Layout of contacts

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Information

Patent Grant
D850309

References
Source

Patent Number
D850,309
Date Filed
Thursday, July 27, 2017
7 years ago
Date Issued
Tuesday, June 4, 2019
5 years ago

Inventors
Original Assignees
- Aehr Test Systems, Inc.
Examiners
- Davis; Antoine Duval
Agents
- De Klerk; Stephen M.

US Classifications
- D10 - Measuring, testing, or signalling instruments
- D13 - Equipment for production, distribution, or transformation of energy
Field of Search
- US
- D10 75
- D10 80
- D10 103
- D13 173
- D13 182
- CPC
- G01R31/04
- G01R31/041
- G01R31/043
- G01R31/045
- G01R31/046
- G01R31/048
- G01R31/2886
- G01R31/2887
- G01R31/2889
- G01R31/2891
- G01R31/2893
- G01R31/2894
- G01R31/2896
- G01R31/2898
- G01R1/0408
- G01R1/0416
- G01R1/0466
- G01R1/0483
- G01R31/2851
- G01R31/31907
- G01R31/31921
- G01R31/318335
- G01R31/31725
- G01R31/3193
- G01R31/28
- G01R31/31813
- G01R31/31919
- G01R31/318385
- G01R1/073
- G01R1/07307
- G01R1/07314
- G01R1/07321
- G01R1/07328
- G01R1/07335
- G01R1/07342
- G01R1/0735
- G01R1/07357
- G01R1/07364
- G01R1/07371
- G01R1/07378
- G01R1/07385
- G01N34/1083
- G01N35/10
- G02B6/4201
- G06F11/0763
- G06F11/221
- G06F11/2242
- G06F11/263
- G11C29/56
- G11C29/02
- G11C29/56008
- H04W24/06
- H04W24/08
- H01L22/34
- H01L22/32
- H01L2924/00
- H01L2924/0002
- H02B1/21
- H02B1/24
- H02B1/36
International Classifications
- 1004
- Term of Grant
  15Years

Information

Abstract

Description

FIG. 1 is a top plan view of a layout of contacts according to our design; and,

FIG. 2 is a side elevation view of the layout of contacts of our design.

Claims

The ornamental design of a layout of contacts, as shown and described.

US Referenced Citations (1)

Number	Name	Date	Kind
D810706	Soyano	Feb 2018	S