Patent Application
20240109303
The present disclosure relates to a liquid ejection apparatus having a function to determine the liquid ejection state of a liquid ejection head, and an ejection state determination apparatus.
A thermal inkjet method is known as a liquid ejection method used by a liquid ejection head mounted on a liquid ejection apparatus such as an inkjet printing apparatus. In the thermal inkjet method, heat is applied to liquid to cause film boiling, and the force of the bubble generation is utilized to eject the liquid from ejection ports.
Such a liquid ejection head may experience non-ejection or an ejection failure of liquid (ink) due to, e.g., clogging of ejection ports or change in the wettability of the surfaces of the ejection ports. In this case, it is preferable that a recovery operation for recovering the ejection state or the like be executed immediately. To this end, it is required that the ejection state of the liquid ejection head be determined accurately and speedily.
Against this backdrop, Japanese Patent Laid-Open No. 2008-000914 proposes a method for determining the ejection state by detecting whether there is a point of change (a characteristic point) in the rate of decrease of temperature detected by temperature detection elements during ejection operation, the temperature detection elements being provided for the respective print elements inside a print element board. However, the sensitivities of temperature sensors may change due to temporal change of the temperature detection elements or change in the state of a protective film for the print elements.
Japanese Patent Laid-Open No. 2019-171673 discloses a technique for accommodating fluctuations in an output from a temperature detection element due to temporal change or the like. In Japanese Patent Laid-Open No. 2019-171673, the print elements are driven by application of two types of pulses: a first pulse for ejecting liquid and a second pulse for not ejecting liquid. Then, outputs outputted from the temperature detection element in an event where the print element is driven by the respective pulses are measured, and based on the measurement results, a threshold for determining the ejection state of the liquid ejection head is updated.
In the ejection state determination method described in Japanese Patent Laid-Open No. 2019-171673, because a value which would be outputted from a temperature detection element by application of the first pulse in a case where an ejection failure is occurring is unknown, a threshold for ejection state determination is set to a value lowered by a certain value from a value outputted from the temperature detection element in a state where liquid is ejected. For this reason, depending on the setting of the certain value, the accuracy of the ejection state determination may be low in a case where there is variability in outputs from the temperature detection elements due to manufacturing variability or the like.
Thus, the present disclosure aims to provide a technique for properly determining the ejection state of a liquid ejection head while reducing influence by manufacturing variability in the liquid ejection head.
In a first aspect of the present invention, there is provided a liquid ejection apparatus including a liquid ejection head having a heat generating resistance element, a temperature detection element that detects temperature corresponding to the heat generating resistance element, and an ejection port provided in correspondence with the heat generating resistance element, the liquid ejection apparatus being configured to eject liquid from the ejection port by driving the heat generating resistance element, the liquid ejection apparatus comprising: an output unit configured to output a value in accordance with a detection output from the temperature detection element; a threshold setting unit configured to set a determination threshold for determining an ejection state of the liquid ejection head using first energy, the determination threshold being set based on a first output value outputted from the output unit in a case where the heat generating resistance element is driven with the first energy in an ejection state in which the liquid is ejected from the ejection port and a second output value estimated to be outputted from the output unit assuming the heat generating resistance element is driven with the first energy in a non-ejection state in which the liquid is not ejected; and a determination unit configured to determine the ejection state by comparing an output value outputted from the output unit in a case where the heat generating resistance element is driven with the first energy with the determination threshold, wherein the threshold setting unit estimates the second output value by using a plurality of output values outputted from the output unit in the non-ejection state in a case where the heat generating resistance element is driven with a plurality of levels of energy.
In a second aspect of the present invention, there is provided an ejection state determination apparatus for determining an ejection state of a liquid ejection head having a heat generating resistance element, a temperature detection element that detects temperature corresponding to the heat generating resistance element, and an ejection port provided in correspondence with the heat generating resistance element, the liquid ejection head being configured to eject liquid from the ejection port by driving of the heat generating resistance element, the ejection state determination apparatus comprising: an output unit configured to output a value in accordance with a detection output from the temperature detection element; a threshold setting unit configured to set a determination threshold for determining the ejection state of the liquid ejection head using the first energy, the determination threshold being set based on a first output value outputted from the output unit in a case where the heat generating resistance element is driven with first energy in an ejection state in which the liquid is ejected from the ejection port and a second output value estimated to be outputted from the output unit assuming the heat generating resistance element is driven with the first energy in a non-ejection state in which the liquid is not ejected; and a determination unit configured to determine the ejection state by comparing an output value outputted from the output unit in a case where the heat generating resistance element is driven with the first energy with the determination threshold, wherein the threshold setting unit estimates the second output value by using an output value outputted from the output unit in an event where the heat generating resistance element is driven with second energy in the non-ejection state and a relation between output values outputted from the output unit in an event where the heat generating resistance element is driven and values of energy used to obtain the respective output values, which is measured in advance in the non-ejection state.
Further features of the present invention will become apparent from the following description of exemplary embodiments with reference to the attached drawings.
Embodiments of the present invention are described in detail below with reference to the drawings attached hereto. Note that the embodiments below are not intended to limit the present invention according to the scope of claims, and not all the combinations of the features described in the present embodiments are necessarily essential as solutions of the present invention.
