The present disclosure generally relates to a liquid ejection head.
Recently manufactured micro-electro-mechanical-system (MEMS) devices, such as pressure sensors and acceleration sensors, include devices each including a substrate set formed by joining substrates together with an adhesive. Examples of such devices include liquid ejection heads that eject liquid.
Examples of such liquid ejection heads include an inkjet print head. The inkjet print head includes energy generating elements to apply energy for ink ejection.
A front surface of a substrate has an ejection-port defining member. The ejection-port defining member has multiple ejection ports for ink ejection. The substrate has through-holes, serving as ink passages, through which ink is supplied from a rear surface of the substrate to the front surface. The through-holes communicate with the ejection ports. After passing through the through-holes, the ink is ejected through the ejection ports by a force applied by the energy generating elements. Examples of the energy generating element includes an element capable of boiling ink by conductive heating, such as a heater element, and an element capable of pressurizing liquid using a change in volume, such as a piezoelectric element.
Japanese Patent Laid-Open No. 2013-91272 discloses a liquid ejection apparatus, which is an exemplary device including a substrate set. Specifically, the apparatus includes pressure generation chambers communicating with nozzle orifices and piezoelectric elements each including a piezoelectric layer and electrodes located on the piezoelectric layer. Liquid accumulated in the pressure generation chambers is ejected through the nozzle orifices.
In a liquid ejection apparatus like that disclosed in Japanese Patent Laid-Open No. 2013-91272, multiple substrates are typically joined together with an adhesive. However, the adhesive may protrude relative to a structure located at joined surfaces of substrates and affect ejection characteristics. For example, the adhesive may overlap a vibration plate of a piezoelectric element, resulting in a change in vibration characteristics. The adhesive may clog a supply port for liquid supply to a common liquid chamber containing an energy generating element and obstruct the liquid supply, thus affecting the ejection characteristics.
The present disclosure provides for a liquid ejection head with controlled flow of an adhesive relative to a structure located at joined surfaces of substrates.
An aspect of the present disclosure provides a liquid ejection head including a first substrate having a first surface and a second surface opposite the first surface, the first surface having a structure, a second substrate having a second surface facing the first surface of the first substrate, and a third substrate having a first surface facing the second surface of the first substrate. The first substrate and the second substrate are joined together by an adhesive located between the first surface of the first substrate and the second surface of the second substrate. The first substrate and the third substrate are joined together by the adhesive located between the second surface of the first substrate and the first surface of the third substrate. The second surface of the first substrate has an opening that is located in a region on a rear side of the structure and that has corners each having a curvature radius R2. The second surface of the second substrate has an opening that is located in a region facing the structure and that has corners each having a curvature radius R1. The curvature radii R1 and R2 satisfy R1<R2.
Further features of the present disclosure will become apparent from the following description of exemplary embodiments with reference to the attached drawings.
Embodiments of the disclosure will be described below with reference to the drawings. The dimensions, materials, shapes, and relative positions of components described herein may be appropriately changed depending on the configuration of an apparatus to which the present disclosure is applied and various conditions, and are therefore not intended to limit the scope of the disclosure to the following embodiments. Note that known or well-known technology in the art is applicable to a configuration or a step that is not particularly illustrated or described herein. Redundant explanation may be omitted.
As used herein, the term “curvature radius” refers to the shape of each corner of an opening in plan view of each substrate as viewed from a joint interface. Depending on the depth of an opening, such as a recess or a through-hole, from a surface (joint interface) on which an adhesive flows, preferably ½ or more of the depth of the opening has the same curvature radius, more preferably ¾ or more of the depth of the opening has the same curvature radius, most preferably the entire depth of the opening has the same curvature radius.
The following embodiments will describe an example of joining of three substrates. The embodiments are not limited to this example and are applicable to joining of three or more substrates.
