LCD panel with integral touchscreen

Abstract

A liquid crystal display (LCD) device (100) having an integrated touchscreen includes a built-in probe signal source behind the liquid crystal (LC) layer (20). The probe signal source may include a pair of light sources (82 and 84) modulated at first and second frequencies (f1 and f2), respectively. A pair of probe light sensing devices (92 and 94) may also be implemented behind the LC layer, each configured to measure the intensities of the first and second frequencies, respectively. The probe light sensing devices are designed to detect user contact with the touchscreen surface by sensing a reflection of the probe light signals from the touchscreen surface. Using the multiple intensity measurements from each probe light sensing device, the location of the point of contact on the touchscreen surface is determined.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

A more complete understanding of the present invention will become apparent from the following description taken in conjunction with the accompanying drawings, wherein:

FIGS. 1A and 1B illustrate the configuration of a typical liquid crystal display (LCD) device;

FIGS. 2A and 2B illustrate different types of backlight sources within typical backlit LCD devices;

FIG. 3 illustrates an LCD device incorporating a pair of probe light sources and probe light sensing devices, according to an exemplary embodiment of the present invention;

FIG. 4A illustrates probe light sources and probe light sensing devices integrated with the backlight source of a backlit LCD device, according to an exemplary embodiment of the present invention.

FIGS. 4B and 4C illustrate alternative configurations, respectively, of the probe light sources and probe light sensing devices integrated with the backlight source of a backlit LCD device, according to an exemplary embodiment of the present invention;

FIG. 5 illustrates probe light sources and probe light sensing devices that are integrated in a reflective-type LCD device, according to an exemplary embodiment of the present invention;

FIGS. 6A and 6B illustrate the effects of user contact with the touchscreen surface on the probe signal light rays within the LCD device, according to an exemplary embodiment of the present invention;

FIG. 7A illustrates paths from the point of contact on the touchscreen surface to the probe light sensing devices according to an exemplary embodiment of the present invention;

FIG. 7B illustrates parameters related to the relative positions of the probe light sensing device with respect to the point of contact, which can be used for computing the location of the point of contact on the touchscreen surface, according to an exemplary embodiment of the present invention; and

FIG. 7C illustrates a more detailed view of a probe light sensing device for describing the relationship between the light intensity measurements and the location of the point of contact, according to an exemplary embodiment of the present invention.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS

In order to integrate a touchscreen interface with a liquid crystal display (LCD) device, the present invention utilizes probe signals transmitted from within the stack of LCD layers to detect user contact with the touchscreen surface. Specifically, one or more probe signal sensing devices are disposed within the LCD stack in order to detect user contact on the touchscreen surface by sensing a reflection of the probe signals from the touchscreen surface. Accordingly, the front protective sheet of the LCD device may be used as the touchscreen surface without requiring additional layers.

According to an exemplary embodiment, a pair of probe light sensing devices may be similarly implemented behind the LC layer to sense the reflection of probe light. Further, the source of the probe signals may comprise one or more probe light sources implemented behind the liquid crystal (LC) layer within the LCD casing or enclosure.

FIG. 3 illustrates an embodiment where a pair of probe light sources 82, 84 and probe light sensing devices 92, 94 within an LCD device 100 according to an exemplary embodiment of the invention. In the LCD stack of FIG. 3, the diffuser 40 and backlight source 50 are represented by dotted lines to indicate that the inclusion of such layers is optional. In other words, the LCD device 100 of the present invention may be configured either as a backlit or reflective-type LCD.

Referring to FIG. 3, the probe light sources 82 and 84 may be configured as pinpoint sources, e.g., light-emitting diodes (LEDs). For instance, if the LCD device 100 utilizes an LED edge-lit light guide assembly (as illustrated in FIGS. 2A and 2B), it is contemplated that the probe light sources 82 and 84 may be integrated with this assembly.

Although FIG. 3 illustrates the probe light sources 82 and 84 as being distanced from one another, this is not necessarily the case. As will be described in more detail below with respect to FIGS. 7A-7C, the probe light sources 82 and 84 may be co-located at a particular corner or region of the device. If the probe light sources 82 and 84 are disposed at separate locations, their relative locations may vary according to various design parameters and other considerations, as will be readily contemplated by those of ordinary skill in the art.

