Claims
- 1. An integrated circuit that implements a (2,k)-regular low-density parity check code decoder with the functionality of 2Lk check node functions and Lk2 variable node functions, comprising:
(a) k2 random access memories (RAMs), (b) k2 variable node units, wherein one variable node unit is coupled to one RAM, (c) a bidirectional shuffle network connected to the said k2 RAMs, (d) k check node units connected to the said shuffle network, and (e) k2 modulo-L counters, wherein each modulo-L counter is an address generator for one RAM.
- 2. An integrated circuit that implements a (3,k)-regular low-density parity check code decoder with the functionality of 3Lk check node functions and Lk2 variable node functions, comprising:
(a) k2 random access memories (RAMs), (b) k2 variable node units, wherein one variable node unit is coupled to one RAM, (c) a first bidirectional shuffle network that is connected to the said RAMs, (d) a second bidirectional shuffle network coupled to the first bidirectional shuffle network, wherein the permutations performed by the second shuffle network are controlled by a g-bit word, (e) a random pattern generator which is coupled to the said second shuffle network wherein the random pattern generator generates the g-bit word to control the permutations in the second shuffle network, (f) k check node units connected to the said second shuffle network, and (g) k2 modulo-L counters, wherein each modulo-L counter is an address generator for one RAM.
- 3. An integrated circuit that implements a (3,k)-regular low-density parity check code decoder with the functionality of 3Lk check node functions and Lk2 variable node functions, comprising:
(a) k2 random access memories (RAMs), (b) k2 variable node units, wherein one variable node unit is coupled to one RAM, (c) a first bidirectional shuffle network that is connected to the said RAMs, wherein the permutations performed by the shuffle network are regular and fixed, (d) a second bidirectional shuffle network that is connected to the said RAMs, wherein the permutations performed by the said shuffle network are regular and fixed, (e) a third bidirectional shuffle network that is connected to the said RAMs, wherein the permutations performed by the said shuffle network are random-like and configurable, (f) k check node units connected to the first shuffle network, (g) k check node units connected to the second shuffle network, (h) k check node units connected to the third shuffle network, (i) k2 modulo-L counters, wherein each modulo-L counter is an address generator for one RAM.
- 4. The integrated circuit of claim 1, wherein the variable node unit retrieves a channel message and 2 check-to-variable messages from the RAM to which it is coupled, and computes 2 variable-to-check messages, and stores the said messages in the RAMs, in every clock cycle.
- 5. The integrated circuit of claim 1, wherein k check node units retrieve k2 variable-to-check messages from the RAMs after shuffling, compute k2 check-to-variable messages, and store them back in the RAMs after unshuffling.
- 6. The integrated circuit of claim 1, wherein the shuffle network performs permutations in first L cycles, and performs no permutations in next L cycles.
- 7. The integrated circuit of claim 2, wherein the variable node unit retrieves a channel message and 2 check-to-variable messages from the RAM to which it is coupled, and computes 2 variable-to-check messages, and stores the said messages in the RAMs.
- 8. The integrated circuit of claim 1, wherein k check node units retrieve k2 variable-to-check messages from the RAMs after shuffling, compute k2 check-to-variable messages, and store them back in the RAMs after unshuffling.
- 9. The integrated circuit of claim 2, wherein the first shuffle network performs permutations in the first L clock cycles and performs no permutations in second and third L clock cycles.
- 10. The integrated circuit of claim 2, wherein the second shuffle network performs no permutations in first and second L clock cycles, and performs permutations in 3rd L clock cycles.
- 11. The integrated circuit of claim 2, wherein the random pattern generator performs a hash function.
- 12. The integrated circuit of claim 2 as part of a wireless transceiver.
- 13. The integrated circuit of claim 2 as part of a storage system.
- 14. The integrated circuit of claim 2 as part of a communications receiver.
- 15. The integrated circuit of claim 3, wherein the check node units compute check-to-variable messages in the first L cycles.
- 16. The integrated circuit of claim 3, wherein the variable node units compute variable-to-check messages in second L cycles.
- 17. The integrated circuit of claim 3 as part of a wireless system.
- 18. The integrated circuit of claim 3 as part of a storage system.
- 19. The integrated circuit of claim 3 as part of a communications receiver.
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application claims the benefit of U.S. Provisional Application No. 60/413,373, filed Sep. 25, 2002, which is incorporated herein by reference in its entirety.
STATEMENT REGARDING FEDERALLY-SPONSORED RESEARCH AND DEVELOPMENT
[0002] This invention was made with Government support under Grant No. DA/DAAG55-98-1-0315 and DA/DAAD19-01-1-0705, Disclosure Z02232, awarded by the Army Research Office. The Government has certain rights in this invention.
Provisional Applications (1)
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Number |
Date |
Country |
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60413373 |
Sep 2002 |
US |