This application is based on and claims priority under 35 USC 119 from Japanese Patent Application No. 2022-067689 filed Apr. 15, 2022.
The present disclosure relates to a light emitting element array and a detection apparatus.
JP2019-219400A discloses a method of measuring a depth that is insensitive to damaged light due to in-plane reflection. The method includes causing a light source to radiate light to a scene, performing damaged light measurement by controlling a first charge storage unit of a pixel to collect charges based on light hit on the pixel during a first period in which the damaged light hits the pixel, but light returning from an object within the field of view of the pixel does not hit the pixel, removing a contribution from the damaged light from one or more measurements affected by the damaged light, based on the damaged light measurement, and determining the depth based on the one or more measurements in which the contribution from the damaged light has been removed.
Aspects of non-limiting embodiments of the present disclosure relate to a light emitting element array, a light emitting device, and a detection apparatus capable of suppressing interference of light due to multipath as compared to a case where a polarization component of light emitted from a plurality of light emitting elements is not considered.
Aspects of certain non-limiting embodiments of the present disclosure address the above advantages and/or other advantages not described above. However, aspects of the non-limiting embodiments are not required to address the advantages described above, and aspects of the non-limiting embodiments of the present disclosure may not address advantages described above.
According to an aspect of the present disclosure, there is provided a light emitting element array including: a plurality of light emitting elements, in which, among polarization components of light emitted by the light emitting element capable of causing interference of emitted light, light intensity of a polarization component of light in a second direction intersecting with a first direction in which light emitting elements capable of causing the interference of the light are arranged is smaller than light intensity of a polarization component in the first direction.
Exemplary embodiment(s) of the present invention will be described in detail based on the following figures, wherein:
Hereinafter, examples of exemplary embodiments according to the technique of the present disclosure will be described in detail with reference to the drawings.
As a measurement apparatus that measures the three-dimensional shape of a measurement target, there is an apparatus that measures the three-dimensional shape based on the so-called time-of-flight (ToF) method which is based on the time of flight of light. In the ToF method, a time from a timing at which light is emitted from a light source in the measurement apparatus to a timing at which light with which irradiation is performed is reflected by the measurement target, and then is received by a three-dimensional sensor (referred to as a 3D sensor below) in the measurement apparatus is measured, and the distance to the measurement target is measured. In this manner, the three-dimensional shape is specified. A target for measuring the 3D shape is referred to as the measurement target. The measurement target is an example of a detection target object. Measurement of a three-dimensional shape may be referred to as “three-dimensional measurement”, “3D measurement”, or “3D sensing”.
The ToF method includes a direct method and a phase difference method (indirect method). The direct method is a method of irradiating a measurement target with pulsed light emitted for a very short time, and actually measuring a time until the light is returned. The phase difference method is a method of periodically flickering pulsed light and detecting, as a phase difference, a time delay when a plurality of rays of pulsed light travel back and forth to and from a measurement target. In the present exemplary embodiment, a three-dimensional shape is measured by the phase difference method as an example.
Such a measurement apparatus is mounted in a portable information processing apparatus or the like, and is used for face authentication of a user who intends to perform an access. In the related art, in the portable information processing apparatus and the like, a method of authenticating a user by using a password, fingerprint, iris, or the like is used. In recent years, there has been a demand for an authentication method with higher security. Therefore, a measurement apparatus that measures a three-dimensional shape has been mounted in the portable information processing apparatus. That is, the measurement apparatus acquires a three-dimensional image of the face of a user who has performed an access, and identifies whether or not the access is permitted. Only in a case where the user is authenticated to have the permitted access, the measurement apparatus permits the use of the own apparatus (portable information processing apparatus).
In addition, such a measurement apparatus is also applied to a case of continuously measuring the three-dimensional shape of a measurement target, such as in augmented reality (AR).
The configurations, functions, methods, and the like described in the present exemplary embodiment described below can be applied not only to face authentication and augmented reality, but also to measurement of the three-dimensional shape of other measurement targets.
Measurement Apparatus 1
The measurement apparatus 1 includes an optical device 3 and a control unit 8. The control unit 8 controls the optical device 3. The control unit 8 includes a three-dimensional-shape specifying unit 81 that specifies the three-dimensional shape of a measurement target. The measurement apparatus 1 is an example of a detection apparatus. The control unit 8 is an example of a detection unit.