In an exemplary embodiment, the probe light sources 82 and 84 are modulated at different fixed frequencies. For instance, as shown in FIG. 3, probe light source 82 may be modulated at the frequency f1 and the other probe light source 84 may be modulated at frequency f2. For embodiments relating to a backlit LCD device 100, the probe light frequencies f1 and f2 may be designed to easily differentiate the signals of probe light sources 82 and 84 from the backlight sources (e.g., pinpoint light sources 52 and CCFLs 56 in FIGS. 2A and 2B). Accordingly, frequencies f1 and f2 may be set above the flicker rate of the LCD, e.g., 50 Hz. In an exemplary embodiment, the probe light frequencies f1 and f2 may be set in the range of 100-150 kHz, which is well above the flicker rate.

Furthermore, the probe light sources 82 and 84 may be operating within, or near, the infrared range to help further distinguish the probe signals from the backlight sources 50. In such an embodiment, the probe light sensing devices 92 and 94 may contain infrared sensors for sensing the probe light signals. The use of infrared or near-infrared probe signals has the advantage of not altering the total visible illumination provided by the backlight.

The probe light sources 82 and 84 are modulated at different frequencies f1 and f2 so that their emitted signals can be differentiated from one other by the probe light sensing devices 92 and 94. Referring again to FIG. 3, each probe light sensing device 92, 94 includes a pair of light sensors that are sensitive to frequencies f1 and f2, respectively. In other words, each probe light sensing device 92, 94 is configured to measure the light intensity at frequency f1 and the light intensity at f2. As shown in FIG. 3, each probe light sensing device 92, 94 sends the measured intensities to a contact locating processor 200, which is configured to locate a point of contact on the touchscreen surface based on the measured intensities.

In an exemplary embodiment, the contact locating processor 200 is programmed to use look-up tables (LUTs) or mathematical calculations to map the received intensities to the location of the point of contact with respect to the touchscreen surface. For example, the contact locating processor 200 may be a digital signal processor (DSP) or a similar type of processing device.

To make the operation of the contact locating processor 200 more effective, the probe light sensing devices 92 and 94 may be disposed at some distance apart from each other with respect to the planar dimensions of the touchscreen surface.

For example, as shown in FIG. 4A, the probe light sensing devices 92 and 94 may be disposed at opposing ends of a common side. Alternatively, it may be even more effective to place the probe light sensing devices 92 and 94 cater-corner to each other, in order to increase the distance between them, as shown in FIGS. 4B and 4C.

As to the probe light sources 82 and 84, whether or not they are distanced from each other (e.g., FIGS. 4A and 4B) or co-located (e.g., FIG. 4C) may depend on whether the contact locating processor 200 uses LUTs or mathematical equations to map the measured intensities to the location of the point of contact.

As shown in FIGS. 4A-4C, the probe light sources 82 and 84 and probe light sensing devices 92 and 94, may be disposed at the same level as the backlight sources (as shown in FIGS. 2A and 2B) behind the LC layer 20 and polarizers 30A and 30 B. On the other hand, for a reflective-type LCD device, FIG. 5 illustrates that the probe light sources 82 and 84 and probe light sensing devices 92 and 94 may be disposed in front of the reflective layer 70.

FIGS. 6A and 6B help demonstrate the principles of the present invention discussed below. Although FIGS. 6A and 6B do not show any backlight sources, it will be readily apparent to those of ordinary skill in the art that the following principles apply equally to backlit and reflective-type LCD devices. Furthermore, while FIGS. 6A and 6B illustrate probe light sources 82 and 84 at separate locations, this is merely exemplary. The principles demonstrated in FIGS. 6A and 6B also apply to embodiments where probe light sources 82 and 84 are co-located.

Specifically, FIG. 6A illustrates the emission of probe light signals when there is no user contact with the touchscreen surface. In FIG. 6A, solid arrows are used for illustrating light rays from probe light source 82, while dotted line arrows are used for illustrating the rays from probe light source 84. As shown in this figure, a substantial portion of the probe light from sources 82 and 84 are transmitted through the LC layer 20 and touchscreen surface (front layer 10). While no user contact is being made with the touchscreen surface, the intensity of probe light rays received at the probe light sensing devices 92 and 94 should remain relatively constant. The intensities detected at each probe light sensing device 92, 94 will depend on its respective distance from the probe light sources 82 and 84. As such, these intensities represent a reference level.