Substrates for a liquid ejection head according to a first embodiment of the present disclosure will be described below with reference to the drawings. In the embodiment described below, specific statements may be made for sufficient explanation of the disclosure. These statements illustrate an example and are not particularly intended to limit the scope of the disclosure.
The liquid ejection head is a member included in a printing apparatus, such as an inkjet printer. The printing apparatus further includes a liquid containing portion that contains liquid to be supplied to the liquid ejection head and a conveying mechanism for a printing medium to be subjected to printing.
The liquid ejection head includes a first substrate 1, a second substrate 2, and a third substrate 3. The first substrate 1 has a first surface 1a and a second surface 1b. The second substrate 2 has a first surface 2a and a second surface 2b. The third substrate 3 has a first surface 3a and a second surface 3b.
The respective substrates are joined together with an adhesive 4 to form a liquid ejection head substrate. In other words, the joined substrates have multiple joined surfaces with at least the adhesive.
The first substrate 1 is, for example, a silicon substrate. The first surface 1a has a vibration film 6. The vibration film 6 has thereon a piezoelectric element 5 (structure). The second surface 1b has an opening (space) that serves as a pressure chamber 7. The vibration film 6 serves as a top wall of the pressure chamber and defines multiple pressure chambers 7.
The second substrate 2 is, for example, a silicon substrate. The second substrate 2 is disposed to cover the piezoelectric element 5. The second surface 2b of the second substrate 2 has a recess 8 facing the piezoelectric element 5, and is joined to the first surface 1a of the first substrate 1 by the adhesive 4. The recess 8 receives multiple piezoelectric elements 5 arranged in one-to-one correspondence to the multiple pressure chambers 7.
The third substrate 3 is joined to the second surface 1b of the first substrate 1. The third substrate 3 is, for example, a silicon substrate. The third substrate 3 defines the pressure chamber 7 together with the first substrate 1 and the vibration film 6.
The third substrate 3 has a liquid ejection passage 9. The liquid ejection passage 9 has a bottom having an ejection port 10 for liquid ejection. The ejection port 10 and the liquid ejection passage 9 extend through the third substrate 3. The ejection port 10 is located on the opposite side of the third substrate 3 from the pressure chamber 7. Therefore, a change in volume of the pressure chamber 7 causes the liquid accumulated in the pressure chamber 7 to pass through the liquid ejection passage 9 and be ejected from the ejection port 10.
The second substrate 2 has thereon an ink tank (not illustrated). The second substrate 2 has a through-hole 11 extending through the second substrate 2. The through-hole 11 of the second substrate 2 further extends through the first substrate 1 and communicates with the pressure chamber 7 in the first substrate 1. Therefore, the liquid in the ink tank is supplied to the pressure chamber 7 through the through-hole 11.
The piezoelectric element 5 is disposed on the vibration film 6, thus forming a piezoelectric actuator. The piezoelectric actuator includes a lower electrode (not illustrated) on a vibration film forming layer, the piezoelectric element 5 on the lower electrode, and an upper electrode (not illustrated) on the piezoelectric element 5.
The vibration film forming layer is formed by, for example, plasma chemical vapor deposition (CVD). Then, a hydrogen barrier film (not illustrated), the lower electrode (not illustrated), a piezoelectric film, and the upper electrode (not illustrated) are sequentially formed. The lower electrode and the upper electrode are formed by, for example, a sputtering process. The piezoelectric film is formed by a sol-gel process. The piezoelectric film may be formed by a sputtering process.
The piezoelectric element 5 can include a film of lead zirconate titanate (PZT) formed by, for example, a sol-gel process or a sputtering process. The piezoelectric element 5 includes a sintered body of metal oxide crystal. An interlayer and a wiring layer are formed so that the actuator can be driven, thus forming the first substrate 1, serving as an actuator substrate.
The piezoelectric element 5 is located on the opposite side of the vibration film 6 from the pressure chamber 7. In other words, the piezoelectric element 5 is located on the opposite surface of the vibration film 6 from the pressure chamber 7.