A communication unit 14 and a storage unit 16 are connected to the I/O 12D.
The communication unit 14 is an interface for performing data communication with an external device.
The storage unit 16 is configured by a non-volatile rewritable memory such as a flash ROM or the like, and stores a measurement program 16A and the like, which will be described later. The three-dimensional-shape specifying unit 81 is configured and the three-dimensional shape of a measurement target is specified, in a manner that the CPU 12A reads the measurement program 16A stored in the storage unit 16 into the RAM 12C and executes the measurement program 16A.
The optical device 3 includes a light emitting device 4 and a 3D sensor 5. The light emitting device 4 includes a wiring board 10, a heat dissipation base material 100, a light source 20, a light diffusion member 30, a drive unit 50, a retention unit 60, and capacitors 70A and 70B. Furthermore, the light emitting device 4 may include passive elements such as a resistive element 6 and a capacitor 7 in order to operate the drive unit 50. Here, it is assumed that two resistive elements 6 and two capacitors 7 are provided. Although two capacitors 70A and 70B are illustrated, one capacitor may be provided. The capacitors 70A and 70B are referred to as a capacitor 70 in a case where the capacitors 70A and 70B are not distinguished from each other. One or a plurality of resistive elements 6 and one or a plurality of capacitors 7 may be provided. Here, electrical components such as the 3D sensor 5, the resistive element 6, and the capacitor 7 other than the light source 20, the drive unit 50, and the capacitor 70 may be referred to as circuit components without distinguishing the above electrical components from each other. The capacitor may be referred to as a capacitor. The 3D sensor 5 is an example of a light receiving unit.
The heat dissipation base material 100, the drive unit 50, the resistive element 6, and the capacitor 7 in the light emitting device 4 are provided on the front surface of the wiring board 10. Although the 3D sensor 5 is not provided on the front surface of the wiring board 10 in
The light source 20, the capacitors 70A and 70B, and the retention unit 60 are provided on the front surface of the heat dissipation base material 100. The light diffusion member 30 is provided above the retention unit 60. Here, it is assumed that the outer shape of the heat dissipation base material 100 and the outer shape of the light diffusion member 30 are the same as each other. Here, the front surface means the front side of the paper surface of
The light source 20 is configured as a light emitting element array in which a plurality of light emitting elements are two-dimensionally arranged (see
The light emitted from the light source 20 is incident on the light diffusion member 30. The light diffusion member 30 diffuses and emits the incident light. The light diffusion member 30 is provided to cover the light source 20 and the capacitors 70A and 70B. That is, the light diffusion member 30 is provided at a predetermined distance from the light source 20 and the capacitors 70A and 70B provided on the heat dissipation base material 100, by the retention unit 60 provided on the front surface of the heat dissipation base material 100. Thus, the light emitted from the light source 20 is diffused by the light diffusion member 30 and applied to the measurement target. In other words, the light emitted from the light source 20 is diffused by the light diffusion member 30 and applied in a wider range than a range in a case where the light diffusion member 30 is not provided.
In a case where three-dimensional measurement is performed by the ToF method, the drive unit 50 requires the light source 20 to emit pulsed light (referred to as emitted light pulse below) having a frequency of 100 MHz or more and a rising time of 1 ns or less, for example. In the case of face authentication as an example, the distance at which irradiation with light is performed is about 10 cm to 1 m. The range in which irradiation with light is performed is about 1 m square. The distance at which irradiation with light is performed is referred to as a measurement distance, and the range in which irradiation with light is performed is referred to as an irradiation range or a measurement range. A surface virtually provided in the irradiation range or the measurement range is referred to as an irradiation surface. The measurement distance to the measurement target and the irradiation range of the measurement target may be other than the measurement distance and the irradiation range described above, such as in cases other than face authentication.
The 3D sensor 5 includes a light receiving element array including a plurality of light receiving elements, and outputs a signal corresponding to the time from a timing at which light is emitted from the light source 20 to a timing at which the 3D sensor 5 receives the light.
