The present invention relates generally to semiconductor lasers and, more particularly, to a laser diode stack that provides improved performance and versatility.
High power laser diodes have been used individually and in arrays in a wide range of applications including materials processing, medical devices, printing/imaging systems and the defense industry. Furthermore due to their size, efficiency and wavelength range, they are ideally suited as a pump source for high power solid state lasers. Unfortunately reliability issues have prevented their use in a number of critical applications such as space-based systems in which launch costs coupled with the inaccessibility of the systems once deployed requires the use of high reliability components.
During operation, a laser diode produces excessive heat which can lead to significant wavelength shifts, premature degradation and sudden failure if not quickly and efficiently dissipated. These problems are exacerbated in a typical laser diode pump array in which the laser diode packing density reduces the area available for heat extraction. Additionally as most high energy pulse lasers require a quasi-CW (QCW) laser diode pump, the extreme thermal cycling of the laser diode active regions typically leads to an even greater level of thermal-mechanical stress induced damage.
One approach to overcoming some of the afore-mentioned problems is a laser diode package (e.g., a G package) in which an efficient heat extracting substrate (e.g., beryllium oxide, copper, copper tungsten, etc.) includes multiple grooves into which individual laser diode bars are soldered using an indium solder. Although this package has improved heat dissipation capabilities, it still suffers from numerous problems. First, the coefficient of thermal expansion (CTE) of the solder does not provide a good match with that of the substrate, leading to solder delamination during thermal cycling. Solder delamination is problematic due to the high drive currents that the solder must conduct into the laser diode as well as the heat which the solder must efficiently transfer from the laser diode to the heat extracting substrate. Second, it is difficult to test the individual laser diode bars before installing them into the grooved substrate, potentially leading to arrays in which one or more of the laser diode bars is defective (i.e., non-operational or out of spec.). Third, mounting the laser diode bars into the individual grooves of the substrate may lead to further stresses if the laser diode bars exhibit any curvature.
Accordingly what is needed in the art is an alternate laser diode package that overcomes the problems inherent in the laser diode packages of the prior art, thereby providing improved reliability and performance. The present invention provides such a laser diode and submount assembly suitable for such a laser diode package.
The present invention provides a laser diode package which includes a stack, either a horizontal stack or a vertical stack, of laser diode submount assemblies. Each laser diode submount assembly includes a submount comprised of a non-conductive material. At least one laser diode is attached to a first portion of one surface of each submount while a spacer is attached to a second portion of the same submount surface. Exemplary laser diodes include single mode single emitter laser diodes, broad area multi-mode single emitter laser diodes, and multiple single emitters fabricated on either a single substrate or on multiple substrates. Preferably the submount has a high thermal conductivity and a CTE that is matched to that of the laser diode. The laser diode stack is formed by mechanically coupling the bottom surface of each submount to the spacer of an adjacent submount assembly. The individual laser diodes of the fabricated stack can be serially coupled together, coupled together in parallel, or individually addressable.
In at least one embodiment of the invention, the top surface of each submount includes a first metallization layer interposed between each laser diode and the first portion of each submount, and a second metallization layer interposed between each spacer and the second portion of each submount. A first laser diode contact can be electrically coupled to the first metallization layer, for example with an electrically conductive solder. A second laser diode contact can be electrically coupled to the second metallization layer, for example with wire or ribbon bonds. Preferably a metallization layer deposited on the bottom surface of each submount is electrically coupled to the first metallization layer with one or more electrically conductive vias within the submount.
Serial laser diode coupling is preferably achieved by using an electrically conductive material for the spacers, electrically coupling the spacer of one assembly to a metallization layer deposited on the bottom surface of the adjacent submount, electrically coupling the metallization layer on the bottom surface of the submount to a first metallization layer on the top surface of the submount using electrically conductive vias, mechanically and electrically coupling the laser diode to the first metallization layer, and electrically coupling the second contact of the laser diode to a second metallization layer interposed between the top surface of the submount and the spacer, wherein the first and second metallization layers on the top surface of each submount are electrically isolated from one another.
To provide package cooling, the laser diode stack is thermally coupled to a cooling block. In at least one embodiment, the cooling block includes a slotted region into which the entire laser diode stack fits. Preferably in this embodiment the cooling block is comprised of a pair of members. In at least one embodiment, the cooling block includes a plurality of slotted regions into which fit the submounts of the laser diode submount assemblies.
A further understanding of the nature and advantages of the present invention may be realized by reference to the remaining portions of the specification and the drawings.
The present invention provides a laser diode submount assembly which can be combined with other laser diode submount assemblies to form either a vertical or horizontal stack. Each laser diode submount assembly includes at least one laser diode. In a preferred embodiment, each laser diode of each submount assembly operates at the same wavelength. In an alternate embodiment, the laser diode or diodes of each submount assembly operate at a different wavelength. In yet another alternate embodiment, the stack includes groups of laser diodes where each group operates at a preset wavelength. It will be appreciated that there are a variety of possible configurations depending upon the number of desired wavelengths and the number of submount assemblies within a specific laser diode package.
