Claims
- 1. A latch circuit comprising;
- data hold means for accepting data upon receipt of a clock signal and for holding said data until receipt of a next clock signal, said data hold means comprising an even number of logic gates, as main active elements of said data hold means, connected in series in a closed loop; and
- filter means for eliminating a pulse generated within said closed loop, said filter means comprising at least some of said logic gates of said data hold means.
- 2. A latch circuit as in claim 1, wherein
- said pulse generated within said closed loop has a period shorter than a total delay time of said closed loop.
- 3. A latch circuit as in claim 1, wherein
- said filter means is a low pass filter including an inverter train having an even number of inverters;
- said logic gates of said data hold means are inverters; and
- said inverters of said inverter train are common with said inverters of said data hold means.
- 4. A latch circuit as in claim 3, wherein
- said filter means includes a multiple input logic gate having one input connected to an output of said inverter train and having another input connected to an input of said inverter train; and
- said one of said logic gates is common with one of said inverters of said inverter train.
- 5. A latch circuit comprising:
- a plurality of stages of data hold means connected in series, a leading stage of said stages functioning as a master stage and a subsequent stage of said stages functioning as a slave stage;
- each of said data hold means comprising a closed loop formed by an even number of logic gates, as main active elements of said data hold means, for accepting data when a clock signal is received and for holding said data until a next clock signal is received; and
- filter means, located in at least said master stage, for eliminating a pulse generated in said closed loop of said data hold means of said master stage, said filter means of said master stage comprising at least some of said logic gates of said data hold means of said master stage.
- 6. A latch circuit as in claim 5, further including:
- a transmission gate for selectively passing said data to said plurality of stages of data hold means, said transmission gate being controlled by said clock signal.
- 7. A latch circuit as in claim 5, wherein
- said filter means is a low pass filter including an inverter train having an even number of inverters;
- said logic gates of said data hold means are inverters; and
- said inverters of said logic train comprise said inverters of said data hold means used in common.
- 8. A latch circuit as in claim 7, wherein
- said filter means includes a multiple input logic gate having one input connected to an output of said inverter train and having another input connected to an input of said inverter train;
- said one of said logic gates is common with one of said inverters of said inverter train.
Parent Case Info
This application is a continuation of application Ser. No. 07/162,149, filed Feb. 29, 1988, now abandoned.
US Referenced Citations (16)
Foreign Referenced Citations (2)
Number |
Date |
Country |
0184350 |
Jun 1986 |
EPX |
WO8403012 |
Aug 1984 |
WOX |
Non-Patent Literature Citations (2)
Entry |
Diehl et al., "Considerations for Single Event Immune VLSI Logic" IEEE Transactions on Nuclear Science, vol. NS-30, No. 6, Dec. 1983. |
Jenkins et al., "Metastability Resolution Latch" IBM Technical Disclosure Bulletin, vol. 23, No. 12, May 1981. |
Continuations (1)
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Number |
Date |
Country |
Parent |
162149 |
Feb 1988 |
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