The vibration film 6 is deformable toward the pressure chamber 7.
A drive voltage applied to the piezoelectric element 5 by a drive integrated circuit (IC) (not illustrated) causes the piezoelectric element 5 to be deformed by the inverse piezoelectric effect. Thus, the vibration film 6 is also deformed together with the piezoelectric element 5, resulting in a change in volume of the pressure chamber 7. This pressurizes the liquid.
The pressurized liquid passes through the liquid ejection passage 9 and is ejected as minute droplets from the ejection port 10.
Substrate processing illustrated in
For Si dry etching, for example, an etching method called the Bosch process can be used. This process includes etching using SF6 gas and coating using C4F8 gas. The curvature radius of the corners of each opening in the first embodiment of the disclosure can be changed to any value by changing an exposure mask for a photoresist.
Although the openings of at least the surfaces to be joined of these substrates (e.g., the second surface 1b of the first substrate 1 and the first surface 3a of the third substrate 3) need to be processed before the substrates are joined together, substrate processing, such as opening formation at surfaces other than the surfaces to be joined and substrate thinning, may be performed either before or after the substrates are joined together.
For the adhesive 4, a material that is highly adhesive to substrates can be suitably used. Furthermore, a material that contains few bubbles and exhibits good coating properties can be used. In addition, a material having a low viscosity that allows the adhesive to be thinned can be used. The adhesive can contain a resin such as epoxy resin, acrylic resin, silicone resin, benzocyclobutene resin, polyamide resin, polyimide resin, and urethane resin.
Examples of a method of curing the adhesive 4 include thermal curing and ultraviolet (UV) radiation delayed curing.
If any of the substrates transmits UV rays, UV curing can also be used. A method of applying the adhesive includes applying the adhesive to a dry film in a spin coating manner and transferring the adhesive to any one of the surfaces to be joined of the substrates. The adhesive may be applied in any other manner, such as by screen printing. If the adhesive is a photosensitive adhesive, photolithographic patterning may be used.
The adhesive can be formed at a thick thickness to eliminate voids upon joining the substrates. Before the substrates are joined together, the adhesive has a thickness of 1.0 μm or more, preferably 2.0 μm or more, more preferably 5.0 μm or more.
Thickening the adhesive can reduce or eliminate voids but increases the likelihood that the adhesive may protrude into an opening at joined surfaces. The problems to be solved in the disclosure are likely to occur.
According to the first embodiment of the present disclosure, the relationship between the curvature radii of the corners of the openings at the joined surfaces of the substrates joined together with the adhesive is defined to control the protruding parts of the adhesive, thus achieving good ejection performance.
Furthermore, a large curvature radius R2 of each corner of the pressure chamber 7 in
As demonstrated in
For a curvature radius R3 of each corner of the opening, serving as the through-hole 11, in
The liquid ejection passage 9 may have any opening shape. However, the adhesive 4 protruding into the opening that serves as the pressure chamber 7 may reach the liquid ejection passage 9 and affect the ejection port 10. For this reason, as illustrated in
Substrates for a liquid ejection head according to a second embodiment of the disclosure will be described below with reference to the drawings. In the embodiment described below, specific statements may be made for sufficient explanation of the disclosure. These statements illustrate an example and are not particularly intended to limit the scope of the disclosure. The following description will focus on the difference between the second embodiment and the first embodiment.
Although the figures of the second embodiment illustrate the liquid ejection head oriented such that ejection ports are located at an upper level and liquid supply ports are located at a lower level, such orientation is taken in fabricating a passage defining member of the liquid ejection head. In most cases, the liquid ejection head is oriented such that the ejection ports are located at a lower level when used.
