This application claims priority to Taiwan Application Serial Number 112151728, filed Dec. 29, 2023, which is herein incorporated by reference in its entirety.
The present invention relates to a light-emitting diode driving circuit. More particularly, the present invention relates to a light-emitting diode driving circuit with failure detection function for light-emitting diodes.
Nowadays, due to many advantages of light-emitting diodes, such as, fast response, low cost, etc., the light-emitting diodes are often used as a light source for a vehicle light. For driving safety, the luminous intensity of the vehicle light is usually restricted by regulations. However, light source components of the vehicle light are more prone to failure because of conditions of use, power supply voltages and other factors. In this case, if any one of the light-emitting diodes of the vehicle light is failure and the diving manner is unadjusted, the luminous intensity of the vehicle light could be inconsistent with regulations, or seriously affect driving safety.
Therefore, how to provide a light-emitting diode driving circuit capable for performing failure detection on light-emitting diodes is an important issue in this field.
The present disclosure provides a light-emitting diode driving circuit. The light-emitting diode driving circuit is electrically connected to alight-emitting diode array. The light-emitting diode array comprises a plurality of light strings. Each of the light strings comprises a plurality of light-emitting diodes. The light strings are connected to a first current terminal to receive a driving current from the first current terminal. The light-emitting diode driving circuit comprises a constant current source, a plurality of resistors, a detection circuit and a determination circuit. The constant current source is electrically connected between the light strings and a second current terminal and configured to control the driving current as a constant current. The resistors include a plurality of first terminals and a plurality of second terminals. The first terminals of the resistors are electrically connected to the light strings, respectively. The second terminals of the resistors are electrically connected a reference voltage. The detection circuit is electrically connected to between the resistors and the light strings. The detection circuit comprises a plurality of diode units. Each of the diode units comprises a first diode and a second diode connected in series. The determination circuit comprises a first comparator and a second comparator. The first comparator comprises a first first input terminal electrically connected to the first diodes, a first second input terminal configured to receive a first floating voltage, and a first output terminal configured to output a first determination signal. The second comparator comprises a second first input terminal electrically connected to the second diodes, a second second input terminal configured to receive a second floating voltage, and a second output terminal configured to output a second determination signal. The first floating voltage and the second floating vary with the reference voltage.
The present disclosure provides another light-emitting diode driving circuit. The light-emitting diode driving circuit is electrically connected to a light-emitting diode array. The light-emitting diode array comprises a plurality of light strings. Each of the light strings comprises a plurality of light-emitting diode. The light strings are electrically connected to a first current terminal to receive a driving current from the first current terminal. The light-emitting diode driving circuit comprises a constant current source, a plurality of resistors, a detection circuit and a comparator. The constant current source is electrically connected between the light strings and a second current terminal and configured to control the driving current as a constant current. The resistors comprise a plurality of first terminals and a plurality of second terminals. The first terminals of the resistors are electrically connected to the light strings, respectively. The second terminals of the resistors are electrically connected to a reference voltage. The detection circuit is electrically connected between the resistors and the light strings. The detection circuit comprises a plurality of diodes. Anode terminals of the diodes are configured to receive a bias direct current. Cathode terminals of the diodes are electrically connected to the resistors, respectively. The comparator comprises a first input terminal electrically connected to the anode terminals of the diodes, a second input terminal configured to receive a floating voltage, and an output terminal configured to output a first determination signal. The floating voltage varies with the reference voltage.
The present disclosure provides another light-emitting diode driving circuit. The light-emitting diode driving circuit is electrically connected to a light-emitting diode array. The light-emitting diode array comprises a plurality of light strings. Each of the light strings comprises a plurality of light-emitting diodes. The light strings are electrically connected to a first current terminal to receive a driving current from the first current terminal. The light-emitting diode driving circuit comprises a constant current source, a plurality of resistors, a detection circuit and a comparator. The constant current source is electrically connected between the light strings and a second current terminal and configured to control the driving current as a constant current. The resistors comprise a plurality of first terminals and a plurality of second terminals. The first terminals of resistors are electrically connected to the light strings, respectively. The second terminals of the resistors are electrically connected to a reference voltage, respectively. The detection circuit is electrically connected between the resistors and the light strings. The detection circuit comprises a plurality of diodes. Cathode terminals of the diodes are configured to receive a bias direct current. Anode terminals of the diodes are electrically connected to the resistors. The comparator comprises a first input terminal electrically connected to the cathode terminals of the diodes, a second input terminal configured to receive a floating voltage, and an output terminal configured to output a determination signal. The floating voltage varies with the reference voltage.
