Field of the Invention
The present disclosure relates to a liquid discharge head that discharges liquid, a liquid discharge apparatus that includes the liquid discharge head, and a method of manufacturing the liquid discharge head.
Description of the Related Art
There is an ink jet printing apparatus, serving as an example of a liquid discharge apparatus, including a liquid discharge head in which energy-generating elements in the liquid flow paths are driven to add energy to liquid inside the liquid flow paths and liquid is discharged from discharge ports onto a printing medium. U.S. Pat. No. 7,837,887 discloses a method of forming liquid supply passages serving as through holes in a substrate of a liquid discharge head. In the above method, a wafer (a silicon substrate) that includes first and second flat surfaces is prepared, a plurality of first flow paths are formed from the first flat surface by etching, and a second flow path that is connected to the first flow paths is formed by etching from the second flat surface towards the first flat surface. The portions in which the first flow paths and the second flow path are connected to each other constitute liquid supply paths that penetrate the substrate. It is desirable to form the first flow paths and the second flow path by reactive ion etching (RIE) that is a type of dry etching since through holes perpendicular to the substrate can be formed using an etching gas. Typically, reactive ion etching is a method of forming a predetermined shape by introducing a reactant gas inside a process chamber and turning the reactant gas into plasma, and using the reactant gas turned into plasma to etch the treatment surface of the substrate. Specifically, the substrate is fixed to a lower electrode inside the process chamber with, for example, an electrostatic chuck and reactant gas is supplied from micropores of an upper electrode to which a high frequency power source is connected between the lower electrode. The supplied reactant gas is turned into plasma between the upper electrode and the lower electrode and etches the substrate such that a predetermined shape is formed.
As illustrated in
In an ink jet printing apparatus that is a type of liquid discharge apparatus, in order for high-speed recording, one may conceive of increasing the discharge frequency of the liquid discharge head. The upper limit of the discharge frequency is determined by the time (refill time) it takes for the liquid to be supplied to the liquid chamber 14 that leads to the discharge ports 17 and to be filled after discharge of liquid. As the refill time becomes shorter, recording can be performed with higher discharge frequency. Furthermore, it is considered that, in order to obtain a printed image with a high definition, it is effective to adopt a method that improves the resolution by making the volume of the discharged liquid small and narrowing the arrangement intervals of the discharge ports 17. In particular, discharge of uniform and small volume droplets and accurate application onto the printing medium are required. Conversely, as described above, when the lengths of the plurality of independent flow paths (first flow paths 12) are different, since each flow path resistance to the corresponding energy-generating element 15 from each individual flow path is different, it is difficult to stabilize the refill time and perform stable discharge of uniform and small volume droplets.
Accordingly, the present disclosure provides a liquid discharge head, a liquid discharge apparatus, and a method of manufacturing the liquid discharge head, in which variation in flow path resistance of flow paths that are connected to discharge ports are small.
The liquid discharge head of the present disclosure includes a substrate and an energy-generating element that is provided on a first surface side of the substrate and that generates energy to discharge liquid. The substrate is provided with a flow path that penetrates through the substrate from the first surface to a second surface that is a surface on another side and the flow path supplies the liquid from the second surface side to the first surface side. The flow path includes a plurality of first flow paths and a second flow path that is positioned on the second surface side with respect to the first flow paths. The plurality of first flow paths open on a bottom portion of the second flow path, and the plurality of first flow paths include a long flow path that is relatively long in a direction perpendicular to the first surface, and a short flow path that is relatively short in the direction perpendicular to the first surface. The long flow path has a flow path resistance per unit length that is smaller than a flow path resistance per unit length of the short flow path.
Further features of the present invention will become apparent from the following description of exemplary embodiments with reference to the attached drawings.
Hereinafter, exemplary embodiments of the present disclosure will be described with reference to the drawings.
A feature of the present disclosure is that among the plurality of first flow paths, a flow path resistance per unit length of each long flow path is smaller than the flow path resistance per unit length of each short flow path. In the present exemplary embodiment, in each of the first flow paths 12, an area (an opening area) in the first surface 11a is larger than a portion (the bottom portion of the second flow path 13) that is in communication with the second flow path 13. More specifically, each first flow path 12 is formed so that the sectional areas become, from a position that is near the energy-generating elements 15, gradually larger as the first flow path 12 is farther away from the energy-generating elements 15 (from the first surface 11a side towards the second surface 11b side).