For example, each light receiving element of the 3D sensor 5 receives pulse-shaped reflected light (referred to as a received light pulse below) from the measurement target with respect to the emitted light pulse from the light source 20. In addition, each light receiving element accumulates charges corresponding to the time until the light is received. The 3D sensor 5 is configured as a CMOS device in which each light receiving element includes two gates and corresponding charge accumulation units. By alternately applying pulses to the two gates, the generated photoelectrons are transferred to either of the two charge accumulation units at a high speed. Charges corresponding to the phase difference between the emitted light pulse and the received light pulse are accumulated in the two charge accumulation units. The 3D sensor 5 outputs, as a signal, a digital value corresponding to the phase difference between the emitted light pulse and the received light pulse for each light receiving element via an AD converter. That is, the 3D sensor 5 outputs a signal corresponding to the time from the timing at which the light source 20 emits the light to the timing at which the 3D sensor 5 receives the light. That is, a signal corresponding to the three-dimensional shape of the measurement target is obtained from the 3D sensor 5. The AD converter may be provided in the 3D sensor 5 or may be provided outside the 3D sensor 5.
The control unit 8 turns on a switch element SW and drives the drive unit 50 to cause the light source 20 to emit light, irradiate the measurement target with light, and cause the 3D sensor 5 to receive the reflected light from the measurement target. The three-dimensional shape of the measurement target is measured from the amount of light received by the 3D sensor 5 by using the ToF method.
The light source 20, the light diffusion member 30, the drive unit 50, and the capacitors 70A and 70B, which constitute the light emitting device 4, will be described below.
Configuration of Light Source 20
A direction perpendicular to the x-direction and the y-direction is defined as the z-direction. The front surface of the light source 20 refers to the front side of the paper surface, that is, the surface on the +z direction side. The back surface of the light source 20 refers to the back side of the paper surface, that is, the surface on the −z direction side. The plan view of the light source 20 is a view of the light source 20 viewed from the front surface side.
More specifically, in the light source 20, the side on which an epitaxial layer that functions as a light emitting layer (active region 206 described later) is formed is referred to as the front surface, the front side, or the front surface side of the light source 20.
The VCSEL is a light emitting element in which an active region as a light emission region is provided between a lower multilayer reflection mirror and an upper multilayer reflection mirror stacked on a semiconductor substrate, and laser light is emitted in a direction perpendicular to the front surface. Therefore, the VCSEL is easier to form a two-dimensional array as compared to the case using edge emitting laser. The number of VCSELs included in the light source 20 is, for example, 100 to 1000. A plurality of VCSELs are connected in parallel and driven in parallel. The above number of VCSELs is an example, and may be set in accordance with the measurement distance and the irradiation range.
An anode electrode 218 (see
Here, it is assumed that a shape (referred to as a planar shape, and the same applies below) of the light source 20 viewed from the front surface side) is a rectangle. The side surface on the −y direction side is referred to as a side surface 21A, the side surface on the +y direction side is referred to as a side surface 21B, the side surface on the −x direction side is referred to as a side surface 22A, and the side surface on the +x direction side is referred to as a side surface 22B. The side surface 21A faces the side surface 21B. The side surfaces 22A and 22B connect the side surfaces 21A and 21B and face each other.
The center of the planar shape of the light source 20, that is, the center in the x-direction and the y-direction is defined as a center Ov.
Drive Unit 50 and Capacitors 70A and 70B
In a case where the light source 20 is intended to be driven at a higher speed, low-side driving is favorable, for example. The low-side driving refers to a configuration in which a drive element such as a MOS transistor is located on the downstream side of a current path with respect to a drive target such as the VCSEL. Conversely, a configuration in which the drive element is located on the upstream side is referred to as high-side driving.
The light source 20 is configured by connecting a plurality of VCSELs in parallel as described above. The anode electrode 218 (see
As illustrated in
The drive unit 50 includes an n-channel MOS transistor 51 and a signal generation circuit 52 that turns the MOS transistor 51 on and off. The drain (denoted as [D] in
The capacitors 70A and 70B have one terminal connected to the power supply line 83 and the other terminal connected to the reference line 84. Here, in a case where there are a plurality of capacitors 70, the plurality of capacitors 70 are connected in parallel. That is, in
Next, a method of driving the light source 20, which is low-side driving, will be described.
