The present disclosure relates generally to light emitting diode (LED) dies, and particularly to an LED die having high light extraction efficiency.
LEDs are solid state light emitting devices formed of semiconductors. LEDs are more stable and reliable than other conventional light sources such as incandescent bulbs. Thus, LEDs are being widely used in various fields such as numeral/character displaying elements, signal lights, and lighting and display devices.
A typical LED die includes a first semiconductor layer, an active layer, a second semiconductor layer, a transparent electrically conductive layer, and a passivation layer formed on the a substrate in sequence. However, the passivation layer is made of silicon oxide having a refractive index in a range between 1.44 and 1.55, while the transparent electrically conductive layer is made of tin doped indium oxide (ITO) having a refractive index in a range between 1.8 and 2.1. When a forward bias is applied to such LED die, light generated from the active layer is mostly confined inside the LED die due to total internal reflection at an interface between the transparent electrically conductive layer and the passivation layer, thereby decreasing the light extraction efficiency of the LED die.
What is needed therefore is an LED die which can overcome the above mentioned limitations.
Many aspects of the present embodiments can be better understood with reference to the following drawings. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present embodiments. Moreover, in the drawings, like reference numerals designate corresponding parts throughout the views.
Referring to
In the present embodiment, the first semiconductor layer 20 is an N-type semiconductor for supplying electrons, the second semiconductor layer 40 is a P-type semiconductor for supplying holes, and the electrons and the holes are coupled together in the active layer 30 to thereby emit light therefrom.
The LED die 100 defines a trench 3 therein. The trench 3 extends downwardly through the transparent electrically conductive layer 50, the second semiconductor layer 40, and the active layer 30, into the first semiconductor layer 20, thereby exposing a part of the first semiconductor layer 20. The exposed part of the first semiconductor layer 20 has an exposed top surface 211. The trench 3 is formed via etching or machining.
In the present embodiment, the first type electrode 60 is an N-type electrode corresponding to the first semiconductor layer 20. The first type electrode 60 is directly formed on the exposed top surface 211 of the first semiconductor layer 20. The second type electrode 70 is a P-type electrode 70 corresponding to the second semiconductor layer 40. The second type electrode 70 is directly formed on the transparent electrically conductive layer 50.
The passivation layer 80 covers the transparent electrically conductive layer 50, sides of the second semiconductor layer 40 and the active layer 30 defining the trench 3 and the exposed part including the exposed surface 211 of the first semiconductor layer 20. The transparent electrically conductive layer 50 is made of tin doped indium oxide. The passivation layer 80 is made of silicon nitride. A refractive index of the passivation layer 80 is close to that of the transparent electrically conductive layer 50. In this embodiment, the refractive index of the transparent electrically conductive layer 50 is in a range between 1.8 and 2.1, and the refractive index of the passivation layer 80 is in a range between 1.8 and 2.0. As the refractive index of the passivation layer 80 is close to that of the transparent electrically conductive layer 50, when a forward bias is applied to the LED die 100, light generated from the active layer 30 is mostly extracted out of the LED die 100, thereby improving the light extraction efficiency of the LED die 100.
A top surface 81 of the passivation layer 80 distant from the substrate 10 is roughened. A surface roughness Ra of the top surface 81 is in a range between 0.1 micrometer and 1 micrometer, thereby enhancing the light extraction efficiency of the
LED die 100. Preferably, the surface roughness Ra of the top surface 81 is in a range between 0.1 micrometer and 0.5 micrometer.
Referring to
Each light guide channel 92 penetrates though the passivation layer 80 to partially expose the transparent electrically conductive layer 50. The passivation layer 80 is divided into a plurality of individual parts 91 by the light guide channels 92.
The light guide channels 92 each extend through the passivation layer 80 into the transparent electrically conductive layer 50. The light guide channels 92 are equally spaced from each other. In the present embodiment, each light guide channel 92 has a configuration of a round blind hole, wherein the light guide channels 92 have the same depths, and a bore diameter of each light guide channel 92 is in a range of 5 to 15 micrometers and preferably the bore diameter is about 10 micrometers. In another embodiment, the bore diameter of each light guide channel 92 can be in a range of 0.3 to 0.7 micrometer and preferably the bore diameter can be about 0.5 micrometer.
When a forward bias is applied to the LED die 100a, a part of light generated from the active layer 30 directly exits from the transparent layer 50 into ambient air via the light guide channels 92 without being blocked by the passivation layer 80, thereby improving a light extraction efficiency of the LED die 100a.
It is believed that the present embodiments and their advantages will be understood from the foregoing description, and it will be apparent that various changes may be made thereto without departing from the spirit and scope of the disclosure or sacrificing all of its material advantages, the examples hereinbefore described merely being preferred or exemplary embodiments of the disclosure.
Number | Date | Country | Kind |
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201310191843X | May 2013 | CN | national |