This application claims the benefits of Taiwan Patent Application No. 105132768 filed on Oct. 11, 2016, the contents of which are incorporated herein by reference in their entirety.
The present invention relates to a liquid level control system and method, and more particularly to a liquid level control system and method which are suitable for wet processes, especially for the panel industry, the semiconductor industry and the bio industry.
In the panel industry, the wet process has developed to a pretty mature technology. However, there are many issues existing in real operation with the limit of the conventional mechanical design.
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Hence, it is needed to provide a liquid level control system to solve the technical issue as discussed above.
One objective of the present invention is to provide a liquid level control system, which has an advantage for solving the above issue.
In order to achieve the objective, the present invention provides a liquid level control system, for a substrate wet-process, which includes a tank, a liquid, a fixing device, and a liquid removal device.
The liquid is stored in the tank. The fixing device is used to fix a substrate in the liquid. The liquid is used to perform processes on a portion of the substrate, which is soaked in the liquid. The liquid removal device is used to remove the liquid from the tank. The portion of the substrate soaked in the liquid is reduced when the liquid is gradually removed from the tank.
In one preferred embodiment, the liquid is selected from the group consisting of an etching solution and a bio solution.
In one preferred embodiment, the fixing device is disposed at a bottom of the tank.
In one preferred embodiment, the liquid removal device is selected from the group consisting of a micro valve and a dosing pump.
In one preferred embodiment, the liquid level control system further includes a filter, which is disposed at a position where the liquid enters into the liquid removal device.
In one preferred embodiment, the liquid level control system further includes a pipe, which is disposed at a position where the liquid leaves from the liquid removal device.
In one preferred embodiment, the liquid level control system further includes a negative pressure device, which is connected with the pipe.
In one preferred embodiment, the liquid removal device is a capillary unit, which removes the liquid from the tank based on capillary effect, with the touch of the capillary unit and the liquid.
In order to achieve the objective, the present invention further provides a liquid level control method, for a substrate wet-process, which includes:
A tank is disposed having a liquid stored therein.
A substrate is fixed by a fixing device in the liquid, wherein the liquid is used to perform processes to at least a portion of the substrate, which is soaked in the liquid.
The liquid is gradually removed from the tank by a liquid removal device, making the at least a portion of the substrate soaked in the liquid be reduced.
In one preferred embodiment, the liquid is selected from the group consisting of an etching solution and a bio solution.
In one preferred embodiment, the fixing device is disposed at a bottom of the tank.
In one preferred embodiment, the liquid removal device is selected from the group consisting a micro valve and a dosing pump.
In one preferred embodiment, the liquid removal device further includes a filter, which is disposed at a position where the liquid enters into the liquid removal device.
In one preferred embodiment, the liquid removal device further includes a pipe, which is disposed at a position where the liquid leaves from the liquid removal device.
In one preferred embodiment, the liquid level control method further includes a negative pressure device, which is connected with the pipe.
In one preferred embodiment, the liquid removal device is a capillary unit, which removes the liquid from the tank based on capillary effect, with the touch of the capillary unit and the liquid.
In comparison to the prior art, the present invention completely prevents technical issues of vibration along with mechanical actuation and disturbance of a surface of the liquid, by fixing the substrate at a certain distance from a bottom of the tank and gradually removing the liquid from the tank with the liquid removal device according to different requirements.
The advantages and features of the invention, as well as the method of carrying out these advantages and features, will become more apparent with the following detailed description of embodiments thereof with reference to the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, and the present invention can be implemented in a wide variety of different ways. The embodiments disclosed below are only intended to provide a more complete disclosure of the present invention. Those skilled in the art will be able to fully understand the scope of the invention, which is defined by the scope of the appended claims. Throughout the specification, the same reference numerals refer to the same elements.
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The tank 110 is used to store a liquid 120. Generally, the liquid 120 is a processing solution, such as etching solution and/or a bio solution, or other liquid might be used in a wet process. The fixing device 130 is used to fix a substrate 140 in the liquid 120. The liquid removal device 150 is used to remove the liquid 120 from the tank 110. Because in the panel industry or wafer industry, it is needed to perform a uniformly wet processing (soaking) process of the substrate 140 during different segments of a fixed time period, in short, making the portion of the substrate soaked in the liquid is reduced, gradually. The present invention abandons the conventional method of moving the substrate, with gradual removal of the liquid 120 from the tank 110, making the portion of the substrate 140 soaked in the liquid 120 is reduced, correspondingly. The removal speed can be timed and rationed and/or continuous, according to requirements.
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Generally, the substrate 140 is a glass substrate or a wafer, so the substrate 140 can be sunken in the liquid 120.
In the preferred embodiment, the liquid 120 might generate etched precipitates or other impurities, so the filter 160 is disposed at a position before the liquid 120 enters into the liquid removal device 150. In other words, the filter 160 interconnects the tank 110 and the liquid removal device 150. Additionally, the liquid removing quantity setup by the liquid removal device 150 is very little, the liquid 120 might not be removed by vacuum or other issues, so the negative pressure device 172 is connected with the pipe 170, which is disposed at a position where the liquid 120 leaves from the liquid removal device 150, with applying a negative pressure to ensure that the liquid 120 can be continuously removed from the tank 110.
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As mentioned above, the present invention completely prevents technical issues of abandoning the substrate for unevenly processed substrates, which are caused by vibration along with mechanical actuation and disturbance at a surface of the liquid, by fixing the substrate at a certain distance from a bottom of the tank and gradually removing the liquid from the tank with the liquid removal device according to different requirements.
As is understood by a person skilled in the art, the foregoing preferred embodiments of the present invention are illustrative rather than limiting of the present invention. It is intended that they cover various modifications and similar arrangements be included within the spirit and scope of the appended claims, the scope of which should be accorded the broadest interpretation so as to encompass all such modifications and similar structures.
Number | Date | Country | Kind |
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105132768 | Oct 2016 | TW | national |