In a case where the control unit 8 causes the light source 20 to emit light, the control unit 8 turns on the switch element SW.
First, it is assumed that a signal generated by the signal generation circuit 52 in the drive unit 50 has an “L level”. In this case, the MOS transistor 51 is in an off state. That is, no current flows between the source ([S] in
At this time, the capacitors 70A and 70B are connected to the power supply 82, one terminals of the capacitors 70A and 70B connected to the power supply line 83 have the power supply potential, and the other terminals connected to the reference line 84 have the reference potential. Therefore, the capacitors 70A and 70B are charged by a current flowing from the power supply 82 (charges are supplied).
Then, in a case where the signal generated by the signal generation circuit 52 in the drive unit 50 becomes an “H level”, the MOS transistor 51 is turned on from the off state. Then, the capacitors 70A and 70B, and the MOS transistor 51 and the VCSEL connected in series form a closed loop. The charges accumulated in the capacitors 70A and 70B are supplied to the MOS transistor 51 and the VCSEL connected in series. In other words, a drive current flows through the VCSEL, and the VCSEL emits light. This closed loop corresponds to a drive circuit that drives the light source 20.
In a case where the signal generated by the signal generation circuit 52 in the drive unit 50 becomes an “L level” again, the MOS transistor 51 shifts from the ON state to the OFF state. As a result, the closed loop (drive circuit) of the capacitors 70A and 70B, and the MOS transistor 51 and the VCSEL connected in series becomes an open loop, and no drive current flows through the VCSEL. This causes the VCSEL to stop light emission. Then, charges from the power supply 82 to the capacitors 70A and 70B, and the capacitors 70A and 70B are charged.
As described above, the MOS transistor 51 repeats on and off, and the VCSEL repeats light emission and non-light emission, each time the signal output from the signal generation circuit 52 shifts between an “H level” and an “L level”. The repetition of turning on and off of the MOS transistor 51 may be referred to as switching.
In the present exemplary embodiment, it is assumed that the light receiving element PD that receives the light emitted by each VCSEL is specified in advance. That is, the light emitted from a plurality of VCSELs is received by the corresponding light receiving element PD. Here, the VCSEL and the light receiving element PD may have a correspondence of any one of one-to-one, many-to-one, one-to-many, and many-to-many. To simplify the description, the case where the VCSEL and the light receiving element PD are in one-to-one correspondence will be described below.
In a case where the distance to the measurement target is measured by irradiating the measurement target with light from the light source 20, and receiving the reflected light, there is a problem that light interference due to multipath may occur. For example, as illustrated in
Here, regarding the interference of light due to multipath, light specularly reflected among rays of reflected light from the wall 32 irradiated with light, that is, light of a polarization component in the z-direction in
Therefore, in the present exemplary embodiment, the light source 20 is set to have a configuration in which, among polarization components of light emitted by a VCSEL capable of causing the interference of the emitted light, light intensity of the polarization component of light in a second direction intersecting with a first direction in which VCSELs capable of causing the interference of light are arranged is smaller than light intensity of the polarization component in the first direction.
For example, as illustrated in
As a method of controlling the polarization direction of the VCSEL, for example, the methods disclosed in References 1 to 3 below can be used, but the present disclosure is not limited to the methods.
As described above, in the light source 20, the polarization direction is controlled so that the light intensity of the polarization component in the y-axis direction, in which the VCSELs capable of causing the interference of light are arranged, is smaller than the light intensity of the polarization component in the x-axis direction. Therefore, the interference of light due to multipath is suppressed as compared to the case where the polarization component of the emitted light is not considered.
Next, a second exemplary embodiment will be described.
In the second exemplary embodiment, a case where a VCSEL capable of causing interference of emitted light is a VCSEL other than a VCSEL being a control target in which the interference of the emitted light is to be suppressed.
For example, as illustrated in
That is, the drive unit 50 drives the plurality of VCSELs so that, among the plurality of VCSELs arranged in the y-axis direction (first direction) and the x-axis direction (second direction), the VCSELs arranged in the y-axis direction emit light at the same light emission timing, and the VCSELs arranged in the x-axis direction emit light at different timings.