As described above, since the second flow path 13 is formed so as to have a rounded shape, the plurality of first flow paths (independent flow paths) 12 include flow paths that are long and flow paths that are short in the direction perpendicular to the first surface 11a. If sectional areas of each of the first flow paths 12, the sectional areas extending in a direction parallel to the first surface 11a, are uniform from the first surface 11a side towards the second surface 11b side, then the flow path resistances in the long flow paths will be large and the flow path resistances in the short flow paths will be small. However, in the present exemplary embodiment, the area of each opening open in the bottom portion of the second flow path 13 is different according to the length of the corresponding first flow path 12. Specifically, while the areas of the openings of the plurality of first flow paths 12 in the first surface 11a (among the plurality of first flow paths 12) are practically the same, the areas of the openings of the long flow paths that open in the bottom portion of the second flow path are larger than those of the short flow paths. Accordingly, the flow path resistances between the long flow paths and the short flow paths can be kept small such that influence caused by variation in flow path resistances due to the difference in the lengths of the first flow paths (independent flow paths) 12 can be restrained from being exerted. As a result, refill time of each flow path can be stabilized and uniform and small volume droplets can be discharged in a stable manner.
In the present exemplary embodiment, in each of the long flow paths, the opening that is open in the bottom portion of the second flow path 13 is larger than the opening that is open in the first surface 11a. Furthermore, the sectional areas extending in the direction parallel to the first surface 11a become gradually larger from the first surface 11a side towards the second surface 11b side. A method of forming such flow paths by reactive ion etching will be described below with reference to
As illustrated in
In forming the flow paths, it is desirable that dry etching using an inductive coupling plasma (ICP) device is applied; however, other dry etching devices adopting other plasma source methods may be used. For example, dry etching using an electron cyclotron resonance (ECR) device or a magnetic neutral line discharge (NLD) plasma generating device may be performed.
In the case of a Bosch process, for example, SF6 gas can be used as the gas for etching, and, for example, C4F8 gas can be used as the coating gas. Typical etching conditions when forming flow paths are a gas pressure in the range of 0.1 Pa to 50 Pa and a gas flow rate in the range of 50 sccm to 1000 sccm for both the etching step and the coating step. Furthermore, by controlling the duration of the etching step in the range of 5 seconds to 20 seconds and the duration of the coating step in the range of 1 second to 10 seconds, flow paths with high perpendicularity can be formed.
On the other hand, in etching to gradually increase the sectional areas of the first flow paths 12, a step of proactively removing a side wall protection film formed by coating is introduced in the etching step. Specifically, adjustment of time and supply of power to the platen (an application of an electric charge to the platen 2) are included. For example, the etching time is increased by 10% or more with respect to the above-described conditions for forming the flow paths with high perpendicularity, and during the etching time, power in the range of 50 W to 200 W is applied to the platen. By applying power to the platen, ions can be attracted to the substrate 11 (the object to be etched) and the coated side wall protection film can be proactively removed. By performing etching and the like under such etching conditions, the first flow paths 12 are each formed with a shape having sectional areas that become gradually larger. Note that in the present disclosure, not only through control of the duration of the etching step and the power to the platen, the desired etching can be carried out through control of parameters, such as the gas pressure, the gas flow rate, and the coil power. Furthermore, the conditions of the coating step can be changed to make the side wall protection film thinner.
Subsequently, specific conditions of a non-Bosch process in which the side walls are protected during etching will be described. In the above case, SF6 gas and O2 gas can be used. In the case of the non-Bosch process, etching and coating are not repeated alternately, but etching is performed while having a byproduct of the etching adhere on the side walls; accordingly, although the perpendicularity is inferior to that of the Bosch process, a virtually perpendicular etching can be performed. Etching can be performed by controlling the gas pressure in the range of 0.1 Pa to 50 Pa and the gas flow rate in the range of 50 sccm to 1000 sccm. In the present exemplary embodiment, etching conditions that increases the etching in the side wall direction will be employed. Specifically, by creating a low vacuum in which the gas pressure is 5 Pa or under, the gas that contributes to the etching is dispersed more such that etching in the side wall direction is performed. Note that in the present disclosure, not only through control of the gas pressure, the desired etching can be carried out through control of parameters, such as the gas flow rate, the coil power, and the power to the platen.
In the exemplary embodiment described above, an exemplification of a form in which, among the first flow paths 12, the sectional areas of each of the long flow paths, the sectional areas extending in the direction parallel to the first surface 11a, become gradually larger from the first surface 11a side towards the second surface 11b side has been given; however, all of the first flow paths 12 do not have to have the above form. For example, as illustrated in
Such flow paths are formed in the following manner, for example. The substrate 11 is first perpendicularly etched from the first surface 11a and at the point when the shortest first flow path 12 comes in communication with the second flow path 13, the etching conditions are changed such that the sectional areas of the first flow paths 12 become gradually larger. Consequently, each long first flow path 12 can be formed so as to include the first portion 12a that extend from the first surface 11a in which the sectional areas are uniform, and the second portion 12b, including the connection portion with the second flow path 13, in which the sectional areas increase. In the above, among the first flow paths 12, the short flow paths extend from the first surface 11a side towards the second surface 11b side such that the sectional areas of each short flow paths extending in the direction parallel to the first surface 11a are practically the same.