FIG. 6B illustrates a situation where the user makes contact with the touchscreen surface, thereby increasing the intensity of probe light within the LCD stack. As shown in this figure, at the point of contact 300, probe light rays from sources 82 and 84 are reflected back into the LCD stack toward the probe light sensing devices 92 and 94. This will increase the measured intensities at the sensors of the probe light sensing device 92, 94. This is illustrated in FIG. 6B by the increased number of light rays (arrows) entering each probe light sensing device 92, 94. The amount by which the measured intensity increases will also depend on the distance between the probe light sensing device 92, 94 and the point of contact 300. As shown in FIG. 6B, the contact locating processor 200 receives the measured intensities from each probe light sensing device 92, 94 in order to determine the location of point of contact 300 based on the touchscreen surface.

The additional intensities measured at each probe light sensing device 92, 94 will depend on both variable and non-variable conditions. Examples of non-variable conditions include the internal characteristics of the LCD stack (including the presence of a backlight assembly, light diffusers, other elements), as well as the reflectivity at the point of contact 300. Their effects on light intensity can be determined according to a calibration process on the device 100 during a pre-operation stage (e.g., manufacturing/testing).

However, the increased intensities also depend on the location of the point of contact 300, i.e., the unknown parameter to be determined by the contact locating processor 200. The measured intensities may also be affected by changes in the ambient light level.

To determine the location coordinates of the point of contact 300 with respect to the planar dimensions of the touch screen surface, the contact locating processor 200 is programmed to match the measured intensities to the location coordinates. The contact locating processor 200 may be designed to continuously evaluate measured intensities (e.g., according to a sampling rate). If any set of measured intensities rise above the reference level, indicating an increased intensity, the contact locating processor 200 may be triggered to process the measured intensities to locate a point of contact 300 on the touchscreen surface.

According to one exemplary embodiment, the contact locating processor may include (or be programmed to access) one or more look-up tables (LUTs) mapping the received set of measured intensities to particular location coordinates for the point of contact 300. This embodiment is especially effective when the probe light sources 82 and 84 are disposed in separate locations (e.g., in FIG. 4A or 4B), since their respective probe light rays will be affected differently by the internal characteristics of the LCD stack.

In an embodiment utilizing one or more LUTs, a pre-operational calibration process during which user contact is simulated for a plurality of locations on the touchscreen surface, and the corresponding measurements of the probe light sensing devices 92 and 94 are recorded for each simulated point on the touchscreen surface. The results of such calibration may be stored in the LUT(s) and, during operation, the contact locating processor 200 maps each set of received intensity measurements to the LUT(s) to determine a corresponding location for the point of contact 300. It will be readily apparent to those of ordinary skill in the art the various types of calibrations and tests that may be performed to establish the LUT data.

Furthermore, for embodiments utilizing an LUT to locate the point of contact, the LCD device 100 may include an ambient light detector to help compensate for changes in the ambient light level. For example, the contact locating processor 200 may be programmed to adjust the intensity measurements, as needed, based on the detected level of ambient light.

According to an alternative exemplary embodiment, the contact locating processor 200 may be programmed with mathematical functions or equations for determining the location of the point of contact 300. In particular, this alternative embodiment is well suited to a configuration where the probe light sources 82 and 84 are co-located (e.g., in FIG. 4C). When the probe light sources 82 and 84 are close together, their respectively rays will be affected the same way by the internal characteristics of the LCD stack. This allows the effects of the internal characteristics to cancel out.

As such, a set of mathematical functions may be defined for each probe light sensing device 92, 94 to map its measured intensities to a parameter related to the sensing device's relative position with respect to the point of contact 300. For instance, in a particular embodiment, the measured intensities of each probe light sensing device 92, 94 can be mapped to a relative angular position of point of contact 300. This particular embodiment will be described in more detail in connection with FIGS. 7A-7C.

In particular, FIGS. 7A-7C illustrate paths connecting the point of contact 300 to the probe light sensing devices 92, 94. In these figures, line 310 illustrates a path from the point of contact 300 to the probe light sensing device 92, while line 320 illustrates a path from point of contact 300 to the probe light sensing device 94.