In the case of the second exemplary embodiment, the VCSELs capable of causing the interference of the emitted light are the VCSELs arranged in the y-axis direction, and the VCSELs arranged in the x-axis direction are the control target in which the interference of the emitted light is to be suppressed. Therefore, the light source 20 is configured by the plurality of VCSELs having the polarization direction that is controlled such that the light intensity of the polarization component in the x-axis direction is smaller than the light intensity of the polarization component in the y-axis direction.
As illustrated in
In this case, as illustrated in
The bandpass filter 5B transmits reflected light of different wavelengths A to C reflected from the measurement target, in accordance with the arrangement pattern of the VCSELs of the wavelengths A to C. That is, in the bandpass filter 5B, a filter that transmits light having a wavelength A, a filter that transmits light having a wavelength B, and a filter that transmits light having a wavelength C are the bandpass filters arranged in the same pattern as the arrangement pattern of the VCSELs of the wavelengths A to C in
In this case, the VCSELs capable of causing the interference of the emitted light are the VCSELs arranged in the y-axis direction, and the VCSELs arranged in the x-axis direction are the control target in which the interference of the emitted light is to be suppressed.
Therefore, also in this case, the light source 20 is configured by the plurality of VCSELs having the polarization direction that is controlled such that the light intensity of the polarization component in the x-axis direction is smaller than the light intensity of the polarization component in the y-axis direction.
In the example in
Therefore, also in this case, the light source 20 is configured by the plurality of VCSELs having the polarization direction that is controlled such that the light intensity of the polarization component in the x-axis direction is smaller than the light intensity of the polarization component in the y-axis direction.
Next, a third exemplary embodiment will be described.
In the third exemplary embodiment, a case where a VCSEL capable of causing interference of emitted light is a VCSEL being a control target in which the interference of the emitted light is to be suppressed.
For example, in the second exemplary embodiment, as illustrated in
However, for example, in a case where the difference in wavelength is small and the effect of suppressing interference of light between VCSELs of different wavelengths is insufficient only by changing the wavelength, the interference may be suppressed in a manner that the wavelength is more changed by changing the wavelength to suppress the interference and by adjusting the polarization component to suppress the interference. Further, for example, in a case where the distance in the x-axis direction (second direction) between the VCSELs of the wavelengths A and B is shorter than the distance in the y-axis direction (first direction) between the VCSELs of the wavelength A, the VCSEL capable of causing the interference of the emitted light may be the VCSEL arranged in the x-axis direction.
Therefore, in this case, the light source 20 is configured by the plurality of VCSELs having the polarization direction that is controlled such that the light intensity of the polarization component in the y-axis direction is smaller than the light intensity of the polarization component in the x-axis direction.
Similar to the second exemplary embodiment, in the example in
Similar to the second exemplary embodiment, the light source 20 may be configured to include VCSELs having different light emission timings instead of the wavelengths. Also in this case, the VCSELs in which the interference of the emitted light may occur may be VCSELs arranged in the x-axis direction.
Therefore, also in this case, the light source 20 is configured by the plurality of VCSELs having the polarization direction that is controlled such that the light intensity of the polarization component in the x-axis direction is smaller than the light intensity of the polarization component in the y-axis direction.
Next, a fourth exemplary embodiment will be described. The light emission section being the control target in which the interference of light is to be suppressed, in the fourth exemplary embodiment, is not the light emission section along the first direction or the second direction. In the second exemplary embodiment and the like, the example in which the VCSEL being the control target in which the interference of the emitted light is to be suppressed is along the first direction or the second direction has been described. In the fourth exemplary embodiment, an example in which a direction in which it is not possible to divide the direction in which the polarization component is adjusted into the first direction and the second direction will be described.
In the fourth exemplary embodiment, there are other light emitting elements between which the distance is longer than a distance between the light emitting elements in which the interference of light is intended to be suppressed by adjusting the polarization component. In other words, the distance between the light emitting elements in which the interference of light is intended to be suppressed by adjusting the polarization components is shorter than the distance to at least some of the other light emitting elements.