Summary, the light-emitting diode driving circuit of the present disclosure includes a plurality of current branches, each electric branch includes a light string and a resistor electrically connected in series, and there is a diode electrically connected between the light string and the resistor included in each current branch. The aforesaid diode turns off or turns on the electrical path between the input terminal of the comparator and the electric current branch according to the voltage drop across the resistor included in each current branch, as such the comparator outputs the failure determination for detecting whether the element included in the light strings is failure.
The present disclosure can be more fully understood by reading the following detailed description of the embodiment, with reference made to the accompanying drawings as follows.
Reference will now be made in detail to embodiments of the present disclosure, examples of which are described herein and illustrated in the accompanying drawings. While the disclosure will be described in conjunction with embodiments, it will be understood that they are not intended to limit the disclosure to these embodiments. Description of the operation does not intend to limit the operation sequence. Any structures resulting from recombination of elements with equivalent effects are within the scope of the present disclosure. It is noted that, in accordance with the standard practice in the industry, the drawings are only used for understanding and are not drawn to scale. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts for better understanding.
In the description herein and throughout the claims that follow, unless otherwise defined, all terms have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein. In the description herein and throughout the claims that follow, the terms “comprise” or “comprising,” “include” or “including,” “have” or “having,” “contain” or “containing” and the like used herein are to be understood to be open-ended, i.e., to mean including but not limited to.
A description is provided with reference to
As shown in
In some embodiments, the light-emitting diode array ARR is electrically connected to the light-emitting diode driving circuit 10. In some embodiments, the light-emitting diode driving circuit 10 includes a detection circuit DETa, a determination circuit CL and resistors RS1˜RSn. In some embodiments, the light strings LS1˜LSn included in the light-emitting diode array ARR are electrically connected in series with the correspondingly resistors RS1˜RSn to form multiple current branches, respectively, and the foregoing current branches are connected in parallel between a first current terminal IIN and a second current terminal IOUT. Specifically, the light string LS1 and the resistor RS1 are electrically connected in series between the first current terminal IIN and the second current terminal IOUT, the light string LS2 and the resistor RS2 are electrically connected in series between the first current terminal IIN and the second current terminal IOUT, and so on. The light string LSn and the resistor RSn are electrically connected in series between the first current terminal IIN and the second current terminal IOUT. In some embodiments, the first current terminal IIN can be considered as a current input terminal of the lighting system 100, and the second current terminal IOUT can be considered as a current output terminal of the lighting system 100.
In some embodiments, first terminals of the light strings LS1˜LSn are electrically connected to the first current terminal IIN and receive a driving current I (which is only represented near the second current terminal IOUT) from the first current terminal IIN. In some embodiments, first terminals of the resistors RS1˜RSn are electrically connected to second terminals of the light strings LS1˜LSn respectively, and second terminals of the resistors RS1˜RSn are electrically connected to the second current terminal IOUT through a constant current source 20. To be noted that, each of the light strings LS1˜LSn of the present disclosure includes two terminals, in which when the first terminal (such as, a terminal near the first current terminal IIN) is an anode terminal (/a cathode terminal), the second terminal (such as, the other terminal near the resistors RS1˜RSn) is a cathode terminal (/an anode terminal). In some embodiments, the driving current I flows from the first current terminal IIN to the second current terminal IOUT through the current branches composed of the light strings LS1˜LSn and the resistors RS1˜RSn. In other words, the driving current I is separated at the first current terminal IIN to multiple currents IS which flow to the second current terminal IOUT respectively through the current branches composed of the light strings LS1˜LSn and the resistors RS1˜RSn and further through the constant current source 20. Under ideal conditions, for example, one of the light strings LS1˜LSn has the same specifications and the same number of light-emitting diodes as the other strings LS1˜LSn, and the currents IS flowing through the current branches are substantially the same to each other.
