional platers separated by a small air gap; anda control system that is adapted to slide said additional aperture plate to select any one of the sets of aperture arrays, thus controlling the degree of confocality and throughput of the microscope.

10. The laser confocal scanning microscope according to claim 1 wherein said driving means for the first galvanometer mirror and/or said intensity modulation means are an electronic control system comprising hard wired logic, a digital signal processor, a microprocessor, a computer or similar computational device.

11. The laser confocal scanning microscope according to claim 1 wherein said laser light source includes a multi-line laser, a tuneable laser, and/or an array of lasers emitting at various wavelengths, and an optical configuration that provides collinear laser beams.

12. The laser confocal scanning microscope according to claim 1 wherein the laser light beams from said laser light source are free space coupled to the beam path or coupled by means of a rigid or flexible optical light guide to the beam path.

13. The laser confocal scanning microscope according to claim 12 wherein the optical light guide is an optical fibre.

14. The laser confocal scanning microscope according to claim claim 1, wherein, the microscope is a 2-D array laser confocal scanning microscope.

15. A method of increasing the intensity throughput of a laser confocal scanning microscope and reducing the appearance of ‘stripes’ due to imperfections in a microlens array and/or confocal aperture array thereof, comprising: increasing a number of repeat patterns in the microlens and confocal aperture arrays that are scanned over an image (sample) plane for each captured image, andcontrolling an emitted laser beam intensity to maintain constant integrated intensities in an image detector while the bidirectional scanning system changes direction.

16. A method of reducing striping in the images captured by a laser confocal scanning microscope, comprising: adding a second galvanometer mirror such that a Gaussian intensity distribution of an emitted laser light is de-scanned at an image (sample) plane, and/ordestroying coherency of an emitted laser light beam by inserting a small angle diffuser, and/orflattening of a Gaussian intensity profile of an emitted laser light beam.

17. A method of changing a degree of confocality in a laser confocal scanning microscope, comprising: adding an array of smaller confocal apertures on a sliding plate adjacent and parallel to an confocal aperture array of the laser confocal scanning microscope and spaced from it by a small air gap.