The first substrate 1 is, for example, a silicon substrate. The first surface 1a has energy generating elements 16 and supply ports 18 corresponding to the energy generating elements 16. The second surface 1b of the first substrate 1 has openings each serving as a passage 19. The supply ports 18 communicate with the passages 19 in the first substrate 1 such that liquid is directed from the passages 19 through the supply ports 18 to common liquid chambers 17 having therein the energy generating elements 16.
The second substrate 2 is, for example, a silicon substrate or a stainless steel substrate. The second substrate 2 is disposed to cover the energy generating elements 16. The second surface 2b of the second substrate 2 has the recesses 8, serving as the common liquid chambers 17, facing the energy generating elements 16. The second substrate 2 is joined to the first substrate 1 such that the recesses 8 receive the multiple energy generating elements 16 arranged in one-to-one correspondence to the multiple common liquid chambers 17. The top of each recess 8 has the ejection port 10 for liquid ejection. The ejection port 10 and the recess 8 extend through the second substrate 2 and correspond to the energy generating element 16. Therefore, a change in volume of the common liquid chamber 17 causes the liquid accumulated in the common liquid chamber 17 to be ejected from the ejection port 10. The second substrate 2 is joined to the first surface 1a of the first substrate 1 by the adhesive 4.
The third substrate 3 is joined to the second surface 1b of the first substrate 1. The third substrate 3 is, for example, a silicon substrate. The third substrate 3 has openings 20 for passage conversion. The openings 20 extend through the third substrate 3.
The openings 20 for passage conversion cause the passages 19 to include liquid supply passages and liquid collection passages. A negative pressure control unit (not illustrated) generates a pressure difference between the liquid supply passage and the liquid collection passage. The pressure difference causes the liquid in the liquid supply passage to flow through the supply port 18 to the common liquid chamber 17 and further flow through the supply port 18 to the liquid collection passage.
This flow allows, for example, liquid increased in viscosity by evaporation through the ejection port 10, bubbles, and a foreign substance, to be collected from the ejection port 10 and the common liquid chamber 17 that are in a printing-stopped state into the liquid collection passage. This can inhibit the liquid in the ejection port 10 and the common liquid chamber 17 from increasing in viscosity.
Furthermore, an ink tank (not illustrated) is disposed upstream of the third substrate 3. The openings 20 for passage conversion in the third substrate 3 communicate with the passages 19 and the supply ports 18 in the first substrate 1 and further communicate with the common liquid chambers 17. In the second embodiment, the supply ports 18 serve as supply paths for the liquid to be ejected by the liquid ejection head.
The first surface 1a of the first substrate 1 has a surface membrane layer (not illustrated) including a wiring layer connected to the energy generating elements 16 and an insulating interlayer. The supply ports 18 and the passages 19 are formed by etching with an etching mask produced using, for example, a photoresist. For example, it is assumed that the energy generating element 16 is an electrothermal transducing element. Under a drive voltage applied by a drive IC (not illustrated), the electrothermal transducing element instantaneously generates bubbles in the liquid. A change in pressure in the common liquid chamber 17 caused by growth of the bubbles is used to eject liquid droplets through the ejection port 10.
Substrate processing illustrated in
A material for the adhesive 4, a method of curing the adhesive 4, and a method of applying the adhesive 4 are the same as those in the first embodiment. The adhesive can be formed at a thick thickness to eliminate voids upon joining the substrates. Before the substrates are joined together, the adhesive has a thickness of 1.0 μm or more, preferably 2.0 μm or more, more preferably 5.0 μm or more. Thickening the adhesive can reduce or eliminate voids but increases the likelihood that the adhesive may protrude into an opening at joined surfaces. The problems to be solved in the disclosure are likely to occur.