Also, although an inkjet printing apparatus is described below as an example of an embodiment of a liquid ejection apparatus of the present disclosure, the liquid ejection apparatus is not limited to a printing apparatus. The liquid ejection apparatus may be, for example, a single-function printer having only a print function or a multifunctional printer having a plurality of functions such as a print function, a fax function, and a scanner function. Also, the liquid ejection apparatus may be, e.g., a manufacturing apparatus for manufacturing a color filter, an electronic device, an optical device, a microstructure, or the like using a predetermined printing method, or a microbubble generation apparatus.
Also, the term “print” as used in the descriptions below may be not only for forming meaningful information such as text or graphics, but also for unmeaningful information. The term “print” may also broadly represent forming an image, a design, a pattern, a structure or the like on a print medium or processing a medium, irrespective of whether it is tangible to be visually perceived by humans. Also, a “printing medium” is not only paper used for typical printing apparatuses, but also any medium that can receive ink, such as fabric, a plastic film, a metal plate, glass, ceramics, resin, wood, or leather.
Further, “ink” should be interpreted broadly like the above-described “print” should. Thus, “ink” is liquid that can be used for formation of an image, a design, a pattern, or the like, processing of a print medium, or processing of ink (e.g., coagulation or insolubilization of a coloring material in ink applied to a printing medium) by being applied onto a printing medium. Also, an “ejection element part” refers collectively to a liquid ejection port, a liquid channel communicating with the ejection port, an element for generating heat energy for ejecting the liquid (a heat generating resistance element), and a driving circuit therefor, unless otherwise noted.
A print element board for a print head used below does not simply refer to a base made of silicon semiconductor, but refers to a structure having the elements, wiring, and the like.
A liquid ejection head exemplified in the present embodiments is what is called a line-type head having a length corresponding to the width of a printing medium, but the present disclosure can also be applied to what is called a serial printing apparatus that performs printing while scanning the printing medium. Examples of the configuration of a serial-type liquid ejection head include one in which a print element board for black (Bk) ink and a print element board for each color ink are mounted, but the present disclosure is not limited to this. A mode may be employed in which a short print head having a plurality of print element boards for the respective ink colors disposed to overlap in an ejection port arrangement direction is scanned relative to a printing medium.
Also, the print head 3 includes the print element boards 10, signal input terminals 91 electrically connected to the print element boards 10 via an electric wiring substrate 90 and flexible wiring substrates 40, and power supply terminals 92. The signal input terminals 91 and the power supply terminals 92 are electrically connected to a control unit of the printing apparatus 1000 and supply the print element board 10 with ejection drive signals and power needed for the ejection, respectively. Wiring aggregation by electric circuits in the electric wiring substrate 90 makes it possible to have less signal input terminals 91 and power supply terminals 92 than the print element boards 10. This reduces the number of electric connections that need to be attached and detached at the time of attaching the print head 3 to the printing apparatus 1000 or replacing the print head.
Also, the printing medium 2 is conveyed by rotation of two conveyance rollers provided at a distance of a length F from each other in the conveyance direction.
Details of the control configuration are described below. In the controller unit 410, the main controller 401 formed of a CPU controls the entire printing apparatus 1000 in accordance with programs and various parameters stored in a ROM 407, while using a RAM 406 as work area. For example, in response to input of a print job from a host apparatus 400 via a host I/F 402 or a wireless I/F 403, an image processing unit 408 performs predetermined image processing on received image data as instructed by the main controller 401. Then, the main controller 401 transmits the image data resulting from the image processing to the print engine unit 417 via a print engine I/F 405.
Note that the printing apparatus 1000 may obtain image data from the host apparatus 400 via wireless or wired communications or may obtain image data from an external storage apparatus (such as a USB memory stick) connected to the printing apparatus 1000. A communication method used for the wireless or wired communications is not limited to a particular one. Examples of a communication method usable for wireless communications include Wireless Fidelity (Wi-Fi) (registered trademark) and Bluetooth (registered trademark). Also, Universal Serial Bus (USB) or the like is usable as a communication method used for wired communications. Also, for example, in response to input of a scan instruction from the host apparatus 400, the main controller 401 transmits this instruction to the scanner engine unit 411 via a scanner engine I/F 409.
An operation panel 404 is a unit for a user to input/output information to/from the printing apparatus 1000. Via the operation panel 404, a user can instruct an action such as copy or scan, configure print mode settings, or check information on the printing apparatus 1000.
In the print engine unit 417, the print controller 419 formed of a CPU controls various mechanisms of the print engine unit 417 in accordance with programs and various parameters stored in a ROM 420, while using a RAM 421 as a work area. For example, the print controller 419 has a function to set threshold setting data Ddth for determining the liquid ejection state of the print head 3. Thus, the print controller 419 implements a function as a threshold setting unit of the present disclosure together with a shift register 941, a latch circuit 942, a digital-to-analog converter (DAC) 943, and the like, which will be described later with reference to
Upon receipt of various commands and image data via a controller I/F 418, the print controller 419 saves them in the RAM 421 temporarily. In order for the print head 3 to be used for a print operation, the print controller 419 causes an image processing controller 422 to convert the saved image data into print data. Once the print data is generated, the print controller 419 causes, via a head I/F 427, the print head 3 to execute a print operation based on the print data. In this event, the print controller 419 conveys the printing medium 2 by driving conveyance rollers 81, 82 via a conveyance control unit 426. As instructed by the print controller 419, the print head 3 executes a print operation in conjunction with the operation of conveying the printing medium 2, and print processing is thereby performed.