With such a form, since the sectional area is larger at the portion of each long first flow path 12 where the length exceeds the short first flow paths 12, it is relatively easy to adjust the sectional area so that the variation in the flow path resistance due to difference in length is reduced. Furthermore, in the present exemplary embodiment, since the portions where the areas of the openings are uniform on the first surface 11a side are large, there is no need to have a wide interval between the adjacent first flow paths 12 and the restriction in design is small.
Detection of the shortest first flow path 12 coming in communication with the second flow path 13 is performed with a photosensor, for example. In other words, light that is emitted when etching is performed to form the first flow paths 12 is captured, and the reduction in the amount of emitted light during etching due to decrease in the etching area of the substrate 11 caused by a portion of the first flow paths 12 coming in communication with the second flow path 13 is detected. As described above, recognition can be made that the shortest first flow path 12 has come in communication with the second flow path 13 when the amount of emitted light due to etching starts to decrease.
Etching conditions when forming the first flow paths 12 are a gas pressure in the range of 0.1 Pa to 50 Pa and a gas flow rate in the range of 50 sccm to 1000 sccm for both the etching step and the coating step. Until the shortest first flow path 12 comes in communication with the second flow path 13, the duration of the etching step is controlled so as to be in the range of 5 seconds to 20 seconds and the duration of the coating step is controlled so as to be in the range of 1 second to 10 seconds so as to perform etching with a high perpendicularity. In other words, etching is started under etching conditions in which the sectional areas become uniform. Then, at the point when the shortest first flow path 12 comes in communication with the second flow path 13, a step of proactively removing a side wall protection film formed by coating is introduced in the etching step. For example, the etching time is increased by 10% or more with respect to the condition for forming the flow paths with high perpendicularity, and during the etching time, power in the range of 50 W to 200 W is applied to the platen. In other words, at a point when at least one first flow path 12 comes in communication with the second flow path 13, the etching conditions are changed so that the sectional areas of the first flow paths 12 become larger, and etching is continued.
In
A case in which the second flow path 13 has a rounded shape has been described above; however, the present disclosure is not limited to the above. For example, even in a case illustrated in
Note that the flow path resistance per unit length is the flow path resistance per same length (unit length) of each of the flow paths with different lengths. Accordingly, in the present disclosure, while the flow path resistance of the entire flow paths is made uniform as much as possible, since the lengths of the flow paths are different between the flow paths, the flow path resistance per unit length of each of the flow paths is different.
The form illustrated in
The etching mask to form the first flow paths 12 may, for example, have a shape illustrated in
The etching mask that forms the first flow paths 12 may have another form (a fifth example) illustrated in
The shapes of the openings for forming the first flow paths 12 in the etching mask forming the first flow paths 12 may be other than a rectangular shape and, for example, may be applied to a form (a sixth example) illustrated in
When the liquid discharge head 4 including the substrate 11 in which the flow paths 12 and 13 are formed with the method described above is manufactured, since the flow path resistance of the flow paths substantially coincide with each other, the refill time can be short in a stable manner and, further, the volume of the discharged droplets can be small in a stable manner.
The present disclosure is capable of making the refill time of liquid after discharge of liquid uniform and, further, is capable of making the volume of the discharged liquid uniform. Accordingly, a further stable discharge of liquid can be achieved and an image with a definition that is further higher and that has high quality can be formed.
While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
This application claims the benefit of Japanese Patent Application No. 2014-248865, filed Dec. 9, 2014, Japanese Patent Application No. 2015-004961, filed Jan. 14, 2015, and Japanese Patent Application No. 2015-179320, filed Sep. 11, 2015, which are hereby incorporated by reference herein in their entirety.
Number | Date | Country | Kind |
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2014-248865 | Dec 2014 | JP | national |
2015-004961 | Jan 2015 | JP | national |
2015-179320 | Sep 2015 | JP | national |
Number | Name | Date | Kind |
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7837887 | McReynolds | Nov 2010 | B2 |
20100208010 | Inoue | Aug 2010 | A1 |
Number | Date | Country | |
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20160159094 A1 | Jun 2016 | US |