As illustrated in FIG. 7B, paths 310 and 320 move toward the probe light sensing devices 92 and 94 at angles of α1 and α2, respectively. Accordingly, parameters α1 and α2 represent a relative angular position between the point of contact 300 and each of the probe light sensing devices 92 and 94, respectively. Referring again to FIG. 7B, H and W refer to the height and width dimensions, respectively, of the touchscreen surface. Thus, after parameters α1 and α2 are derived (e.g., according to calculations described below in connection with FIG. 7C), the X, Y position of the point of contact 300 may be calculated according to the following equations:

$\begin{array}{cc}X=\left[H\sin \left(\mathrm{\alpha 2}\right)-W\cos \left(\mathrm{\alpha 2}\right)\right]·\frac{\sin \left(\mathrm{\alpha 1}\right)}{\sin \left(\mathrm{\alpha 2}-\mathrm{\alpha 1}\right)}& \left(\mathrm{Eq}.1\right)\\ Y=\left[W\cos \left(\mathrm{\alpha 1}\right)-H\sin \left(\mathrm{\alpha 1}\right)\right]·\frac{\cos \left(\mathrm{\alpha 2}\right)}{\sin \left(\mathrm{\alpha 2}-\mathrm{\alpha 1}\right)}& \left(\mathrm{Eq}.2\right)\end{array}$

With reference to FIG. 7C, an exemplary technique for mapping the measured intensities of the probe light sensing devices 92 and 24 to their respective angular position parameters α1 and α2 will now be described. Specifically, FIG. 7C illustrates the particular case where the measured intensities of probe light sensing device 94 are mapped to angular parameter α2.

As shown in FIG. 7C, the probe light sources 82 and 84 are co-located in nearly the same planar (x, y) coordinates. This figure also shows that the light sensors in the probe light sensing device 94 are also co-located in nearly the same planar coordinates. The particular configuration of FIG. 7C may be varied, however. For example, instead of stacking the probe light sources 82 and 84, they may be placed beside each other and still be deemed “co-located” for purposes of this invention.

FIG. 7C further illustrates that a filter 900 is placed in front of one of the light sensors in the probe light sensing device 94. For purpose of illustration, FIG. 7C shows the filter 900 being placed in front of the light sensor that is sensitive to frequency f2. The filter 900 has a predetermined opacity, which is a function of the angle (α2) associated with the incoming light. For example, the opacity may be set to T₀ sin α2, where T₀ is a maximum opacity parameter.

The intensities of light rays originating at probe light sources 82 and 84, respectively, and bouncing back at the point of contact 300 are represented by I_f1 and I_f2. Since the difference in position between probe light sources 82 and 84 is negligible, I_f1 and I_f2 are assumed to be equal. Of course, this assumption is based on the further assumption that sources 82 and 84 are rated for the same intensity. If sources 82 and 84 are rated at different intensities, the values of I_f1 and I_f2 should be normalized based on the rated intensities.

Furthermore, since the difference in position between the light sensors in light sensing device 94 is also negligible, their respective distances from the point of contact 300 are assumed to be equal. Thus, referring to FIG. 7C, it is assumed that Df1=Df2, where Df1 represents the distance between point of contact 300 and the light sensor for frequency f1, and Df2 represents the distance between point of contact 300 and the light sensor for frequency f2.

Thus, the following relationships may be established between the measured intensities and the angle α2 associated with path 310:

$\begin{array}{cc}S\left(f1\right)=\frac{I_{f1}}{{\left(\mathrm{Df}1\right)}^2}& \left(\mathrm{Eq}.3\right)\\ S\left(f2\right)=T_0\sin \mathrm{\alpha 2}·\frac{I_{f2}}{{\left(\mathrm{Df}2\right)}^2}& \left(\mathrm{Eq}.4\right)\end{array}$

where

S(f1) is the intensity measurement of the light sensor for frequency f1;

S(f2) is the intensity measurement of the light sensor for frequency f2;

and T₀ is the opacity for filter 900.

Furthermore, using the assumption Df1=Df2, the following relationships are also established:

$\begin{array}{cc}\frac{S\left(f1\right)}{S\left(f2\right)}=T_0\sin \mathrm{\alpha 2}& \left(\mathrm{Eq}.5\right)\\ \mathrm{\alpha 2}=\arcsin \left[\left(\frac{S\left(f1\right)}{S\left(f2\right)}\right)/T_0\right]& \left(\mathrm{Eq}.6\right)\end{array}$

Furthermore, Eqs. 3-6 may similarly be applied to the measured intensities of the probe light sensing device 92 in order to calculate the angle α1 associated with path 310. Thus, by plugging in the values of α1 and α2 into Eqs. 1 and 2 above, the X, Y coordinates of point of contact 300 can be determined.