A head carriage control unit 425 changes the direction and position of the print head 3 according to the maintenance status or the operation status, such as print status, of the printing apparatus 1000. An ink supply control unit 424 controls the liquid supply unit 220 so that the pressure of the ink supplied to the print head 3 may fall within a proper range. While a maintenance operation is performed for the print head 3, a maintenance control unit 423 controls the operations of a cap unit and a wiping unit in a maintenance unit (not shown).
In the scanner engine unit 411, the main controller 401 controls the hardware resources of a scanner controller 415 in accordance with the programs and various parameters stored in the ROM 407, while using the RAM 406 as a work area. The various mechanisms of the scanner engine unit 411 are thereby controlled. For example, via a controller I/F 414, the main controller 401 controls the hardware resources in the scanner controller 415 to convey an original placed by a user on an ADF (not shown) via a conveyance control unit 413 and scan the original with a sensor 416. Then, the scanner controller 415 saves the scanned image data in a RAM 412.
Note that, by converting the thus-obtained image data into print data, the print controller 419 can cause the print head 3 to execute a print operation based on the image data scanned by the scanner controller 415.
The configuration of the print element board 10 of the present embodiments is described.
As shown in
As shown in
As shown in
Next, the internal structure of the print element board 10 and the flow of ink in the print element board 10 are described with reference to
An example of the printing apparatus and an example of the print head 3 of the embodiments of the present disclosure have thus been described above. The printing apparatus and the print head 3 described above are applied to the first to fifth embodiments to be described below.
As shown in
Then an interlayer insulating film 906, such as SiO, is provided as an upper layer of the temperature detection element 905 and the insulating film PSG 903. Provided on the interlayer insulating film 906 are the heater 15 which is TaSiN or the like and performs electrothermal conversion and AL2 wiring 908 which connects the heater 15 to a drive circuit formed on the Si substrate 901. Further, a passivation film 909 formed of SiO2 and the like is provided on the AL2 wiring 908, and an anti-cavitation film 910 which is Ta, Ir, or the like and improves the anti-cavitation property on the heater 15 is provided on the passivation film 909.
As shown in
Although the temperature detection element 905 shown in
Next, profiles of temperature detected by the temperature detection element 905 upon application of an application voltage for ink ejection to the heater 15 is described with reference to
As shown in
Meanwhile, the temperature detection element 905 is formed of a thin-film resistor and is connected to a constant current source 944 and switch elements 947, 948. Once a sensor selection signal SE becomes ON (High active), the switch elements 947, 948 close, applying a constant current Iref from the constant current source 944 to the temperature detection element 905. At the same time, a voltage signal across the temperature detection element 905 is inputted to a differential amplifier 950. Meanwhile, once the sensor selection signal SE becomes OFF (Low), the switch elements 947 and 948 open, shutting off both the application of the constant current Iref to the temperature detection element 905 and the input of the voltage signal across the temperature detection element 905 to the differential amplifier 950.
For example, the constant current Iref can be set in 32 stages with 0.1-mA increments between 0.6 mA to 3.7 mA. Hereinafter, a set width in one stage is called one rank. For the range of 32 ranks, a set value Diref for the constant current Iref is defined as a 5-bit digital value. This set value Diref is transferred to the shift register 941 in synchronization with a clock signal (not shown). Then, the set value Diref is latched by the latch circuit 942 at the timing of a latch signal (not shown) and is outputted to the current-output-type digital-to-analog converter (DAC) 943.
The output signal from the latch circuit 942 is held until the next latch timing, and in the meantime, the next set value Diref is transferred to the shift register 941. An output current Irefin from the digital-to-analog converter (DAC) is inputted to the constant current source 944 and is outputted as the constant current Iref after being amplified, for example, 12-fold.
A resistance value Rs of the temperature detection element 905 at a temperature T changes depending on a temperature change in accordance with the amount of heat generated by the temperature detection element 905. More specifically, the resistance value Rs of the temperature detection element 905 is expressed by the following Formula 1:
Rs=Rs0{1+TCR(T−T0)} (Formula 1)
where T0 is a room temperature, Rs0 is a resistance value at the room temperature T0, and TCR is a temperature resistance coefficient for the temperature detection element 905.
Once the constant current Iref is applied to the temperature detection element 905, a differential voltage VS is generated across the temperature detection element 905. This differential voltage VS is expressed by the following Formula 2:
VS=Iref−Rs=Iref−Rs0{1+TCR(T−T0)}. (Formula 2)
The differential voltage VS is inverted and inputted to the differential amplifier 950. Then, in that state, an output voltage Vdif becomes a negative voltage equal to or below a ground voltage GND, and actually, the output voltage Vdif from the differential amplifier 950 becomes 0 V and is fed back to the negative terminal of an operational amplifier inside the differential amplifier 950. In this case, an unexpected signal would be outputted from the differential amplifier 950. To avoid this, an offset voltage Vref which is sufficient to make the output Vdif reach or exceed the ground voltage GND is applied from a constant voltage source 951 to the differential amplifier 950.