In some embodiments, the constant current source 20 is electrically connected between the light strings LS1˜LSn and the second current terminal IOUT. In some embodiments, the constant current source 20 is electrically connected to the current path of the driving current I. In some embodiments, the constant current source 20 is configured to generate a constant output current. That is, the constant current source 20 is configured to control the driving current I as a constant current.
In some embodiments, the detection circuit DETa is electrically connected between the resistors RS1˜RSn and the light strings LS1˜LSn, for example, through nodes N1˜Nn. In some embodiments, the detection circuit DETa includes diode units DU1˜DUn. In some embodiments, each of the diode units DU1˜DUn includes two diodes, for example, the diode unit DU1 includes diodes D1A and D1B, and so on. The diode unit DUn includes diode DnA and DnB. In some embodiments, cathode terminals of the diodes D1A˜DnA are electrically connected to first terminals of the resistors RS1˜RSn respectively (that is, the cathode terminals of the diodes D1A˜DnA are electrically connected to the nodes N1˜Nn respectively), and anode terminals of the diodes D1A˜DnA are electrically connected to the determination circuit CL. In some embodiments, anode terminals of the diodes D1B˜DnB are electrically connected to the first terminals of the resistors RS1˜RSn through the nodes N1˜Nn respectively, and cathode terminals of the diodes D1A˜DnA are respectively electrically to the determination circuit CL. In some embodiments, the diodes D1A˜DnA and D1B˜DnB can be implemented by P-N junction diodes. In some embodiments, the diodes D1A˜DnA and D1B˜DnB can be implemented by Zener diodes. In some embodiments, the diodes D1A˜DnA and D1B˜DnB can be implemented by Schottky diodes. Generally, a Schottky diode has a voltage drop which is about or less than 0.2 volts, a voltage error which is low when it is applied, and further deviation which is small under high and low temperature conditions.
In some embodiments, the determination circuit CL includes comparators 16˜17 and an OR gate 18. In some embodiments, a first input terminal of the comparator 16 (such as, an inverting input terminal, which is illustrated as “-” in drawings) is electrically connected to the anode terminals of the diodes D1A˜DnA, and a second input terminal of the comparator 16 (such as, a non-inverting input terminal, which is illustrated as “+” in drawings) is configured to receive a floating voltage Vref_min. In some embodiments, a first input terminal of the comparator 17 (such as, a non-inverting input terminal) is electrically connected to the cathode terminals of the diodes D1B˜DnB, and a second input terminal (such as, an inverting input terminal) of the comparator 17 is configured to receive a floating voltage Vref_max.
In some embodiments, the second input terminal of the comparator 16 is electrically connected to a floating voltage source 14 to receive the floating voltage Vref_min provided by the floating voltage source 14. In some embodiments, a second terminal (such as, a negative electrode) of the floating voltage source 14 is electrically connected to a reference voltage Vref. In some embodiments, since the driving current I is controlled as a constant current, if the voltage VIN at the first current terminal IIN floats, any one voltage on the current path of the driving current I floats, accordingly. That is, the reference voltage Vref floats or varies with the voltage VIN at the first current terminal IIN. Accordingly, by coupling the second terminal of the floating voltage source 14 to the reference voltage Vref, the floating voltage Vref_min is equal to the sum of a fixed voltage difference provided by the floating voltage source 14 and the reference voltage Vref, and the value of the floating voltage Vref_min can exactly vary in response to the variation of the voltage VIN at the first current terminal IIN. Therefore, in a case where the voltage VIN at the first current terminal IIN varies, the comparison result generated by the comparator 16 may not become meaningless when the second terminal of the comparator 16 receives a incorrect baseline for comparison. By contrast, the floating voltage source 14 is grounded in related technologies, and the comparison result is affected by the variation of the voltage at the input terminal. In contrast to this, the determination result of the present disclosure is not affected by the variation of the voltage VIN at the first current terminal IIN.