While a particular embodiment is described above using mathematical equations to map the measured intensities to angular position parameters α1 and α2, the contact locating processor 200 may programmed with other types of mathematical equations that map the measured intensities to the position of the point of contact 300, as will be readily contemplated by those of ordinary skill in the art.

The present invention is applicable to various types of touchscreen applications. For instance, in an exemplary embodiment, the touchscreen surface may be partitioned into a set of “keys” from which the user may choose. Thus, by determining the location of the point of contact 300, the LCD device 100 can determine which particular key on the touchscreen surface has been touched by the user. For instance, the contact locating processor 200 may be further configured to the location of point of contact 300 to a particular touchscreen key, and notify the appropriate application of which key has been chosen by the user.

Although various exemplary embodiments are described above, the present invention also covers any modifications and variations thereof, which do not depart from the scope or spirit of the present invention.

Claims

1. A liquid crystal display (LCD) device, comprising: a casing configured to hold a transparent touchscreen surface in place;a liquid crystal (LC) layer disposed within the casing behind the touchscreen surface;a probe signal source disposed within the casing behind the LC layer, the probe signal source being configured to transmit a probe signal through the touchscreen surface;a probe signal sensing device disposed within the casing behind the LC layer; anda contact locating device configured to locate a point of contact on the touchscreen surface based on a reflection of the probe signal from the touchscreen surface.

2. The LCD device of claim 1, wherein the probe signal sensing device is configured to measure an intensity of the probe light, and the reflection of the probe light is detected based on an increase in the measured intensity.

3. The LCD device of claim 1, wherein the LCD device includes a backlight source configured to transmit backlight through the touchscreen surface to convey information to a user.

4. The LCD device of claim 3, wherein the backlight source comprises a plurality of light-emitting diodes (LEDs) including the probe light source.

5. The LCD device of claim 1, wherein the probe signal source includes first and second probe light sources configured to emit light at a first and second frequency, respectively, andthe probe signal sensing device includes first and second probe light sensing devices, each probe light sensing device including a pair of light sensors for measuring light intensities at the first and second frequencies, respectively.

6. The LCD device of claim 5, wherein the first and second probe light sources are light-emitting diodes (LEDs).

7. The LCD device of claim 5, wherein the first and second frequencies are above 50 Hz.

8. The LCD device of claim 5, wherein the first and second probe light sources are operating in the infrared range.

9. The LCD device of claim 5, wherein the contact locating device includes a digital signal processor (DSP) configured to: receive the measured light intensities of the first and second frequencies from each of the first and second probe light sensing devices, anddetermine location coordinates of the point of contact with respect to the planar dimensions of the touchscreen surface based on the received measured intensities.

10. The LCD device of claim 9, further comprising a lookup table (LUT) with location information, the lookup table being accessible to the contact locating device, wherein the DSP is configured to determine the location coordinates of the point of contact by performing a lookup of the LUT based on the received measured intensities.

11. The LCD device of claim 10, wherein the location data in the LUTs are calibrated according to internal conditions of the LCD device.

12. The LCD device of claim 10, further comprising an ambient light detector for detecting an ambient light level, wherein DSP is configured to adjust the received measured intensities based on an ambient light level

13. The LCD device of claim 9, wherein the DSP configured to: calculate an angle (α1) associated with a path from the point of contact to the first probe light sensing device;calculate an angle (α2) associated with a path from the point of contact to the second probe light sensing device; andcalculate the location coordinates based on α1 and α2.

14. A liquid crystal display (LCD) device, comprising: a casing configured to hold a transparent touchscreen surface in place;a liquid crystal (LC) layer disposed within the casing behind the touchscreen surface;first and second light-emitting diodes (LEDs) disposed within the casing behind the LC layer, the first and second LEDs being configured to transmit first and second probe lights, respectively, through the touchscreen surface;first and second light sensing devices disposed within the casing behind the LC layer, each configured to measure intensities of both the first and second probe lights; anda processing device configured to detect a point of contact on the touchscreen surface by calculating location coordinates from which the first and second probe signals are reflected back to the first and second light sensing devices based on the measured intensities.