As shown in
The output voltage Vdif of the differential amplifier 950 showing such a change is next inputted to a filter circuit 952. The filter circuit 952 is a circuit for converting the maximum gradient at the temperature drop of the output voltage Vdif from the differential amplifier 950 into a peak value. This filter circuit 952 is formed by a band-pass filter (BPF) 952 having a secondary low-pass filter and a primary high-pass filter that are cascade-connected to each other. The low-pass filter of the band-pass filter 952 attenuates high-frequency noise which is on the higher side than a cutoff frequency fcL, and the high-pass filter extracts a gradient at the temperature drop by performing first-order differentiation on frequencies lower than a cutoff frequency fcH, and removes a direct-current component. As a result of this signal processing by the filter circuit 952, the filter circuit 952 outputs a signal VF which serves as the basis for a signal Vinv for determining whether the print head 3 is in a normal ejection state or in a non-ejection state.
Note that because this signal VF too might become a negative voltage equal to or below the ground voltage GND, as described earlier, an offset voltage Vofs which is sufficient to make the signal VF reach or exceed the ground voltage GND is applied from a constant voltage source 953 to the positive terminal of the filter circuit 952.
Because signals with lower frequencies have been attenuated by the high-pass filter to decrease the output voltage, the output signal VF from the filter circuit 952 is amplified by an inversion amplifier (INV) 954 which is an output unit provided at a later stage. Because the inversion amplifier 954 inverts the inputted signal VF which is a positive voltage and makes the inputted signal VF a negative voltage, an offset voltage is applied to increase the voltage of the output signal Vinv, as with the filter circuit 952.
In this event, an output from the constant voltage source that applies the offset voltage Vofs to the filter circuit 952 is branched off to apply the same offset voltage Vofs to the inversion amplifier 954 as well. As a result, the output signal Vinv from the inversion amplifier 954 is as expressed by the following Formula 3:
Vinv=Vofs+Ginv(Vofs−VF) (Formula 3)
where Ginv is the rate of amplification by the inversion amplifier 954.
The output signal Vinv from the inversion amplifier 954 is inputted to the positive terminal of a comparator 955. The comparator 955 compares the output signal Vinv inputted to the positive terminal with a threshold voltage Dth inputted to the negative terminal, and outputs a determination signal CMP which is effective in a case where Vinv>Dth. In this way, the comparator 955 has a function as a determination unit that determines the ejection state of the print head 3.
For example, the threshold voltage Dth can be set in the range of 256 ranks, with 8-mV increments between 0.5 V to 2.54 V. For the range of 256 ranks, a set value Ddth for the threshold voltage Dth can be expressed as a 8-bit digital value. This set value Ddth is transferred to a shift register (SR) 961 in synchronization with a clock signal (not shown). Then, the output from the shift register 961 is latched by the latch circuit 962 at the timing of a latch signal (not shown) and then outputted to a voltage-output-type digital-to-analog converter (DAC) 963. The output signal from the latch circuit 962 is held until the next latch timing, and in the meantime, the next set value Ddth is transferred to the shift register 961.
The peak voltage Vp of the output voltage Vinv from the inversion amplifier 954 is detected using the comparator 955 in the procedure described below. First, in the first latch period of the latch circuit 942, a constant current Iref0 (e.g., 1.6 mA) is applied to the temperature detection element 905, the constant current Iref0 corresponding to a reference set value Diref0 transferred to the shift register 941 connected at the constant current source 944 side. Then, in this state, a pulsed application voltage (hereinafter also referred to as a drive pulse) is applied to the heater 15. Note that the application of the drive pulse to the heater 15 is performed by turning on and off of the switch element 946 connected to the constant voltage source 945. In this event, a reference set value Ddth0 corresponding to the threshold voltage Dth0 serving as a reference is inputted to the comparator 955 to be compared with the peak voltage Vp of the output voltage Vinv from the inversion amplifier 954. Then, once the comparator 955 outputs a determination pulse CMP, the rank of Dth is raised by one for the next latch period, and the comparison with the peak voltage of the output voltage Vinv from the inversion amplifier 954 is similarly performed.
The above operation is repeated until the determination pulse CMP is not outputted from the comparator 955, and the last rank of the threshold voltage Dth at which the determination pulse CMP was outputted is set as the peak voltage Vp. For example, in order to detect the peak voltage Vp in the normal ejection state shown in
Meanwhile, in a case where the determination pulse CMP is not outputted in the first latch period, the rank of Dth is lowered by one for the next latch period, and the comparison with the peak of Vinv is similarly performed. This is repeated until the determination pulse CMP is outputted, and the rank of Dth at which the determination pulse CMP was outputted is set as a peak voltage Vp. In the example of normal ejection in
Here, in a case where energy not reaching the minimum ejection enabling energy is applied to the heater 15, bubble generation caused by the heater 15 is insufficient, causing the non-ejection state where no droplet is ejected. By contrast, in a case where the application energy applied to the heater 15 reaches the minimum ejection enabling energy, the force of bubble generation enables a droplet to be ejected.
As shown in
Meanwhile, in the non-ejection state, a characteristic point does not appear as shown in
As shown in
Utilizing such nature, the present disclosure sets the threshold voltage Dth by estimating the peak voltage Vp in the non-ejection state and thus making it less likely for the accuracy of ejection failure detection to be low even with variability in sensor sensitivity.