In some embodiments, the second input terminal of the comparator 17 is electrically connected to a floating voltage source 15 to receive the floating voltage Vref_max provided by the floating voltage source 15. In some embodiments, a second terminal (such as, a negative electrode) of the floating voltage source 15 is electrically connected to the reference voltage Vref. In some embodiments, since the driving current I is controlled as a constant current, if the voltage VIN at the first current terminal IIN floats, any one voltage on the current path of the driving current I floats, accordingly. That is, the reference voltage Vref floats or varies with the voltage VIN at the first current terminal IIN. Accordingly, by coupling the second terminal of the floating voltage source 15 to the reference voltage Vref, the floating voltage Vref_max is equal to the sum of a fixed voltage difference provided by the floating voltage source 15 and the reference voltage Vref, and the value of the floating voltage Vref_max can exactly vary in response to the voltage VIN at the first current terminal IIN. Therefore, in a case where the voltage VIN at the first current terminal IIN varies, the comparison result generated by the comparator 17 will not become meaningless when the second terminal of the comparator 17 receives an incorrect baseline for comparison. By contrast, the floating voltage source 15 is grounded in related technologies, and the comparison result is affected by the variation of the voltage at the input terminal. In contrast to this, the determination result of the present disclosure is not affected by the variation of the voltage VIN at the first current terminal IIN.
In some embodiments, a bias current source 11 is electrically connected to the anode terminals of the diodes D1A˜DnA and the first input terminal of the comparator 16. In some embodiments, the bias current source 11 is configured to provide a bias current Ibias_min, such that the states of the diode D1A˜DnA operate at the operating point to maintain a basic operation. In some embodiments, the bias current Ibias_min is within a range of 0.5 mA˜1.5 mA. In other embodiments, the bias current Ibias_min can be implemented by a current that is smaller than 0.5 mA or greater than 1.5 mA. In some embodiments, an open-circuit failure detection circuit is composed of the diodes D1A˜DnA, the resistors RS1˜RSn and the comparator 16. How to operate the open-circuit failure detection circuit will be described in detailed in the following embodiments.
In some embodiments, the bias current source 12 is electrically connected to the cathode terminals of the diodes D1B˜DnB and the first input terminal of the comparator 17. In some embodiments, the bias current source 12 is configured to provide a bias current Ibias_max, such that the states of the diodes D1B˜DnB operate at the operating point. In some embodiments, the bias current Ibias_max is within a range of 0.5 mA˜1.5 mA. In the other embodiments, the bias current Ibias_max can be implemented by a current that is smaller than 0.5 mA or greater than 1.5 mA. In the other embodiments, a short-circuit failure detection circuit is composed of the diodes D1B˜DnB, the resistors RS1˜RSn and the comparator 17. How to operate the short-circuit failure detection circuit will be described in detailed in the following embodiments.
For better illustrates the operation of the open-circuit failure detection under the normal operating condition and the open-circuit failure condition, a description is provided with reference to
In Table 1, the voltage at the second terminal of the resistor RS2 is assumed to be 0 volts. The term “RS” indicates to a resistance of each of the resistors RS1˜RSn, and the term “VDA” indicates to a voltage drop of each of the diodes D1A˜DnA. In some embodiments, when the light-emitting diodes L11-Lnn included in the light strings LS1˜LSn are under the normal operating condition, the voltage drops across the aforementioned current branches are the same, such that the amplitudes of the currents Is flowing through the current branches are the same. In some embodiments, the light strings LS1˜LSn have the same number of light-emitting diodes, and these light-emitting diodes have the same specification. In some embodiments, the resistances of the resistors RS1˜RSn are the same, and the diodes D1A˜DnA have the same specification. In some embodiments, when the light strings LS1˜LSn operate normally, each of the currents flowing through the light strings LS1˜LSn can be given by (I/n), and the voltages VS1˜VSn are voltages across the resistors RS1˜RSn respectively, which could be given by (I/n)*RSn, where the term “I” indicates the amplitude of the driving current, the term “n” indicates the number of light strings LS1˜LSn, and the term “RSn” indicates the resistance of each of the resistors RS1˜RSn. As shown in
In some embodiments, the floating voltages Vref_min and Vref_max are default values, and these two default voltage values may be set as upper and lower limit values based on the median value of the voltages VS1˜VSn. When any one of the voltages Vs_min and Vs_max exceeds the range between the upper and lower limit values, which means that there is open-circuit or short-circuit failure occur in one or more light-emitting diode. A difference between this upper or lower limit value and the median value of the voltages VS1˜VSn depends on the voltage drop of a single light-emitting diode and the distribution range thereof, which usually can be within a range of 0.4 volts˜2.6 volts.