Laser diode bars are used in a variety of high power laser diode applications.
As shown in
In the illustrated embodiment, a conductive spacer 411 is mounted on top of, and in electrical contact with, metallization layer 403. Spacer 411 serves as a contact pad, preferably the N contact, for laser 413. Laser 413 is mounted to metallization layer 405, laser 413 positioned such that the emitting facet 415 is substantially parallel with end face 417 of submount 401. Exemplary laser diodes include both single mode single emitter laser diodes and broad area multi-mode single emitter laser diodes. Additionally, multiple single emitters, either fabricated on individual substrates or on a single substrate, can be mounted to submount 401, thereby forming an array of single emitters on a single submount assembly. Laser bars, due both to their size (i.e., 1 centimeter) and their poor heat dissipation characteristics that result from close emitter spacing, are not used with the submount assemblies of the invention.
As previously noted, one contact for laser diode 413, and preferably the N contact, is spacer 411. Laser diode 413 is electrically coupled to conductive spacer 411 using wire bonds, ribbon bonds, or other electrical connector means which couple the laser diode to metallization layer 403. For illustration purposes, both representative wire bonds 419 and a representative contacting member 421 are shown in
Although
After completion of the submount assembly regardless of its configuration (e.g., submount assembly 400 or submount assembly 700), preferably the laser diode or diodes 413 attached to each submount are tested. Early testing, i.e., prior to assembly of the entire laser diode package, offers several advantages over testing after package completion. First, it allows defective laser diodes to be identified prior to package assembly, thus minimizing the risk of completing a package assembly only to find that it does not meet specifications due to one or more defective laser diodes. Thus the present package assembly improves on assembly fabrication efficiency, both in terms of time and materials. Second, early testing allows improved matching of the performance of the individual laser diodes within an assembly, for example providing a means of achieving improved wavelength matching between laser diodes or allowing laser diodes operating at different wavelengths to be coupled together in the desired order.
During the next series of steps the laser diode package, which is comprised of a stack of laser diode submount assemblies, is fabricated. The perspective view of
The individual laser diodes of the fabricated stack can be electrically coupled together in a variety of ways. For example, in one preferred embodiment laser diodes 413 are serially coupled together by bonding the upper surface of the contact spacer (e.g., contact 411 of assembly 400 or contact 701 of assembly 700) to a portion of metallization layer 407. Preferably the solder used to couple the contact spacer pads to metallization layer 407 has a lower melting temperature than the solder used to fabricate the individual submount assemblies, thus insuring that during this stage of assembly the reflow process used to combine the submount assemblies will not damage the individual assemblies. In an alternate embodiment of the invention laser diodes 413 are not serially coupled together, rather they are coupled together in parallel, or they are individually addressable. Individual addressability allows a subset of the total number of laser diodes within the stack to be activated at any given time. In order to achieve individual addressability, or to couple the laser diodes together in a parallel fashion, the electrically conductive path between individual submount assemblies must be severed. Severing the conductive path can be accomplished in several ways. For example, spacer 411 (or spacer 701) can be fabricated from a non-conductive material. Alternately, the size of metallization layer 407 can be reduced such that it does not contact spacer 411 (or spacer 701) when a stack of assemblies is formed. The conductive path between assemblies can also be severed by eliminating vias 409 and/or metallization layer 407. Regardless of the technique used to sever the conductive path between assemblies, a variety of techniques can be used to electrically contact each laser diode 413. For example, contact can be made via metallization layers 403 and 405. It will be appreciated that the exact technique used to contact lasers 413 depends on the way in which the conductive path between assemblies is severed.
Due to the use of thermally conductive, electrically isolating submounts, a stack of submount assemblies fabricated in accordance with the invention can be directly coupled to a cooling block, even a cooling block fabricated from an electrically conductive material (e.g., copper). A stack of submount assemblies fabricated in accordance with the invention can be integrated into a cooling block in a number of ways, the invention not being limited to a specific cooling block configuration. For example, in one embodiment illustrated in
It will be appreciated that a variety of cooling block configurations can be used with the laser diode stacks of the present invention, especially in light of the non-conductive nature of the individual submounts. For example,
As will be understood by those familiar with the art, the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. Accordingly, the disclosures and descriptions herein are intended to be illustrative, but not limiting, of the scope of the invention which is set forth in the following claims.
This application is a continuation-in-part of U.S. patent application Ser. No. 11/384,940, filed Mar. 20, 2006, and Ser. No. 11/417,581, filed May 4, 2006, the disclosures of which are incorporated herein by reference for any and all purposes.
Number | Date | Country | |
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Parent | 11384940 | Mar 2006 | US |
Child | 11492140 | Jul 2006 | US |
Parent | 11417581 | May 2006 | US |
Child | 11492140 | Jul 2006 | US |