As described earlier, the ejection state of the print head 3 is detected by setting the threshold voltage Dth between the peak voltage Vp in the normal ejection state and the peak voltage Vp in the non-ejection state and comparing the threshold voltage Dth with the peak voltage Vp outputted upon application of application energy for performing an ejection operation to the heater 15. Thus, unless the threshold voltage Dth is set to a proper value between the peak voltage Vp in the normal ejection state and the peak voltage Vp in the non-ejection state, the accuracy of ejection state detection will be low. Note that in the description below, application energy which, by being applied to the heater 15, enables liquid to be normally ejected from an ejection port with the heater 15, its drive circuit, and the ejection port being in a state of being capable of ejecting liquid normally is referred to as ejection enabling energy.
The temperature detection element 905 and the detection circuit used for the ejection state detection have various types of manufacturing variability, and thus, the peak voltage Vp varies even with the same ejection state. For example, the peak voltage Vp varies due to variability in the temperature properties of the temperature detection element 905 itself or in the amplification factor of the inversion amplifier (INV). For this reason, it is preferable that the ejection state be detected with a proper threshold voltage Dth being set for each print element board, each ejection state detection circuit, and each print element.
However, in prior art shown in Japanese Patent Laid-Open No. 2019-171673, in the setting of the threshold voltage Dth, the threshold voltage Dth for the non-ejection state is unknown, and therefore the ejection state determination is performed by setting the threshold voltage Dth to a value lowered by a certain value from the peak voltage Vp in the normal ejection state. In this event, in a case where the certain value by which the value is lowered from the peak voltage Vp in the normal ejection state is too large or too small, the ejection state determination may fail to be determined properly.
For example, in a case where due to manufacturing variability or the like, the amplification factor of the inversion amplifier 954 or an output value from the temperature detection element 905 is smaller than a proper value, the peak voltage Vp in the normal ejection state is closer to the peak voltage Vp in the non-ejection state. In a case where the certain value by which the value is lowered from the peak voltage Vp for the normal ejection state is too large, it is possible to determine a complete non-ejection state, but there is a possibility that a state having an ejection failure, such as liquid being ejected taking a curving course or ejected at a low speed, may be determined as normal ejection.
Also, conversely, in a case where the certain value by which the value is lowered from the peak voltage Vp in the normal ejection state is too small, there is a possibility that a normal ejection state may be determined as non-ejection. Specifically, in a case where due to manufacturing variability, the amplification factor of the inversion amplifier 954 or the temperature property of the temperature detection element 905 is larger than a proper value, the peak voltage Vp increases. Thus, in a case where the certain value by which the value is lowered from the peak voltage Vp is small, even in the normal ejection state, the peak voltage Vp falls short of the threshold voltage Dth which is set based on the above certain value, which leads to normal ejection being erroneously determined as non-ejection.
For this reason, the present embodiment estimates the peak voltage Vp in the non-ejection state by using the nature of the peak voltage Vp in the non-ejection state being distributed on a regression line as described earlier. Thus, the peak voltage Vp in the ejection state and the peak voltage Vp in the non-ejection state can be known. Consequently, the difference between the peak voltage Vp in the ejection state and the peak voltage Vp in the non-ejection state can be accurately calculated, and this difference can be used to estimate the state of manufacturing variability in the target print element (heater) 15. Then, the threshold voltage Dth is set according to the manufacturing variability in the heater 15 and the like, which makes it less likely for the accuracy of ejection state determination to be low even in a case where there is manufacturing variability in the inversion amplifier 954, the temperature detection element 905, or the like.
In the present embodiment, in order to set the threshold voltage Dth, first, a non-ejection state is forcibly created for the target ejection port. Then, in S801, application energy applied to the heater 15 is set to any application energy E1, the application energy E1 is used to drive the heater 15, and the peak voltage Vp of an output value from the inversion amplifier 954 is measured. The application energy E1 used here is also called second energy to be contrasted with first energy to be described later. The measurement of this peak voltage Vp is performed as described earlier. Specifically, while changing the threshold voltage Dth inputted to the negative terminal of the comparator 955, the threshold voltage Dth is compared with the output signal Vinv outputted from the inversion amplifier 954, and the threshold voltage at which the determination signal CMP is outputted is set as a peak voltage. Hereinbelow, the peak voltage Vp outputted from the inversion amplifier 954 upon application of the application energy E1 to the heater 15 is denoted as Vp_E1.
The non-ejection state may be created with any method as long as a tail of an ejected droplet does not fall onto the heater 15. For instance, the ejection port 13 may be covered up, or the surface of the ejection port 13 may be filled with a large amount of ink. Examples of the method for covering up the surface of the ejection port 13 include attaching a tape to the ejection port as described above or bringing a film, rubber, resin, or the like into close contact with the surface of the ejection port 13 to cover it. Examples of the method for filling the surface of the ejection port 13 with a large amount of ink include covering the print element board 10 with a cap which is made of resin, rubber, or the like and is filled inside with liquid such as ink, cleaning liquid, or the like.