As shown in
Continuing from the above description, when at least one light-emitting diode (such as, the light-emitting diode L22) included in the light strings LS1˜LSn is under the open-circuit failure condition, the comparator 16 outputs the determination signal VDET1 with the high logic level. Therefore, the determination signal VDET1 with the high logic level indicates that at least one light-emitting diode included in the light strings LS1˜LSn is under the open-circuit failure condition, and the determination signal VDET1 with the low logic level indicates that there is no open-circuit failure occurring in the light-emitting diodes L11˜Lnn. That is, the determination signal VDET1 is configured to provide open-circuit information about the light-emitting diodes L11˜Lnn.
In some embodiments, when the light-emitting diode L22 is under the open-circuit failure condition, voltages at the first terminals of the diodes D1A and DnA are less than voltages at the second terminals thereof (for example, the voltage at the first terminal of the diode DnA is equal to the voltage at the node N2, which is substantially equal to 0). Therefore, each of the diodes D1A˜DnA excluding the diode D2A is in the turn-off state. In some embodiments, when the light-emitting diode L22 is under the open-circuit failure condition, a voltage at the first terminal of the diode D2B (the voltage VS2 at the node N2) is not greater than a voltage at the second terminal of the diode D2B, and therefore the diode D2B is in the turn-off state. In some embodiments, when the light-emitting diode L22 is under the open-circuit failure condition, a voltage across two terminals of each of the diodes D1B˜DnB excluding the diode D2B remains at a certain voltage (that is, the voltage drop of the general diode which is 0.7 volts, or the voltage drop of the Zener diode which is 0.1 volts), such that the voltage Vs_max at the non-inverting input terminal of the comparator 17 can be given by [Is′*RS−VDB], where the term “VDB” indicates a voltage drop of each of the diodes D1B˜DnB. In some embodiments, if at least one of the light-emitting diode (such as, the light-emitting diode L22) included in the light strings LS1˜LSn is under the open-circuit failure condition, the comparator 17 outputs the determination signal VDET2 with a low logic level.
In some embodiments, when all of the light strings LS1˜LSn operate normally, the OR gate 18 outputs the failure determination signal VDET_OUT with a low logic level according to the determination signals VDET1 and VDET2. On the other hand, when at least one of the light-emitting diode (such as, the light-emitting diode L22) included in the light strings LS1˜LSn is under the open-circuit failure condition, the OR gate 18 outputs the failure determination signal VDET_OUT with a high logic level according to the determination signals VDET1 and VDET2.
For better illustration of the short-circuit failure detection under a normal operating condition and a short-circuit failure condition, a description is provided with reference to
In Table 2, the voltage at the second terminal of the resistor RS2 is assumed to be 0 volts. The term “RS” indicates to the resistance of each of the resistors RS1˜RSn, and the term “VDB” indicates to the conduction voltage of each of the diodes D1B˜DnB. In some embodiments, when all of the light-emitting diodes L11˜Lnn included in the light strings LS1˜LSn are under the normal operating condition, the voltage drops across the aforementioned current branches are the same, such that the amplitudes of the currents Is flowing through the current branches are the same. In some embodiments, the light strings LS1˜LSn have the same number of light-emitting diodes, and these light-emitting diodes have the same specification. In some embodiments, the resistances of the resistors RS1˜RSn are the same, and the diodes D1B˜DnB the have the same specification.