Obstruction of the supply ports 18 by protruding parts of the adhesive 4 may block the supply ports 18, so that the liquid cannot be supplied to the common liquid chambers 17. For a configuration in which the liquid in the liquid supply passages flows through the supply ports 18 to the common liquid chambers 17 and further flows through the supply ports 18 to the liquid collection passages as in the second embodiment, the supply ports 18 may be narrowed by the protruding parts of the adhesive. This may make it difficult for, for example, the liquid increased in viscosity by evaporation through the ejection ports 10, bubbles, and a foreign substance, to be collected into the liquid collection passages. Thus, the liquid in the ejection ports 10 and the common liquid chambers 17 may increase in viscosity and thus affect ejection performance.
According to the second embodiment of the disclosure, the relationship between the curvature radii of the corners of the openings at the joined surfaces of the substrates joined together with the adhesive is defined to control the protruding parts of the adhesive, thus achieving good ejection performance.
Furthermore, a large curvature radius R2 of each corner of the passages 19 in
In other words, the curvature radii R1 and R2 satisfying R1<R2 can reduce or eliminate the effects of the adhesive 4 on the supply ports 18. Furthermore, the adhesive 4 protruding on the first surface 3a of the third substrate 3 may obstruct the openings 20 for passage conversion, extend through the openings, and reach the second surface 3b of the third substrate 3. For this reason, a curvature radius R5 of each corner of the openings 20 for passage conversion in the third substrate 3 can satisfy R2<R5, or R1<R2<R5.
As demonstrated in
Substrates for a liquid ejection head according to a third embodiment of the disclosure will be described below with reference to the drawings. In the embodiment described below, specific statements may be made for sufficient explanation of the disclosure. These statements illustrate an example and are not particularly intended to limit the scope of the disclosure. The following description will focus on the difference between the third embodiment and the first embodiment.
The first substrate 1 is, for example, a silicon substrate. The first surface 1a has the vibration film 6 and the recess 8 located on the vibration film 6. The piezoelectric element 5 is located on the bottom of the recess 8. The recess 8 may be formed by processing the substrate. As illustrated in
The second substrate 2 is, for example, a silicon substrate. The second substrate 2 is disposed to cover the piezoelectric element 5. The second surface 2b of the second substrate 2 is joined to the first surface 1a of the first substrate 1 by the adhesive 4.
The first surface 3a of the third substrate 3 has an opening that serves as the pressure chamber 7. The respective substrates are joined together such that the recess 8 receives multiple piezoelectric elements 5 arranged in one-to-one correspondence to multiple pressure chambers 7.
The third substrate 3 is, for example, a silicon substrate, and at least has the opening, serving as the pressure chamber 7, and the ejection port 10 for liquid ejection. Although the liquid ejection passage illustrated in the first embodiment is not illustrated in the third embodiment, the liquid ejection passage may be located between the pressure chamber 7 and the ejection port 10 as in the first embodiment.
The first surface 3a of the third substrate 3 is joined to the second surface 1b of the first substrate 1. The vibration film 6 serves as the top wall of each pressure chamber 7 and defines the multiple pressure chambers 7.
According to the third embodiment of the disclosure, changing the curvature radii of the corners of the openings at the joined surfaces of the respective substrates controls the protruding parts of the adhesive, thus achieving good ejection performance.
Furthermore, a small curvature radius R2 of each corner of the pressure chamber 7 in
As demonstrated in
For the curvature radius R3 of each corner of the opening, serving as the through-hole 11, in
Substrates for a liquid ejection head according to a fourth embodiment of the disclosure will be described below with reference to the drawings. In the embodiment described below, specific statements may be made for sufficient explanation of the disclosure. These statements illustrate an example and are not particularly intended to limit the scope of the disclosure. The following description will focus on the difference between the fourth embodiment and the second embodiment.
Although the figures of the fourth embodiment illustrate the liquid ejection head oriented such that ejection ports are located at an upper level and liquid supply ports are located at a lower level, such orientation is taken in fabricating a passage defining member of the liquid ejection head. In most cases, the liquid ejection head is oriented such that the ejection ports are located at a lower level when used.