After the measurement of the peak voltage Vp_E1, through S802 and S803, processing is performed to calculate (estimate) a peak voltage Vp (Vp_ft) outputted upon application of ejection enabling energy Ed for actually determining the ejection state to the heater 15 in the non-ejection state. This ejection enabling energy Ed is also referred to as first energy. In other words, processing to calculate the peak voltage Vp (Vp_ft) estimated to be outputted assuming the first energy is applied to the heater 15 in the non-ejection state is performed through S802 and S803. What is needed to calculate the peak voltage Vp (Vp_ft) is, as described earlier, the slope of a regression line indicating the relation between the application energy E and the peak value Vp in the non-ejection state. To this end, first in S802, information on the slope of a regression line is read. Next in S803, a regression line is calculated using the slope previously read and the peak voltage Vp_E1 measured in S801. Then, also in S803, this regression line is used to calculate (estimate) the peak voltage Vp (Vp_ft) to be outputted assuming the first energy is applied to the heater 15 in the non-ejection state. Note that as the regression line slope information, a value measured in advance is saved in a storage region such as EEPROM in the print head 3 or a storage region in the inkjet printing apparatus 1000. The measurement of the regression line slope can be performed at the time of, for example, manufacturing of the print head 3. Alternatively, at the start of use of the inkjet printing apparatus 1000, the measurement can be performed on the printing apparatus 1000. In either case, the measurement of the slope is done prior to the processing shown in the flowchart in
After the estimation of the peak voltage Vp_ft in the non-ejection state, the processing proceeds back to the flowchart shown in
If it is determined in S805 that liquid is being ejected, in the present embodiment, the threshold voltage Dth is determined using a reference table which is prepared in advance and has a plurality of combinations of the difference (Vp_d−Vp_ft) and the threshold voltage Dth.
Because the difference between Vp_d in the ejection state and Vp_ft in the non-ejection state which is set accurately based on the regression line is calculated in this way, it is possible to accurately estimate the state of manufacturing variability of the temperature detection element corresponding to the target print element. Specifically, in a case where the difference between Vp_d and Vp_ft is small, it is possible to estimate that Vp's sensitivity to a temperature change is low due to manufacturing variability, and in a case where the difference is large, it is possible to estimate that Vp's sensitivity to a temperature change is high. Setting the threshold voltage Dth according to the estimated variability of the print element can make it less likely for the accuracy of the ejection state detection to be low even in a case where there is manufacturing variability in the inversion amplifier (INV), the temperature detection element 905, or the like.
Note that, to estimate the peak voltage Vp_ft to be outputted by the ejection enabling energy Ed (the first energy) in the non-ejection state, the present disclosure uses not the ejection enabling energy Ed (the first energy) which is actually used, but the ejection enabling energy E1 (the second energy). The merits of this approach are described below. In general, after some time of using the print head 3, ink may be burnt and stick to the heater 15, or the anti-cavitation film 910 may wear out. Then, even with the same energy applied, the amount of heat transmitted from the heater 15 to ink changes. Because the amount of heat transmitted to ink is important in ink ejection, it is necessary to change the energy to apply so that a proper amount of heat may be transmitted to ink at all times. In changing the energy as described above, the peak voltage Vp_ft to be outputted in the non-ejection state by newly-set energy can be estimated from the output Vp_E1 obtained by the previous energy and the slope of a regression line. Thus, there is a merit of being able to omit the measurement of the peak voltage Vp_ft outputted by the newly-set energy.
Next, a second embodiment of the present disclosure is described. The second embodiment described below enables the measurement of the peak voltage Vp_E1 in the first embodiment to be carried out in a simpler way. In the first embodiment, in measurement of the peak voltage Vp_E1, a non-ejection state is created forcibly by, e.g., covering up the surface of the ejection port 13. However, this requires a mechanical action of covering up the ejection ports 13 and therefore takes time for the measurement. Thus, the second embodiment makes it possible to measure the peak voltage Vp_E1 without performing a mechanical action. Specifically, a non-ejection state is created by setting the ejection enabling energy to a value below the minimum ejection enabling energy, and this allows Vp_E1 to be measured in a shorter time.
As described above, in a case where the application energy E is below the minimum ejection enabling energy (E<1.00), the print head 3 is in a non-ejection state. For this reason, no characteristic point appears on the voltage Vdif outputted from the inversion amplifier 954, and therefore, the amount of change of the peak voltage Vp relative to the ejection enabling energy E is small, as shown in
Also, the broken line RL in
Using the nature described above, the present embodiment estimates, from the peak voltage Vp for E<1.00, the peak voltage Vp to be outputted upon application of the application energy E of 1.00 or above in the non-ejection state and sets the threshold voltage Dth based on the estimated peak voltage Vp in the non-ejection state. This makes it less likely for the accuracy of ejection failure determination to be low even in a case where there is sensitivity variability in the temperature detection element 905 or its drive circuit.
After the calculation of the peak voltage Vp_ft, the same processing as that in S804 to S807 in the first embodiment is performed in S904 to S907 to determine whether an ejection failure such as non-ejection is occurring at the corresponding ejection element part. Then, if it is determined that ejection is being performed normally, the threshold voltage Dth corresponding to the difference (Vp_d−Vp_ft) is determined using the reference table prepared in advance.
According to the second embodiment thus described, by obtaining Vp outputted upon application of energy below the minimum ejection enabling energy, it is possible to set the threshold voltage Dth without covering up the ejection port 13.