As shown in
As shown in
In some embodiments, the determination signal VDET2 with the high logic level indicates that at least one light-emitting diode included in the light strings LS1˜LSn is under the short-circuit failure condition, and the determination signal VDET2 with the low logic level indicates that there is no short-circuit failure occurring in the light-emitting diodes L11˜Lnn. That is, the determination signal VDET1 is configured to provide the short-circuit information about the light-emitting diodes L11˜Lnn.
In some embodiments, when the light-emitting diode L22 is under the short-circuit failure condition, voltages at the first terminals of the diodes D1B and DnB are less than the voltages at second terminals thereof, and each of the diodes D1B˜DnB excluding the diode D2B is in the turn-off state. In some embodiments, when the light-emitting diode L22 is under the short-circuit failure condition, a voltage at the second terminal of the diode D2A (the voltage VS2 at the node N2) is greater than the voltage at the first terminal thereof the diode D2A, so that the diode D2A is in the turn-off state. In some embodiments, when the light-emitting diode L22 is under the short-circuit failure condition, a voltage across two terminals of each of the diodes D1B˜DnB excluding the diode D2B remains at a certain voltage (that is, the voltage drop of the diode which is 0.7 volts, or the voltage drop of the Zener diode which is 0.1 volts), such that the voltage Vs_min at the inverting input terminal of the comparator 16 can be given by [Is″*RS+VDA], where the term “VDA” indicates to a voltage drop of each of the diodes D1A˜DnA. In some embodiments, the value of [Is″*RS+VDA] is greater than the floating voltage Vref_min, and the comparator 16 outputs the determination signal VDET1 with a low logic level when the light-emitting diode L22 is under the short-circuit failure condition. In some embodiments, when the at least one light-emitting diode (such as, the light-emitting diode L22) included in the light strings LS1˜LSn is under the short-circuit failure condition, the determination signal VDET2 output by the comparator 16 outputs the determination signal VDET2 with the low logic level.
In some embodiments, when the light strings LS1˜LSn operate normally, the OR gate 18 outputs the failure determination signal VDET_OUT with the low logic level according to the determination signals VDET1 and VDET2. On the other hand, when at least one light-emitting diode (such as, the light-emitting diode L22) included in the light strings LS1˜LSn is under the short-circuit failure condition, the OR gate 18 outputs the failure determination signal VDET_OUT with the high logic level according to the determination signals VDET1 and VDET2. In other words, whether at least one of open-circuit event or short-circuit event occurs in the light-emitting diode array ARR can be determined by the failure determination signal VDET_OUT output by the OR gate 18.
A description is provided with reference to
A description is provided with reference to
In some embodiments, the bias current source 11 can be implemented by a resistor electrically connected to the first current terminal IIN and the inverting input terminal of the comparator 16 for providing a bias current Ibias_min to the diodes D1A˜DnA, such that the diodes D1A˜DnA operate at the operating point to remain in a basic operation. In some embodiments, the bias current source 12 can be implemented by a resistor electrically connected to the second current terminal IOUT and the non-inverting input terminal of the comparator 17 for providing the a current Ibias_max to the diodes D1B˜DnB, such that the diodes D1B˜DnB operate at the operating point to remain in a basic operation.
A description is provided with reference to
A description is provided with reference to
A description is provided with reference to
A description is provided with reference to
A description is provided with reference to
A description is provided with reference to
Summary, the detection circuit DETa included in the light-emitting diode driving circuit 10 of the present disclosure can detect whether there is a failure condition occurs in the light-emitting diodes L11˜Lnn included in multiple current branches, thereby simplifying the design of the circuit and improving the operational efficiency of the circuits.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the present invention cover modifications and variations of this invention provided they fall within the scope of the following claims.
| Number | Date | Country | Kind |
|---|---|---|---|
| 112151728 | Dec 2023 | TW | national |