The first substrate 1 is, for example, a silicon substrate. The first surface 1a has the energy generating elements 16 and the supply ports 18 corresponding to the energy generating elements 16. The first surface 1a of the first substrate 1 has the recesses 8. Each of the energy generating elements 16 is located on the bottom of the recess 8. The recesses 8 may be formed by processing the substrate. As illustrated in
The second substrate 2 is, for example, a silicon substrate or a stainless steel substrate, and has multiple ejection ports 10 for liquid ejection. The second surface 2b of the second substrate 2 is joined to the first surface 1a of the first substrate 1 such that the ejection ports 10 are aligned with the respective energy generating elements 16. The recesses 8 at the first surface 1a of the first substrate 1 serve as the common liquid chambers 17. For example, it is assumed that the energy generating element 16 is an electrothermal transducing element. Under a drive voltage applied by a drive IC (not illustrated), the electrothermal transducing element instantaneously generates bubbles in the liquid. A change in pressure in the common liquid chamber 17 caused by growth of the bubbles is used to eject liquid droplets through the ejection port 10.
The third substrate 3 is, for example, a silicon substrate. The third substrate 3 has the passages 19 integrated with a passage conversion member. The passages 19 include liquid supply passages and liquid collection passages as in the second embodiment. A pressure difference generated by a negative pressure control unit (not illustrated) causes the liquid in the liquid supply passage to flow through the supply port 18 to the common liquid chamber 17 and further flow through the supply port 18 to the liquid collection passage. The second surface 3b of the third substrate 3 has the openings 20 for passage conversion. The openings 20 and the passages 19 extend through the third substrate 3.
The supply ports 18 in the first substrate 1 communicate with the passages 19 in the third substrate 3 such that the liquid is directed from the passages 19 through the supply ports 18 to the common liquid chambers 17 having therein the energy generating elements 16.
Furthermore, the adhesive 4 may protrude into the passages 19 at the second surface 1b of the first substrate 1, extend along the corners of the passages 19, and similarly obstruct the supply ports 18.
Obstruction of the supply ports 18 by protruding parts of the adhesive 4 may block the supply ports 18, so that the liquid cannot be supplied to the common liquid chambers 17. For a configuration in which the liquid in the liquid supply passages flows through the supply ports 18 to the common liquid chambers 17 and further flows through the supply ports 18 to the liquid collection passages as in the fourth embodiment, the supply ports 18 may be narrowed by the protruding parts of the adhesive. This may make it difficult for, for example, the liquid increased in viscosity by evaporation through the ejection ports 10, bubbles, and a foreign substance, to be collected into the liquid collection passages. Thus, the liquid in the ejection ports 10 and the common liquid chambers 17 may increase in viscosity and thus affect ejection performance.
According to the fourth embodiment of the disclosure, the relationship between the curvature radii of the corners of the openings at the joined surfaces of the substrates joined together with the adhesive is defined to control the protruding parts of the adhesive, thus achieving good ejection performance.
Furthermore, a small curvature radius R2 of each corner of the passages 19 in
As demonstrated in
The embodiments of the disclosure can provide a liquid ejection head with controlled flow of an adhesive protruding relative to a structure located at joined surfaces of substrates.
While the present disclosure has been described with reference to exemplary embodiments, it is to be understood that the disclosure is not limited to the disclosed exemplary embodiments. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and functions.
This application claims the benefit of priority from Japanese Patent Application No. 2021-192914, filed Nov. 29, 2021, which is hereby incorporated by reference herein in its entirety.
Number | Date | Country | Kind |
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2021-192914 | Nov 2021 | JP | national |
Number | Name | Date | Kind |
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20170100934 | Masuda | Apr 2017 | A1 |
20210031524 | Yonemoto | Feb 2021 | A1 |
Number | Date | Country |
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2007045017 | Feb 2007 | JP |
2013091272 | May 2013 | JP |
Number | Date | Country | |
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20230166507 A1 | Jun 2023 | US |