In the fourth exemplary embodiment, as illustrated in
In the example in
Also, in the example in
Although the exemplary embodiment has been described above, the technology of the present disclosure is not limited to the scope described in the above exemplary embodiments.
For example, in the present exemplary embodiment, the case where the three-dimensional shape of the measurement target is specified by measuring the distance to the measurement target has been described. For example, the three-dimensional shape of the measurement target may be specified only by detecting whether or not there is the measurement target within a predetermined distance.
In the present exemplary embodiment, the example of the light emitting element array in which a plurality of VCSELs are arranged in both the first direction and the second direction has been described. The technique disclosed may be applied to, for example, a light emitting element array having a configuration in which a plurality of VCSELs are arranged only in one direction. In addition, in the fourth exemplary embodiment, the example of the light emitting element array in which light emission sections consisting of a plurality of VCSELs are arranged in both the first direction and the second direction has been described. The technique disclosed may be applied to a light emitting element array having a configuration in which light emission sections are arranged only in one direction, for example, a light emitting element array configured by the light emission sections 24, 25, and 27 in the example in
Further, in the present exemplary embodiment, the example in which the technique disclosed is applied to the measurement apparatus that measures a three-dimensional shape has been described. The technique disclosed may also be applied to a configuration in which interference in a certain direction can be predicted in advance, among measurement apparatuses. For example, in a case where a distance to an obstacle in front of a vehicle during traveling is measured by attaching a measurement apparatus to the outer portion of the vehicle, and multipath from the road surface is a concern, a direction perpendicular to the road surface may be set to the first direction, and the horizontal direction with respect to the road surface may be set to the second direction, in consideration of an attachment direction in which the measurement apparatus is attached. With such a configuration, even in a case where the degree of reflection from the road surface, in particular, on a rainy day changes and the number of multipaths suddenly increases, the influence is suppressed.
Further, the technique disclosed may be applied to optical communication in which VCSELs are inserted into an optical waveguide such as an optical fiber. In a case where a plurality of VCSELs are inserted into separate optical fibers, the VCSELs inserted into the separate optical fibers may be regarded as light emitting elements in which the interference of light is suppressed. In this case, the polarization component may be controlled so that interference with other VCSELs inserted into the same optical fiber is less likely to occur.
In addition, the control unit 8 that measures the three-dimensional shape of the measurement target may be configured with a dedicated processor (for example, GPU: Graphics Processing Unit, ASIC: Application Specific Integrated Circuit, FPGA: Field Programmable Gate Array, programmable logic device, and the like), and may be incorporated in the optical device 3. In this case, the distance to the measurement target is measured by the optical device 3 alone.
In the present exemplary embodiment, the configuration in which the measurement program 16A is installed in the storage unit 16 has been described, but the present invention is not limited to this. The measurement program 16A according to the present exemplary embodiment may be provided in a mode in which the information processing program is recorded on a computer-readable storage medium. For example, the measurement program 16A according to the present exemplary embodiment may be provided in a form of being recorded in an optical disc such as a CD (Compact Disc)-ROM and a DVD (Digital Versatile Disc)-ROM, or semiconductor such as a universal serial bus (USB) memory and a memory card. Further, the measurement program 16A according to the present exemplary embodiment may be acquired from an external device via a communication line connected to the communication unit 14.
In the embodiments above, the term “processor” refers to hardware in a broad sense. Examples of the processor include general processors (e.g., CPU: Central Processing Unit) and dedicated processors (e.g., GPU: Graphics Processing Unit, ASIC: Application Specific Integrated Circuit, FPGA: Field Programmable Gate Array, and programmable logic device).
In the embodiments above, the term “processor” is broad enough to encompass one processor or plural processors in collaboration which are located physically apart from each other but may work cooperatively. The order of operations of the processor is not limited to one described in the embodiments above, and may be changed.
The foregoing description of the exemplary embodiments of the present invention has been provided for the purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise forms disclosed. Obviously, many modifications and variations will be apparent to practitioners skilled in the art. The embodiments were chosen and described in order to best explain the principles of the invention and its practical applications, thereby enabling others skilled in the art to understand the invention for various embodiments and with the various modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the following claims and their equivalents.
Number | Date | Country | Kind |
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2022-067689 | Apr 2022 | JP | national |