Next, a third embodiment of the present disclosure is described with reference to the flowcharts in
As described in the second embodiment, the broken line RL in
Utilizing this, the third embodiment sets the threshold voltage Dth through the processing shown in the flowcharts shown in
In
Note that, as described earlier, the relation between the application energy E and the peak voltage Vp in the non-ejection state can be expressed by a regression line irrespective of whether the application energy E is ejection enabling energy or not. Although a linear regression equation is found using the relations between two levels of application energy E1, E2 below 1.00 and their corresponding peak voltages Vp (Vp_E1, Vp_E2) in the present embodiment, the present disclosure is not limited to this. For example, a non-ejection state may be forcibly created using, e.g., a method of covering up the ejection port 13 as in the first embodiment, and a regression line may be measured using the peak voltages Vp (Vp_E1, Vp_E2) corresponding to the respective levels of application energy E1, E2 that are 1.00 or above. It is also possible to set one of the two levels of application energy used for the measurement of the peak voltages to energy below the minimum ejection enabling energy and set the other one of the levels of application energy to energy equal to or above the minimum ejection enabling energy. However, the application energy equal to or above the minimum ejection enabling energy is applied after a non-ejection state is created forcibly.
In this way, the present embodiment is characterized in measuring peak voltages Vp outputted upon application of two different levels of ejection enabling energy in the non-ejection state and finding a linear regression equation from the peak voltages measured. Specific means and steps for achieving this characteristic are not limited to particular ones.
Next, a fourth embodiment of the present disclosure is described. In the examples shown in the first to third embodiments described above, the threshold voltage Dth corresponding to the difference (Vp_d−Vp_ft) between the peak voltage Vp_d in the ejection state and the peak voltage Vp_ft in the non-ejection state is determined from the reference table. By contrast, the present embodiment finds the threshold voltage Dth for determining the ejection state by performing computation shown in S118 in
In the present embodiment, the processing in S118 is executed if it is determined in S115 that the difference (Vp_d−Vp_ft) between the peak voltage Vp_d in the ejection state and the peak voltage Vp_ft in the non-ejection state is equal to or above a difference threshold.
In S118, the sum of the product of the peak voltage Vp_d and a constant k where 0<k<1 and the product of the peak voltage Vp_ft and a constant (1−k) is calculated, and the calculated value is set as Dth_cal. Specifically, the following computation is performed:
Dth_cal=k−Vp_d+(1−k)−Vp_ft. (Formula 4)
The present embodiment has a reference table having threshold voltages Dth defined in 8-mV increments, like the threshold voltages Dth in the reference table in
In general, with too large a constant k, there is a higher possibility of normal ejection being erroneously determined as non-ejection due to measurement variability in the peak voltage Vp_d. With too small a constant k, an ejected droplet is more likely to take a curving course, and thus it is difficult to detect an ejection failure that causes a liquid droplet to be ejected at a low speed. Thus, the constant k is preferably set to a value equal to or above 0.1 and equal to or below 0.9.
Also, in a case where the temperature detection element 905 has low sensitivity to temperature change, the low sensitivity contributes to reduction in the measurement variability in the peak voltage Vp, but the difference between the peak voltage Vp_d in the ejection state and the peak voltage Vp_ft in the non-ejection state becomes small. As a result, the settable range for Dth narrows. Meanwhile, in a case where the temperature detection element 905 has high Vp's sensitivity to temperature change, the high sensitivity contributes to increase in the measurement variability in the peak voltage Vp, but the difference between the peak voltage Vp_d and the peak voltage Vp_ft becomes large as well. As a result, the settable range for the threshold voltage Dth widens. Thus, a more proper threshold voltage Dth can be set by setting the threshold voltage Dth through proportional distribution of the peak voltage Vp_d and the peak voltage Vp_ft.
In the present embodiment, Dth is set by multiplying the peak voltage Vp_d and the peak voltage Vp_ft by the constant k and the constant (1−k), respectively, as described above. This is in other words synonymous with setting Dth through the proportional distribution described above. Thus, the fourth embodiment can make it less likely for the accuracy of ejection state determination to be low due to manufacturing variability than the third embodiment described earlier does.
Next, a fifth embodiment of the present disclosure is described. The third and fourth embodiments described above measure the peak voltages Vp in the non-ejection state corresponding to two levels of application energy below the minimum ejection enabling energy. By contrast, the present embodiment measures the peak voltages Vp in the non-ejection state corresponding to three levels of application energy below the minimum ejection enabling energy. The following describes threshold setting processing of the present embodiment with reference to
In S121 in
Next, in S124, processing in S1241, 1242 shown in
After that, processing in S125 to S130 shown in
In the third and fourth embodiments described above, a regression line is found based on two peak voltage Vp_E1, Vp_E2 in order to estimate the peak voltage Vp_ft in the non-ejection state. For this reason, the regression line is substantially a straight line connecting two points. By contrast, in the present embodiment in which a regression line is found based on three peak voltages Vp_E1, Vp_E2, Vp_E3, the regression line differs depending on the regression method. In the present embodiment, because the values of application energy (E1, E2, E3) are substantially known, Vp_ft can be estimated with no problem using a regression line obtained by the typical method of least squares. However, in a case where the values of the application energy are presumed to be suspect, standardized major axis regression (geometric mean regression) or the like may be used.
Measuring three peak voltages Vp for the estimation of the peak voltage Vp_ft in the non-ejection state like in the present embodiment can increase the accuracy of the estimation of the peak voltage Vp_ft in the non-ejection state, compared to using two peak voltages. Then, the accurate estimation of the peak voltage Vp_ft in the non-ejection state enables the threshold voltage Dth to be set properly, which leads to further improvement in the accuracy of ejection state determination. Although three peak voltages Vp (Vp_ft) in the non-ejection state are measured in the present embodiment, it is to be noted that four or more peak voltages Vp may be measured. The more the peak voltages measured, the higher the accuracy of the ejection state determination.
The first to fifth embodiments described above use the peak voltage Vp obtained by application of energy in the non-ejection state. Zero (0) energy may be used as this application energy in the non-ejection state. For example, as shown in
Note that in a case where E=0, the peak voltage Vp is outputted without application of energy, and this is equivalent to the offset voltage Vofs shown in
Also, in the embodiments above, in selecting at least two levels of energy from a plurality of levels of energy that bring about the non-ejection state, a combination of values of energy that are apart from each other is preferably selected. This is because, with the temperature detection element 905 with low sensitivity to temperature, the amount of change in the peak voltage Vp is very small especially for the energy below the minimum ejection enabling energy, which may lead to large error in the estimation of the peak voltage Vp_ft in the non-ejection state. Thus, to estimate the peak voltage Vp_ft in the non-ejection state with high accuracy, among the at least two levels of energy in the non-ejection state, the farthest-apart two values of energy with a difference of one-tenth or more of the minimum ejection enabling energy are desirably selected.
Also, although the present disclosure carries out the ejection state determination by setting the threshold voltage Dth for ejection state determination, the setting of the threshold voltage Dth is desirably carried out for all the ejection element parts except for the ones determined as not ejecting. This is because the value of the threshold voltage Dth varies depending on the manufacturing variability in the heaters 15 and the temperature detection elements 905. For example, variability in the film thicknesses or resistances of the heaters 15 causes variability in the values of the minimum ejection enabling energy among the ejection element parts. In general, ejection ports in one array eject liquid using the same application energy. Thus, with different values of the minimum ejection enabling energy, temperature change also varies among the ejection element parts, and consequently, the threshold voltage Dth varies among the ejection element parts. In view of this situation, it is preferable to measure the peak voltage Vp with ejection enabling energy in the non-ejection state and set the determination threshold voltage Dth, for all the ejection element parts.
However, in the print head 3 including a plurality of print element boards 10 like in the present disclosure, there are several tens to hundreds of thousands of ejection element parts, and it may be difficult to store the threshold voltages Dth for all those enormous number of ejection element parts. In such a case, for example, the threshold voltage Dth of one of neighboring 32 ejection element parts may be set. Because manufacturing variability tends to be small among close ejection element parts, it is preferable that ejection element parts in one group be ones close to each other. In a case where a plurality of ejection element parts are put together as one group as described above, the threshold setting processing of the embodiments described above may be applied to a particular representative one of the ejection element parts in one group to set the threshold voltage Dth for that particular ejection element part. In this case, it is conceivable that the threshold voltages Dth for the temperature detection elements other than the particular temperature detection element are set based on the threshold voltage Dth set for the particular temperature detection element.
Also, after finding the threshold voltages Dth by applying the threshold setting processing of the embodiments described above to a plurality of ejection element parts in one group, the mean or median may be calculated after exclusion of outliers, and the mean or median may be set as the representative threshold voltage Dth of the one group. While various modes are conceivable for the setting of the threshold voltage Dth for each group, in either mode, the threshold voltage Dth may be set by applying the processing in the embodiments described above to at least one of the ejection element parts in one group.
Embodiment(s) of the present invention can also be realized by a computer of a system or apparatus that reads out and executes computer executable instructions (e.g., one or more programs) recorded on a storage medium (which may also be referred to more fully as a ‘non-transitory computer-readable storage medium’) to perform the functions of one or more of the above-described embodiment(s) and/or that includes one or more circuits (e.g., application specific integrated circuit (ASIC)) for performing the functions of one or more of the above-described embodiment(s), and by a method performed by the computer of the system or apparatus by, for example, reading out and executing the computer executable instructions from the storage medium to perform the functions of one or more of the above-described embodiment(s) and/or controlling the one or more circuits to perform the functions of one or more of the above-described embodiment(s). The computer may comprise one or more processors (e.g., central processing unit (CPU), micro processing unit (MPU)) and may include a network of separate computers or separate processors to read out and execute the computer executable instructions. The computer executable instructions may be provided to the computer, for example, from a network or the storage medium. The storage medium may include, for example, one or more of a hard disk, a random-access memory (RAM), a read only memory (ROM), a storage of distributed computing systems, an optical disk (such as a compact disc (CD), digital versatile disc (DVD), or Blu-ray Disc (BD)™), a flash memory device, a memory card, and the like.
According to the configuration of the present disclosure, the ejection state of a liquid ejection head can be determined properly while reducing influence by manufacturing variability in the liquid ejection head.
While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
This application claims the benefit of Japanese Patent Application No. 2022-157460 filed Sep. 30, 2022, which is hereby incorporated by reference wherein in its entirety.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2022-157460 | Sep 2022 | JP | national |
